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Guo F, Chen Y, Song Y, Deng Y, Hua W, Yang W, Chen T, Wu Z, Qiu L, Guo X. Oxygen Vacancies Driven by Co in the Deeply Charged State Inducing Intragranular Cracking of Ni-Rich Cathodes. Small 2024:e2310321. [PMID: 38180291 DOI: 10.1002/smll.202310321] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/11/2023] [Revised: 12/05/2023] [Indexed: 01/06/2024]
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