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Bugnet M, Löffler S, Ederer M, Kepaptsoglou DM, Ramasse QM. Current opinion on the prospect of mapping electronic orbitals in the transmission electron microscope: State of the art, challenges and perspectives. J Microsc 2024. [PMID: 38818951 DOI: 10.1111/jmi.13321] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/05/2024] [Revised: 05/03/2024] [Accepted: 05/08/2024] [Indexed: 06/01/2024]
Abstract
The concept of electronic orbitals has enabled the understanding of a wide range of physical and chemical properties of solids through the definition of, for example, chemical bonding between atoms. In the transmission electron microscope, which is one of the most used and powerful analytical tools for high-spatial-resolution analysis of solids, the accessible quantity is the local distribution of electronic states. However, the interpretation of electronic state maps at atomic resolution in terms of electronic orbitals is far from obvious, not always possible, and often remains a major hurdle preventing a better understanding of the properties of the system of interest. In this review, the current state of the art of the experimental aspects for electronic state mapping and its interpretation as electronic orbitals is presented, considering approaches that rely on elastic and inelastic scattering, in real and reciprocal spaces. This work goes beyond resolving spectral variations between adjacent atomic columns, as it aims at providing deeper information about, for example, the spatial or momentum distributions of the states involved. The advantages and disadvantages of existing experimental approaches are discussed, while the challenges to overcome and future perspectives are explored in an effort to establish the current state of knowledge in this field. The aims of this review are also to foster the interest of the scientific community and to trigger a global effort to further enhance the current analytical capabilities of transmission electron microscopy for chemical bonding and electronic structure analysis.
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Affiliation(s)
- M Bugnet
- CNRS, INSA Lyon, Université Claude Bernard Lyon 1, MATEIS, UMR 5510, Villeurbanne, France
- SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, UK
- School of Chemical and Process Engineering, University of Leeds, Leeds, UK
| | - S Löffler
- University Service Centre for Transmission Electron Microscopy, TU Wien, Wien, Austria
| | - M Ederer
- University Service Centre for Transmission Electron Microscopy, TU Wien, Wien, Austria
| | - D M Kepaptsoglou
- SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, UK
- School of Physics, Engineering and Technology, University of York, York, UK
| | - Q M Ramasse
- SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, UK
- School of Chemical and Process Engineering, University of Leeds, Leeds, UK
- School of Physics and Astronomy, University of Leeds, Leeds, UK
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2
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Pofelski A, Jia H, Deng S, Yu H, Park TJ, Manna S, Chan MKY, Sankaranarayanan SKRS, Ramanathan S, Zhu Y. Subnanometer Scale Mapping of Hydrogen Doping in Vanadium Dioxide. NANO LETTERS 2024; 24:1974-1980. [PMID: 38316025 DOI: 10.1021/acs.nanolett.3c04411] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2024]
Abstract
Hydrogen donor doping of correlated electron systems such as vanadium dioxide (VO2) profoundly modifies the ground state properties. The electrical behavior of HxVO2 is strongly dependent on the hydrogen concentration; hence, atomic scale control of the doping process is necessary. It is however a nontrivial problem to quantitatively probe the hydrogen distribution in a solid matrix. As hydrogen transfers its sole electron to the material, the ionization mechanism is suppressed. In this study, a methodology mapping the doping distribution at subnanometer length scale is demonstrated across a HxVO2 thin film focusing on the oxygen-hydrogen bonds using electron energy loss spectroscopy (EELS) coupled with first-principles EELS calculations. The hydrogen distribution was revealed to be nonuniform along the growth direction and between different VO2 grains, calling for intricate hydrogenation mechanisms. Our study points to a powerful approach to quantitatively map dopant distribution in quantum materials relevant to energy and information sciences.
