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de Voogd JM, van Spronsen MA, Kalff FE, Bryant B, Ostojić O, den Haan AMJ, Groot IMN, Oosterkamp TH, Otte AF, Rost MJ. Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance. Ultramicroscopy 2017; 181:61-69. [PMID: 28525802 DOI: 10.1016/j.ultramic.2017.05.009] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/15/2017] [Revised: 04/20/2017] [Accepted: 05/09/2017] [Indexed: 10/19/2022]
Abstract
Within the last three decades Scanning Probe Microscopy has been developed to a powerful tool for measuring surfaces and their properties on an atomic scale such that users can be found nowadays not only in academia but also in industry. This development is still pushed further by researchers, who continuously exploit new possibilities of this technique, as well as companies that focus mainly on the usability. However, although imaging has become significantly easier, the time required for a safe approach (without unwanted tip-sample contact) can be very time consuming, especially if the microscope is not equipped or suited for the observation of the tip-sample distance with an additional optical microscope. Here we show that the measurement of the absolute tip-sample capacitance provides an ideal solution for a fast and reliable pre-approach. The absolute tip-sample capacitance shows a generic behavior as a function of the distance, even though we measured it on several completely different setups. Insight into this behavior is gained via an analytical and computational analysis, from which two additional advantages arise: the capacitance measurement can be applied for observing, analyzing, and fine-tuning of the approach motor, as well as for the determination of the (effective) tip radius. The latter provides important information about the sharpness of the measured tip and can be used not only to characterize new (freshly etched) tips but also for the determination of the degradation after a tip-sample contact/crash.
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Affiliation(s)
- J M de Voogd
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands.
| | - M A van Spronsen
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
| | - F E Kalff
- Department of Quantum Nanoscience, Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands
| | - B Bryant
- Department of Quantum Nanoscience, Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands; High Field Magnet Laboratory, Radboud University, Toernooiveld 7, 6525 ED Nijmegen, The Netherlands
| | - O Ostojić
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
| | - A M J den Haan
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
| | - I M N Groot
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands; Leiden Institute of Chemistry, Leiden University, P.O. Box 9502, 2300 RA Leiden, the Netherlands
| | - T H Oosterkamp
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands
| | - A F Otte
- Department of Quantum Nanoscience, Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands
| | - M J Rost
- Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands.
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Roobol SB, Onderwaater WG, van Spronsen MA, Carla F, Balmes O, Navarro V, Vendelbo S, Kooyman PJ, Elkjær CF, Helveg S, Felici R, Frenken JWM, Groot IMN. In situ studies of NO reduction by H2 over Pt using surface X-ray diffraction and transmission electron microscopy. Phys Chem Chem Phys 2017; 19:8485-8495. [DOI: 10.1039/c6cp08041c] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Exposure to H2 induces faceting of the Pt nanoparticle, while exposure to NO induces rounding of the nanoparticle.
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Roobol SB, Cañas-Ventura ME, Bergman M, van Spronsen MA, Onderwaater WG, van der Tuijn PC, Koehler R, Ofitserov A, van Baarle GJC, Frenken JWM. The ReactorAFM: non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions. Rev Sci Instrum 2015; 86:033706. [PMID: 25832237 DOI: 10.1063/1.4916194] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
An Atomic Force Microscope (AFM) has been integrated in a miniature high-pressure flow reactor for in-situ observations of heterogeneous catalytic reactions under conditions similar to those of industrial processes. The AFM can image model catalysts such as those consisting of metal nanoparticles on flat oxide supports in a gas atmosphere up to 6 bar and at a temperature up to 600 K, while the catalytic activity can be measured using mass spectrometry. The high-pressure reactor is placed inside an Ultrahigh Vacuum (UHV) system to supplement it with standard UHV sample preparation and characterization techniques. To demonstrate that this instrument successfully bridges both the pressure gap and the materials gap, images have been recorded of supported palladium nanoparticles catalyzing the oxidation of carbon monoxide under high-pressure, high-temperature conditions.
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Affiliation(s)
- S B Roobol
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - M E Cañas-Ventura
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - M Bergman
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - M A van Spronsen
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - W G Onderwaater
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - P C van der Tuijn
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - R Koehler
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
| | - A Ofitserov
- Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden, The Netherlands
| | - G J C van Baarle
- Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden, The Netherlands
| | - J W M Frenken
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300, The Netherlands
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Herbschleb CT, van der Tuijn PC, Roobol SB, Navarro V, Bakker JW, Liu Q, Stoltz D, Cañas-Ventura ME, Verdoes G, van Spronsen MA, Bergman M, Crama L, Taminiau I, Ofitserov A, van Baarle GJC, Frenken JWM. The ReactorSTM: atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions. Rev Sci Instrum 2014; 85:083703. [PMID: 25173272 DOI: 10.1063/1.4891811] [Citation(s) in RCA: 26] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
To enable atomic-scale observations of model catalysts under conditions approaching those used by the chemical industry, we have developed a second generation, high-pressure, high-temperature scanning tunneling microscope (STM): the ReactorSTM. It consists of a compact STM scanner, of which the tip extends into a 0.5 ml reactor flow-cell, that is housed in a ultra-high vacuum (UHV) system. The STM can be operated from UHV to 6 bars and from room temperature up to 600 K. A gas mixing and analysis system optimized for fast response times allows us to directly correlate the surface structure observed by STM with reactivity measurements from a mass spectrometer. The in situ STM experiments can be combined with ex situ UHV sample preparation and analysis techniques, including ion bombardment, thin film deposition, low-energy electron diffraction and x-ray photoelectron spectroscopy. The performance of the instrument is demonstrated by atomically resolved images of Au(111) and atom-row resolution on Pt(110), both under high-pressure and high-temperature conditions.
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Affiliation(s)
- C T Herbschleb
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - P C van der Tuijn
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - S B Roobol
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - V Navarro
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - J W Bakker
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - Q Liu
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - D Stoltz
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - M E Cañas-Ventura
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - G Verdoes
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - M A van Spronsen
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - M Bergman
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - L Crama
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - I Taminiau
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
| | - A Ofitserov
- Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden, The Netherlands
| | - G J C van Baarle
- Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden, The Netherlands
| | - J W M Frenken
- Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands
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