Improvement of Detection Limits for Particle Contamination by Confocal Configuration in X-Ray Fluorescence Microscope.
ANAL SCI 2021;
37:1447-1451. [PMID:
34024866 DOI:
10.2116/analsci.21p111]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
Abstract
Micro X-ray fluorescence (XRF) enables the non-destructive analysis of particle contamination. In this study, we compared the detection sensitivities and the LLD (lower limit of detection) values of micro-metallic particle contaminations on the plastic detected by micro-XRF and confocal micro-XRF. First, to verify the effectiveness of the confocal micro-XRF, we compared the intensities of different shaping copper samples (plate, thin film and particle). The results demonstrated that confocal micro-XRF is more effective than micro-XRF for the detection of micro particles. Second, to compare the SN ratios of different X-ray energies, several micro-metallic particles (Si, Fe, and Cu) set on an acrylic plate were measured by micro-XRF and confocal micro-XRF. It was found that the SN ratios of the confocal micro-XRF when measuring the Si, Fe, and Cu particles were improved to be approximately 14.6, 21.9, and 43.5-times those of the micro-XRF, respectively. It was determined that confocal micro-XRF is more effective for micro-metallic particles in the higher energy region.
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