Distributed focusing reduces mirror error sensitivity on x-ray beamlines

The appearance of very low emittance, high-power synchrotron sources has resulted in ever longer beamlines, often requiring a very weak curvature on the mirrors that transport the beam to the experiment, where the radius of curvature is on the order of kilometers. Manufacturing weakly curved, low figure error grazing incidence mirrors is difficult as the mirrors must be manufactured to an accuracy comparable to the wavelength of the transmitted light. Often the delivered mirrors have figure errors at various length scales (general shape, slope errors, roughness), which compromise image quality. An error in general shape, like the radii of a toroidal mirror, results in long-sighted or short-sighted imaging that is not so simply corrected by changing the distances and incidence angles as the mirror controls the beam focus in both vertical and horizontal directions; for a toroidal mirror, the tangential and sagittal radii need to match correctly for the desired focusing effect. Adaptive downstream optics can compensate for this. In this paper, an alternative method to reduce the sensitivity to a large radius error outside the specified tolerance range in the first mirror of a plane grating monochromator beamline at MAX IV is presented. It is found that distributed focusing by two passive, fixed radius mirrors reduces greatly the sensitivity to the radius errors in both mirrors. The radius tolerance of a mirror initially found to be unacceptable for single stage focusing is easily accommodated on both mirrors in distributed focusing, without compromising the imaging capability.

Performance and characterization of the FinEstBeAMS beamline at the MAX IV Laboratory

FinEstBeAMS (Finnish-Estonian Beamline for Atmospheric and Materials Sciences) is a multidisciplinary beamline constructed at the 1.5 GeV storage ring of the MAX IV synchrotron facility in Lund, Sweden. The beamline covers an extremely wide photon energy range, 4.5-1300 eV, by utilizing a single elliptically polarizing undulator as a radiation source and a single grazing-incidence plane grating monochromator to disperse the radiation. At photon energies below 70 eV the beamline operation relies on the use of optical and thin-film filters to remove higher-order components from the monochromated radiation. This paper discusses the performance of the beamline, examining such characteristics as the quality of the gratings, photon energy calibration, photon energy resolution, available photon flux, polarization quality and focal spot size.

HIPPIE: a new platform for ambient-pressure X-ray photoelectron spectroscopy at the MAX IV Laboratory

HIPPIE is a soft X-ray beamline on the 3 GeV electron storage ring of the MAX IV Laboratory, equipped with a novel ambient-pressure X-ray photoelectron spectroscopy (APXPS) instrument. The endstation is dedicated to performing in situ and operando X-ray photoelectron spectroscopy experiments in the presence of a controlled gaseous atmosphere at pressures up to 30 mbar [1 mbar = 100 Pa] as well as under ultra-high-vacuum conditions. The photon energy range is 250 to 2200 eV in planar polarization and with photon fluxes >10¹² photons s^-1 (500 mA ring current) at a resolving power of greater than 10000 and up to a maximum of 32000. The endstation currently provides two sample environments: a catalysis cell and an electrochemical/liquid cell. The former allows APXPS measurements of solid samples in the presence of a gaseous atmosphere (with a mixture of up to eight gases and a vapour of a liquid) and simultaneous analysis of the inlet/outlet gas composition by online mass spectrometry. The latter is a more versatile setup primarily designed for APXPS at the solid-liquid (dip-and-pull setup) or liquid-gas (liquid microjet) interfaces under full electrochemical control, and it can also be used as an open port for ad hoc-designed non-standard APXPS experiments with different sample environments. The catalysis cell can be further equipped with an IR reflection-absorption spectrometer, allowing for simultaneous APXPS and IR spectroscopy of the samples. The endstation is set up to easily accommodate further sample environments.

Upgrade of the SPECIES beamline at the MAX IV Laboratory

The SPECIES beamline has been transferred to the new 1.5 GeV storage ring at the MAX IV Laboratory. Several improvements have been made to the beamline and its endstations during the transfer. Together the Ambient Pressure X-ray Photoelectron Spectroscopy and Resonant Inelastic X-ray Scattering endstations are capable of conducting photoelectron spectroscopy in elevated pressure regimes with enhanced time-resolution and flux and X-ray scattering experiments with improved resolution and flux. Both endstations offer a unique capability for experiments at low photon energies in the vacuum ultraviolet and soft X-ray range. In this paper, the upgrades on the endstations and current performance of the beamline are reported.

Negative-ion/positive-ion coincidence spectroscopy as a tool to identify anionic fragments: The case of core-excited CHF3

We have studied the dissociation of the trifluoromethane molecule, CHF₃ , into negative ionic fragments at the C 1s and F 1s edges. The measurements were performed by detecting coincidences between negative and positive ions. We observed five different negative ions: F^- , H^- , C^- , CF^- , and F₂ ^- . Their production was confirmed by the analysis of triple coincidence events (negative-ion/positive-ion/positive-ion or NIPIPI coincidences) that were recorded with cleaner signals than those of the negative-ion/positive-ion coincidences. The intensities of the most intense NIPIPI coincidence channels were recorded as a function of photon energy across the C 1s and F 1s excitations and ionization thresholds. We also observed dissociation channels involving the formation of one negative ion and three positive ions. Our results demonstrate that negative-ion/positive-ion coincidence spectroscopy is a very sensitive method to observe anions, which at inner-shell edges are up to three orders of magnitude less probable dissociation products than cations.

