Rasmussen A, Deckert V. New dimension in nano-imaging: breaking through the diffraction limit with scanning near-field optical microscopy.
Anal Bioanal Chem 2004;
381:165-72. [PMID:
15551072 DOI:
10.1007/s00216-004-2896-3]
[Citation(s) in RCA: 57] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/30/2004] [Revised: 10/08/2004] [Accepted: 10/12/2004] [Indexed: 11/29/2022]
Abstract
In recent years scanning near-field optical microscopy (SNOM) has developed into a powerful surface analytical technique for observing specimens with lateral resolution equal to or even better than 100 nm. A large number of applications, from material science to biology, have been reported. In this paper, two different kinds of near-field optical microscopy, aperture and scattering-type SNOM, are reviewed together with recent studies in surface analysis and biology. Here, near-field optical techniques are discussed in comparison with related methods, such as scanning probe and standard optical microscopy, with respect to their specific advantages and fields of application.
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