Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy

Quantitative Elasticity Mapping of Submicron Silica Hollow Particles by PeakForce QNM AFM Mode

Silica hollow spheres with a diameter of 100-300 nm and a shell thickness of 8±2 nm were synthesized using a self-templating amphiphilic polymeric precursor, i.e., poly(ethylene glycol)-substituted hyperbranched polyethoxysiloxane. Their elastic properties were addressed with a high-frequency AFM indentation method based on the PeakForce QNM (quantitative nanomechanical mapping) mode enabling simultaneous visualization of the surface morphology and high-resolution mapping of the mechanical properties. The factors affecting the accuracy of the mechanical measurements such as a local slope of the particle surface, deformation of the silica hollow particles by a solid substrate, shell thickness variation, and applied force range were analysed. The Young's modulus of the shell material was evaluated as E=26±7 GPa independent of the applied force in the elastic regime of deformations. Beyond the elastic regime, the buckling instability was observed revealing a non-linear force-deformation response with a hysteresis between the loading and unloading force-distance curves and irreversible deformation of the shell at high applied forces. Thus, it was demonstrated that PeakForce QNM mode can be used for quantitative measurements of the elastic properties of submicon-sized silica hollow particles with nano-size shell thickness, as well as for estimation of the buckling behaviour beyond the elastic regime of shell deformations.

Evaluation of Mechanical Properties of Porous OSG Films by PFQNM AFM and Benchmarking with Traditional Instrumentation

Characterization of mechanical properties of thin porous films with nanoscale resolution remains a challenge for instrumentation science. In this work, atomic force microscopy (AFM) in the PeakForce quantitative nanomechanical mapping (PFQNM) mode is used for Young's modulus measurements of porous organosilicate glass films. The test samples were prepared by sol-gel techniques using silicon alkoxide and methyl-modified silicon alkoxide to prepare films with different CH₃/Si ratios. The film porosity was engineered by using a Brij 30 template and the evaporation-induced self-assembly technique. The chemical composition, pore structure, and modification during air storage and thermal annealing were studied using FTIR spectroscopy and ellipsometric porosimetry (EP). Since PFQNM AFM was first used for evaluation of Young's modulus of thin porous films, the obtained results are benchmarked using nanoindentation (NI), surface acoustic wave (SAW) spectroscopy, and EP. The results have good agreement with each other, but PFQNM and NI give slightly larger values than SAW and EP. The difference is in agreement with previously reported data and reflects the different physical meaning of the obtained values. It is shown that the presence of physically adsorbed water strongly influences the results generated by PFQNM AFM, and therefore, reliable water removal from the studied materials is necessary.

The Middle Lamella of Plant Fibers Used as Composite Reinforcement: Investigation by Atomic Force Microscopy

Today, plant fibers are considered as an important new renewable resource that can compete with some synthetic fibers, such as glass, in fiber-reinforced composites. In previous works, it was noted that the pectin-enriched middle lamella (ML) is a weak point in the fiber bundles for plant fiber-reinforced composites. ML is strongly bonded to the primary walls of the cells to form a complex layer called the compound middle lamella (CML). In a composite, cracks preferentially propagate along and through this layer when a mechanical loading is applied. In this work, middle lamellae of several plant fibers of different origin (flax, hemp, jute, kenaf, nettle, and date palm leaf sheath), among the most used for composite reinforcement, are investigated by atomic force microscopy (AFM). The peak-force quantitative nanomechanical property mapping (PF-QNM) mode is used in order to estimate the indentation modulus of this layer. AFM PF-QNM confirmed its potential and suitability to mechanically characterize and compare the stiffness of small areas at the micro and nanoscale level, such as plant cell walls and middle lamellae. Our results suggest that the mean indentation modulus of ML is in the range from 6 GPa (date palm leaf sheath) to 16 GPa (hemp), depending on the plant considered. Moreover, local cell-wall layer architectures were finely evidenced and described.

Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing

Several subsurface imaging methods based on atomic force microscopy (AFM) linear nanomechanical mapping, namely contact resonance (CR), bimodal and harmonic AFMs, are investigated and compared. Their respective subsurface detection capability is estimated and evaluated on a model specimen, which is prepared by embedding SiO₂ microparticles in a PDMS elastomer. The measured CR frequency, bimodal and harmonic amplitudes are related to local mechanical properties by analyzing cantilever dynamics and further linked to subsurface depths of the particles by finite element analysis. The maximum detectable depths are obtained from the apparent particle diameters in subsurface image channels via employing a simple geometrical model. Under common experimental settings, results demonstrate that the depth limits reach up to about 812 nm, 212 nm and 127 nm for CR, bimodal and harmonic AFM modes, respectively. The depth sensitivity can be tuned and optimized by using either different cantilever eigenmodes in CR-AFM or spectroscopy analysis in bimodal and harmonic AFMs. The three imaging methods have their own suitable application situations. The comparisons can advance a further step into understanding the subsurface image contrast via AFM mechanical sensing.

Charge-Induced Disorder Controls the Thermal Conductivity of Entropy-Stabilized Oxides

Manipulating a crystalline material's configurational entropy through the introduction of unique atomic species can produce novel materials with desirable mechanical and electrical properties. From a thermal transport perspective, large differences between elemental properties such as mass and interatomic force can reduce the rate at which phonons carry heat and thus reduce the thermal conductivity. Recent advances in materials synthesis are enabling the fabrication of entropy-stabilized ceramics, opening the door for understanding the implications of extreme disorder on thermal transport. Measuring the structural, mechanical, and thermal properties of single-crystal entropy-stabilized oxides, it is shown that local ionic charge disorder can effectively reduce thermal conductivity without compromising mechanical stiffness. These materials demonstrate similar thermal conductivities to their amorphous counterparts, in agreement with the theoretical minimum limit, resulting in this class of material possessing the highest ratio of elastic modulus to thermal conductivity of any isotropic crystal.

On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy

Contact-resonance atomic force microscopy (CR-AFM) is of great interest and very valuable for a deeper understanding of the mechanics of biological materials with moduli of at least a few GPa. However, sample surfaces can present a high topography range with significant slopes, where the local angle can be as large as  ± 50°. The non-trivial correlation between surface slope and CR-frequency hinders a straight-forward interpretation of CR-AFM indentation modulus measurements on such samples. We aim to demonstrate the significant influence of the surface slope on the CR-frequency that is caused by the local angle between sample surface and the AFM cantilever and present a practical method to correct the measurements. Based on existing analytical models of the effect of the AFM set-up's intrinsic cantilever tilt on CR-frequencies, we compute the non-linear variation of the first two (eigen)modes CR-frequency for a large range of surface angles. The computations are confirmed by CR-AFM experiments performed on a curved surface. Finally, the model is applied to directly correct contact modulus measurements on a durum wheat starch granule as an exemplary sample.

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and to estimate the mixture ratio of the constituent components in nanocomposites. The major influencing factors, namely amplitude feedback set-point, drive frequency and laser spot position along the cantilever beam, were systematically investigated. Employing different set-points induces alternation of tip-sample interaction forces and thus different harmonic responses. The numerical simulations of the cantilever dynamics were well-correlated with the experimental observations. Owing to the deviation of the drive frequency from the fundamental resonance, harmonic amplitude contrast reversal may occur. It was also found that the laser spot position affects the harmonic signal strengths as expected. Based on these investigations, harmonic AFM was employed to identify material components and estimate the mixture ratio in multicomponent materials. The composite samples are composed of different kinds of nanoparticles with almost the same shape and size. Higher harmonic imaging offers better information on the distribution and mixture of different nanoparticles as compared to other techniques, including topography and conventional tapping phase. Therefore, harmonic AFM has potential applications in various fields of nanoscience and nanotechnology.

