Unambiguous interpretation of atomically resolved force microscopy images of an insulator

Probing the Nature of Chemical Bonds by Atomic Force Microscopy

The nature of the chemical bond is important in all natural sciences, ranging from biology to chemistry, physics and materials science. The atomic force microscope (AFM) allows to put a single chemical bond on the test bench, probing its strength and angular dependence. We review experimental AFM data, covering precise studies of van-der-Waals-, covalent-, ionic-, metallic- and hydrogen bonds as well as bonds between artificial and natural atoms. Further, we discuss some of the density functional theory calculations that are related to the experimental studies of the chemical bonds. A description of frequency modulation AFM, the most precise AFM method, discusses some of the experimental challenges in measuring bonding forces. In frequency modulation AFM, forces between the tip of an oscillating cantilever change its frequency. Initially, cantilevers were made mainly from silicon. Most of the high precision measurements of bonding strengths by AFM became possible with a technology transfer from the quartz watch technology to AFM by using quartz-based cantilevers ("qPlus force sensors"), briefly described here.

Role of tip apices in scanning force spectroscopy on alkali halides at room temperature-chemical nature of the tip apex and atomic-scale deformations

We have revealed processes of the tip apex distortion in the measurements of non-contact scanning force microscopy. High-spatial-resolution two-dimensional force mapping on KCl(100) surfaces for a large number of tips, seven tips, enabled us to see the complex behavior of the tip apex distortion. The tips are from Si without additional coating, but are altered by the tip-sample interaction and show the behavior of different atomic species. On the KCl(001) surfaces, the tip apex, consisting of K and Cl atoms or of Si, distorted several times while changing the distance even in a weak attractive region. There are variations in rigidity of the tip apex, but all tips distorted in the small attractive region. This complex behavior was categorized in patterns by our analyses. We compare the experimental force-distance data to atomistic simulations using rigid KCl-terminated tips and KCl-terminated tips with an additional KCl-pair designed to perform atomic jumps. We also compare the experimental force-distance data to first principles simulations using Si tips. We mainly find K-terminated tips and Si-terminated tips. We find that Si tips show only one force minimum whereas KCl-terminated tips show two force minima in line with the stronger rigidity of Si compared to KCl. At room temperature, the tip apex atoms can perform atomic jumps that change the atomic configuration of the tip apex.

Electrostatic forces above graphene nanoribbons and edges interpreted as partly hydrogen-free

Graphene nanoribbons' electronic transport properties strongly depend on the type of edge, armchair, zigzag or other, and on edge functionalization that can be used for band-gap engineering. For only partly hydrogenated edges interesting magnetic properties are predicted. Electric charge accumulates at edges and corners. Scanning force microscopy has so far shown the centre of graphene nanoribbons with atomic resolution using a quartz crystal tuning fork sensor of high stiffness. Weak long-range electrostatic forces related to the charge accumulation on the edges of graphene nanoribbons could not be imaged so far. Here, we show the electrostatic forces at the corners and edges of graphene nanoribbons are amenable to measurement. We use soft cantilevers and a bimodal imaging technique to combine enhanced sensitivity to weak long-range electrostatic forces with the high resolution of the second-frequency shift. Additionally, in our work the edges of the nanoribbons are mainly hydrogen-free, opening to the route to investigations of partly hydrogenated magnetic nanoribbons.

Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip

Terminating the tip of an atomic force microscope with a CO molecule allows data to be acquired with a well-known and inert apex. Previous studies have shown conflicting results regarding the electrostatic interaction, indicating in some cases that the negative charge at the apex of the CO dominates, whereas in other cases the positive charge at the end of the metal tip dominates. To clarify this, we investigated [Formula: see text](111). [Formula: see text] is an ionic crystal and the (111) surface does not possess charge inversion symmetry. Far from the surface, the interaction is dominated by electrostatics via the negative charge at the apex. Closer to the surface, Pauli repulsion and CO bending dominate, which leads to an unexpected appearance of the complex 3-atom unit cell. We compare simulated data in which the electrostatics are modeled by point particles versus a charge density calculated by DFT. We also compare modeling Pauli repulsion via individual Lennard-Jones potentials versus a total charge density overlap. In doing so, we determine forcefield parameters useful for future investigations of biochemical processes.

