Kinetic growth with surface relaxation: Continuum versus atomistic models

Kardar-Parisi-Zhang growth in ɛ dimensions and beyond

We examine anew the relationship of directed polymers in random media on traditional hypercubic versus hierarchical lattices, with the goal of understanding the dimensionality dependence of the essential scaling index β at the heart of the Kardar-Parisi-Zhang universality class. A seemingly accurate, but entirely empirical, ansatz due to Perlsman and Schwartz, proposed many years ago, can be put in proper context by anchoring the connection between these distinct lattice types at vanishing dimensionality. We graft together complementary perturbative field-theoretic and nonperturbative real-space renormalization group tools to establish the necessary connection, thereby elucidating the central mystery underlying the ansatz's uncanny apparent success, but also revealing its intrinsic limitations. Furthermore, we perform an extensive Euler integration of the KPZ equation in 3+1 dimensions which, bolstered by a separate directed polymer simulation, allows us an estimate for the critical exponent β_{3+1}^{KPZ}=0.1845(4) that greatly improves upon all previous Monte Carlo calculations in this regard and rules out the Perlsman-Schwartz value, 0.1882^{+}, in that dimension. Finally, leveraging this hybrid RG partnership permits us a versatile, more potent, tool to explore the general KPZ problem across dimensions, as well as a conjecture for its key critical exponent, β=1/2-0.22967ɛ, as ɛ→0, testable in a three-loop calculation.

Bifractality in the one-dimensional Wolf-Villain model

We introduce a multifractal optimal detrended fluctuation analysis to study the scaling properties of the one-dimensional Wolf-Villain (WV) model for surface growth. This model produces coarsened surface morphologies for long timescales (up to 10^{9} monolayers) and its universality class remains an open problem. Our results for the multifractal exponent τ(q) reveal an effective local roughness exponent consistent with a transient given by the molecular beam epitaxy (MBE) growth regime and Edwards-Wilkinson (EW) universality class for negative and positive q values, respectively. Therefore, although the results corroborate that long-wavelength fluctuations belong to the EW class in the hydrodynamic limit, as conjectured in the recent literature, a bifractal signature of the WV model with an MBE regime at short wavelengths was observed.

From noise on the sites to noise on the links: Discretizing the conserved Kardar-Parisi-Zhang equation in real space

Numerical analysis of conserved field dynamics has been generally performed with pseudospectral methods. Finite differences integration, the common procedure for nonconserved field dynamics, indeed struggles to implement a conservative noise in the discrete spatial domain. In this work we present a method to generate a conservative noise in the finite differences framework, which works for any discrete topology and boundary conditions. We apply it to numerically solve the conserved Kardar-Parisi-Zhang (cKPZ) equation, widely used to describe surface roughening when the number of particles is conserved. Our numerical simulations recover the correct scaling exponents α, β, and z in d=1 and in d=2. To illustrate the potentiality of the method, we further consider the cKPZ equation on different kinds of nonstandard lattices and on the random Euclidean graph. This is a unique numerical study of conserved field dynamics on an irregular topology, paving the way for a broad spectrum of possible applications.

Surface Evolution of Polymer Films Grown by Vapor Deposition: Growth of Local and Global Slopes of Interfaces

The kinetic roughening of polymer films grown by vapor deposition polymerization was analyzed using the widely accepted classification framework of "generic scaling ansatz" given for the structure factor. Over the past two decades, this method has played a pivotal role in classifying diverse forms of dynamic scaling and understanding the mechanisms driving interface roughening. The roughness exponents of the polymer films were consistently determined as α=1.25±0.09, αloc=0.73±0.02, and αs=0.99±0.06. However, the inability to unambiguously assign these roughness exponent values to a specific scaling subclass prompts the proposal of a practical alternative. This report illustrates how all potential dynamic scaling can be consistently identified and classified based on the relationship between two temporal scaling exponents measured in real space: the average local slope and the global slope of the interface. The intrinsic anomalous roughening class is conclusively assigned to polymer film growth characterized by anomalous "native (background slope-removed) local height fluctuations". Moreover, the new analysis reveals that interfaces exhibiting anomalous scaling, previously classified as intrinsic anomalous roughening, could potentially belong to the super-rough class, particularly when the spectral roughness exponent αs is equal to 1.

Finite-size and finite-time scaling for kinetic rough interfaces

We consider discrete models of kinetic rough interfaces that exhibit space-time scale invariance in height-height correlation. We use the generic scaling theory of Ramasco et al. [Phys. Rev. Lett. 84, 2199 (2000)0031-900710.1103/PhysRevLett.84.2199] to confirm that the dynamical structure factor of the height profile can uniquely characterize the underlying dynamics. We apply both finite-size and finite-time scaling methods that systematically allow an estimation of the critical exponents and the scaling functions, eventually establishing the universality class accurately. The finite-size scaling analysis offers an alternative way to characterize the anomalous rough interfaces. As an illustration, we investigate a class of self-organized interface models in random media with extremal dynamics. The isotropic version shows a faceted pattern and belongs to the same universality class (as shown numerically) as the Sneppen model (version A). We also examine an anisotropic version of the Sneppen model and suggest that the model belongs to the universality class of the tensionless Kardar-Parisi-Zhang (tKPZ) equation in one dimension.

Scaling of surface roughness in film deposition with height-dependent step edge barriers

We perform kinetic Monte Carlo simulations of film growth in simple cubic lattices with solid-on-solid conditions, Ehrlich-Schwoebel (ES) barriers at step edges, and a kinetic barrier related to the hidden off-plane diffusion at multilayer steps. Broad ranges of the diffusion-to-deposition ratio R, detachment probability per lateral neighbor, ε, and monolayer step crossing probability P=exp[-E_{ES}/(k_{B}T)] are studied. Without the ES barrier, four possible scaling regimes are shown as the coverage θ increases: nearly layer-by-layer growth with damped roughness oscillations; kinetic roughening in the Villain-Lai-Das Sarma (VLDS) universality class when the roughness is W∼1 (in lattice units); unstable roughening with mound nucleation and growth, where slopes of logW×logθ plots reach values larger than 0.5; and asymptotic statistical growth with W=θ^{1/2} solely due to the kinetic barrier at multilayer steps. If the ES barrier is present, the layer-by-layer growth crosses over directly to the unstable regime, with no transient VLDS scaling. However, in simulations up to θ=10^{4} (typical of films with a few micrometers), low temperatures (small R, ε, or P) may suppress the two or three initial regimes, while high temperatures and P∼1 produce smooth surfaces at all thicknesses. These crossovers help to explain proposals of nonuniversal exponents in previous works. We define a smooth film thickness θ_{c} where W=1 and show that VLDS scaling at that point indicates negligible ES barriers, while rapidly increasing roughness indicates a small ES barrier (E_{ES}∼k_{B}T). θ_{c} scales as ∼exp(const×P^{2/3}) if the other parameters are kept fixed, which represents a high sensitivity on the ES barrier. The analysis of recent experimental data in the light of our results distinguishes cases where E_{ES}/(k_{B}T) is negligible, ∼1, or ≪1.

