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Tsuruoka T, Terabe K. Solid polymer electrolyte-based atomic switches: from materials to mechanisms and applications. SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS 2024; 25:2342772. [PMID: 38766515 PMCID: PMC11100443 DOI: 10.1080/14686996.2024.2342772] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/01/2024] [Accepted: 04/09/2024] [Indexed: 05/22/2024]
Abstract
As miniaturization of semiconductor memory devices is reaching its physical and technological limits, there is a demand for memory technologies that operate on new principles. Atomic switches are nanoionic devices that show repeatable resistive switching between high-resistance and low-resistance states under bias voltage applications, based on the transport of metal ions and redox reactions in solids. Their essential structure consists of an ion conductor sandwiched between electrochemically active and inert electrodes. This review focuses on the resistive switching mechanism of atomic switches that utilize a solid polymer electrolyte (SPE) as the ion conductor. Owing to the superior properties of polymer materials such as mechanical flexibility, compatibility with various substrates, and low fabrication costs, SPE-based atomic switches are a promising candidate for the next-generation of volatile and nonvolatile memories. Herein, we describe their operating mechanisms and key factors for controlling the device performance with different polymer matrices. In particular, the effects of moisture absorption in the polymer matrix on the resistive switching behavior are addressed in detail. As potential applications, atomic switches with inkjet-printed SPE and quantum conductance behavior are described. SPE-based atomic switches also have great potential in use for neuromorphic devices. The development of these devices will be enhanced using nanoarchitectonics concepts, which integrate functional materials and devices.
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Affiliation(s)
- Tohru Tsuruoka
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
| | - Kazuya Terabe
- Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
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2
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Liu X, Sun C, Ye X, Zhu X, Hu C, Tan H, He S, Shao M, Li RW. Neuromorphic Nanoionics for Human-Machine Interaction: From Materials to Applications. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024:e2311472. [PMID: 38421081 DOI: 10.1002/adma.202311472] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/31/2023] [Revised: 02/06/2024] [Indexed: 03/02/2024]
Abstract
Human-machine interaction (HMI) technology has undergone significant advancements in recent years, enabling seamless communication between humans and machines. Its expansion has extended into various emerging domains, including human healthcare, machine perception, and biointerfaces, thereby magnifying the demand for advanced intelligent technologies. Neuromorphic computing, a paradigm rooted in nanoionic devices that emulate the operations and architecture of the human brain, has emerged as a powerful tool for highly efficient information processing. This paper delivers a comprehensive review of recent developments in nanoionic device-based neuromorphic computing technologies and their pivotal role in shaping the next-generation of HMI. Through a detailed examination of fundamental mechanisms and behaviors, the paper explores the ability of nanoionic memristors and ion-gated transistors to emulate the intricate functions of neurons and synapses. Crucial performance metrics, such as reliability, energy efficiency, flexibility, and biocompatibility, are rigorously evaluated. Potential applications, challenges, and opportunities of using the neuromorphic computing technologies in emerging HMI technologies, are discussed and outlooked, shedding light on the fusion of humans with machines.
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Affiliation(s)
- Xuerong Liu
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
| | - Cui Sun
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Xiaoyu Ye
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Xiaojian Zhu
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Cong Hu
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Hongwei Tan
- Department of Applied Physics, Aalto University, Aalto, FI-00076, Finland
| | - Shang He
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Mengjie Shao
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Run-Wei Li
- CAS Key Laboratory of Magnetic Materials and Devices, and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
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3
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Xie J, Patoary MN, Rahman Laskar MA, Ignacio ND, Zhan X, Celano U, Akinwande D, Sanchez Esqueda I. Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge Contacts. NANO LETTERS 2024; 24:2473-2480. [PMID: 38252466 DOI: 10.1021/acs.nanolett.3c04057] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/23/2024]
Abstract
Two-dimensional materials (2DMs) have gained significant interest for resistive-switching memory toward neuromorphic and in-memory computing (IMC). To achieve atomic-level miniaturization, we introduce vertical hexagonal boron nitride (h-BN) memristors with graphene edge contacts. In addition to enabling three-dimensional (3D) integration (i.e., vertical stacking) for ultimate scalability, the proposed structure delivers ultralow power by isolating single conductive nanofilaments (CNFs) in ultrasmall active areas with negligible leakage thanks to atomically thin (∼0.3 nm) graphene edge contacts. Moreover, it facilitates studying fundamental resistive-switching behavior of single CNFs in CVD-grown 2DMs that was previously unattainable with planar devices. This way, we studied their programming characteristics and observed a consistent single quantum step in conductance attributed to unique atomically constrained nanofilament behavior in CVD-grown 2DMs. This resistive-switching property was previously suggested for h-BN memristors and linked to potential improvements in stability (robustness of CNFs), and now we show experimental evidence including superior retention of quantized conductance.