Fragmentation of Methanol Molecules after Core Excitation and Core Ionization Studied by Negative-Ion/Positive-Ion Coincidence Experiments

We have studied the fragmentation of the methanol molecule after core excitation and core ionization by observing coincidences between negative and positive ions. Five different negative ions (H^-, C^-, CH^-, O^-, and OH^-) were observed at both the C 1s and O 1s edges. As negative ion formation occurs after resonant and normal Auger decay of core-hole states, it is necessarily linked with the release of positively charged fragments. Our data show that such fragmentation can happen in many different ways: We found approximately 30 negative-ion/positive-ion/positive-ion coincidence (NIPIPICO) channels. All involve only singly charged positive ions. Fragmentation channels leading to atomic ions are the most probable, but positive molecular ions are also frequently found in the context of anion formation. Coincidence yields as a function of photon energy were determined for the most intense NIPIPICO channels. Adding together the data measured at different photon energies, we could also verify the occurrence of four-ion coincidences, which involved one negative ion (H^- or O^-) and three positive ions.

The SPECIES beamline at the MAX IV Laboratory: a facility for soft X-ray RIXS and APXPS

SPECIES is an undulator-based soft X-ray beamline that replaced the old I511 beamline at the MAX II storage ring. SPECIES is aimed at high-resolution ambient-pressure X-ray photoelectron spectroscopy (APXPS), near-edge X-ray absorption fine-structure (NEXAFS), X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS) experiments. The beamline has two branches that use a common elliptically polarizing undulator and monochromator. The beam is switched between the two branches by changing the focusing optics after the monochromator. Both branches have separate exit slits, refocusing optics and dedicated permanent endstations. This allows very fast switching between two types of experiments and offers a unique combination of the surface-sensitive XPS and bulk-sensitive RIXS techniques both in UHV and at elevated ambient-pressure conditions on a single beamline. Another unique property of the beamline is that it reaches energies down to approximately 27 eV, which is not obtainable on other current APXPS beamlines. This allows, for instance, valence band studies under ambient-pressure conditions. In this article the main properties and performance of the beamline are presented, together with selected showcase experiments performed on the new setup.

Multilayer based soft-x-ray polarimeter at MAX IV Laboratory

A high precision five rotation-axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers has been designed and manufactured. To cover the extreme ultraviolet regime, Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have also been designed and produced. The polarimeter mechanics is supported on a hexapod to simplify the alignment relative to photon beam. The instrument is designed so that it can be easily transferred between different beamlines.

A tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation

We present a newly constructed spectrometer for negative-ion/positive-ion coincidence spectroscopy of gaseous samples. The instrument consists of two time-of-flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument can measure double and triple coincidences between mass-resolved negative and positive ions with high detection efficiency. First results include identification of several negative-ion/positive-ion coincidence channels following inner-shell photoexcitation of sulfur hexafluoride (SF6).

On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology

To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components for high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. To enable high efficiency in terms of photon flux, such optics will be coated with application-tailored single or multilayer coatings. Advanced thin-film fabrication of today enables the synthesis of layers on the sub-nanometre precision level over a deposition length of up to 1500 mm. Specifically dedicated metrology instrumentation of comparable accuracy has been developed to characterize such optical elements. Second-generation slope-measuring profilers like the nanometre optical component measuring machine (NOM) at the BESSY-II Optics laboratory allow the inspection of up to 1500 mm-long reflective optical components with an accuracy better than 50 nrad r.m.s. Besides measuring the shape on top of the coated mirror, it is of particular interest to characterize the internal material properties of the mirror coating, which is the domain of X-rays. Layer thickness, density and interface roughness of single and multilayer coatings are investigated by means of X-ray reflectometry. In this publication recent achievements in the field of slope measuring metrology are shown and the characterization of different types of mirror coating demonstrated. Furthermore, upcoming challenges to the inspection of ultra-precise optical components designed to be used in future FEL and DLSR beamlines are discussed.

Probing the valence character of O 1s→Rydberg excited O2 by participator Auger decay measurements and partial ion yield spectroscopy following x-ray absorption

The valence character of O 1s-->Rydberg excited O2 is investigated by means of participator Auger decay spectroscopy, performed at selected photon energies across the K-shell resonance region, and by means of partial ion yield x-ray absorption spectroscopy. For several of the excitation energies studied, the authors find substantial sigma*(4Sigmau-, 2Sigmau-) valence character being mixed with nssigma and npsigma (4Sigmau-, 2Sigmau-) Rydberg states. An experimental indication of a coupling between the channels associated with quartet and doublet ion cores is considered and discussed. New spectroscopic constants are derived for the singly ionized X 2Pig state of O2 based on the observation of at least 20 vibrational sublevels.

Doppler-free resonant Raman auger spectroscopy of Ne+ 2s2p(5)3p excited states

Using very high resolution achieved by the Doppler-free resonant Raman Auger technique, we have resolved the lowest terms of the series of inner-valence excitations 2s2p(5)((1,3)P)np 2S, 2P, and 2D in Ne+. The measured Auger anisotropic parameters and branching ratios help to establish the assignments of these levels. The measured lifetime widths are in reasonable agreements with ab initio calculations available in the literature.