One-point height fluctuations and two-point correlators of (2+1) cylindrical KPZ systems

While the one-point height distributions (HDs) and two-point covariances of (2+1) Kardar-Parisi-Zhang (KPZ) systems have been investigated in several recent works for flat and spherical geometries, for the cylindrical one the HD was analyzed for few models and nothing is known about the spatial and temporal covariances. Here, we report results for these quantities, obtained from extensive numerical simulations of discrete KPZ models, for three different setups yielding cylindrical growth. Beyond demonstrating the universality of the HD and covariances, our results reveal other interesting features of this geometry. For example, the spatial covariances measured along the longitudinal and azimuthal directions are different, with the former being quite similar to the curve for flat (2+1) KPZ systems, while the latter resembles the Airy_{2} covariance of circular (1+1) KPZ interfaces. We also argue (and present numerical evidence) that, in general, the rescaled temporal covariance A(t/t_{0}) decays asymptotically as A(x)∼x^{-λ[over ¯]} with an exponent λ[over ¯]=β+d^{*}/z, where d^{*} is the number of interface sides kept fixed during the growth (being d^{*}=1 for the systems analyzed here). Overall, these results complete the picture of the main statistics for the (2+1) KPZ class.

Fractal characterizations of MeV ion treated CaF2 thin films

We present the morphological evolution and fractal characterizations of CaF₂ thin-film surfaces modified by bombardment with 100 MeV Au⁺⁸ ions at various fluences. Atomic force microscopy (AFM) combined with line profile and two-dimensional power spectral density (2D-PSD) analysis was utilized to investigate the evolution of surface morphology as a function of fluence. The AFM images were utilized to investigate the relationship between fractal dimension, roughness exponent, lateral correlation length, and ion fluence. The surface erosion owing to sputtering was depicted using Rutherford backscattering spectrometry. The structural characteristics' dependency on fluence was explored with the help of glancing angle x-ray diffraction measurements on virgin and irradiated samples. Tensile stress calculated using a peak shift in the glancing angle x-ray diffractogram showed an increase in tensile stress with fluence that caused the surface to crack after the fracture strength of the surface was crossed. 2D-PSD analysis signified the role of sputtering over surface diffusion for the observed surface modifications. Fractal dimensions first increased and then decreased with ion fluence. The lateral correlation length decreased, while the roughness exponent increased with fluence after the threshold value.

Accessibility of the surface fractal dimension during film growth

Fractal properties on self-affine surfaces of films growing under nonequilibrium conditions are important in understanding the corresponding universality class. However, measurement of the surface fractal dimension has been intensively investigated and is still very problematic. In this work, we report the behavior of the effective fractal dimension in the context of film growth involving lattice models believed to belong to the Kardar-Parisi-Zhang (KPZ) universality class. Our results, which are presented for growth in a d-dimensional substrate (d=1,2) and use the three-point sinuosity (TPS) method, show universal scaling of the measure M, which is defined in terms of discretization of the Laplacian operator applied to the height of the film surface, M=t^{δ}g[Θ], where t is the time, g[Θ] is a scale function, δ=2β, Θ≡τt^{-1/z}, β, and z are the KPZ growth and dynamical exponents, respectively, and τ is a spatial scale length used to compute M. Importantly, we show that the effective fractal dimensions are consistent with the expected KPZ dimensions for d=1,2, if Θ≲0.3, which include a thin film regime for the extraction of the fractal dimension. This establishes the scale limits in which the TPS method can be used to accurately extract effective fractal dimensions that are consistent with those expected for the corresponding universality class. As a consequence, for the steady state, which is inaccessible to experimentalists studying film growth, the TPS method provided effective fractal dimension consistent with the KPZ ones for almost all possible τ, i.e., 1≲τ<L/2, where L is the lateral size of the substrate on which the deposit is grown. In the growth of thin films, the true fractal dimension can be observed in a narrow range of τ, the upper limit of which is of the same order of magnitude as the correlation length of the surface, indicating the limits of self-affinity of a surface in an experimentally accessible regime. This upper limit was comparatively lower for the Higuchi method or the height-difference correlation function. Scaling corrections for the measure M and the height-difference correlation function are studied analytically and compared for the Edwards-Wilkinson class at d=1, yielding similar accuracy for both methods. Importantly, we extend our discussion to a model representing diffusion-dominated growth of films and find that the TPS method achieves the corresponding fractal dimension only at steady state and in a narrow range of the scale length, compared to that found for the KPZ class.

Kardar-Parisi-Zhang universality class in (d+1)-dimensions

The determination of the exact exponents of the KPZ class in any substrate dimension d is one of the most important open issues in Statistical Physics. Based on the behavior of the dimensional variation of some exact exponent differences for other growth equations, I find here that the KPZ growth exponents (related to the temporal scaling of the fluctuations) are given by β_{d}=7/8d+13. These exponents present an excellent agreement with the most accurate estimates for them in the literature. Moreover, they are confirmed here through extensive Monte Carlo simulations of discrete growth models and real-space renormalization group (RG) calculations for directed polymers in random media (DPRM), up to d=15. The left-tail exponents of the probability density functions for the DPRM energy provide another striking verification of the analytical result above.

Morphologies and dynamics of free surfaces of crystals composed of active particles

Active matter exhibits various collective motions and nonequilibrium phases, such as crystals; however, their surface properties have been poorly explored. Here, we use Brownian dynamics simulations to investigate the surface morphology and dynamics of two-dimensional active crystals during and after growth. For crystal growth on a substrate, the position and roughness of the crystal surface reach steady states at different times. In the steady state, the surface exhibits superdiffusive behaviour at the short time, and the roughness is insensitive to the roughening process and particle activity. We observe two-stage and three-stage surface roughening at different Péclet numbers. The result of dynamic scaling analysis shows that the surface is similar to anomalous roughening, which is distinct from the normal roughening typically found in conventional passive systems. Capillary wave theory for a thermal equilibrium system can describe the active surface fluctuations only in the long-wavelength regime, indicating that active particles mainly drive the surface out of equilibrium locally. These similarities and differences between the active and passive crystal surfaces are essential for understanding active crystals and interfaces.

