1
|
Chen C, Zhu Y, Gao D, Li M, Zhang Z, Chen H, Feng Y, Wang C, Sun J, Chen J, Tian H, Ding L, Chen C. Molecular Synergistic Passivation for Efficient Perovskite Solar Cells and Self-Powered Photodetectors. Small 2023; 19:e2303200. [PMID: 37178255 DOI: 10.1002/smll.202303200] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/01/2023] [Indexed: 05/15/2023]
Abstract
The interface between the perovskite and electron-transporting material is often treated for defect passivation to improve the photovoltaic performance of devices. A facile 4-Acetamidobenzoic acid (containing an acetamido, a carboxyl, and a benzene ring)-based molecular synergistic passivation (MSP) strategy is developed here to engineer the SnOx /perovskite interface, in which dense SnOx are prepared using an E-beam evaporation technology while the perovskite is deposited with vacuum flash evaporation deposition method. MSP engineering can synergistically passivate defects at the SnOx /perovskite interface by coordinating with Sn4+ and Pb2+ with functional group CO in the acetamido and carboxyl. The optimized solar cell devices can achieve the highest efficiency of 22.51% based on E-Beam deposited SnOx and 23.29% based on solution-processed SnO2 , respectively, accompanied by excellent stability exceeding 3000 h. Further, the self-powered photodetectors exhibit a remarkably low dark current of 5.22 × 10-9 A cm-2 , a response of 0.53 A W-1 at zero bias, a detection limit of 1.3 × 1013 Jones, and a linear dynamic range up to 80.4 dB. This work proposes a molecular synergistic passivation strategy to enhance the efficiency and responsivity of solar cells and self-powered photodetectors.
Collapse
Affiliation(s)
- Chunlei Chen
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Yunfei Zhu
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Deyu Gao
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Mengjia Li
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Zuolin Zhang
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Hongjian Chen
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Yinsu Feng
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Chen Wang
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
| | - Jie Sun
- Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Jiangzhao Chen
- Key Laboratory of Optoelectronic Technology & Systems (MoE), College of Optoelectronic Engineering, Chongqing University, Chongqing, 400044, China
| | - He Tian
- School of Integrated Circuits, Tsinghua University, Beijing, 100084, China
| | - Liming Ding
- Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Cong Chen
- School of Materials Science and Engineering, State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300130, China
- Macao Institute of Materials Science and Engineering (MIMSE), Macau University of Science and Technology, Macau, 999078, China
| |
Collapse
|