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Affiliation(s)
- Alexandre Pofelski
- Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, United States
| | - Haili Jia
- Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States
| | - Sunbin Deng
- School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, United States
| | - Haoming Yu
- School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, United States
| | - Tae Joon Park
- School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, United States
| | - Sukriti Manna
- Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States
- Department of Mechanical and Industrial Engineering, University of Illinois, Chicago, Illinois 60607, United States
| | - Maria K Y Chan
- Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States
| | - Subramanian K R S Sankaranarayanan
- Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States
- Department of Mechanical and Industrial Engineering, University of Illinois, Chicago, Illinois 60607, United States
| | - Shriram Ramanathan
- School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, United States
- Department of Electrical and Computer Engineering, Rutgers, The State University of New Jersey, Piscataway, New Jersey 08901, United States
| | - Yimei Zhu
- Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, United States
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3
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Dyck O, Almutlaq J, Lingerfelt D, Swett JL, Oxley MP, Huang B, Lupini AR, Englund D, Jesse S. Direct imaging of electron density with a scanning transmission electron microscope. Nat Commun 2023; 14:7550. [PMID: 37985658 PMCID: PMC10662251 DOI: 10.1038/s41467-023-42256-9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/15/2022] [Accepted: 07/27/2023] [Indexed: 11/22/2023] Open
Abstract
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution using a technique known as secondary electron e-beam-induced current (SEEBIC). Here, we apply the SEEBIC imaging technique to a stacked 2D heterostructure device to reveal the spatially resolved electron density of an encapsulated WSe2 layer. We find that the double Se lattice site shows higher emission than the W site, which is at odds with first-principles modelling of valence ionization of an isolated WSe2 cluster. These results illustrate that atomic level SEEBIC contrast within a single material is possible and that an enhanced understanding of atomic scale SE emission is required to account for the observed contrast. In turn, this suggests that, in the future, subtle information about interlayer bonding and the effect on electron orbitals could be directly revealed with this technique.
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Affiliation(s)
- Ondrej Dyck
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
| | | | - David Lingerfelt
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Jacob L Swett
- Biodesign Institute, Arizona State University, Tempe, 87287, AZ, USA
| | - Mark P Oxley
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Bevin Huang
- Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Andrew R Lupini
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Dirk Englund
- Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
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4
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Xu M, Li A, Pennycook SJ, Gao SP, Zhou W. Probing a Defect-Site-Specific Electronic Orbital in Graphene with Single-Atom Sensitivity. PHYSICAL REVIEW LETTERS 2023; 131:186202. [PMID: 37977630 DOI: 10.1103/physrevlett.131.186202] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/07/2023] [Accepted: 09/05/2023] [Indexed: 11/19/2023]
Abstract
Visualization of individual electronic states ascribed to specific unoccupied orbitals at the atomic scale can reveal fundamental information about chemical bonding, but it is challenging since bonding often results in only subtle variations in the whole density of states. Here, we utilize atomic-resolution energy-loss near-edge fine structure (ELNES) spectroscopy to map out the electronic states attributed to specific unoccupied p_{z} orbital around a fourfold coordinated silicon point defect in graphene, which is further supported by theoretical calculations. Our results illustrate the power of atomic-resolution ELNES towards the probing of defect-site-specific electronic orbitals in monolayer crystals, providing insights into understanding the effect of chemical bonding on the local properties of defects in solids.
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Affiliation(s)
- Mingquan Xu
- School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
| | - Aowen Li
- School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
| | - Stephen J Pennycook
- School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
| | - Shang-Peng Gao
- Department of Materials Science, Fudan University, Shanghai, 200433, People's Republic of China
| | - Wu Zhou
- School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
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5
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Wu M, Shi R, Qi R, Li Y, Du J, Gao P. Four-dimensional electron energy-loss spectroscopy. Ultramicroscopy 2023; 253:113818. [PMID: 37544270 DOI: 10.1016/j.ultramic.2023.113818] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2023] [Revised: 06/20/2023] [Accepted: 07/25/2023] [Indexed: 08/08/2023]
Abstract
Recent advances in scanning transmission electron microscopy have enabled atomic-scale focused, coherent, and monochromatic electron probes, achieving nanoscale spatial resolution, meV energy resolution, sufficient momentum resolution, and a wide energy detection range in electron energy-loss spectroscopy (EELS). A four-dimensional EELS (4D-EELS) dataset can be recorded with a slot aperture selecting the specific momentum direction in the diffraction plane and the beam scanning in two spatial dimensions. In this paper, the basic principle of the 4D-EELS technique and a few examples of its application are presented. In addition to parallelly acquired dispersion with energy down to a lattice vibration scale, it can map the real space variation of any EELS spectrum features with a specific momentum transfer and energy loss to study various locally inhomogeneous scattering processes. Furthermore, simple mathematical combinations associating the spectra at different momenta are feasible from the 4D dataset, e.g., the efficient acquisition of a reliable electron magnetic circular dichroism (EMCD) signal is demonstrated. This 4D-EELS technique provides new opportunities to probe the local dispersion and related physical properties at the nanoscale.