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Affiliation(s)
- Jing Xie
- Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe Arizona 85281, United States
| | - Md Naim Patoary
- Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe Arizona 85281, United States
| | - Md Ashiqur Rahman Laskar
- Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe Arizona 85281, United States
| | - Nicholas D Ignacio
- The University of Texas at Austin, Texas Materials Institute, Austin Texas 78712, United States
| | - Xun Zhan
- The University of Texas at Austin, Texas Materials Institute, Austin Texas 78712, United States
| | - Umberto Celano
- Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe Arizona 85281, United States
| | - Deji Akinwande
- The University of Texas at Austin, Texas Materials Institute, Austin Texas 78712, United States
- The University of Texas at Austin, Chandra Department of Electrical and Computer Engineering, Austin Texas 78712, United States
| | - Ivan Sanchez Esqueda
- Arizona State University, School of Electrical, Computer, and Energy Engineering, Tempe Arizona 85281, United States
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Milano G, Raffone F, Bejtka K, De Carlo I, Fretto M, Pirri FC, Cicero G, Ricciardi C, Valov I. Electrochemical rewiring through quantum conductance effects in single metallic memristive nanowires. NANOSCALE HORIZONS 2024; 9:416-426. [PMID: 38224292 DOI: 10.1039/d3nh00476g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/16/2024]
Abstract
Memristive devices have been demonstrated to exhibit quantum conductance effects at room temperature. In these devices, a detailed understanding of the relationship between electrochemical processes and ionic dynamic underlying the formation of atomic-sized conductive filaments and corresponding electronic transport properties in the quantum regime still represents a challenge. In this work, we report on quantum conductance effects in single memristive Ag nanowires (NWs) through a combined experimental and simulation approach that combines advanced classical molecular dynamics (MD) algorithms and quantum transport simulations (DFT). This approach provides new insights on quantum conductance effects in memristive devices by unravelling the intrinsic relationship between electronic transport and atomic dynamic reconfiguration of the nanofilment, by shedding light on deviations from integer multiples of the fundamental quantum of conductance depending on peculiar dynamic trajectories of nanofilament reconfiguration and on conductance fluctuations relying on atomic rearrangement due to thermal fluctuations.
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Affiliation(s)
- Gianluca Milano
- Advanced Materials Metrology and Life Sciences Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, 10135 Torino, Italy.
| | - Federico Raffone
- Department of Applied Science and Technology, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy.
| | - Katarzyna Bejtka
- Department of Applied Science and Technology, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy.
- Centre for Sustainable Future Technologies, Istituto Italiano di Tecnologia, Via Livorno 60, 10144 Torino, Italy
| | - Ivan De Carlo
- Advanced Materials Metrology and Life Sciences Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, 10135 Torino, Italy.
- Department of Electronics and Telecommunications, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy
| | - Matteo Fretto
- Advanced Materials Metrology and Life Sciences Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, 10135 Torino, Italy.
| | - Fabrizio Candido Pirri
- Department of Applied Science and Technology, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy.
