Gradwohl KP, Danilewsky AN, Roder M, Schmidbauer M, Janicskó-Csáthy J, Gybin A, Abrosimov N, Sumathi RR. Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals.
J Appl Crystallogr 2020;
53:880-884. [PMID:
32788899 PMCID:
PMC7401780 DOI:
10.1107/s1600576720005993]
[Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/21/2020] [Accepted: 05/01/2020] [Indexed: 11/10/2022] Open
Abstract
White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.
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