Design and testing of a two-monochromator reference spectrofluorimeter for high-accuracy total radiance factor measurements

Angular dependence of fluorescence from turbid media

We perform Monte Carlo light scattering simulations to study the angular distribution of the fluorescence emission from turbid media and compare the results to measured angular distributions from fluorescing white paper samples. The angular distribution of fluorescence emission is significantly depending on the concentration of fluorophores. The simulations show also a dependence on the angle of incidence that is however not as evident in the measurements. A detailed analysis of the factors affecting this angular distribution indicates that it is strongly correlated to the mean depth of the fluorescence process. The findings can find applications in fluorescence spectroscopy and are of particular interest when optimizing the impact of fluorescence on e.g. the appearance of paper as the measured values are angle dependent.

State-of-the art comparability of corrected emission spectra. 1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories

The development of fluorescence applications in the life and material sciences has proceeded largely without sufficient concern for the measurement uncertainties related to the characterization of fluorescence instruments. In this first part of a two-part series on the state-of-the-art comparability of corrected emission spectra, four National Metrology Institutes active in high-precision steady-state fluorometry performed a first comparison of fluorescence measurement capabilities by evaluating physical transfer standard (PTS)-based and reference material (RM)-based calibration methods. To identify achievable comparability and sources of error in instrument calibration, the emission spectra of three test dyes in the wavelength region from 300 to 770 nm were corrected and compared using both calibration methods. The results, obtained for typical spectrofluorometric (0°/90° transmitting) and colorimetric (45°/0° front-face) measurement geometries, demonstrated a comparability of corrected emission spectra within a relative standard uncertainty of 4.2% for PTS- and 2.4% for RM-based spectral correction when measurements and calibrations were performed under identical conditions. Moreover, the emission spectra of RMs F001 to F005, certified by BAM, Federal Institute for Materials Research and Testing, were confirmed. These RMs were subsequently used for the assessment of the comparability of RM-based corrected emission spectra of field laboratories using common commercial spectrofluorometers and routine measurement conditions in part 2 of this series (subsequent paper in this issue).

State-of-the art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards

In the second part of this two-part series on the state-of-the-art comparability of corrected emission spectra, we have extended this assessment to the broader community of fluorescence spectroscopists by involving 12 field laboratories that were randomly selected on the basis of their fluorescence measuring equipment. These laboratories performed a reference material (RM)-based fluorometer calibration with commercially available spectral fluorescence standards following a standard operating procedure that involved routine measurement conditions and the data evaluation software LINKCORR developed and provided by the Federal Institute for Materials Research and Testing (BAM). This instrument-specific emission correction curve was subsequently used for the determination of the corrected emission spectra of three test dyes, X, QS, and Y, revealing an average accuracy of 6.8% for the corrected emission spectra. This compares well with the relative standard uncertainties of 4.2% for physical standard-based spectral corrections demonstrated in the first part of this study (previous paper in this issue) involving an international group of four expert laboratories. The excellent comparability of the measurements of the field laboratories also demonstrates the effectiveness of RM-based correction procedures.

Qualification of a fluorescence spectrometer for measuring true fluorescence spectra

New analytical methods using fluorescence detection are becoming increasingly quantitative and require easy-to-use material standards for fluorometer qualification and method validation. NIST is responding to this need by developing and producing such standards. Reported here is the first step in this process, which is to qualify a research-grade fluorescence spectrometer for measuring true fluorescence spectra of reference material candidates. "True" spectra are defined here as those with fluorescence intensity, either relative or absolute as required, and wavelength both being reported with high accuracy and known precision, after wavelength has been calibrated and corrections for excitation intensity and detection system response have been applied. The uncertainties determined in relative and absolute intensity-corrected fluorescence spectra using both calibrated source (CS)- and calibrated detector (CD)-based methods were compared. The CS-based method gave uncertainties, typically about +/-5% for relative spectral correction, that were about half that of the CD-based method for determining both relative and absolute spectral correction factors. Absolute spectral correction factors can be determined using either method without knowing the optical geometry of the instrument. The absolute spectral correction factors were found to have much larger uncertainties than the corresponding relative correction factors with uncertainties for the CS-based method of +/-10% to +/-15% being typical and +/-20% or more not being uncommon, particularly for excitation and emission wavelengths below 400 nm. Uncertainties arising from detection system nonlinearity and instrument polarization ratios were also explored.

Spectral responsivity of various types of silicon photodiode at oblique incidence: comparison of measured and calculated values

The spectral responsivity of several types of silicon photodiode at oblique incidence (approximately 45 degrees) is investigated. Both windowless diodes and diodes that incorporate quartz windows are considered. The spectral responsivities are measured directly for both parallel and perpendicular polarized radiation. For comparison, the responsivity at oblique incidence is also calculated from the normal-incidence measured responsivity in conjunction with the reflectance values at normal and oblique incidence calculated from thin-film theory by use of the measured oxide thicknesses of the diodes and published data on the refractive indices of silicon and fused silica. A technique, believed to be novel, is described for accurately measuring the oxide thicknesses of the diodes. A comparison of calculated and measured responsivity values shows that, when imperfect polarizers are used, it may be more accurate over a certain spectral range to calculate the responsivities at oblique incidence rather than to measure them directly. The additional uncertainty associated with the calculated responsivity values at oblique incidence, with respect to the original source data for normal incidence, is +/-1% over a wide spectral range.