Chemical Identification of the Foremost Tip Atom in Atomic Force Microscopy

Chemical identification of individual surface atoms has been achieved by measuring the chemical bonds between tip and surface atoms using atomic force microscopy. On the other hand, the discrimination of chemical species at the tip apex is still a challenging task, even though the differences of the species have significant effects on atomic-scale contrast and atom manipulation. Here, we perform the chemical identification of a foremost tip atom using bond energies measured on precharacterized atomic species on a Si surface. We find that chemically different tips show different trends in the chemical bond energy on the sites and that Pauling's equation for polar covalent bonds well describes those trends. On the basis of this knowledge, in situ chemical identification becomes possible. Using the chemically identified (here, Si and Al) tips, we determine the electronegativity of locally formed silicon oxide solely by experiments. Previously such determination was difficult without the help of theoretical calculations. These successful results confirm the validity and versatility of Pauling's equation for application to atomic-scale objects.

Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules. The advent of using molecular-modified tips in noncontact atomic force microscopy (nc-AFM) has made it possible to image (planar) molecules with atomic resolution. However, the mechanisms responsible for elemental contrast with passivated tips are not fully understood. Here, we investigate elemental contrast by carrying out both nc-AFM and Kelvin probe force microscopy (KPFM) experiments on epitaxial monolayer hexagonal boron nitride (hBN) on Ir(111). The hBN overlayer is inert, and the in-plane bonds connecting nearest-neighbor boron and nitrogen atoms possess strong covalent character and a bond length of only ∼1.45 Å. Nevertheless, constant-height maps of both the frequency shift Δ f and the local contact potential difference exhibit striking sublattice asymmetry. We match the different atomic sites with the observed contrast by comparison with nc-AFM image simulations based on the density functional theory optimized hBN/Ir(111) geometry, which yields detailed information on the origin of the atomic-scale contrast.

Water wettability of graphene: interplay between the interfacial water structure and the electronic structure

Wetting phenomena are ubiquitous and impact a wide range of applications. Simulations so far have largely relied on classical potentials. Here, we report the development of an approach that combines density-functional theory (DFT)-based calculations with classical wetting theory that allows practical but sufficiently accurate determination of the water contact angle (WCA). As a benchmark, we apply the approach to the graphene and graphite surfaces that recently received considerable attention. The results agree with and elucidate the experimental data. For metal-supported graphene where electronic interactions play a major role, we demonstrate that doping of graphene by the metal substrate significantly alters the wettability. In addition to theory, we report new experimental measurements of the WCA and the force of adhesion that corroborate the theoretical results. We demonstrate a correlation between the force of adhesion and WCA, and the use of the atomic force microscope (AFM) technique as an alternative measure for wettability at the nanoscale. The present work not only provides a detailed understanding of the wettability of graphene, including the role of electrons, but also sets the stage for studying the wettability alteration mechanism when sufficiently accurate force fields may not be available.