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Affiliation(s)
- Mei Wu
- International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China
| | - Ruochen Shi
- International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China
| | - Ruishi Qi
- Department of Physics, University of California at Berkeley, Berkeley 94720, United States
| | - Yuehui Li
- International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China
| | - Jinlong Du
- Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China
| | - Peng Gao
- International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China; Collaborative Innovation Center of Quantum Matter, Beijing 100871, China; Interdisciplinary Institute of Light-Element Quantum Materials and Research Center for Light-Element Advanced Materials, Peking University, Beijing 100871, China.
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6
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Ederer M, Löffler S. Optimizing experimental parameters for orbital mapping. Ultramicroscopy 2023; 256:113866. [PMID: 37866278 DOI: 10.1016/j.ultramic.2023.113866] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2023] [Revised: 09/29/2023] [Accepted: 10/08/2023] [Indexed: 10/24/2023]
Abstract
A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital maps, can be produced. Thus, unprecedented insight into the electronic orbitals responsible for most of the electrical, magnetic and optical properties of bulk materials can be gained. However, the incredibly demanding requirements on spatial as well as spectral resolution paired with the low signal-to-noise ratio severely limits the day-to-day use of this new technique. With the use of simulations, we strive to alleviate these challenges as much as possible by identifying optimal experimental parameters. In this manner, we investigate representative examples of a transition metal oxide, a material consisting entirely of light elements, and an interface between two different materials to find and compare acceptable ranges for sample thickness, acceleration voltage and electron dose for a scanning probe as well as for parallel illumination.
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Affiliation(s)
- Manuel Ederer
- University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria.
| | - Stefan Löffler
- University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria
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7
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Iwashimizu C, Haruta M, Nemoto T, Kurata H. Different atomic contrasts in HAADF images and EELS maps of rutile TiO2. Microscopy (Oxf) 2023; 72:353-360. [PMID: 36440709 DOI: 10.1093/jmicro/dfac067] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/14/2022] [Revised: 11/21/2022] [Accepted: 11/27/2022] [Indexed: 08/05/2023] Open
Abstract
High-angle annular dark-field (HAADF) imaging and elemental mapping at the atomic scale by scanning transmission electron microscopy (STEM) combined with electron energy-loss spectroscopy (EELS) are widely used for material characterization, in which quantitative understanding of the contrast of the image is required. Here, we report an unexpected image contrast in the elemental mapping of rutile TiO2, where the Ti L2,3 map shows an anisotropic elliptical shape that extends along the long axis in the octahedral structure, while the atomic contrast of Ti columns in the HAADF image is almost circular. Multi-slice simulation reveals that unique electron channeling related to the rutile structure and the difference of the potentials between HAADF and EELS cause the different atomic contrasts in the two images.
