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Importance of point defect reactions for the atomic-scale roughness of III-V nanowire sidewalls. NANOTECHNOLOGY 2019;30:324002. [PMID: 30995632 DOI: 10.1088/1361-6528/ab1a4e] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
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Shallow Heavily Doped n++ Germanium by Organo-Antimony Monolayer Doping. ACS APPLIED MATERIALS & INTERFACES 2017;9:20179-20187. [PMID: 28534397 DOI: 10.1021/acsami.7b02645] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
3
Estimation of π-π Electronic Couplings from Current Measurements. NANO LETTERS 2017;17:3215-3224. [PMID: 28358215 DOI: 10.1021/acs.nanolett.7b00804] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
4
Nonstoichiometric Low-Temperature Grown GaAs Nanowires. NANO LETTERS 2015;15:6440-6445. [PMID: 26339987 DOI: 10.1021/acs.nanolett.5b01802] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
5
On the mechanical and electronic properties of thiolated gold nanocrystals. NANOSCALE 2015;7:1809-1819. [PMID: 25518743 DOI: 10.1039/c4nr06180b] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
6
Persistent enhancement of the carrier density in electron irradiated InAs nanowires. NANOTECHNOLOGY 2013;24:275706. [PMID: 23764855 DOI: 10.1088/0957-4484/24/27/275706] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
7
Faceting, composition and crystal phase evolution in III-V antimonide nanowire heterostructures revealed by combining microscopy techniques. NANOTECHNOLOGY 2012;23:095702. [PMID: 22322440 DOI: 10.1088/0957-4484/23/9/095702] [Citation(s) in RCA: 61] [Impact Index Per Article: 5.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
8
Efficient photogeneration of charge carriers in silicon nanowires with a radial doping gradient. NANOTECHNOLOGY 2011;22:315710. [PMID: 21737870 DOI: 10.1088/0957-4484/22/31/315710] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
9
Direct evidence for shallow acceptor states with nonspherical symmetry in GaAs. PHYSICAL REVIEW LETTERS 2005;94:026407. [PMID: 15698206 DOI: 10.1103/physrevlett.94.026407] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/22/2004] [Indexed: 05/24/2023]
10
Imaging the wave-function amplitudes in cleaved semiconductor quantum boxes. PHYSICAL REVIEW LETTERS 2000;85:1068-1071. [PMID: 10991476 DOI: 10.1103/physrevlett.85.1068] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/30/1999] [Indexed: 05/23/2023]
11
Growth of ultrathin iron silicide films: Observation of the gamma -FeSi2 phase by electron spectroscopies. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:5714-5717. [PMID: 10011535 DOI: 10.1103/physrevb.49.5714] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
12
Probing the local atomic environment at the interfaces in the Fe-Si system by the surface-extended energy-loss fine-structure technique. PHYSICAL REVIEW. B, CONDENSED MATTER 1991;44:13811-13814. [PMID: 9999597 DOI: 10.1103/physrevb.44.13811] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
13
Auger and electron-energy-loss spectroscopy study of interface formation in the Ti-Si system. PHYSICAL REVIEW. B, CONDENSED MATTER 1990;41:3087-3096. [PMID: 9994082 DOI: 10.1103/physrevb.41.3087] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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