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Juste-Dolz A, Fernández E, Micó G, Bru LA, Muñoz P, Avella-Oliver M, Pastor D, Maquieira Á. Surface Bragg gratings of proteins patterned on integrated waveguides for (bio)chemical analysis. Mikrochim Acta 2023; 191:63. [PMID: 38157073 DOI: 10.1007/s00604-023-06124-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/15/2023] [Accepted: 11/23/2023] [Indexed: 01/03/2024]
Abstract
The incorporation of biomacromolecules onto silicon waveguiding microstructures constitutes a growing trend that pushes towards compact and miniaturized biosensing systems. This paper presents the integration of one-dimensional periodic nanostructures of proteins on the surface of micrometric silicon waveguides for transducing binding events between biomacromolecules. The study demonstrates this new bioanalytical principle by experimental results and theoretical calculations, and proves that rib waveguides (1--1.6-µm width) together with protein gratings (495--515-nm period) display suitable spectral responses for this optical biosensing system. Protein assemblies of bovine serum albumin are fabricated on the surface of silicon nitride waveguides, characterized by electron microscopy, and their response is measured by optical frequency domain reflectometry along the fabrication process and the subsequent stages of the biorecognition assays. Detection and quantification limits of 0.3 and 3.7 µg·mL-1, respectively, of specific antibodies are inferred from experimental dose-response curves. Among other interesting features, the results of this study point towards new miniaturized and integrated sensors for label-free bioanalysis.
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Affiliation(s)
- Augusto Juste-Dolz
- Instituto Interuniversitario de Investigación de Reconocimiento Molecular y Desarrollo Tecnológico (IDM), Universitat Politècnica de València, Universitat de València, 46022, Valencia, Spain
| | - Estrella Fernández
- Instituto Interuniversitario de Investigación de Reconocimiento Molecular y Desarrollo Tecnológico (IDM), Universitat Politècnica de València, Universitat de València, 46022, Valencia, Spain
| | - Gloria Micó
- Photonics Research Labs, ITEAM, Universitat Politècnica de València, 46022, Valencia, Spain
| | - Luis A Bru
- Photonics Research Labs, ITEAM, Universitat Politècnica de València, 46022, Valencia, Spain
| | - Pascual Muñoz
- Photonics Research Labs, ITEAM, Universitat Politècnica de València, 46022, Valencia, Spain
| | - Miquel Avella-Oliver
- Instituto Interuniversitario de Investigación de Reconocimiento Molecular y Desarrollo Tecnológico (IDM), Universitat Politècnica de València, Universitat de València, 46022, Valencia, Spain.
- Departamento de Química, Universitat Politècnica de València, 46022, Valencia, Spain.
| | - Daniel Pastor
- Photonics Research Labs, ITEAM, Universitat Politècnica de València, 46022, Valencia, Spain.
| | - Ángel Maquieira
- Instituto Interuniversitario de Investigación de Reconocimiento Molecular y Desarrollo Tecnológico (IDM), Universitat Politècnica de València, Universitat de València, 46022, Valencia, Spain.
- Departamento de Química, Universitat Politècnica de València, 46022, Valencia, Spain.
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Bru LA, Pastor D, Muñoz P. Advanced and versatile interferometric technique for the characterization of photonic integrated devices. Opt Express 2021; 29:36503-36515. [PMID: 34809060 DOI: 10.1364/oe.435683] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/02/2021] [Accepted: 07/30/2021] [Indexed: 06/13/2023]
Abstract
Adaptable and complex optical characterization of photonic integrated devices, permitting to unearth possible design and fabrication errors in the different workflow steps are highly desired in the community. Here, we propose a technique capable of resolving full optical amplitude and phase response, in both frequency and time domains, of a photonic integrated device. It relies on optical frequency domain interferometry and makes use of a novel integrated architecture; a 3-way interferometer enabling single input and single output detection. We derive the test structure design rules and provide extensive experimental validation in silicon nitride and silicon on insulator technologies, by testing relevant devices such as arrayed waveguide grating, Mach-Zehnder interferometers, and ring resonators. Horizontal and vertical chip coupling, different external setup arrangements, and the optical dispersion de-embedding inherent to the technique are demonstrated. Finally, we discuss why this characterization approach might lay the groundwork of a standard testing tool for photonic integrated devices.
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Bru LA, Pastor D, Muñoz P. Integrated optical frequency domain reflectometry device for characterization of complex integrated devices. Opt Express 2018; 26:30000-30008. [PMID: 30469880 DOI: 10.1364/oe.26.030000] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/25/2018] [Accepted: 09/10/2018] [Indexed: 06/09/2023]
Abstract
Because of the demand for advanced measurement systems in the field of modern photonic integrated circuits, optical frequency domain reflectometry (OFDR) is a robust technique for characterizing design-to-fabrication deviations. In this paper we report an OFDR device where the interferometric part is monolithically integrated along with the device under test. We discuss the advantages in terms of compactness and performance, and the importance of the incorporated dispersion de-embedding mechanism. Experimental validation is carried out by interrogating an arrayed waveguide grating on a silicon nitride platform. The results establish the proposed device as a first step in the quest for a universal test structure for integrated devices.
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