Imaging prototypical aromatic molecules on insulating surfaces: a review

Insulating substrates allow for in-plane contacted molecular electronics devices where the molecule is in contact with the insulator. For the development of such devices it is important to understand the interaction of molecules with insulating surfaces. As substrates, ionic crystals such as KBr, KCl, NaCl and CaF₂ are discussed. The surface energies of these substrates are small and as a consequence intrinsic properties of the molecules, such as molecule-molecule interaction, become more important relative to interactions with the substrates. As prototypical molecules, three variants of graphene-related molecules are used, pentacene, [Formula: see text] and PTCDA. Pentacene is a good candidate for molecular electronics applications due to its high charge carrier mobility. It shows mainly an upright standing growth mode and the morphology of the islands is strongly influenced by dewetting. A new second flat-lying phase of the molecule has been observed. Studying the local work function using the Kelvin method reveals details such as line defects in the center of islands. The local work function differences between the upright-standing and flat-lying phase can only be explained by charge transfer that is unusual on ionic crystalline surfaces. [Formula: see text] nucleation and growth is explained by loosely bound molecules at kink sites as nucleation sites. The stability of [Formula: see text] islands as a function of magic numbers is investigated. Peculiar island shapes are obtained from unusual dewetting processes already at work during growth, where molecules 'climb' to the second molecular layer. PTCDA is a prototypical semiconducting molecule with strong quadrupole moment. It grows in the form of elongated islands where the top and the facets can be molecularly resolved. In this way the precise molecular arrangement in the islands is revealed.

Influence of ions on two-dimensional and three-dimensional atomic force microscopy at fluorite-water interfaces

Recent advancement in liquid-environment atomic force microscopy (AFM) has enabled us to visualize three-dimensional (3D) hydration structures as well as two-dimensional (2D) surface structures with subnanometer-scale resolution at solid-water interfaces. However, the influence of ions present in solution on the 2D- and 3D-AFM measurements has not been well understood. In this study, we perform atomic-scale 2D- and 3D-AFM measurements at fluorite-water interfaces in pure water and a supersaturated solution of fluorite. The images obtained in these two environments are compared to understand the influence of the ions in solution on these measurements. In the 2D images, we found clear difference in the nanoscale structures but no significant difference in the atomic-scale contrasts. However, the 3D force images show clear difference in the subnanometer-scale contrasts. The force contrasts measured in pure water largely agree with those expected from the molecular dynamics simulation and the solvent tip approximation model. In the supersaturated solution, an additional force peak is observed over the negatively charged fluorine ion site. This location suggests that the observed force peak may originate from cations adsorbed on the fluorite surface. These results demonstrate that the ions can significantly alter the subnanometer-scale force contrasts in the 3D-AFM images.

Chemical Identification at the Solid-Liquid Interface

Solid-liquid interfaces are decisive for a wide range of natural and technological processes, including fields as diverse as geochemistry and environmental science as well as catalysis and corrosion protection. Dynamic atomic force microscopy nowadays provides unparalleled structural insights into solid-liquid interfaces, including the solvation structure above the surface. In contrast, chemical identification of individual interfacial atoms still remains a considerable challenge. So far, an identification of chemically alike atoms in a surface alloy has only been demonstrated under well-controlled ultrahigh vacuum conditions. In liquids, the recent advent of three-dimensional force mapping has opened the potential to discriminate between anionic and cationic surface species. However, a full chemical identification will also include the far more challenging situation of alike interfacial atoms (i.e., with the same net charge). Here we demonstrate the chemical identification capabilities of dynamic atomic force microscopy at solid-liquid interfaces by identifying Ca and Mg cations at the dolomite-water interface. Analyzing site-specific vertical positions of hydration layers and comparing them with molecular dynamics simulations unambiguously unravels the minute but decisive difference in ion hydration and provides a clear means for telling calcium and magnesium ions apart. Our work, thus, demonstrates the chemical identification capabilities of dynamic AFM at the solid-liquid interface.

Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite

A material's ability to interact with approaching matter is governed by the structural and chemical nature of its surfaces. Tailoring surfaces to meet specific needs requires developing an understanding of the underlying fundamental principles that determine a surface's reactivity. A particularly insightful case occurs when the surface site exhibiting the strongest attraction changes with distance. To study this issue, combined noncontact atomic force microscopy and scanning tunneling microscopy experiments have been carried out, where the evolution of the local chemical interaction with distance leads to a contrast reversal in the force channel. Using highly ordered pyrolytic graphite surfaces and metallic probe tips as a model system, we find that at larger tip-sample distances, carbon atoms exhibit stronger attractions than hollow sites while upon further approach, hollow sites become energetically more favorable. For the tunneling current that is recorded at large tip-sample separations during acquisition of a constant-force image, the contrast is dominated by the changes in tip-sample distance required to hold the force constant ('cross-talk'); at smaller separations the contrast turns into a convolution of this cross-talk and the local density of states. Analysis shows that the basic factors influencing the force channel contrast reversal are locally varying decay lengths and an onset of repulsive forces that occurs for distinct surface sites at different tip-sample distances. These findings highlight the importance of tip-sample distance when comparing the relative strength of site-specific chemical interactions.

A relationship between three-dimensional surface hydration structures and force distribution measured by atomic force microscopy

Hydration plays important roles in various solid-liquid interfacial phenomena. Very recently, three-dimensional scanning force microscopy (3D-SFM) has been proposed as a tool to visualise solvated surfaces and their hydration structures with lateral and vertical (sub) molecular resolution. However, the relationship between the 3D force map obtained and the equilibrium water density, ρ(r), distribution above the surface remains an open question. Here, we investigate this relationship at an interface of an inorganic mineral, fluorite, and water. The force maps measured in pure water are directly compared to force maps generated using the solvent tip approximation (STA) model and from explicit molecular dynamics simulations. The results show that the simulated STA force map describes the major features of the experimentally obtained force image. The agreement between the STA data and the experiment establishes the correspondence between the water density used as an input to the STA model and the experimental hydration structure and thus provides a tool to bridge the experimental force data and atomistic solvation structures. Further applications of this method should improve the accuracy and reliability of both interpretation of 3D-SFM force maps and atomistic simulations in a wide range of solid-liquid interfacial phenomena.

Coherent diffractive imaging: towards achieving atomic resolution

The next generation of X-ray sources will feature highly brilliant X-ray beams that will enable the imaging of local nanoscale structures with unprecedented resolution. A general formalism to predict the achievable spatial resolution in coherent diffractive imaging, based solely on diffracted intensities, is provided. The coherent dose necessary to reach atomic resolution depends significantly on the atomic scale structure, where disordered or amorphous materials require roughly three orders of magnitude lower dose compared with the expected scaling of uniform density materials. Additionally, dose reduction for crystalline materials are predicted at certain resolutions based only on their unit-cell dimensions and structure factors.

Structural development and energy dissipation in simulated silicon apices

In this paper we examine the stability of silicon tip apices by using density functional theory (DFT) calculations. We find that some tip structures - modelled as small, simple clusters - show variations in stability during manipulation dependent on their orientation with respect to the sample surface. Moreover, we observe that unstable structures can be revealed by a characteristic hysteretic behaviour present in the F(z) curves that were calculated with DFT, which corresponds to a tip-induced dissipation of hundreds of millielectronvolts resulting from reversible structural deformations. Additionally, in order to model the structural evolution of the tip apex within a low temperature NC-AFM experiment, we simulated a repeated tip-surface indentation until the tip structure converged to a stable termination and the characteristic hysteretic behaviour was no longer observed. Our calculations suggest that varying just a single rotational degree of freedom can have as measurable an impact on the tip-surface interaction as a completely different tip structure.

Systematic study of the dolomite (104) surface by bimodal dynamic force microscopy in ultra-high vacuum

We have investigated the morphology and structure of dolomite MgCa(CO(3))(2)(104) surfaces by bimodal dynamic force microscopy with flexural and torsional resonance modes in ultra-high vacuum at room temperature. We found that the surface slowly decomposes by degassing CO(2) in a vacuum and becomes covered by amorphous clusters, presumably MgO and CaO. By choosing an optimal sample preparation procedure (i.e. cleaving in a vacuum and mild annealing for stabilizing clusters for a short time), atomically clean surfaces were obtained. The complex tip-sample interaction, arising from carbonate groups and Mg and Ca atoms of the surface, induces a large variety of atomic-scale imaging features.

Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations

Three-dimensional dynamic force spectroscopy measurements were carried out above KBr(001) at low temperature in order to investigate the distance dependence of the tip-sample interactions. In particular, the recorded 3D frequency shift data as well as the extracted interaction force and potential energy fields were analysed with respect to influences of tip and/or sample deformations. We found that a postprocessing correction of the observed deformations significantly modifies the magnitude of the extracted interaction forces and also the image contrast.

Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field

Non-contact atomic force microscopy is used to measure the 3D force field on a dense-packed Cu(111) surface. An unexpected image contrast reversal is observed as the tip is moved towards the surface, with atoms appearing first as bright spots, whereas hollow and bridge sites turn bright at smaller tip-sample distances. Computer modeling is used to elucidate the nature of the image contrast. We find that the contrast reversal is essentially a geometrical effect, which, unlike in gold, is observable in Cu due to an unusually large stability of the tip-sample junction over large distances.

Models of the interaction of metal tips with insulating surfaces

We present the results of atomistic simulations of metallic atomic-force-microscopy tips interacting with ionic substrates, with atomic resolution. Chromium and tungsten tips are used to image the NaCl(001) and MgO(001) surfaces. The interaction of the tips with the surface is simulated by using density-functional-theory calculations employing a mixed Gaussian and plane-wave basis and cluster-tip models. In each case, the apex of the metal cluster interacts more attractively with anions in the surfaces than with cations, over the range of typical imaging distances, which leads to these sites being imaged as raised features (bright) in constant-frequency-shift images. We compare the results of the interaction of a chromium tip with the NaCl surface, with calculations employing exclusively plane-wave basis sets and a fully periodic tip model, and demonstrate that the electronic structure of the tip model employed can have a significant quantitative effect on calculated forces when the tip and surface are clearly separated.

'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study

A Si adatom on a Si(111)-(7 × 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

Stable cation inversion at the MgAl2O4(100) surface

From an interplay of atom-resolved noncontact atomic force microscopy, surface x-ray diffraction experiments, and density functional theory calculations, we reveal the detailed atomic-scale structure of the (100) surface of an insulating ternary metal oxide, MgAl2O4 (spinel). We surprisingly find that the MgAl2O4(100) surface is terminated by an Al and O-rich structure with a thermodynamically favored amount of Al atoms interchanged with Mg. This finding implies that so-called Mg-Al antisites, which are defects in the bulk of MgAl2O4, become a thermodynamically stable and integral part of the surface.

Recent trends in surface characterization and chemistry with high-resolution scanning force methods

The current status and future prospects of non-contact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin insulating films in high resolution are discussed. The rapid development of these techniques and their use in combination with other scanning probe microscopy methods over the last few years has made them increasingly relevant for studying, controlling, and functionalizing the surfaces of many key materials. After introducing the instruments and the basic terminology associated with them, state-of-the-art experimental and theoretical studies of insulating surfaces and thin films are discussed, with specific focus on defects, atomic and molecular adsorbates, doping, and metallic nanoclusters. The latest achievements in atomic site-specific force spectroscopy and the identification of defects by crystal doping, work function, and surface charge imaging are reviewed and recent progress being made in high-resolution imaging in air and liquids is detailed. Finally, some of the key challenges for the future development of the considered fields are identified.

Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces

In the last two decades the atomic force microscope (AFM) has become the premier tool for topographical analysis of surface structures at the nanometre scale. In its ultimately sensitive implementation, namely dynamic scanning force microscopy (SFM) operated in the so-called non-contact mode (NC-AFM), this technique yields genuine atomic resolution and offers a unique tool for real space atomic-scale studies of surfaces, nanoparticles as well as thin films, single atoms and molecules on surfaces irrespective of the substrate being electrically conducting or non-conducting. Recent advances in NC-AFM have paved the way for groundbreaking atomic level insight into insulator surfaces, specifically in the most important field of metal oxides. NC-AFM imaging now strongly contributes to our understanding of the surface structure, chemical composition, defects, polarity and reactivity of metal oxide surfaces and related physical and chemical surface processes. Here we review the latest advancements in the field of NC-AFM applied to the fundamental atomic resolution studies of clean single crystal metal oxide surfaces with special focus on the representative materials Al(2)O(3)(0001), TiO(2)(110), ZnO(1000) and CeO(2)(111).