- Centre for Sustainable Future Technologies, Istituto Italiano di Tecnologia, Via Livorno 60, 10144 Torino, Italy
| | - Giancarlo Cicero
- Department of Applied Science and Technology, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy.
| | - Carlo Ricciardi
- Department of Applied Science and Technology, Politecnico di Torino, C.so Duca degli Abruzzi 24, 10129 Torino, Italy.
| | - Ilia Valov
- Forschungszentrum Jülich, Institute of Electrochemistry and Energy System, WilhelmJohnen-Straße, 52428, Jülich, Germany
- "Acad. Evgeni Budevski" (IEE-BAS), Bulgarian Academy of Sciences (BAS), Acad. G. Bonchev Str., Block 10, 1113 Sofia, Bulgaria
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5
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Weng Z, Zheng H, Li L, Lei W, Jiang H, Ang KW, Zhao Z. Reliable Memristor Crossbar Array Based on 2D Layered Nickel Phosphorus Trisulfide for Energy-Efficient Neuromorphic Hardware. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2304518. [PMID: 37752744 DOI: 10.1002/smll.202304518] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/30/2023] [Revised: 08/04/2023] [Indexed: 09/28/2023]
Abstract
Designing reliable and energy-efficient memristors for artificial synaptic arrays in neuromorphic computing beyond von Neumann architecture remains a challenge. Here, memristors based on emerging layered nickel phosphorus trisulfide (NiPS3 ) are reported that exhibit several favorable characteristics, including uniform bipolar nonvolatile switching with small operating voltage (<1 V), fast switching speed (< 20 ns), high On/Off ratio (>102 ), and the ability to achieve programmable multilevel resistance states. Through direct experimental evidence using transmission electron microscopy and energy dispersive X-ray spectroscopy, it is revealed that the resistive switching mechanism in the Ti/NiPS3 /Au device is related to the formation and dissolution of Ti conductive filaments. Intriguingly, further investigation into the microstructural and chemical properties of NiPS3 suggests that the penetration of Ti ions is accompanied by the drift of phosphorus-sulfur ions, leading to induced P/S vacancies that facilitate the formation of conductive filaments. Furthermore, it is demonstrated that the memristor, when operating in quasi-reset mode, effectively emulates long-term synaptic weight plasticity. By utilizing a crossbar array, multipattern memorization and multiply-and-accumulate (MAC) operations are successfully implemented. Moreover, owing to the highly linear and symmetric multiple conductance states, a high pattern recognition accuracy of ≈96.4% is demonstrated in artificial neural network simulation for neuromorphic systems.
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Affiliation(s)
- Zhengjin Weng
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing, 210096, China
| | - Haofei Zheng
- Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Singapore
| | - Lingqi Li
- Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Singapore
| | - Wei Lei
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing, 210096, China
| | - Helong Jiang
- State Key Laboratory of Lake Science and Environment, Nanjing Institute of Geography and Limnology Chinese Academy of Sciences, Nanjing, 210008, China
| | - Kah-Wee Ang
- Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Singapore
- Institute of Materials Research and Engineering, A*STAR, Singapore, 138634, Singapore
| | - Zhiwei Zhao
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing, 210096, China
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6
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Cui Z, Sa B, Xue KH, Zhang Y, Xiong R, Wen C, Miao X, Sun Z. Magnetic-ferroelectric synergic control of multilevel conducting states in van der Waals multiferroic tunnel junctions towards in-memory computing. NANOSCALE 2024; 16:1331-1344. [PMID: 38131373 DOI: 10.1039/d3nr04712a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/23/2023]
Abstract
van der Waals (vdW) multiferroic tunnel junctions (MFTJs) based on two-dimensional materials have gained significant interest due to their potential applications in next-generation data storage and in-memory computing devices. In this study, we construct vdW MFTJs by employing monolayer Mn2Se3 as the spin-filter tunnel barrier, TiTe2 as the electrodes and In2S3 as the tunnel barrier to investigate the spin transport properties based on first-principles quantum transport calculations. It is highlighted that apparent tunneling magnetoresistance (TMR) and tunneling electroresistance (TER) effects with a maximum TMR ratio of 6237% and TER ratio of 1771% can be realized by using bilayer In2S3 as the tunnel barrier under finite bias. Furthermore, the physical origin of the distinguished TMR and TER effects is unraveled from the k||-resolved transmission spectra and spin-dependent projected local density of states analysis. Interestingly, four distinguishable conductance states reveal the implementation of four-state nonvolatile data storage using one MFTJ unit. More importantly, in-memory logic computing and multilevel data storage can be achieved at the same time by magnetic switching and electrical control, respectively. These results shed light on vdW MFTJs in the applications of in-memory computing as well as multilevel data storage devices.