Rough or crumpled: Phases in kinetic growth with surface relaxation

We show that generic kinetic growth processes with surface relaxations can exhibit a hitherto unexplored crumpled phase with short-range orientational order at dimensions d<4. A sufficiently strong spatially nonlocal part of the chemical potential associated with the particle current above a threshold in the system can trigger this crumpling. The system can also be in a perturbatively accessible rough phase with long-range orientational order but short-range positional order at d<4 with known scaling exponents. Intriguingly, in d>4 we argue that there is no crumpling transition; instead, there is a roughening transition from a smooth to a rough phase for large enough nonlocal particle chemical potential. Experimental and theoretical implications of these results are discussed.

Height distributions in interface growth: The role of the averaging process

Height distributions (HDs) are key quantities to uncover universality and geometry-dependence in evolving interfaces. To quantitatively characterize HDs, one uses adimensional ratios of their first central moments (m_{n}) or cumulants (κ_{n}), especially the skewness S and kurtosis K, whose accurate estimate demands an averaging over all L^{d} points of the height profile at a given time, in translation-invariant interfaces, and over N independent samples. One way of doing this is by calculating m_{n}(t) [or κ_{n}(t)] for each sample and then carrying out an average of them for the N interfaces, with S and K being calculated only at the end. Another approach consists in directly calculating the ratios for each interface and, then, averaging the N values. It turns out, however, that S and K for the growth regime HDs display strong finite-size and -time effects when estimated from these "interface statistics," as already observed in some previous works and clearly shown here, through extensive simulations of several discrete growth models belonging to the EW and KPZ classes on one- and two-dimensional substrates of sizes L=const. and L∼t. Importantly, I demonstrate that with "1-point statistics," i.e., by calculating m_{n}(t) [or κ_{n}(t)] once for all NL^{d} heights together, these corrections become very weak, so that S and K attain values very close to the asymptotic ones already at short times and for small L's. However, I find that this "1-point" (1-pt) approach fails in uncovering the universality of the HDs in the steady-state regime (SSR) of systems whose average height, h[over ¯], is a fluctuating variable. In fact, as demonstrated here, in this regime the 1-pt height evolves as h(t)=h[over ¯](t)+s_{λ}A^{1/2}L^{α}ζ+⋯-where P(ζ) is the underlying SSR HD-and the fluctuations in h[over ¯] yield S_{1-pt}∼t^{-1/2} and K_{1-pt}∼t^{-1}. Nonetheless, by analyzing P(h-h[over ¯]), the cumulants of P(ζ) can be accurately determined. I also show that different, but universal, asymptotic values for S and K (related, so, to different HDs) can be found from the "interface statistics" in the SSR. This reveals the importance of employing the various complementary approaches to reliably determine the universality class of a given system through its different HDs.

Fractal Analysis on Surface Topography of Thin Films: A Review

The topographies of various surfaces have been studied in many fields due to the significant influence that surfaces have on the practical performance of a given sample. A comprehensive evaluation requires the assistance of fractal analysis, which is of significant importance for modern science and technology. Due to the deep insights of fractal theory, fractal analysis on surface topographies has been widely applied and recommended. In this paper, the remarkable uprising in recent decades of fractal analysis on the surfaces of thin films, an essential domain of surface engineering, is reviewed. By summarizing the methods used to calculate fractal dimension and the deposition techniques of thin films, the results and trends of fractal analysis are associated with the microstructure, deposition parameters, etc. and this contributes profoundly to exploring the mechanism of film growth under different conditions. Choosing appropriate methods of surface characterization and calculation methods to study diverse surfaces is the main challenge of current research on thin film surface topography by using fractal theory. Prospective developing trends are proposed based on the data extraction and statistics of the published literature in this field.

Fixed-dimension renormalization group analysis of conserved surface roughening

Conserved surface roughening represents a special case of interface dynamics where the total height of the interface is conserved. Recently, it was suggested [Caballero et al., Phys. Rev. Lett. 121, 020601 (2018)PRLTAO0031-900710.1103/PhysRevLett.121.020601] that the original continuum model known as the Conserved Kardar-Parisi-Zhang (CKPZ) equation is incomplete, as additional nonlinearity is not forbidden by any symmetry in d>1. In this work, we perform detailed field-theoretic renormalization group (RG) analysis of a general stochastic model describing conserved surface roughening. Systematic power counting reveals additional marginal interaction at the upper critical dimension, which appears also in the context of molecular beam epitaxy. Depending on the origin of the surface particle's mobility, the resulting model shows two different scaling regimes. If the particles move mainly due to the gravity, the leading dispersion law is ω∼k^{2}, and the mean-field approximation describing a flat interface is exact in any spatial dimension. On the other hand, if the particles move mainly due to the surface curvature, the interface becomes rough with the mean-field dispersion law ω∼k^{4}, and the corrections to scaling exponents must be taken into account. We show that the latter model consist of two subclasses of models that are decoupled in all orders of perturbation theory. Moreover, our RG analysis of the general model reveals that the universal scaling is described by a rougher interface than the CKPZ universality class. The universal exponents are derived within the one-loop approximation in both fixed d and ɛ-expansion schemes, and their relation is discussed. We point out all important details behind these two schemes, which are often overlooked in the literature, and their misinterpretation might lead to inconsistent results.

Statistics of adatom diffusion in a model of thin film growth

We study the statistics of the number of executed hops of adatoms at the surface of films grown with the Clarke-Vvedensky (CV) model in simple cubic lattices. The distributions of this number N are determined in films with average thicknesses close to 50 and 100 monolayers for a broad range of values of the diffusion-to-deposition ratio R and of the probability ε that lowers the diffusion coefficient for each lateral neighbor. The mobility of subsurface atoms and the energy barriers for crossing step edges are neglected. Simulations show that the adatoms execute uncorrelated diffusion during the time in which they move on the film surface. In a low temperature regime, typically with Rε≲1, the attachment to lateral neighbors is almost irreversible, the average number of hops scales as 〈N〉∼R^{0.38±0.01}, and the distribution of that number decays approximately as exp[-(N/〈N〉)^{0.80±0.07}]. Similar decay is observed in simulations of random walks in a plane with randomly distributed absorbing traps and the estimated relation between 〈N〉 and the density of terrace steps is similar to that observed in the trapping problem, which provides a conceptual explanation of that regime. As the temperature increases, 〈N〉 crosses over to another regime when Rε^{3.0±0.3}∼1, which indicates high mobility of all adatoms at terrace borders. The distributions P(N) change to simple exponential decays, due to the constant probability for an adatom to become immobile after being covered by a new deposited layer. At higher temperatures, the surfaces become very smooth and 〈N〉∼Rε^{1.85±0.15}, which is explained by an analogy with submonolayer growth. Thus, the statistics of adatom hops on growing film surfaces is related to universal and nonuniversal features of the growth model and with properties of trapping models if the hopping time is limited by the landscape and not by the deposition of other layers.

