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Tang L, Jia X, Ma H, Liu S, Chen Y, Tao T, Chen L, Wu J, Li C, Wang X, Weng J. Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry. Sensors (Basel) 2023; 23:7898. [PMID: 37765955 PMCID: PMC10537313 DOI: 10.3390/s23187898] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/20/2023] [Revised: 09/12/2023] [Accepted: 09/13/2023] [Indexed: 09/29/2023]
Abstract
A microwave absolute distance measurement method with ten-micron-level accuracy and meter-level range based on frequency domain interferometry is proposed and experimentally demonstrated for the first time. Theoretical analysis indicates that an interference phenomenon occurs instantaneously in the frequency domain when combining two homologous broad-spectrum microwave beams with different paths, and the absolute value of the distance difference between the two paths is only inversely proportional to the period of frequency domain interference fringes. The proof-of-principle experiments were performed to prove that the proposed method can achieve absolute distance measurement in the X-band with standard deviations of 15 μm, 17 μm, and 26 μm and within ranges of 1.69 m, 2.69 m, and 3.75 m. Additionally, a displacement resolution of 100 microns was realized. The multi-target recognition performance was also verified in principle. Furthermore, at the expense of a slight decrease in ranging accuracy, a fast distance measurement with the single measurement time of 20 μs was achieved by using a digitizer combined with a Fourier transform analyzer. Compared with the current microwave precision ranging technologies, the proposed method not only has the advantages of high precision, large range, and rapid measurement capability, but the required components are also easily obtainable commercial devices. The proposed method also has better complex engineering applicability, because the ten-micron-level ranging accuracy is achievable only by using a simple Fourier transform without any phase estimation algorithm, which greatly reduces the requirement for signal-to-noise ratio.
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Affiliation(s)
- Longhuang Tang
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Xing Jia
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Heli Ma
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Shenggang Liu
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Yongchao Chen
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Tianjiong Tao
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Long Chen
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Jian Wu
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Chengjun Li
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Xiang Wang
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
| | - Jidong Weng
- Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China; (X.J.); (H.M.); (S.L.); (Y.C.); (T.T.); (L.C.); (J.W.); (C.L.); (X.W.)
- National Key Laboratory of Shock Wave and Detonation Physics, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, China
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Feng XW, Feng DZ. A Robust Nonrigid Point Set Registration Method Based on Collaborative Correspondences. Sensors (Basel) 2020; 20:s20113248. [PMID: 32517316 PMCID: PMC7308981 DOI: 10.3390/s20113248] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/22/2020] [Revised: 06/04/2020] [Accepted: 06/05/2020] [Indexed: 11/16/2022]
Abstract
The nonrigid point set registration is one of the bottlenecks and has the wide applications in computer vision, pattern recognition, image fusion, video processing, and so on. In a nonrigid point set registration problem, finding the point-to-point correspondences is challengeable because of the various image degradations. In this paper, a robust method is proposed to accurately determine the correspondences by fusing the two complementary structural features, including the spatial location of a point and the local structure around it. The former is used to define the absolute distance (AD), and the latter is exploited to define the relative distance (RD). The AD-correspondences and the RD-correspondences can be established based on AD and RD, respectively. The neighboring corresponding consistency is employed to assign the confidence for each RD-correspondence. The proposed heuristic method combines the AD-correspondences and the RD-correspondences to determine the corresponding relationship between two point sets, which can significantly improve the corresponding accuracy. Subsequently, the thin plate spline (TPS) is employed as the transformation function. At each step, the closed-form solutions of the affine and nonaffine parts of TPS can be independently and robustly solved. It facilitates to analyze and control the registration process. Experimental results demonstrate that our method can achieve better performance than several existing state-of-the-art methods.
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Braun J, Štroner M, Urban R, Dvoček F. Suppression of Systematic Errors of Electronic Distance Meters for Measurement of Short Distances. Sensors (Basel) 2015; 15:19264-301. [PMID: 26258777 DOI: 10.3390/s150819264] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/20/2015] [Revised: 07/14/2015] [Accepted: 07/30/2015] [Indexed: 11/17/2022]
Abstract
In modern industrial geodesy, high demands are placed on the final accuracy, with expectations currently falling below 1 mm. The measurement methodology and surveying instruments used have to be adjusted to meet these stringent requirements, especially the total stations as the most often used instruments. A standard deviation of the measured distance is the accuracy parameter, commonly between 1 and 2 mm. This parameter is often discussed in conjunction with the determination of the real accuracy of measurements at very short distances (5–50 m) because it is generally known that this accuracy cannot be increased by simply repeating the measurement because a considerable part of the error is systematic. This article describes the detailed testing of electronic distance meters to determine the absolute size of their systematic errors, their stability over time, their repeatability and the real accuracy of their distance measurement. Twenty instruments (total stations) have been tested, and more than 60,000 distances in total were measured to determine the accuracy and precision parameters of the distance meters. Based on the experiments’ results, calibration procedures were designed, including a special correction function for each instrument, whose usage reduces the standard deviation of the measurement of distance by at least 50%.
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