Structure and stability of semiconductor tip apexes for atomic force microscopy

The short range force between the tip and the surface atoms, that is responsible for atomic-scale contrast in atomic force microscopy (AFM), is mainly controlled by the tip apex. Thus, the ability to image, manipulate and chemically identify single atoms in semiconductor surfaces is ultimately determined by the apex structure and its composition. Here we present a detailed and systematic study of the most common structures that can be expected at the apex of the Si tips used in experiments. We tackle the determination of the structure and stability of Si tips with three different approaches: (i) first principles simulations of small tip apexes; (ii) simulated annealing of a Si cluster; and (iii) a minima hopping study of large Si tips. We have probed the tip apexes by making atomic contacts between the tips and then compared force-distance curves with the experimental short range forces obtained with dynamic force spectroscopy. The main conclusion is that although there are multiple stable solutions for the atomically sharp tip apexes, they can be grouped into a few types with characteristic atomic structures and properties. We also show that the structure of the last atomic layers in a tip apex can be both crystalline and amorphous. We corroborate that the atomically sharp tips are thermodynamically stable and that the tip-surface interaction helps to produce the atomic protrusion needed to get atomic resolution.

Site-specific force-vector field studies of KBr(001) by atomic force microscopy

The spatial orientation and magnitude of forces acting between the tip atoms of an atomic force microscope tip and the surface atoms of an atomically clean surface can be determined by force field measurements. We compare two force-vector fields obtained along and between the ionic lattice sites of a KBr(001) surface with atomistic simulations for two differently configured tips. This careful analysis allows us to identify the K(+)-termination of the tip apex as well as the polarity of the KBr lattice.

True atomic-resolution imaging of (1014) calcite in aqueous solution by frequency modulation atomic force microscopy

Calcite (CaCO3) is one of the most abundant minerals on earth and plays an important role in a wide range of different fields including, for example, biomineralization and environmental geochemistry. Consequently, surface processes and reactions such as dissolution and growth as well as (macro)molecule adsorption are of greatest interest for both applied as well as fundamental research. An in-depth understanding of these processes requires knowledge about the detailed surface structure in its natural state which is quite often a liquid environment. We have studied the most stable cleavage plane of calcite under liquid conditions using frequency modulation atomic force microscopy. Using this technique, we achieved true atomic-resolution imaging, demonstrating the high-resolution capability of frequency modulation atomic force microscopy in liquids. We could reproduce contrast features reported before using contact mode atomic force microscopy, originating from the protruding oxygen atom of the carbonate groups. Besides this contrast, however, our results, indeed, indicate that we obtain more detailed structural information, revealing the calcium sublattice of the (1014) cleavage plane.

Atomic-scale force-vector fields

The magnitude and direction of forces acting between individual atoms as a function of their relative position can be described by atomic-scale force-vector fields. We present a noncontact atomic force microscopy based determination of the force fields between an atomically sharp tip and the (001) surface of a KBr crystal in conjunction with atomistic simulations. The direct overlap of experiment and simulation allows identification of the frontmost tip atom and of the surface sublattices. Superposition of vertical and lateral forces reveals the spatial orientation of the interatomic force vectors.

Atomic scale Kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface

From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.

Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy

Atomic force microscopy in the non-contact mode (nc-AFM) can provide atom-resolved images of the surface of, in principle, any material independent of its conductivity. Due to the complex mechanisms involved in the contrast formation in nc-AFM imaging, it is, however, far from trivial to identify individual surface atoms or adsorbates from AFM images. In this work, we successfully demonstrate how to extract detailed information about defects and the chemical identity of adsorbates on a metal oxide surface from nc-AFM images. We make use of the observation that the apex of the AFM tip can be altered to expose either a positive or negative tip termination. The complementary set of images recorded with the two tip terminations unambiguously define the ionic sub-lattices and reveal the exact positions of oxygen vacancies and hydroxyl (OH) defects on a TiO(2) surface. Chemical specificity is extracted by comparing the characteristic contrast patterns of the defects with results from comprehensive AFM simulations. Our methodology of analysis is generally applicable and may be pivotal for uncovering surface defects and adsorbates on other transition metal oxides designed for heterogeneous catalysis, photo-electrolysis or biocompatibility.

Differentiation of molecules in a mixed self-assembled monolayer of H-and Cl-terminated bicyclo[2.2.2]octane derivatives

H- and Cl-terminal groups of bicyclo[2.2.2]octane (BCO) derivatives in a mixed self-assembled monolayer (SAM) on Au(111) were imaged using a modified Si tip with a CaF(2) nanocluster to differentiate the two terminals, which have different electronegativities. In order to achieve this we fabricated a new sample holder, on which a CaF(2) single crystal and the mixed SAM on Au(111) could be mounted side by side. We transferred the holder with the two samples into a ultrahigh vacuum (UHV) atomic force microscopy (AFM) chamber. Upon cleaving the CaF(2) single crystal under UHV, a fresh and clean CaF(2)(111) surface parallel with the SAM surface appeared within 2 mm of the separation. The modified Si tip was prepared by repeatedly making contact between a Si tip and the CaF(2)(111) surface. The resulting modified tip could image the atomic periodicity of a Ca(2+) and an F(-) sublattice on the CaF(2)(111) surface depending on the sign of the tip-terminating ion, i.e. an F(-) and a Ca(2+) ion, respectively, as reported previously (Foster et al 2002 Phys. Rev. B 66 235417). Using the modified Si tip with the known tip-terminating ion, we observed the Cl-terminal in the surrounding H-terminals in the mixed SAM by noncontact (NC) AFM. Here, the Cl-terminal is negatively charged due to its electronegativity and thus the BCO moiety with the Cl-terminal is terminated by a C(δ+)-Cl(δ-) permanent dipole, while the H-terminal is almost neutral. The Cl-terminal appeared brighter (more attractive) and darker (more repulsive) than the surrounding H-terminals in NC-AFM images depending on the sign of the tip-terminating ion, i.e. a Ca(2+) and an F(-) on the modified tip, respectively, although the relationship between the image contrast and the sign of the tip-terminating ion was not always perfect because of the instability of the tip-terminating ion on the nanocluster. The present method can be used to distinguish terminal groups with different electronegativities.

Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope

Frequency-modulated atomic force microscopy (FM-AFM; also called non-contact atomic force microscopy) is the prevailing operation mode in (sub-)atomic resolution vacuum applications. A major obstacle that prohibits a wider application range is the low frame capture rate. The speed of FM-AFM is limited by the low bandwidth of the automatic gain control (AGC) and frequency demodulation loops. In this work we describe a novel algorithm that can be used to overcome these weaknesses. We analysed the settling times of the proposed loops and that of the complete system, and we found that an approximately 70-fold improvement can be achieved over the existing real and virtual atomic force microscopes. We show that proportional-integral-differential controllers perform better in the frequency demodulation loop than conventional proportional-integral controllers. We demonstrate that the signal to noise ratio of the proposed system is 5.7 × 10(-5), which agrees with that of the conventional systems; thus, the new algorithm would improve the performance of FM-AFMs without compromising the resolution.