Geometry dependence in linear interface growth

The effect of geometry in the statistics of nonlinear universality classes for interface growth has been widely investigated in recent years, and it is well known to yield a split of them into subclasses. In this work, we investigate this for the linear classes of Edwards-Wilkinson and of Mullins-Herring in one and two dimensions. From comparison of analytical results with extensive numerical simulations of several discrete models belonging to these classes, as well as numerical integrations of the growth equations on substrates of fixed size (flat geometry) or expanding linearly in time (radial geometry), we verify that the height distributions (HDs) and the spatial and the temporal covariances are universal but geometry-dependent. In fact, the HDs are always Gaussian, and, when defined in terms of the so-called "KPZ ansatz" [h≃v_{∞}t+(Γt)^{β}χ], their probability density functions P(χ) have mean null, so that all their cumulants are null, except by their variances, which assume different values in the flat and radial cases. The shape of the (rescaled) covariance curves is analyzed in detail and compared with some existing analytical results for them. Overall, these results demonstrate that the splitting of such university classes is quite general, being not restricted to the nonlinear ones.

Modeling of nonequilibrium surface growth by a limited-mobility model with distributed diffusion length

Kinetic Monte Carlo (KMC) simulations are a well-established numerical tool to investigate the time-dependent surface morphology in molecular beam epitaxy experiments. In parallel, simplified approaches such as limited mobility (LM) models characterized by a fixed diffusion length have been studied. Here we investigate an extended LM model to gain deeper insight into the role of diffusional processes concerning the growth morphology. Our model is based on the stochastic transition rules of the Das Sarma-Tamborena model but differs from the latter via a variable diffusion length. A first guess for this length can be extracted from the saturation value of the mean-squared displacement calculated from short KMC simulations. Comparing the resulting surface morphologies in the sub- and multilayer growth regime to those obtained from KMC simulations, we find deviations which can be cured by adding fluctuations to the diffusion length. This mimics the stochastic nature of particle diffusion on a substrate, an aspect which is usually neglected in LM models. We propose to add fluctuations to the diffusion length by choosing this quantity for each adsorbed particle from a Gaussian distribution, where the variance of the distribution serves as a fitting parameter. We show that the diffusional fluctuations have a huge impact on cluster properties during submonolayer growth as well as on the surface profile in the high coverage regime. The analysis of the surface morphologies on one- and two-dimensional substrates during sub- and multilayer growth shows that the LM model can produce structures that are indistinguishable to the ones from KMC simulations at arbitrary growth conditions.

Effects of a kinetic barrier on limited-mobility interface growth models

The role played by a kinetic barrier originated by out-of-plane step edge diffusion, introduced by Leal et al. [J. Phys.: Condens. Matter 23, 292201 (2011)JCOMEL0953-898410.1088/0953-8984/23/29/292201], is investigated in the Wolf-Villain and Das Sarma-Tamborenea models with short-range diffusion. Using large-scale simulations, we observe that this barrier is sufficient to produce growth instability, forming quasiregular mounds in one and two dimensions. The characteristic surface length saturates quickly indicating a uncorrelated growth of the three-dimensional structures, which is also confirmed by a growth exponent β=1/2. The out-of-plane particle current shows a large reduction of the downward flux in the presence of the kinetic barrier enhancing, consequently, the net upward diffusion and the formation of three-dimensional self-assembled structures.

Local roughness exponent in the nonlinear molecular-beam-epitaxy universality class in one dimension

We report local roughness exponents, α_{loc}, for three interface growth models in one dimension which are believed to belong to the nonlinear molecular-beam-epitaxy (nMBE) universality class represented by the Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801 (2017)2470-004510.1103/PhysRevE.95.042801] and compared the outcomes with standard detrending methods. We observe in all investigated models that ODFA outperforms the standard methods providing exponents in the narrow interval α_{loc}^{}∈[0.96,0.98] quantitatively consistent with two-loop renormalization group predictions for the VLDS equation. In particular, these exponent values are calculated for the Clarke-Vvdensky and Das Sarma-Tamborenea models characterized by very strong corrections to the scaling, for which large deviations of these values had been reported. Our results strongly support the absence of anomalous scaling in the nMBE universality class and the existence of corrections in the form α_{loc}^{}=1-ε of the one-loop renormalization group analysis of the VLDS equation.

Multi-facets of kinetic roughening of interfaces

In this review, the authors are going to explore the intriguing aspects of kinetic roughening of interfaces. Interface roughness dynamics connected with various physical processes have been studied through novel microscopic models in connection with experiments. The statistical properties of such rough interfaces appearing in wide range of physical systems are observed to belong to different universality classes characterized by the scaling exponents. With the advancement of characterization techniques, the scaling exponents of thin-film surface (or the morphological evolution of amorphous surfaces eroded by ion bombardment) are easily computed even in situ during the growing (erosion) conditions. The relevant key physical parameters during the dynamics crucially control the overall scaling behaviour as well as the scaling exponents. The non-universal nature of scaling exponents is emphasized on the variations of the physical parameters in experimental studies and also in theoretical models. Overall, this review containing both theoretical and experimental results will unfold some novel features of surface morphology and its evolution and shed important directions to build an appropriate theoretical framework to explain the observations in systematic and consistent experiments.

Circular Kardar-Parisi-Zhang interfaces evolving out of the plane

Circular KPZ interfaces spreading radially in the plane have Gaussian unitary ensemble (GUE) Tracy-Widom (TW) height distribution (HD) and Airy_{2} spatial covariance, but what are their statistics if they evolve on the surface of a different background space, such as a bowl, a mountain, or any surface of revolution? To give an answer to this, we report here extensive numerical analyses of several one-dimensional KPZ models on substrates whose size enlarges as 〈L(t)〉=L_{0}+ωt^{γ}, while their mean height 〈h〉 increases as usual [〈h〉∼t]. We show that the competition between the L enlargement and the correlation length (ξ≃ct^{1/z}) plays a key role in the asymptotic statistics of the interfaces. While systems with γ>1/z have HDs given by GUE and the interface width increasing as w∼t^{β}, for γ<1/z the HDs are Gaussian, in a correlated regime where w∼t^{αγ}. For the special case γ=1/z, a continuous class of distributions exists, which interpolate between Gaussian (for small ω/c) and GUE (for ω/c≫1). Interestingly, the HD seems to agree with the Gaussian symplectic ensemble (GSE) TW distribution for ω/c≈10. Despite the GUE HDs for γ>1/z, the spatial covariances present a strong dependence on the parameters ω and γ, agreeing with Airy_{2} only for ω≫1, for a given γ, or when γ=1, for a fixed ω. These results considerably generalize our knowledge on 1D KPZ systems, unveiling the importance of the background space on their statistics.