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Affiliation(s)
- Chisaki Iwashimizu
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
| | - Mitsutaka Haruta
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
| | - Takashi Nemoto
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
| | - Hiroki Kurata
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
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8
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Martis J, Susarla S, Rayabharam A, Su C, Paule T, Pelz P, Huff C, Xu X, Li HK, Jaikissoon M, Chen V, Pop E, Saraswat K, Zettl A, Aluru NR, Ramesh R, Ercius P, Majumdar A. Imaging the electron charge density in monolayer MoS 2 at the Ångstrom scale. Nat Commun 2023; 14:4363. [PMID: 37474521 PMCID: PMC10359339 DOI: 10.1038/s41467-023-39304-9] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/18/2022] [Accepted: 06/06/2023] [Indexed: 07/22/2023] Open
Abstract
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom spatial resolution. These electric field maps represent the integrated effect of the nucleus, core electrons and valence electrons, and separating their contributions is non-trivial. In this paper, we utilized simultaneously acquired 4D-STEM center of mass (CoM) images and annular dark field (ADF) images to determine the projected electron charge density in monolayer MoS2. We evaluate the contributions of both the core electrons and the valence electrons to the derived electron charge density; however, due to blurring by the probe shape, the valence electron contribution forms a nearly featureless background while most of the spatial modulation comes from the core electrons. Our findings highlight the importance of probe shape in interpreting charge densities derived from 4D-STEM and the need for smaller electron probes.
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Affiliation(s)
- Joel Martis
- Department of Mechanical Engineering, Stanford University, Stanford, CA, USA
| | - Sandhya Susarla
- The National Center for Electron Microscopy (NCEM), The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
- Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
- School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA
| | - Archith Rayabharam
- Department of Mechanical Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, USA
| | - Cong Su
- Department of Physics, University of California Berkeley, Berkeley, CA, USA
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, USA
- Kavli Energy NanoScience Institute, University of California Berkeley, Berkeley, CA, USA
| | - Timothy Paule
- Department of Physics, University of California Berkeley, Berkeley, CA, USA
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, USA
- Kavli Energy NanoScience Institute, University of California Berkeley, Berkeley, CA, USA
| | - Philipp Pelz
- The National Center for Electron Microscopy (NCEM), The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
- Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Erlangen, Germany
| | - Cassandra Huff
- Department of Electrical Engineering, Stanford University, Stanford, CA, USA
| | - Xintong Xu
- Department of Mechanical Engineering, Stanford University, Stanford, CA, USA
| | - Hao-Kun Li
- Department of Mechanical Engineering, Stanford University, Stanford, CA, USA
| | - Marc Jaikissoon
- Department of Electrical Engineering, Stanford University, Stanford, CA, USA
| | - Victoria Chen
- Department of Electrical Engineering, Stanford University, Stanford, CA, USA
| | - Eric Pop
- Department of Electrical Engineering, Stanford University, Stanford, CA, USA
| | - Krishna Saraswat
- Department of Electrical Engineering, Stanford University, Stanford, CA, USA
| | - Alex Zettl
- Department of Physics, University of California Berkeley, Berkeley, CA, USA
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, USA
- Kavli Energy NanoScience Institute, University of California Berkeley, Berkeley, CA, USA
| | - Narayana R Aluru
- Department of Mechanical Engineering, The University of Texas at Austin, Austin, TX, USA
| | - Ramamoorthy Ramesh
- Department of Physics, University of California Berkeley, Berkeley, CA, USA
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, USA
| | - Peter Ercius
- The National Center for Electron Microscopy (NCEM), The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
| | - Arun Majumdar
- Department of Mechanical Engineering, Stanford University, Stanford, CA, USA.
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Pang J, Peng S, Hou C, Zhao H, Fan Y, Ye C, Zhang N, Wang T, Cao Y, Zhou W, Sun D, Wang K, Rümmeli MH, Liu H, Cuniberti G. Applications of Graphene in Five Senses, Nervous System, and Artificial Muscles. ACS Sens 2023; 8:482-514. [PMID: 36656873 DOI: 10.1021/acssensors.2c02790] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/20/2023]
Abstract
Graphene remains of great interest in biomedical applications because of biocompatibility. Diseases relating to human senses interfere with life satisfaction and happiness. Therefore, the restoration by artificial organs or sensory devices may bring a bright future by the recovery of senses in patients. In this review, we update the most recent progress in graphene based sensors for mimicking human senses such as artificial retina for image sensors, artificial eardrums, gas sensors, chemical sensors, and tactile sensors. The brain-like processors are discussed based on conventional transistors as well as memristor related neuromorphic computing. The brain-machine interface is introduced for providing a single pathway. Besides, the artificial muscles based on graphene are summarized in the means of actuators in order to react to the physical world. Future opportunities remain for elevating the performances of human-like sensors and their clinical applications.
