High-Sensitivity Microthermometry Method Based on Vacuum-Deposited Thin Films Exhibiting Gradual Spin Crossover above Room Temperature

We report on the fabrication, characterization, and microthermometry application of high-quality, nanometric thin films, with thicknesses in the range 20-200 nm, of the molecular spin-crossover complex [Fe(HB(1,2,3-triazol-1-yl)₃)₂]. The films were obtained by vacuum thermal evaporation and characterized by X-ray diffraction, UV spectrophotometry, and atomic force microscopy. The as-deposited films are dense and crystalline with a preferred [011] orientation of the monoclinic crystal lattice normal to the substrate surface. The films exhibit a gradual spin conversion centered at ca. 374 K spanning the 273-473 K temperature range, irrespective of their thickness. When deposited on a microelectronic device, these films can be used to enhance the UV-light thermoreflectance coefficient of reflective surfaces by more than an order of magnitude, allowing for high-sensitivity thermoreflectance thermal imaging.

Transient 2D Junction Temperature Distribution Measurement by Short Pulse Driving and Gated Integration with Ordinary CCD Camera

The time resolution of the transient process is usually limited by the minimum exposure time of the high-speed camera. In this work, we proposed a method that can achieve nanosecond temporal resolution with an ordinary CCD camera by driving the LED under test with a periodic short-pulse signal and multiple-cycle superposition to obtain two-dimensional transient junction temperature distribution of the heating process. The temporal resolution is determined by the pulse width of the drive source. In the cooling process, the Boxcar gated integration principle is adopted to complete the two-dimensional transient junction temperature distribution with temporal resolution subject to the minimum exposure time of the CCD camera, i.e., 1 μs in this case. To demonstrate the validity of this method, we measured the two-dimensional transient junction temperature distribution of the blue LEDs according to the principle of thermoreflectance and compared it with the thermal imaging method.

Evidence of Universal Temperature Scaling in Self-Heated Percolating Networks

During routine operation, electrically percolating nanocomposites are subjected to high voltages, leading to spatially heterogeneous current distribution. The heterogeneity implies localized self-heating that may (self-consistently) reroute the percolation pathways and even irreversibly damage the material. In the absence of experiments that can spatially resolve the current distribution and a nonlinear percolation model suitable to interpret them, one relies on empirical rules and safety factors to engineer these materials. In this paper, we use ultrahigh resolution thermo-reflectance imaging, coupled with a new imaging processing technique, to map the spatial distribution ΔT(x, y; I) and histogram f(ΔT) of temperature rise due to self-heating in two types of 2D networks (percolating and copercolating). Remarkably, we find that the self-heating can be described by a simple two-parameter Weibull distribution, even under voltages high enough to reconfigure the percolation pathways. Given the generality of the phenomenological argument supporting the distribution, other percolating networks are likely to show similar stress distribution in response to sufficiently large stimuli. Furthermore, the spatial evolution of the self-heating of network was investigated by analyzing the spatial distribution and spatial correlation, respectively. An estimation of degree of hotspot clustering reveals a mechanism analogous to crystallization physics. The results should encourage nonlinear generalization of percolation models necessary for predictive engineering of nanocomposite materials.