Kardar-Parisi-Zhang growth on one-dimensional decreasing substrates

Recent experimental works on one-dimensional (1D) circular Kardar-Parisi-Zhang (KPZ) systems whose radii decrease in time have reported controversial conclusions about the statistics of their interfaces. Motivated by this, here we investigate several one-dimensional KPZ models on substrates whose size changes in time as L(t)=L_{0}+ωt, focusing on the case ω<0. From extensive numerical simulations, we show that for L_{0}≫1 there exists a transient regime in which the statistics is consistent with that of flat KPZ systems (the ω=0 case), for both ω<0 and ω>0. Actually, for a given model, L_{0} and |ω|, we observe that a difference between ingrowing (ω<0) and outgrowing (ω>0) systems arises only at long times (t∼t_{c}=L_{0}/|ω|), when the expanding surfaces cross over to the statistics of curved KPZ systems, whereas the shrinking ones become completely correlated. A generalization of the Family-Vicsek scaling for the roughness of ingrowing interfaces is presented. Our results demonstrate that a transient flat statistics is a general feature of systems starting with large initial sizes, regardless of their curvature. This is consistent with their recent observation in ingrowing turbulent liquid crystal interfaces, but it is in contrast with the apparent observation of curved statistics in colloidal deposition at the edge of evaporating drops. A possible explanation for this last result, as a consequence of the very small number of monolayers analyzed in this experiment, is given. This is illustrated in a competitive growth model presenting a few-monolayer transient and an asymptotic behavior consistent, respectively, with the curved and flat statistics.

Temperature behaviour of the average size of nanoparticle lattices co-deposited with an amorphous matrix. Analysis of Ge + Al2O3 and Ni + Al2O3 thin films

We theoretically interpret the thermal behaviour of the average radius versus substrate temperature of regular quantum dot/nanocluster arrays formed by sputtering semiconductor/metal atoms with oxide molecules. The analysis relies on a continuum theory for amorphous films with given surface quantities, perturbed by a nanoparticle lattice. An account of the basic thermodynamic contributions is given in terms of force-flux phenomenological coefficients of each phase (Ge, Ni, Al₂O₃). Average radii turn out to be expressible by a characteristic length scale and a dimensionless parameter, which mainly depend upon temperature through diffusion lengths, film pressures and finite-size corrections to interfacial tensions. The numerical agreement is good in both Ge ([Formula: see text]) and Ni ([Formula: see text]) lattices grown at temperatures [Formula: see text]800 K, despite the lower temperature behaviour of quantum dots seeming to suggest further driving forces taking part in such processes.

Crossover from compact to branched films in electrodeposition with surface diffusion

We study a model for thin film electrodeposition in which instability development by preferential adsorption and reduction of cations at surface peaks competes with surface relaxation by diffusion of the adsorbates. The model considers cations moving in a supported electrolyte, adsorption and reduction when they reach the film surface, and consequent production of mobile particles that execute activated surface diffusion, which is represented by a sequence of random hops to neighboring lattice sites with a maximum of G hop attempts (G≫1), a detachment probability ε<1 per neighboring particle, and a no-desorption condition. Computer simulations show the formation of a compact wetting layer followed by the growth of branched deposits. The maximal thickness z_{c} of that layer increases with G but is weakly affected by ε. A scaling approach describes the crossover from smooth film growth to unstable growth and predicts z_{c}∼G^{γ}, with γ=1/[2(1-ν)]≈0.43, where ν≈0.30 is the inverse of the dynamical exponent of the Villain-Lai-Das Sarma equation that describes the initial roughening. Using previous results for related deposition models, the thickness z_{c} can be predicted as a function of an activation energy for terrace surface diffusion and the temperature, and the small effects of the parameter ε are justified. These predictions are confirmed by the numerical results with good accuracy. We discuss possible applications, with a particular focus on the growth of multifuncional structures with stacking layers of different porosity.

Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces

We present an optimal detrended fluctuation analysis (DFA) and apply it to evaluate the local roughness exponent in nonequilibrium surface growth models with mounded morphology. Our method consists in analyzing the height fluctuations computing the shortest distance of each point of the profile to a detrending curve that fits the surface within the investigated interval. We compare the optimal DFA (ODFA) with both the standard DFA and nondetrended analysis. We validate the ODFA method considering a one-dimensional model in the Kardar-Parisi-Zhang universality class starting from a mounded initial condition. We applied the methods to the Clarke-Vvedensky (CV) model in 2+1 dimensions with thermally activated surface diffusion and absence of step barriers. It is expected that this model belongs to the nonlinear molecular beam epitaxy (nMBE) universality class. However, an explicit observation of the roughness exponent in agreement with the nMBE class was still missing. The effective roughness exponent obtained with ODFA agrees with the value expected for the nMBE class, whereas using the other methods it does not agree. We also characterize the transient anomalous scaling of the CV model and obtained that the corresponding exponent is in agreement with the value reported for other nMBE models with weaker corrections to the scaling.

Effects of film growth kinetics on grain coarsening and grain shape

We study models of grain nucleation and coarsening during the deposition of a thin film using numerical simulations and scaling approaches. The incorporation of new particles in the film is determined by lattice growth models in three different universality classes, with no effect of the grain structure. The first model of grain coarsening is similar to that proposed by Saito and Omura [Phys. Rev. E 84, 021601 (2011)PLEEE81539-375510.1103/PhysRevE.84.021601], in which nucleation occurs only at the substrate, and the grain boundary evolution at the film surface is determined by a probabilistic competition of neighboring grains. The surface grain density has a power-law decay, with an exponent related to the dynamical exponent of the underlying growth kinetics, and the average radius of gyration scales with the film thickness with the same exponent. This model is extended by allowing nucleation of new grains during the deposition, with constant but small rates. The surface grain density crosses over from the initial power law decay to a saturation; at the crossover, the time, grain mass, and surface grain density are estimated as a function of the nucleation rate. The distributions of grain mass, height, and radius of gyration show remarkable power law decays, similar to other systems with coarsening and particle injection, with exponents also related to the dynamical exponent. The scaling of the radius of gyration with the height h relative to the base of the grain show clearly different exponents in growth dominated by surface tension and growth dominated by surface diffusion; thus it may be interesting for investigating the effects of kinetic roughening on grain morphology. In growth dominated by surface diffusion, the increase of grain size with temperature is observed.