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Affiliation(s)
- Zhou Cui
- Multiscale Computational Materials Facility & Materials Genome Institute, School of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China.
| | - Baisheng Sa
- Multiscale Computational Materials Facility & Materials Genome Institute, School of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China.
| | - Kan-Hao Xue
- School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan 430074, China
| | - Yinggan Zhang
- College of Materials, Fujian Provincial Key Laboratory of Theoretical and Computational Chemistry, Xiamen University, Xiamen 361005, P. R. China
| | - Rui Xiong
- Multiscale Computational Materials Facility & Materials Genome Institute, School of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China.
| | - Cuilian Wen
- Multiscale Computational Materials Facility & Materials Genome Institute, School of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China.
| | - Xiangshui Miao
- School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan 430074, China
| | - Zhimei Sun
- School of Materials Science and Engineering, and Center for Integrated Computational Materials Science, International Research Institute for Multidisciplinary Science, Beihang University, Beijing 100191, P. R. China.
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7
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Aguirre FL, Piros E, Kaiser N, Vogel T, Petzold S, Gehrunger J, Hochberger C, Oster T, Hofmann K, Suñé J, Miranda E, Alff L. Revealing the quantum nature of the voltage-induced conductance changes in oxygen engineered yttrium oxide-based RRAM devices. Sci Rep 2024; 14:1122. [PMID: 38212346 PMCID: PMC10784569 DOI: 10.1038/s41598-023-49924-2] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/27/2023] [Accepted: 12/13/2023] [Indexed: 01/13/2024] Open
Abstract
In this work, the quasi-analog to discrete transition occurring in the current-voltage characteristic of oxygen engineered yttrium oxide-based resistive random-access memory (RRAM) devices is investigated in detail. In particular, the focus of our research is not on the absolute conductance values of this characteristic but on the magnitude of its conductance changes occurring during the reset process of the device. It is found that the detected changes correspond to conductance values predominantly of the order of the quantum unit of conductance G0 = 2e2/h, where e is the electron charge and h the Planck constant. This feature is observed even at conductance levels far above G0, i.e. where electron transport is seemingly diffusive. It is also observed that such behavior is reproducible across devices comprising yttrium oxide layers with different oxygen concentrations and measured under different voltage sweep rates. While the oxygen deficiency affects the total number of quantized conductance states, the magnitude of the changes in conductance, close to 1 G0, is invariant to the oxygen content of the functional layer.
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Affiliation(s)
- F L Aguirre
- Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, 08193, Cerdanyola del Valles, Spain.
- Intrinsic Semiconductor Technologies, Ltd., Buckinghamshire, United Kingdom.
| | - E Piros
- Advanced Thin Film Technology Division, Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany.