Lateral manipulation of atomic size defects on the CaF(2)(111) surface

Atomic scale manipulation on insulating surfaces is one of the great challenges of non-contact atomic force microscopy. Here we demonstrate lateral manipulation of defects occupying single ionic sites on a calcium fluoride (111)-surface. Defects stem from the interaction of the residual gas with the surface. The process of surface degradation is briefly discussed. Manipulation is performed over a wide range of path lengths ranging from tens of nanometres down to a few lattice constants. We introduce a simple manipulation protocol based on line-by-line scanning of a surface region containing defects to be manipulated, and record tip-surface distance and cantilever resonance frequency detuning as a function of the manipulation pathway in real time. We suggest a hopping model to describe manipulation where the tip-defect interaction is governed by repulsive forces.

Sublattice identification in scanning force microscopy on alkali halide surfaces

We propose and apply to the KBr(001) surface a new procedure for species recognition in scanning force microscopy (SFM) of ionic crystal surfaces which show a high symmetry of the charge arrangement. The method is based on a comparison between atomistic simulations and site-specific frequency versus distance measurements. First, by taking the difference of force-distance curves extracted at a few judiciously chosen surface sites we eliminate site-independent long-range forces. The obtained short-range force differences are then compared with calculated ones assuming plausible tip apex models. This procedure allows for the first time identification of the tip apex polarity and of the positive and negative sublattices in SFM images of the (001) cleavage surface of an ionic crystal with the rock salt structure.

Correct height measurement in noncontact atomic force microscopy

We demonstrate that topography measurements by noncontact atomic force microscopy are subject to residual electrostatic forces. On highly oriented pyrolitic graphite (HOPG) with a submonolayer coverage of C60, we monitor the step height from C60 to HOPG as a function of dc bias between tip and sample. Because of the different contact potential of C60 and HOPG ( approximately 50 mV), the step height is strongly dependent on the dc bias. The presented results and additional simulations demonstrate clearly that for correct height measurements it is mandatory to use a Kelvin probe force microscopy method with active compensation of electrostatic forces.

Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy

The (001) surface of UHV cleaved single MgO crystals was imaged with dynamic mode scanning force microscopy. Large-scale images show various defects, like steps of mostly one atomic height, rectangular holes of nanometer size, and some complex adstructures. First time images with atomic resolution show one square ionic sublattice in its bulklike dimension with a corrugation of up to 40 pm along the <001> direction. Most images exhibit atomic point defects which appear as depressions including a few ionic lattice sites proving that point defects are stable on flat terraces.

Signature of a chemical bond in the conductance between two metal surfaces

Conductance in monatomic metal contacts is quantized; it increases in discrete steps of one conductance quantum 2e(2)/h. By contrast, in a vacuum barrier between two metal surfaces we find that conductance increases linearly and continuously with the interaction energy between individual atoms. This behavior shows unambiguously that current flow between single atoms is a measure for their chemical interaction. In the controlled environment of a scanning tunneling microscope it should allow us to study the formation of covalent bonds up to the point where these atoms finally jump into contact.

Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface

Alumina is a technologically important oxide crystal because of its use as a catalyst and as a substrate for microelectronic applications. A precise knowledge of its surface atomic structure is a prerequisite for understanding and controlling the physical processes involved in many of its applications. Here we use a dynamic scanning force microscopy technique to image directly the atomic structure of the high-temperature phase of the alpha-Al2O3(0001) surface. Evidence for a surface reconstruction appears as a grid of protrusions that represent a rhombic unit cell, and we confirm that the arrangement of atoms is in the form of surface domains with hexagonal atomic order at the centre and disorder at the periphery. We show that, on exposing the surface to water and hydrogen, this surface structure is important in the formation of hydroxide clusters. These clusters appear as a regular pattern of rings that can be explained by self-organization processes involving cluster-surface and cluster-cluster interactions. Alumina has long been regarded as the definitive test for atomic-resolution force microscopy of insulators so the whole class of insulating oxides should now open for direct atomic-scale surface investigations.