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Belianinov A, Vasudevan R, Strelcov E, Steed C, Yang SM, Tselev A, Jesse S, Biegalski M, Shipman G, Symons C, Borisevich A, Archibald R, Kalinin S. Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets. Adv Struct Chem Imaging 2015; 1:6. [PMID: 27547705 PMCID: PMC4977326 DOI: 10.1186/s40679-015-0006-6] [Citation(s) in RCA: 67] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/27/2015] [Accepted: 04/21/2015] [Indexed: 11/10/2022]
Abstract
The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information.
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Affiliation(s)
- Alex Belianinov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rama Vasudevan
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Evgheni Strelcov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Chad Steed
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sang Mo Yang
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 151-747 South Korea
- Department of Physics and Astronomy, Seoul National University, Seoul, 151-747 South Korea
| | - Alexander Tselev
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Stephen Jesse
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Michael Biegalski
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Galen Shipman
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer, Computational, and Statistical Sciences, Los Alamos National Laboratory, Los Alamos, NM 87545 USA
| | - Christopher Symons
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Albina Borisevich
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rick Archibald
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sergei Kalinin
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
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Cao G, Singh DJ, Zhang XG, Samolyuk G, Qiao L, Parish C, Jin K, Zhang Y, Guo H, Tang S, Wang W, Yi J, Cantoni C, Siemons W, Payzant EA, Biegalski M, Ward TZ, Mandrus D, Stocks GM, Gai Z. Ferromagnetism and nonmetallic transport of thin-film α-FeSi(2): a stabilized metastable material. Phys Rev Lett 2015; 114:147202. [PMID: 25910157 DOI: 10.1103/physrevlett.114.147202] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/01/2014] [Indexed: 06/04/2023]
Abstract
A metastable phase α-FeSi_{2} was epitaxially stabilized on a silicon substrate using pulsed laser deposition. Nonmetallic and ferromagnetic behaviors are tailored on α-FeSi_{2} (111) thin films, while the bulk material of α-FeSi_{2} is metallic and nonmagnetic. The transport property of the films renders two different conducting states with a strong crossover at 50 K, which is accompanied by the onset of a ferromagnetic transition as well as a substantial magnetoresistance. These experimental results are discussed in terms of the unusual electronic structure of α-FeSi_{2} obtained within density functional calculations and Boltzmann transport calculations with and without strain. Our finding sheds light on achieving ferromagnetic semiconductors through both their structure and doping tailoring, and provides an example of a tailored material with rich functionalities for both basic research and practical applications.
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Affiliation(s)
- Guixin Cao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - D J Singh
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - X-G Zhang
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - German Samolyuk
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Liang Qiao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Chad Parish
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Ke Jin
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
| | - Yanwen Zhang
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
| | - Hangwen Guo
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Siwei Tang
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
| | - Wenbin Wang
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Jieyu Yi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
| | - Claudia Cantoni
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Wolter Siemons
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - E Andrew Payzant
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - Michael Biegalski
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
| | - T Z Ward
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - David Mandrus
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
| | - G M Stocks
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056, USA
| | - Zheng Gai
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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Tenne DA, Turner P, Schmidt JD, Biegalski M, Li YL, Chen LQ, Soukiassian A, Trolier-McKinstry S, Schlom DG, Xi XX, Fong DD, Fuoss PH, Eastman JA, Stephenson GB, Thompson C, Streiffer SK. Ferroelectricity in ultrathin BaTiO3 films: probing the size effect by ultraviolet Raman spectroscopy. Phys Rev Lett 2009; 103:177601. [PMID: 19905783 DOI: 10.1103/physrevlett.103.177601] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/23/2009] [Indexed: 05/28/2023]
Abstract
We demonstrate the dramatic effect of film thickness on the ferroelectric phase transition temperature Tc in strained BaTiO3 films grown on SrTiO3 substrates. Using variable-temperature ultraviolet Raman spectroscopy enables measuring Tc in films as thin as 1.6 nm, and a film thickness variation from 1.6 to 10 nm leads to Tc tuning from 70 to about 925 K. Raman data are consistent with synchrotron x-ray scattering results, which indicate the presence of 180 degrees domains below Tc, and thermodynamic phase-field model calculations of Tc as a function of thickness.
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Affiliation(s)
- D A Tenne
- Department of Physics, Boise State University, 1910 University Drive, Boise, Idaho 83725-1570, USA.
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Lupini AR, Borisevich AY, Idrobo JC, Christen HM, Biegalski M, Pennycook SJ. Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEM. Microsc Microanal 2009; 15:441-453. [PMID: 19754980 DOI: 10.1017/s1431927609990389] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
The successful development of third-order aberration correctors in transmission electron microscopy has seen aberration-corrected electron microscopes evolve from specialist projects, custom built at a small number of sites to common instruments in many modern laboratories. Here we describe some initial results illustrating the two- and three-dimensional (3D) performance of an aberration-corrected scanning transmission electron microscope with a prototype improved aberration corrector designed to also minimize fifth-order aberrations and a new, higher brightness gun. We show that atomic columns separated by 0.63 A can be resolved and demonstrate detection of single dopant atoms with 3D sensitivity.
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Affiliation(s)
- A R Lupini
- Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, TN 37831, USA.
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Choi KJ, Biegalski M, Li YL, Sharan A, Schubert J, Uecker R, Reiche P, Chen YB, Pan XQ, Gopalan V, Chen LQ, Schlom DG, Eom CB. Enhancement of ferroelectricity in strained BaTiO3 thin films. Science 2004; 306:1005-9. [PMID: 15528439 DOI: 10.1126/science.1103218] [Citation(s) in RCA: 432] [Impact Index Per Article: 21.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/02/2022]
Abstract
Biaxial compressive strain has been used to markedly enhance the ferroelectric properties of BaTiO3 thin films. This strain, imposed by coherent epitaxy, can result in a ferroelectric transition temperature nearly 500 degrees C higher and a remanent polarization at least 250% higher than bulk BaTiO3 single crystals. This work demonstrates a route to a lead-free ferroelectric for nonvolatile memories and electro-optic devices.
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Affiliation(s)
- K J Choi
- Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA
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