Mesoscale pattern formation of self-propelled rods with velocity reversal

We study self-propelled particles with velocity reversal interacting by uniaxial (nematic) alignment within a coarse-grained hydrodynamic theory. Combining analytical and numerical continuation techniques, we show that the physics of this active system is essentially controlled by the reversal frequency. In particular, we find that elongated, high-density, ordered patterns, called bands, emerge via subcritical bifurcations from spatially homogeneous states. Our analysis reveals further that the interaction of bands is weakly attractive and, consequently, bands fuse upon collision in analogy with nonequilibrium nucleation processes. Moreover, we demonstrate that a renormalized positive line tension can be assigned to stable bands below a critical reversal rate, beyond which they are transversally unstable. In addition, we discuss the kinetic roughening of bands as well as their nonlinear dynamics close to the threshold of transversal instability. Altogether, the reduction of the multiparticle system onto the dynamics of bands provides a unified framework to understand the emergence and stability of nonequilibrium patterns in this self-propelled particle system. In this regard, our results constitute a proof of principle in favor of the hypothesis in microbiology that velocity reversal of gliding rod-shaped bacteria regulates the transitions between various self-organized patterns observed during the bacterial life cycle.

Universality and dependence on initial conditions in the class of the nonlinear molecular beam epitaxy equation

We report extensive numerical simulations of growth models belonging to the nonlinear molecular beam epitaxy (nMBE) class, on flat (fixed-size) and expanding substrates (ES). In both d=1+1 and 2+1, we find that growth regime height distributions (HDs), and spatial and temporal covariances are universal, but are dependent on the initial conditions, while the critical exponents are the same for flat and ES systems. Thus, the nMBE class does split into subclasses, as does the Kardar-Parisi-Zhang (KPZ) class. Applying the "KPZ ansatz" to nMBE models, we estimate the cumulants of the 1+1 HDs. Spatial covariance for the flat subclass is hallmarked by a minimum, which is not present in the ES one. Temporal correlations are shown to decay following well-known conjectures.

Width and extremal height distributions of fluctuating interfaces with window boundary conditions

We present a detailed study of squared local roughness (SLRDs) and local extremal height distributions (LEHDs), calculated in windows of lateral size l, for interfaces in several universality classes, in substrate dimensions d_{s}=1 and 2. We show that their cumulants follow a Family-Vicsek-type scaling, and, at early times, when ξ≪l (ξ is the correlation length), the rescaled SLRDs are given by log-normal distributions, with their nth cumulant scaling as (ξ/l)^{(n-1)d_{s}}. This gives rise to an interesting temporal scaling for such cumulants as 〈w_{n}〉_{c}∼t^{γ_{n}}, with γ_{n}=2nβ+(n-1)d_{s}/z=[2n+(n-1)d_{s}/α]β. This scaling is analytically proved for the Edwards-Wilkinson (EW) and random deposition interfaces and numerically confirmed for other classes. In general, it is featured by small corrections, and, thus, it yields exponents γ_{n} (and, consequently, α,β and z) in good agreement with their respective universality class. Thus, it is a useful framework for numerical and experimental investigations, where it is usually hard to estimate the dynamic z and mainly the (global) roughness α exponents. The stationary (for ξ≫l) SLRDs and LEHDs of the Kardar-Parisi-Zhang (KPZ) class are also investigated, and, for some models, strong finite-size corrections are found. However, we demonstrate that good evidence of their universality can be obtained through successive extrapolations of their cumulant ratios for long times and large l. We also show that SLRDs and LEHDs are the same for flat and curved KPZ interfaces.

Smoothening in thin-film deposition on rough substrates

The evolution of the surface roughness W of a thin film deposited on a rough substrate is studied with a model of temperature-activated adatom diffusion, irreversible lateral aggregation, and no step energy barrier, in which the main parameter is the ratio R of diffusion and deposition rates. At sufficiently low temperatures (R≲10), the average number of adatom steps after adsorption is very small, thus W monotonically increases with time t due to an approximately uncorrelated deposition at short times. If the temperature is not very low (R∼10(3) or larger), smoothening occurs at short times and the Villain-Lai-Das Sarma (VLDS) growth equation governs the long time roughening, which is attained after a crossover time t(c) that increases with the correlation length ξ(i) of the substrate. Scaling arguments predict the dependence of t(c) on temperature and on the substrate production time and the scaling relation for the difference between the roughness of films deposited on rough and flat substrates, in good agreement with numerical results. The effect of temperature is not a direct extension of previous results on flat substrates because the short wavelength fluctuations delay the formation of terraces. For this reason, the effective energy obtained from the dependence of t(c) on R is 40% of the energy of activated adatom diffusion. A scaling law for the initial smoothening is proposed as W/W(i)=Ψ(t/t(c1)), with a crossover time t(c1)≡R(-θ)ξ(i)(z), where W(i) is the substrate roughness, θ≈0.4, and z is the VLDS dynamical exponent. It provides good data collapse if W is not very small and is suggested to be tested experimentally.

Roughness reduction of large-area high-quality thick Al films for echelle gratings by multi-step deposition method

Generally, echelle grating ruling is performed on a thick Al film. Consequently, high-quality large-area thick Al films preparation becomes one of the most important factors to realize a high-performance large-size echelle grating. In this paper, we propose a novel multi-step deposition process to improve thick Al films quality. Compared with the traditional single-step deposition process, it is found that the multi-step deposition process can effectively suppress large-size grains growth resulting in a low surface roughness and high internal compactness of thick Al films. The differences between single- and multi-step deposition processes are discussed in detail. By using multi-step deposition process, we prepared high-quality large-area Al films with a thickness more than 10 μm on a 520 mm × 420 mm neoceramic glass substrate.

