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Yang Z, Guo C, Qin L, Hu JT, Luan P, Liang Z, Li X, Ding H, Wang DK, Zhang T, Zhu Q, Lu ZH. Enhanced Organic Thin-Film Transistor Stability by Preventing MoO 3 Diffusion with Metal/MoO 3/Organic Multilayered Interface Source-Drain Contact. ACS Appl Mater Interfaces 2023; 15:1704-1717. [PMID: 36541611 DOI: 10.1021/acsami.2c18780] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/17/2023]
Abstract
The source-drain electrode with a MoO3 interfacial modification layer (IML) is considered the most promising method to solve electrical contact issues impeding organic thin-film transistors (OTFTs) from commercialization. However, this method raises many concerns because MoO3 might diffuse into organic materials, which causes device instability. In this work, we observed a significant device stability degradation by damaging on/off switching performance caused by MoO3 diffusion. To prevent the MoO3 diffusion, a source-drain electrode with a multilayered interface contact (MIC) consisting of a top-down stack of metal, MoO3 IML, and organic buffer layer (OBL) is proposed. In the MIC device, the MoO3 IML serves well for its intended functions of reducing contact resistance and suppressing minority carrier injection to the OTFT channel. The inclusion of OBL to the MIC helps block MoO3 diffusion and thereby leads to better device stability and an increased on/off ratio. Through combinations with several organic compounds as a buffer layer, the MoO3 diffusion related electrical behaviors of OTFTs are systematically studied. Key parameters related to MoO3 diffusion such as the Fick coefficient and bias-stress stability such as carrier trapping time are extracted from numerical device analysis. Finally, we summarize a general rule of material selection for making robust source-drain contact.
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Affiliation(s)
- Zhenxin Yang
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Chunhua Guo
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Lingping Qin
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Jun-Tao Hu
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Pengyan Luan
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Zheng Liang
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Xiaoliang Li
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Huaiyi Ding
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Deng-Ke Wang
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
- National Center for International Research on Photoelectric and Energy Materials, Yunnan University, Kunming650504, China
| | - Tao Zhang
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
| | - Qiang Zhu
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
- National Center for International Research on Photoelectric and Energy Materials, Yunnan University, Kunming650504, China
| | - Zheng-Hong Lu
- Key Laboratory of Yunnan Provincial Higher Education Institution for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming650504, China
- National Center for International Research on Photoelectric and Energy Materials, Yunnan University, Kunming650504, China
- Department of Materials Science and Engineering, University of Toronto, TorontoM5S 3E4, Canada
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