Multi-characterization of LiCoO2 cathode films using advanced AFM-based techniques with high resolution

ABSTARCT

The thin film Li-ion batteries have been extensively used in micro-electronic devices due to their miniaturization, high capacity density and environmental friendliness, etc. In order to further prolong the lifetime of the film batteries, one of important tasks is to explore the aging mechanisms of the cathode films. In this paper, we especially focused on the multi-characterization of the LiCoO₂ film in nanoscale, which is carried out by combining advanced AFM-based techniques with capacity measurement. The surface morphology, contact stiffness as well as surface potential were measured by amplitude modulation-frequency modulation (AM-FM) and kelvin probe force microscope (KPFM), respectively. Remarkable changes after different numbers of charge/discharge cycling were observed and the intrinsic reasons of them were discussed in detail. To acknowledge the relationship with these microscopic changes, the macro-capacity of the thin films was also measured by the galvanostatic charge/discharge method. These comprehensive results would provide a deep insight into the fading mechanism of the cathode film, being helpful for the design and selection of the cathode film materials for high performance batteries.

Study of mechanical behavior of AFM silicon tips under mechanical load

In this paper we address critical issues concerning calibration of AFM based methods used for nanoscale mechanical characterization of materials. It has been shown that calibration approaches based on macroscopic models for contact mechanics may yield excellent results in terms of the indentation modulus of the sample, but fail to provide a comprehensive and actual information concerning the tip-sample contact radius or the mechanical properties of the tip. Explanations for the severely reduced indentation modulus of the tip included the inadequacies of the models used for calculations of the tip-sample contact stiffness, discrepancies in the actual and ideal shape of the tip, presence of the amorphous silicon phase within the silicon tip, as well as negligence of the actual size of the stress field created in the tip during elastic interactions. To clarify these issues, we investigated the influence of the mechanical load applied to four AFM silicon tips on their crystalline state by exposing them to systematically increasing loads, evaluating the character of the tip-sample interactions via the load-unload stiffness curves, and assessing the state of the tips from HR-TEM images. The results presented in this paper were obtained in a series of relatively simple and basic atomic force acoustic microscopy (AFAM) experiments. The novel combination of TEM imaging of the AFM tips with the analysis of the load-unload stiffness curves gave us a detailed insight into their mechanical behavior under load conditions. We were able to identify the limits for the elastic interactions, as well as the hallmarks for phase transformation and dislocation formation and movement. The comparison of the physical dimensions of the AFM tips, geometry parameters determined from the values of the contact stiffness, and the information on the crystalline state of the tips allowed us a better understanding of the nanoscale contact.

Atomic force acoustic microscopy: Influence of the lateral contact stiffness on the elastic measurements

Atomic force acoustic microscopy is a dynamic technique where the resonances of a cantilever, that has its tip in contact with the sample, are used to quantify local elastic properties of surfaces. Since the contact resonance frequencies (CRFs) monotonically increase with the tip-sample contact stiffness, they are used to evaluate the local elastic properties of the surfaces through a suitable contact mechanical model. The CRFs depends on both, normal and lateral contact stiffness, kN and kS respectively, where the last one is taken either as constant (kS<1), or as zero, leading to uncertainty in the estimation of the elastic properties of composite materials. In this work, resonance spectra for free and contact vibration were used in a finite element analysis of cantilevers to show the influence of kS in the resonance curves due to changes in the kS/kN ratio. These curves have regions for the different vibrational modes that are both, strongly and weakly dependent on kS, and they can be used in a selective manner to obtain a precise mapping of elastic properties.

Nanomechanical Mapping of a Deformed Elastomer: Visualizing a Self-Reinforcement Mechanism

Mapping the structure evolution and mechanical properties of elastic polymers or biomaterials during bulk deformation has been difficult, yet this information has long been thought to be key for understanding the structure-mechanical property relationship necessary to guide the design of new materials. Here we use a nanomechanical mapping to assess the structural evolution and mechanical properties of a deformed isoprene rubber (IR) to elucidate a self-reinforcement mechanism in this material. A hierarchical nanofibrillar structure, ranging from several to a hundred nanometers in size, comprised of fibers oriented parallel to the stretching direction was found. The nanofibers, connected by oriented amorphous tie chains, form a network structure that is responsible for significantly enhanced stress, a key factor giving rise to the self-reinforcement of IR and, more than likely, most elastomers that undergo strained-induced crystallization.

Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy

Nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. With many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.

Nanometer-resolved mechanical properties around GaN crystal surface steps

The mechanical properties of surfaces and nanostructures deviate from their bulk counterparts due to surface stress and reduced dimensionality. Experimental indentation-based techniques present the challenge of measuring these effects, while avoiding artifacts caused by the measurement technique itself. We performed a molecular dynamics study to investigate the mechanical properties of a GaN step of only a few lattice constants step height and scrutinized its applicability to indentation experiments using a finite element approach (FEM). We show that the breakdown of half-space symmetry leads to an "artificial" reduction of the elastic properties of comparable lateral dimensions which overlays the effect of surface stress. Contact resonance atomic force microscopy (CR-AFM) was used to compare the simulation results with experiments.

Nanoscale-resolved elasticity: contact mechanics for quantitative contact resonance atomic force microscopy

Contact resonance atomic force microscopy (CR-AFM) constitutes a powerful approach for nanometer-resolved mechanical characterization of surfaces. Yet, absolute accuracy is frequently impaired by ad hoc assumptions on the dynamic AFM cantilever characteristics as well as contact model. Within the present study, we clarify the detailed interplay of stress fields and geometries for full quantitative understanding, employing combined experimental numerical studies for real AFM probes. Concerning contact description, a two-parameter ansatz is utilized that takes tip geometries and their corresponding indentation moduli into account. Parameter sets obtained upon experimental data fitting for different tip blunting states, are discussed in terms of model-specific artificiality versus real contact physics at the nanoscale. Unveiling the underlying physics in detail, these findings pave the way for accurate characterization of nanomechanical properties with highest resolution.

Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differences in the observables of the cantilever dynamics, as well as the different effect of the tip-sample contact properties on those observables in each configuration are discussed. Finally, the expected accuracy of CR-AFM using phase-locked loop detection is investigated and quantification of the typical errors incurred during measurements is provided.

Atomic Force Microscopy Nanomechanics Visualizes Molecular Diffusion and Microstructure at an Interface

Here we demonstrate a simple, yet powerful method, atomic force microscopy (AFM) nanomechanical mapping, to directly visualize the interdiffusion and microstructure at the interface between two polymers. Nanomechanical measurements on the interface between poly(vinyl chloride) (PVC) and poly(caprolactone) (PCL) allow quantification of diffusion kinetics, observation of microstructure, and evaluation of mechanical properties of the interdiffusion regions. These results suggest that nanomechanical mapping of interdiffusion enables the quantification of diffusion with high resolution over large distances without the need of labeling and the assessment of mechanical property changes resulting from the interdiffusion.

Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy

In this work, a new procedure is demonstrated to retrieve the conservative and dissipative contributions to contact resonance atomic force microscopy (CR-AFM) measurements from the contact resonance frequency and resonance amplitude. By simultaneously tracking the CR-AFM frequency and amplitude during contact AFM scanning, the contact stiffness and damping were mapped with nanoscale resolution on copper (Cu) interconnects and low-k dielectric materials. A detailed surface mechanical characterization of the two materials and their interfaces was performed in terms of elastic moduli and contact damping coefficients by considering the system dynamics and included contact mechanics. Using Cu as a reference material, the CR-AFM measurements on the patterned structures showed a significant increase in the elastic modulus of the low-k dielectric material compared with that of a blanket pristine film. Such an increase in the elastic modulus suggests an enhancement in the densification of low-k dielectric films during patterning. In addition, the subsurface response of the materials was investigated in load-dependent CR-AFM point measurements and in this way a depth dimension was added to the common CR-AFM surface characterization. With the new proposed measurement procedure and analysis, the present investigation provides new insights into characterization of surface and subsurface mechanical responses of nanoscale structures and the integrity of their interfaces.

