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For: Gracia-Abad R, Sangiao S, Kumar Chaluvadi S, Orgiani P, Teresa JMD. Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi2Se3 Thin Films. Materials (Basel) 2023;16:2244. [PMID: 36984129 PMCID: PMC10051711 DOI: 10.3390/ma16062244] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/21/2023] [Revised: 03/03/2023] [Accepted: 03/08/2023] [Indexed: 06/18/2023]
Number Cited by Other Article(s)
1
S A, Amaladass EP, Amirthapandian S, David C, Mani A. The effect of charged particle irradiation on the transport properties of bismuth chalcogenide topological insulators: a brief review. Phys Chem Chem Phys 2024;26:2745-2767. [PMID: 38179833 DOI: 10.1039/d3cp02462h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/06/2024]
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