Transition from compact to porous films in deposition with temperature-activated diffusion

We study a thin-film growth model with temperature activated diffusion of adsorbed particles, allowing for the formation of overhangs and pores, but without detachment of adatoms or clusters from the deposit. Simulations in one-dimensional substrates are performed for several values of the diffusion-to-deposition ratio R of adatoms with a single bond and of the detachment probability ε per additional nearest neighbor, respectively, with activation energies are E(s) and E(b). If R and ε independently vary, regimes of low and high porosity are separated at 0.075≤ε(c)≤0.09, with vanishingly small porosity below that point and finite porosity for larger ε. Alternatively, for fixed values of E(s) and E(b) and varying temperature, the porosity has a minimum at T(c), and a nontrivial regime in which it increases with temperature is observed above that point. This is related to the large mobility of adatoms, resembling features of equilibrium surface roughening. In this high-temperature region, the deposit has the structure of a critical percolation cluster due to the nondesorption. The pores are regions enclosed by blobs of the corresponding percolating backbone, thus the distribution of pore size s is expected to scale as s(-τ̃) with τ̃≈1.45, in reasonable agreement with numerical estimates. Roughening of the outer interface of the deposits suggests Villain-Lai-Das Sarma scaling below the transition. Above the transition, the roughness exponent α≈0.35 is consistent with the percolation backbone structure via the relation α=2-d(B), where d(B) is the backbone fractal dimension.

A bifractal nature of reticular patterns induced by oxygen plasma on polymer films

Plasma etching was demonstrated to be a promising tool for generating self-organized nano-patterns on various commercial films. Unfortunately, dynamic scaling approach toward fundamental understanding of the formation and growth of the plasma-induced nano-structure has not always been straightforward. The temporal evolution of self-aligned nano-patterns may often evolve with an additional scale-invariance, which leads to breakdown of the well-established dynamic scaling law. The concept of a bifractal interface is successfully applied to reticular patterns induced by oxygen plasma on the surface of polymer films. The reticular pattern, composed of nano-size self-aligned protuberances and underlying structure, develops two types of anomalous dynamic scaling characterized by super-roughening and intrinsic anomalous scaling, respectively. The diffusion and aggregation of short-cleaved chains under the plasma environment are responsible for the regular distribution of the nano-size protuberances. Remarkably, it is uncovered that the dynamic roughening of the underlying structure is governed by a relaxation mechanism described by the Edwards-Wilkinson universality class with a conservative noise. The evidence for the basic phase, characterized by the negative roughness and growth exponents, has been elusive since its first theoretical consideration more than two decades ago.

Skewness in (1+1)-dimensional Kardar-Parisi-Zhang-type growth

We use the (1+1)-dimensional Kardar-Parisi-Zhang equation driven by a Gaussian white noise and employ the dynamic renormalization-group of Yakhot and Orszag without rescaling [J. Sci. Comput. 1, 3 (1986)]. Hence we calculate the second- and third-order moments of height distribution using the diagrammatic method in the large-scale and long-time limits. The moments so calculated lead to the value S=0.3237 for the skewness. This value is comparable with numerical and experimental estimates.

Nonuniversal effects in mixing correlated-growth processes with randomness: interplay between bulk morphology and surface roughening

To construct continuum stochastic growth equations for competitive nonequilibrium surface-growth processes of the type RD+X that mixes random deposition (RD) with a correlated-growth process X, we use a simplex decomposition of the height field. A distinction between growth processes X that do and do not create voids in the bulk leads to the definition of the effective probability p(eff) of the process X that is a measurable property of the bulk morphology and depends on the activation probability p of X in the competitive process RD+X. The bulk morphology is reflected in the surface roughening via nonuniversal prefactors in the universal scaling of the surface width that scales in p(eff). The equation and the resulting scaling are derived for X in either a Kardar-Parisi-Zhang or Edwards-Wilkinson universality class in (1+1) dimensions and are illustrated by an example of X being a ballistic deposition. We obtain full data collapse on its corresponding universal scaling function for all p∈(0;1]. We outline the generalizations to (1+n) dimensions and to many-component competitive growth processes.

Scaling in complex systems: a link between the dynamics of networks and growing interfaces

We consider growing interfaces as dynamical networks whose nodes are the discrete points of the interface and the edges the physical interactions among them. We map the points of the interface formed at each time into a graph by means of a visibility algorithm. As the corresponding interfaces grow, their visibility graphs change over time. We show that the visibility graphs are all scale free for each time. We use the variance of the node degrees as a measure of the dynamical properties of these graphs. This magnitude reveals an unexpected scaling behaviour of these graphs in both the number of nodes and time. This enables to define three robust exponents that characterize any type of dynamics with more detail than the classical scaling analysis applied directly to the physical interfaces. To check the feasibility of this approach we study and classify six different dynamical processes and estimate their critical exponents. We conclude that the dynamics of physical systems far from equilibrium can be determined by its corresponding visibility network. Indeed, this methodology is able to discern among dynamical processes that hitherto have been classified in the same universality class according to the scaling analysis of their interfaces.

A brief review of mathematical models of thin film growth and surfaces. A possible route to avoid defects in stents

The morphology of thin films has been extensively studied in the last years. The properties of a thin film are closely related to its microstructure, especially to its morphology and surface roughness. Optical reflectivity, conductivity, and porosity are characteristics that depend on the film structure. The knowledge of atomistic details of the thin film growth process is useful for the development of new techniques and the control of thin films and new materials. Models of growth process are very powerful tools that can help researchers to predict and control physical, chemical, and mechanical properties. In this work we briefly summarize the theoretical models that have been used in the studies of thin films growth. By describing the deposition process of atoms/molecules on the surface of the substrate, one can study the evolution of the bulk and the surface roughness of a thin film. If an experimental growth process is appropriately described by a theoretical model (or even a combination of one or more different models), it can also provide indications to control the surface roughness and porosity of the film. Controlling the growth process one can obtain materials with a set of desired properties, namely tribological, porosity, and electrical ones. These characteristics are necessary for example, for hosting a solid lubricant on the surface of the material. We believe that the models presented in this work can be very useful in understanding the mechanisms of control and adherence of electrodeposited films which are commonly used in medical applications such as stent devices. We also believe that the models can be helpful to the understanding surface problems related to the superficial defects in stents.

Crystal growth from a supersaturated melt: relaxation of the solid-liquid dynamic stiffness

We discuss the growth process of a crystalline phase out of a metastable over-compressed liquid that is brought into contact with a crystalline substrate. The process is modeled by means of molecular dynamics. The particles interact via the Lennard-Jones potential and their motion is locally thermalized by Langevin dynamics. We characterize the relaxation process of the solid-liquid interface, showing that the growth speed is maximal for liquid densities above the solid coexistence density, and that the structural properties of the interface rapidly converge to equilibrium-like properties. In particular, we show that the off-equilibrium dynamic stiffness can be extracted using capillary wave theory arguments, even if the growth front moves fast compared to the typical diffusion time of the compressed liquid, and that the dynamic stiffness converges to the equilibrium stiffness in times much shorter than the diffusion time.