| | - N Kaiser
- Advanced Thin Film Technology Division, Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany
| | - T Vogel
- Advanced Thin Film Technology Division, Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany
| | - S Petzold
- Advanced Thin Film Technology Division, Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany
| | - J Gehrunger
- Computer Systems Group, Department of Electrical Engineering and Information Technology, Technische Universität Darmstadt, Darmstadt, Germany
| | - C Hochberger
- Computer Systems Group, Department of Electrical Engineering and Information Technology, Technische Universität Darmstadt, Darmstadt, Germany
| | - T Oster
- Integrated Electronic Systems Lab, Department of Electrical Engineering and Information Technology, Technische Universität Darmstadt, Darmstadt, Germany
| | - K Hofmann
- Integrated Electronic Systems Lab, Department of Electrical Engineering and Information Technology, Technische Universität Darmstadt, Darmstadt, Germany
| | - J Suñé
- Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, 08193, Cerdanyola del Valles, Spain
| | - E Miranda
- Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, 08193, Cerdanyola del Valles, Spain
| | - L Alff
- Advanced Thin Film Technology Division, Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany
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8
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Sunny MM, Thamankar R. Spike rate dependent synaptic characteristics in lamellar, multilayered alpha-MoO 3 based two-terminal devices - efficient way to control the synaptic amplification. RSC Adv 2024; 14:2518-2528. [PMID: 38226148 PMCID: PMC10788777 DOI: 10.1039/d3ra07757h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/13/2023] [Accepted: 12/19/2023] [Indexed: 01/17/2024] Open
Abstract
Brain-inspired computing systems require a rich variety of neuromorphic devices using multi-functional materials operating at room temperature. Artificial synapses which can be operated using optical and electrical stimuli are in high demand. In this regard, layered materials have attracted a lot of attention due to their tunable energy gap and exotic properties. In the current study, we report the growth of layered MoO3 using the chemical vapor deposition (CVD) technique. MoO3 has an energy gap of 3.22 eV and grows with a large aspect ratio, as seen through optical and scanning electron microscopy. We used transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy for complete characterisation. The two-terminal devices using platinum (Pt/MoO3/Pt) exhibit superior memory with the high-resistance state (HRS) and low-resistance state (LRS) differing by a large resistance (∼MΩ). The devices also show excellent synaptic characteristics. Both optical and electrical pulses can be utilised to stimulate the synapse. Consistent learning (potentiation) and forgetting (depression) curves are measured. Transition from long term depression to long term potentiation can be achieved using the spike frequency dependent pulsing scheme. We have found that the amplification of postsynaptic current can be tuned using such frequency dependent spikes. This will help us to design neuromorphic devices with the required synaptic amplification.
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Affiliation(s)
- Meenu Maria Sunny
- Department of Physics, Vellore Institute of Technology Vellore TN India
- Centre for Functional Materials, Vellore Institute of Technology Vellore TN India
| | - R Thamankar
- Centre for Functional Materials, Vellore Institute of Technology Vellore TN India
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9
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Zhao C, Yan W, Zhang W, Liu D. Coherent Phonon Manipulation via Electron-Phonon Interaction for Facilitated Relaxation of Metastable Centers in ZnO. NANO LETTERS 2023; 23:8995-9002. [PMID: 37733386 DOI: 10.1021/acs.nanolett.3c02536] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 09/22/2023]
Abstract
Methods that allow versatile manipulation of metastable centers in semiconductors are highly important owing to their potential for quantum information processing and computations. In this study, we demonstrate that the electron-phonon interaction enables phonon participation to promote relaxation of metastable centers in ZnO, which is known for its persistent photoconductivity (PPC) effect. Experimentally, we show that continuous infrared (IR) radiation (1064 nm, ∼30 mW/cm2) promotes longitudinal optical phonons via the Fröhlich interaction and increases the PPC relaxation rate by ∼4 folds. More importantly, we discover that coherent phonons activated by an ultrashort pulse IR laser of the same power increased the relaxation rate by ∼1200-fold, as confirmed by ultrafast transient spectroscopy to be correlated to the excitation of coherent acoustic phonons via the inverse piezoelectric effect. We expect this study to provide valuable guidance for the development of novel quantum and photoactive devices.
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Affiliation(s)
- Chaopeng Zhao
- Institute of Novel Semiconductors, State Key Laboratory of Crystal Materials, Shandong University, 27 South Shanda Road, Jinan, Shandong 250100, P. R. China
| | - Weishan Yan
- Institute of Novel Semiconductors, State Key Laboratory of Crystal Materials, