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Popov VA, Borunova AB, Senatulin BR, Shelekhov EV, Kirichenko AN. Peculiarities of fullerenes and carbon onions application for reinforcing the aluminum matrix in the metal matrix composites. SURF INTERFACE ANAL 2019; 52:127-31. [DOI: 10.1002/sia.6722] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/20/2022]
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Lee J, Shin K, Lee KB, Lee Y. Surface analysis of diblock copolymer films by TOF-SIMS in combination with AFM. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5513] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Jihye Lee
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul 136-791 Korea
| | - Kwanwoo Shin
- Department of Chemistry; Sogang University; Seoul 121-742 Korea
| | - Kang-Bong Lee
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul 136-791 Korea
| | - Yeonhee Lee
- Advanced Analysis Center; Korea Institute of Science and Technology; Seoul 136-791 Korea
- Department of Nanomaterials Science and Engineering; Korea University of Science and Technology; Daejeon 305-350 Korea
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Thompson RJ, Fearn S, Tan KJ, Cramer HG, Kloc CL, Curson NJ, Mitrofanov O. Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy. Phys Chem Chem Phys 2013; 15:5202-7. [DOI: 10.1039/c3cp50310k] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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Philipp P, Ngo QK, Shtein M, Kieffer J, Wirtz T. Ag-Organic Layered Samples for Optoelectronic Applications: Interface Width and Roughening Using a 500 eV Cs+ Probe in Dynamic Secondary Ion Mass Spectrometry. Anal Chem 2012. [DOI: 10.1021/ac302939m] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
- Patrick Philipp
- Department “Science and Analysis of Materials” (SAM), Centre de Recherche Public−Gabriel Lippmann,
41 Rue du Brill, L-4422 Belvaux, Luxembourg
| | - Quyen K. Ngo
- Department “Science and Analysis of Materials” (SAM), Centre de Recherche Public−Gabriel Lippmann,
41 Rue du Brill, L-4422 Belvaux, Luxembourg
| | - Max Shtein
- Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136,
United States
| | - John Kieffer
- Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136,
United States
| | - Tom Wirtz
- Department “Science and Analysis of Materials” (SAM), Centre de Recherche Public−Gabriel Lippmann,
41 Rue du Brill, L-4422 Belvaux, Luxembourg
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