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Huang T, Hou Y, Zheng H, Zhao L, Wang J, Jiang R, Hu S, Chu S, Zhang Y, Jia S, Wang J. Size-Dependent Electrochemical Performance Mediated by Stress-Induced Cracking in Zn2SnO4 Electrodes. ACS Nano 2024. [PMID: 38315444 DOI: 10.1021/acsnano.3c10144] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2024]
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