Local diffusion induced roughening in cobalt phthalocyanine thin film growth

We have studied the kinetic roughening in the growth of cobalt phthalocyanine (CoPc) thin films grown on SiO2/Si(001) surfaces as a function of the deposition time and the growth temperature using atomic force microscopy (AFM). We have observed that the growth exhibits the formation of irregular islands, which grow laterally as well as vertically with coverage of CoPc molecules, resulting rough film formation. Our analysis further disclosed that such formation is due to an instability in the growth induced by local diffusion of the molecules following an anomalous scaling behavior. The instability relates the (ln(t))(1/2), with t as deposition time, dependence of the local surface slope as described in nonequilibrium film growth. The roughening has been characterized by calculating different scaling exponents α, β, and 1/z determined from the height fluctuations obtained from AFM images. We obtained an average roughness exponent α = 0.78 ± 0.04. The interface width (W) increases following a power law as W ∼ t(β), with growth exponent β = 0.37 ± 0.05 and lateral correlation length (ξ) grows as ξ ∼ t(1/z) with dynamic exponent 1/z = 0.23 ± 0.06. The exponents revealed that the growth belongs to a different class of universality.

Driven surface diffusion with detailed balance and elastic phase transitions

Driven surface diffusion occurs, for example, in molecular beam epitaxy when particles are deposited under an oblique angle. Elastic phase transitions happen when normal modes in crystals become soft due to the vanishing of certain elastic constants. We show that these seemingly entirely disparate systems fall under appropriate conditions into the same universality class. We derive the field-theoretic Hamiltonian for this universality class, and we use renormalized field theory to calculate critical exponents and logarithmic corrections for several experimentally relevant quantities.

Strong anisotropy in two-dimensional surfaces with generic scale invariance: nonlinear effects

We expand a previous study [Phys. Rev. E 86, 051611 (2012)] on the conditions for occurrence of strong anisotropy in the scaling properties of two-dimensional surfaces displaying generic scale invariance. In that study, a natural scaling ansatz was proposed for strongly anisotropic systems, which arises naturally when analyzing data from, e.g., thin-film production experiments. The ansatz was tested in Gaussian (linear) models of surface dynamics and in nonlinear models, like the Hwa-Kardar (HK) equation [Phys. Rev. Lett. 62, 1813 (1989)], which are susceptible of accurate approximations through the former. In contrast, here we analyze nonlinear equations for which such approximations fail. Working within generically scale-invariant situations, and as representative case studies, we formulate and study a generalization of the HK equation for conserved dynamics and reconsider well-known systems, such as the conserved and the nonconserved anisotropic Kardar-Parisi-Zhang equations. Through the combined use of dynamic renormalization group analysis and direct numerical simulations, we conclude that the occurrence of strong anisotropy in two-dimensional surfaces requires dynamics to be conserved. We find that, moreover, strong anisotropy is not generic in parameter space but requires, rather, specific forms of the terms appearing in the equation of motion, whose justification needs detailed information on the dynamical process that is being modeled in each particular case.

Roughening in electronic growth of Ag on Si(111)-(7×7) surfaces

Roughening in the electronic growth of Ag films on Si(111)-(7×7) surfaces for a film thickness ranging from 1 to 30 monolayers is reported. Ag films exhibit the growth of flat-top plateaus of preferential heights due quantum electronic effect. We have observed roughening of the film growth due to instability with linear diffusion characterized by the ln(θ)(1/2) dependence of the local surface slope, where θ is the Ag coverage. The roughening of the surface morphology has been characterized by scaling exponents α, β and 1/z, which are determined using scanning tunneling microscopy. Increased value of α = 0.67 ± 0.04 at the early stage of the electronic growth with two atomic layer height flat-top isolated Ag mounds to 0.77 ± 0.06 at the later stage of the growth when isolated mounds coalesce and form percolated structures maintaining preferential heights of an even number of atomic layers in the Ag mounds indicates the instability in the electronic growth. As a result, interface width W increases as a power law of coverage (θ), W ∼ θ(β), with growth exponent β = 0.33 ± 0.03, and lateral correlation length ξ grows as ξ ∼ θ(1/z) with 1/z = 0.27 ± 0.05.

Intermediate asymptotics of the capillary-driven thin-film equation

We present an analytical and numerical study of the two-dimensional capillary-driven thin-film equation. In particular, we focus on the intermediate asymptotics of its solutions. Linearising the equation enables us to derive the associated Green's function and therefore obtain a complete set of solutions. Moreover, we show that the rescaled solution for any summable initial profile uniformly converges in time towards a universal self-similar attractor that is precisely the rescaled Green's function. Finally, a numerical study on compact-support initial profiles enables us to conjecture the extension of our results to the nonlinear equation.

Normal dynamic scaling in the class of the nonlinear molecular-beam-epitaxy equation

The scaling of local height fluctuations is studied numerically in lattice growth models of the class of the nonlinear stochastic equation of Villain-Lai-Das Sarma (VLDS) in substrate dimensions d=1 and 2. In d=1, the average local slopes of the conserved restricted solid-on-solid (CRSOS) models converge to a finite value in the long-time limit, with power-law corrections in time whose exponents are close to 0.1. Other VLDS models in d=1, such as that of Das Sarma and Tamborenea, show a divergence of local slopes up to 10(6) monolayers, typical of anomalous roughening, but a comparison of roughness distributions shows that they scale as the linear fourth-order growth equation in those time scales. Normal scaling is also obtained in a modified VLDS equation with instability suppression, in contrast to recent numerical works. In d=2, a CRSOS model and a model with lateral aggregation of diffusing particles show normal scaling of the local slopes, also with small correction exponents. These results consistently show that the VLDS class has normal dynamic scaling in d=1 and 2, in agreement with the theoretical predictions of Phys. Rev. Lett. 94, 166103 (2005), and they show that the apparently anomalous features observed in previous works are effects of large scaling correction terms or crossover effects.

Nonequilibrium cluster diffusion during growth and evaporation in two dimensions

The diffusion of growing or evaporating two-dimensional clusters is investigated. At equilibrium, it is well known that the mean square displacement (MSD) of the cluster center of mass is linear in time. In nonequilibrium conditions, we find that the MSD exhibits a nonlinear time dependence, leading to three regimes: (i) during curvature-driven evaporation, the MSD shows a square-root singularity close to the collapse time; (ii) in slow growth or evaporation, the dynamics is in the Edwards-Wilkinson universality class, and the MSD shows a logarithmic behavior; (iii) far from equilibrium, the dynamics belongs to the Kardar-Parisi-Zhang universality class and the MSD shows a power-law behavior with a characteristic exponent 1/3. These results agree with kinetic Monte Carlo simulations, and can be generalized to other universality classes.