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Liu Y, Li H, Han R, Ouyang Q, Guo Y, Zhang Z, Mu L, Sainio S, Nordlund D, Zan L, Jiang Z. Unveiling Atomic-Scale Product Selectivity at the Cocatalyst-TiO 2 Interface Using X-Ray Techniques: Insights into Interface Reactivity. Small Methods 2024; 8:e2301120. [PMID: 38009509 DOI: 10.1002/smtd.202301120] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/22/2023] [Revised: 11/02/2023] [Indexed: 11/29/2023]
Abstract
The microstructure at the interface between the cocatalyst and semiconductor plays a vital role in concentrating photo-induced carriers and reactants. However, observing the atomic arrangement of this interface directly using an electron microscope is challenging due to the coverings of the semiconductor and cocatalyst. To address this, multiple metal-semiconductor interfaces on three TiO2 crystal facets (M/TiO2 ─N, where M represents Ag, Au, and Pt, and N represents the 001, 010, and 101 single crystal facets). The identical surface atomic configuration of the TiO2 facets allowed us to investigate the evolution of the microstructure within these constructs using spectroscopies and DFT calculations. For the first time, they observed the transformation of saturated Ti6c ─O bonds into unsaturated Ti5c ─O and Ti6c ─O─Pt bonds on the TiO2 ─010 facet after loading Pt. This transformation have a direct impact on the selectivity of the resulting products, leading to the generation of CO and CH4 at the Ti6c ─O─Pt and Pt sites, respectively. These findings pinpoint the pivotal roles played by the atomic arrangement at the M/TiO2 ─N interfaces and provide valuable insights for the development of new methodologies using conventional lab-grade equipment.
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Affiliation(s)
- Yin Liu
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
- College of Chemistry and Molecular Sciences, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Hanqi Li
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Rong Han
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Qin Ouyang
- College of Chemistry and Molecular Sciences, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Yuzheng Guo
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Zhaofu Zhang
- The Institute of Technological Sciences, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Linqin Mu
- School for Engineering of Matter, Transport and Energy, Arizon State University, Phoenix, AZ, 85287, USA
| | - Sami Sainio
- SSRL MSD Soft X-rays, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA, 94309, USA
| | - Dennis Nordlund
- SSRL MSD Soft X-rays, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA, 94309, USA
| | - Ling Zan
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
| | - Zhuo Jiang
- School of Electrical Engineering and Automation, Wuhan University, Luojiashan, Wuhan, 430072, China
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