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For: Zerrad M, Deumié C, Lequime M, Amra C. An alternative scattering method to characterize surface roughness from transparent substrates. Opt Express 2007;15:9222-9231. [PMID: 19547263 DOI: 10.1364/oe.15.009222] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]

For:	Zerrad M, Deumié C, Lequime M, Amra C. An alternative scattering method to characterize surface roughness from transparent substrates. Opt Express 2007;15:9222-9231. [PMID: 19547263 DOI: 10.1364/oe.15.009222] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]

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(The first 100,000 artilces are displayed in RCA.)