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1
Oellers T, Arigela VG, Kirchlechner C, Dehm G, Ludwig A. Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties. ACS Comb Sci 2020;22:142-149. [PMID: 32069014 DOI: 10.1021/acscombsci.9b00182] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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Arigela VG, Oellers T, Ludwig A, Kirchlechner C, Dehm G. Development of a high-temperature micromechanics stage with a novel temperature measurement approach. Rev Sci Instrum 2019;90:073904. [PMID: 31370468 DOI: 10.1063/1.5086261] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/19/2018] [Accepted: 06/28/2019] [Indexed: 06/10/2023]
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Abboud A, Kirchlechner C, Keckes J, Conka Nurdan T, Send S, Micha JS, Ulrich O, Hartmann R, Strüder L, Pietsch U. Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector. J Appl Crystallogr 2017;50:901-908. [PMID: 28656042 PMCID: PMC5458596 DOI: 10.1107/s1600576717005581] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/02/2016] [Accepted: 04/12/2017] [Indexed: 12/04/2022]  Open
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Jaya BN, Hoffmann R, Kirchlechner C, Dehm G, Scheu C, Langer G. Coccospheres confer mechanical protection: New evidence for an old hypothesis. Acta Biomater 2016;42:258-264. [PMID: 27449337 DOI: 10.1016/j.actbio.2016.07.036] [Citation(s) in RCA: 19] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2016] [Revised: 06/27/2016] [Accepted: 07/19/2016] [Indexed: 11/30/2022]
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Cordill MJ, Glushko O, Kreith J, Marx V, Kirchlechner C. Measuring electro-mechanical properties of thin films on polymer substrates. Microelectron Eng 2015;137:96-100. [PMID: 26082564 PMCID: PMC4456064 DOI: 10.1016/j.mee.2014.08.002] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/02/2014] [Revised: 08/01/2014] [Accepted: 08/03/2014] [Indexed: 05/30/2023]
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Cordill MJ, Marx VM, Kirchlechner C. Ductile film delamination from compliant substrates using hard overlayers. Thin Solid Films 2014;571:302-307. [PMID: 25641995 PMCID: PMC4307999 DOI: 10.1016/j.tsf.2014.02.093] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
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Abboud A, Kirchlechner C, Send S, Micha JS, Ulrich O, Pashniak N, Strüder L, Keckes J, Pietsch U. A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Rev Sci Instrum 2014;85:113901. [PMID: 25430118 DOI: 10.1063/1.4900482] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
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Moser G, Felber H, Rashkova B, Imrich P, Kirchlechner C, Grosinger W, Motz C, Dehm G, Kiener D. Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing. ACTA ACUST UNITED AC 2013. [DOI: 10.3139/147.110171] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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