Zou M, Gaowei M, Zhou T, Sumant AV, Jaye C, Fisher DA, Bohon J, Smedley J, Muller EM. An all-diamond X-ray position and flux monitor using nitrogen-incorporated
ultra-nanocrystalline diamond contacts.
J Synchrotron Radiat 2018;
25:1060-1067. [PMID:
29979167 PMCID:
PMC6038597 DOI:
10.1107/s1600577518006318]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/01/2018] [Accepted: 04/24/2018] [Indexed: 05/30/2023]
Abstract
Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. The feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.
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