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Affiliation(s)
- Jinbo Pang
- Collaborative Innovation Center of Technology and Equipment for Biological Diagnosis and Therapy in Universities of Shandong, Institute for Advanced Interdisciplinary Research (iAIR), University of Jinan, Jinan 250022, China
| | - Songang Peng
- High-Frequency High-Voltage Device and Integrated Circuits R&D Center and Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, China
| | - Chongyang Hou
- Collaborative Innovation Center of Technology and Equipment for Biological Diagnosis and Therapy in Universities of Shandong, Institute for Advanced Interdisciplinary Research (iAIR), University of Jinan, Jinan 250022, China
| | - Hongbin Zhao
- State Key Laboratory of Advanced Materials for Smart Sensing, GRINM Group Co. Ltd., Xinwai Street 2, Beijing 100088, People's Republic of China
| | - Yingju Fan
- School of Chemistry and Chemical Engineering, University of Jinan, Shandong, Jinan 250022, China
| | - Chen Ye
- School of Chemistry and Chemical Engineering, University of Jinan, Shandong, Jinan 250022, China
| | - Nuo Zhang
- School of Chemistry and Chemical Engineering, University of Jinan, Shandong, Jinan 250022, China
| | - Ting Wang
- State Key Laboratory of Biobased Material and Green Papermaking and People's Republic of China School of Bioengineering, Qilu University of Technology, Shandong Academy of Sciences, No. 3501 Daxue Road, Jinan 250353, People's Republic of China
| | - Yu Cao
- Key Laboratory of Modern Power System Simulation and Control & Renewable Energy Technology (Ministry of Education) and School of Electrical Engineering, Northeast Electric Power University, Jilin 132012, China
| | - Weijia Zhou
- Collaborative Innovation Center of Technology and Equipment for Biological Diagnosis and Therapy in Universities of Shandong, Institute for Advanced Interdisciplinary Research (iAIR), University of Jinan, Jinan 250022, China
| | - Ding Sun
- School of Electrical and Computer Engineering, Jilin Jianzhu University, Changchun 130118, P. R. China
| | - Kai Wang
- School of Electrical Engineering, Weihai Innovation Research Institute, Qingdao University, Qingdao 266000, China
| | - Mark H Rümmeli
- Leibniz Institute for Solid State and Materials Research Dresden, Dresden, D-01171, Germany.,College of Energy, Soochow Institute for Energy and Materials Innovations, and Key Laboratory of Advanced Carbon Materials and Wearable Energy Technologies of Jiangsu Province, Soochow University, Suzhou 215006, China.,Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie Sklodowskiej 34, Zabrze 41-819, Poland.,Institute for Complex Materials, IFW Dresden, 20 Helmholtz Strasse, Dresden 01069, Germany.,Center for Energy and Environmental Technologies, VŠB-Technical University of Ostrava, 17. Listopadu 15, Ostrava 708 33, Czech Republic
| | - Hong Liu
- Collaborative Innovation Center of Technology and Equipment for Biological Diagnosis and Therapy in Universities of Shandong, Institute for Advanced Interdisciplinary Research (iAIR), University of Jinan, Jinan 250022, China.,State Key Laboratory of Crystal Materials, Center of Bio & Micro/Nano Functional Materials, Shandong University, 27 Shandanan Road, Jinan 250100, China
| | - Gianaurelio Cuniberti
- Institute for Materials Science and Max Bergmann Center of Biomaterials and Center for Advancing Electronics Dresden, Technische Universität Dresden, Dresden 01069, Germany
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