Performance-Enhanced Static Modulated Fourier Transform Spectrometer with a Spectral Reconstruction

A static modulated Fourier transform spectrometer has been noted to be a compact and fast evaluation tool for spectroscopic inspection, and many novel structures have been reported to support its performance. However, it still suffers from poor spectral resolution due to the limited sampling data points, which marks its intrinsic drawback. In this paper, we outline the enhanced performance of a static modulated Fourier transform spectrometer with a spectral reconstruction method that can compensate for the insufficient data points. An enhanced spectrum can be reconstructed by applying a linear regression method to a measured interferogram. We obtain the transfer function of a spectrometer by analyzing what interferogram can be detected with different values of parameters such as focal length of the Fourier lens, mirror displacement, and wavenumber range, instead of direct measurement of the transfer function. Additionally, the optimal experimental conditions for the narrowest spectral width are investigated. Application of the spectral reconstruction method achieves an improved spectral resolution from 74 cm^-1 when spectral reconstruction is not applied to 8.9 cm^-1, and a narrowed spectral width from 414 cm^-1 to 371 cm^-1, which are close to the values of the spectral reference. In conclusion, the spectral reconstruction method in a compact static modulated Fourier transform spectrometer effectively enhances its performance without any additional optic in the structure.

Miniature Fourier Transform Spectrometer Based on Thin-Film Lithium Niobate

A miniature Fourier transform spectrometer is proposed using a thin-film lithium niobate electro-optical modulator instead of the conventional modulator made by titanium diffusion in lithium niobate. The modulator was fabricated by a contact lithography process, and its voltage-length and optical waveguide loss were 2.26 V·cm and 1.01 dB/cm, respectively. Based on the wavelength dispersion of the half-wave voltage of the fabricated modulator, the emission spectrum of the input signal was retrieved by Fourier transform processing of the interferogram, and the analysis of the experimental data of monochromatic light shows that the proposed miniaturized FTS can effectively identify the input signal wavelength.

Intensity Simulation of a Fourier Transform Infrared Spectrometer

This paper introduces an intensity simulation for the Fourier transform infrared spectrometer whose core element is the Michelson interferometer to provide support for the on-orbit monitoring of the instrument and to improve the data processing and application of the Fourier transform spectrometer. The Geostationary Interferometric Infrared Imager (GIIRS) aboard on Fengyun-4B (FY-4B) satellite, which will be launched in 2020, aims to provide hyperspectral infrared observations. An intensity simulation of the Michelson interferometer based on the GIIRS’s instrument parameters is systematically analyzed in this paper. Off-axis effects and non-linearity response are two important factors to be considered in this simulation. Off-axis effects mainly cause the wavenumber shift to induce a large brightness temperature error compared with the input spectrum, and the non-linearity response reduces the energy received by the detector. Then, off-axis effects and a non-linearity response are added to the input spectrum successively to obtain the final spectrum. Off-axis correction and non-linearity correction are also developed to give a full simulation process. Comparing the corrected spectrum with the input spectrum, we can see that the brightness temperature errors have a magnitude of 10⁻³ K, and this fully proves the reliability and rationality of the whole simulation process.

H∞ Robust Control of a Large-Piston MEMS Micromirror for Compact Fourier Transform Spectrometer Systems

Incorporating linear-scanning micro-electro-mechanical systems (MEMS) micromirrors into Fourier transform spectral acquisition systems can greatly reduce the size of the spectrometer equipment, making portable Fourier transform spectrometers (FTS) possible. How to minimize the tilting of the MEMS mirror plate during its large linear scan is a major problem in this application. In this work, an FTS system has been constructed based on a biaxial MEMS micromirror with a large-piston displacement of 180 μm, and a biaxial H∞ robust controller is designed. Compared with open-loop control and proportional-integral-derivative (PID) closed-loop control, H∞ robust control has good stability and robustness. The experimental results show that the stable scanning displacement reaches 110.9 μm under the H∞ robust control, and the tilting angle of the MEMS mirror plate in that full scanning range falls within ±0.0014°. Without control, the FTS system cannot generate meaningful spectra. In contrast, the FTS yields a clean spectrum with a full width at half maximum (FWHM) spectral linewidth of 96 cm^-1 under the H∞ robust control. Moreover, the FTS system can maintain good stability and robustness under various driving conditions.

A Fourier Transform Spectrometer Based on an Electrothermal MEMS Mirror with Improved Linear Scan Range

A Fourier transform spectrometer (FTS) that incorporates a closed-loop controlled, electrothermally actuated microelectromechanical systems (MEMS) micromirror is proposed and experimentally verified. The scan range and the tilting angle of the mirror plate are the two critical parameters for MEMS-based FTS. In this work, the MEMS mirror with a footprint of 4.3 mm × 3.1 mm is based on a modified lateral-shift-free (LSF) bimorph actuator design with large piston and reduced tilting. Combined with a position-sensitive device (PSD) for tilt angle sensing, the feedback controlled MEMS mirror generates a 430 µm stable linear piston scan with the mirror plate tilting angle less than ±0.002°. The usable piston scan range is increased to 78% of the MEMS mirror’s full scan capability, and a spectral resolution of 0.55 nm at 531.9 nm wavelength, has been achieved. It is a significant improvement compared to the prior work.

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

We have constructed a new facility at the National Institute of Standards and Technology (NIST) to measure the index of refraction of transmissive materials in the wavelength range from the visible to the vacuum ultraviolet. An etalon of the material is illuminated with synchrotron radiation, and the interference fringes in the transmittance spectrum are measured using a Fourier transform spectrometer. The refractive index of calcium fluoride, CaF2, has been measured from 600 nm to 175 nm and the resulting values agree with a traditional goniometric measurement to within 1 × 10(-5). The uncertainty in the index values is currently limited by the uncertainty in the thickness measurement of the etalon.