Dual resonance excitation system for the contact mode of atomic force microscopy

We propose an improved system that enables simultaneous excitation and measurements of at least two resonance frequency spectra of a vibrating atomic force microscopy (AFM) cantilever. With the dual resonance excitation system it is not only possible to excite the cantilever vibrations in different frequency ranges but also to control the excitation amplitude for the individual modes. This system can be used to excite the resonance frequencies of a cantilever that is either free of the tip-sample interactions or engaged in contact with the sample surface. The atomic force acoustic microscopy and principally similar methods utilize resonance frequencies of the AFM cantilever vibrating while in contact with the sample surface to determine its local elastic modulus. As such calculation demands values of at least two resonance frequencies, two or three subsequent measurements of the contact resonance spectra are necessary. Our approach shortens the measurement time by a factor of two and limits the influence of the AFM tip wear on the values of the tip-sample contact stiffness. In addition, it allows for in situ observation of processes transpiring within the AFM tip or the sample during non-elastic interaction, such as tip fracture.

Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy

Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the range from hundreds of nanonewtons to a few micronewtons. Such large forces can cause sample damage and preclude direct measurement of ultrathin films or nanofeatures. Here, we present a contact resonance spectroscopy AFM technique that utilizes a cantilever's higher flexural eigenmodes to enable modulus measurements with contact forces as low as 10 nN, even on stiff materials. Analysis with a simple analytical beam model of spectra for a compliant cantilever's fourth and fifth flexural eigenmodes in contact yielded good agreement with bulk measurements of modulus on glass samples in the 50-75 GPa range. In contrast, corresponding analysis of the conventionally used first and second eigenmode spectra gave poor agreement under the experimental conditions. We used finite element analysis to understand the dynamic contact response of a cantilever with a physically realistic geometry. Compared to lower eigenmodes, the results from higher modes are less affected by model parameters such as lateral stiffness that are either unknown or not considered in the analytical model. Overall, the technique enables local mechanical characterization of materials previously inaccessible to AFM-based nanomechanics methods.

Compressive stress effect on the radial elastic modulus of oxidized Si nanowires

Detailed understanding and optimal control of the properties of Si nanowires are essential steps in developing Si nanoscale circuitry. In this work, we have investigated mechanical properties of as-grown and oxidized Si nanowires as a function of their diameter. From contact-resonance atomic force microscopy measurements, the effect of the compressive stress at the Si-SiO(2) interface was revealed in the diameter dependence of the elastic modulus of Si nanowires oxidized at 900 and 1000 degrees C. A modified core-shell model that includes the interface stress developed during oxidation captures the diameter dependence observed in the measured elastic moduli of these oxidized Si nanowires. The values of strain and stress as well as the width of the stressed transition region at the Si-SiO(2) interface agree with those reported in simulations and experiments.

Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopy

Novel phenomena accompanying atomic-scale friction are studied on NaCl(001) by the combination of quasistatic lateral force measurements with dynamic measurements of contact resonance frequencies. For loads up to a few nN the flexural resonance is tracked by a phase-locked-loop by the use of small oscillation amplitude (50 pm). The contact resonance varies during the stick stages, which demonstrates that the dynamic measurement provides additional information about small changes of the stressed contact. Improved sensitivity is also observed across atomic-scale defects which are clearly observed in the contact frequency channel. The low lateral contact stiffness inferred from the observed torsional resonance agrees well with that deduced from the quasistatic measurements and strongly suggests that the contact is atomic-sized.

High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy

High spatial resolution imaging of material properties is an important task for the continued development of nanomaterials and studies of biological systems. Time-varying interaction forces between the vibrating tip and the sample in a tapping-mode atomic force microscope contain detailed information about the elastic, adhesive, and dissipative response of the sample. We report real-time measurement and analysis of the time-varying tip-sample interaction forces with recently introduced torsional harmonic cantilevers. With these measurements, high-resolution maps of elastic modulus, adhesion force, energy dissipation, and topography are generated simultaneously in a single scan. With peak tapping forces as low as 0.6 nN, we demonstrate measurements on blended polymers and self-assembled molecular architectures with feature sizes at 1, 10, and 500 nm. We also observed an elastic modulus measurement range of four orders of magnitude (1 MPa to 10 GPa) for a single cantilever under identical feedback conditions, which can be particularly useful for analyzing heterogeneous samples with largely different material components.