Identifying suboxide grains at the metal–oxide interface of a corroded Zr–1.0%Nb alloy using (S)TEM, transmission-EBSD and EELS

Untangling competition between epitaxial strain and growth stress through examination of variations in local oxidation

Understanding corrosion mechanisms is of importance for reducing the global cost of corrosion. While the properties of engineering components are considered at a macroscopic scale, corrosion occurs at micro or nano scale and is influenced by local microstructural variations inherent to engineering alloys. However, studying such complex microstructures that involve multiple length scales requires a multitude of advanced experimental procedures. Here, we present a method using correlated electron microscopy techniques over a range of length scales, combined with crystallographic modelling, to provide understanding of the competing mechanisms that control the waterside corrosion of zirconium alloys. We present evidence for a competition between epitaxial strain and growth stress, which depends on the orientation of the substrate leading to local variations in oxide microstructure and thus protectiveness. This leads to the possibility of tailoring substrate crystallographic textures to promote stress driven, well-oriented protective oxides, and so to improving corrosion performance.

Improving the imaging capability of an on-axis transmission Kikuchi detector

Transmission Kikuchi Diffraction (TKD) in the scanning electron microscope has been developing at a fast pace since its introduction less than a decade ago. The recently presented on-axis detector configuration, with its optimized geometry, has significantly increased the signal yield and facilitated the acquisition of STEM images in bright field (BF) and dark field (DF) mode, in addition to the automated orientation mapping of nanocrystalline electron transparent samples. However, the physical position of the integrated imaging system, located outside the detector screen, requires its movement in order to combine high resolution STEM images with high resolution orientation measurements. The difference between the two positions makes it impossible to acquire optimal signals simultaneously, leading to challenges when investigating site-specific nanocrystalline microstructures. To eliminate this drawback, a new imaging capability was added at the centre of the on-axis TKD detector, thus enabling acquisition of optimal quality BF images and orientation maps without detector movement. The advantages brought about by this new configuration are presented and the associated limitations are discussed.

In situtransmission electron microscopy study of the thermally induced formation of δ′-ZrO in pure Zr and Zr-based alloy

This study reportsin situobservations of the formation of the δ′-ZrO phase, occurring during the annealing of transmission electron microscopy (TEM) thin foils of both pure Zr and a Zr–Sn–Nb–Mo alloy at 973 K in a transmission electron microsope. The lattice parameters of δ′-ZrO were measured and determined to be similar to those of the ω-Zr phase. The orientation relationship between the δ′-ZrO and α-Zr phases has been identified as either {(11 \overline{2}0)}_{\rm ZrO}//{(0002)}_{\alpha} and {[0002]}_{\rm ZrO}//{[11 \overline{2}0]}_{\alpha} or {(\overline{1}011)}_{\rm ZrO}//{(0002)}_{\alpha} and {[01{\overline 1}1]_{{\rm{ZrO}}}}//{[11{\overline 2}0]_\alpha} depending on the orientation of the α grain relative to the TEM thin-foil normal. The nucleation and growth of δ′-ZrO were dynamically observed. This study suggests a new and convenient way to study oxidation mechanisms in Zr alloys and provides a deeper understanding of the properties of the newly reported δ′-ZrO. Since δ′-ZrO has a Zr sublattice which is identical to that of ω-Zr, the orientation relationships between the α and δ′-ZrO phases may also shed light on the orientation relations existing between α- and ω-Zr, and hence α- and ω-Ti.

Beam broadening in transmission and conventional EBSD

Transmission electron backscatter diffraction (t-EBSD) has become a routine technique for crystal orientation mapping when ultrahigh resolution is needed and has demonstrated advantages in the characterization of nanoscale and micron-sized samples (Babinsky et al., 2015). In this work, we use experimental measurements and simulations to compare the resolution of the transmission and conventional reflection EBSD techniques across a range of sample volumes and characterization conditions. Monte Carlo simulations of electron trajectories provide the opportunity to estimate beam size and effective resolution, as well as electron flux, as a function of sample thickness or incident beam energy in t-EBSD. Increasing incident beam energy is shown to negatively impact beam diameter in some cases, and the effect of thinning a sample for conventional EBSD is shown to improve characterization resolution but dramatically decrease the number of high-loss electrons backscattered to the detector. In addition to considering spatial resolution when implementing EBSD techniques, it is found that maintaining a high yield of diffracted electrons to the detector is also of critical importance, which is supported by experimental results. Consequently, this work provides key insights into the nature of electron scattering and probe volume for the practical implementation of both transmission and reflection EBSD techniques.

In-Depth View of the Structure and Growth of SnO2 Nanowires and Nanobrushes

Strategic application of an array of complementary imaging and diffraction techniques is critical to determine accurate structural information on nanomaterials, especially when also seeking to elucidate structure-property relationships and their effects on gas sensors. In this work, SnO2 nanowires and nanobrushes grown via chemical vapor deposition (CVD) displayed the same tetragonal SnO2 structure as revealed via powder X-ray diffraction bulk crystallinity data. Additional characterization using a range of electron microscopy imaging and diffraction techniques, however, revealed important structure and morphology distinctions between the nanomaterials. Tailoring scanning transmission electron microscopy (STEM) modes combined with transmission electron backscatter diffraction (t-EBSD) techniques afforded a more detailed view of the SnO2 nanostructures. Indeed, upon deeper analysis of individual wires and brushes, we discovered that, despite a similar bulk structure, wires and brushes grew with different crystal faces and lattice spacings. Had we not utilized multiple STEM diffraction modes in conjunction with t-EBSD, differences in orientation related to bristle density would have been overlooked. Thus, it is only through a methodical combination of several structural analysis techniques that precise structural information can be reliably obtained.

Application of Transmitted Kikuchi Diffraction in Studying Nano-oxide and Ultrafine Metallic Grains

Transmitted Kikuchi diffraction (TKD) is an emerging SEM-based technique that enables investigation of highly refined grain structures. It offers higher spatial resolution by utilizing conventional electron backscattered diffraction equipment on electron-transparent samples. A successful attempt has been made to reveal nano-oxide grain structures as well as ultrafine severely deformed metallic grains. The effect of electron beam current was studied. Higher beam currents enhance pattern contrast and intensity. Lower detector exposure times could be employed to accelerate the acquisition time and minimize drift and carbon contamination. However, higher beam currents increase the electron interaction volume and compromise the spatial resolution. Lastly, TKD results were compared to orientation mapping results in TEM (ASTAR). Results indicate that a combination of TKD and EDS is a capable tool to characterize nano-oxide grains such as Al2O3 and Cr2O3 with similar crystal structures.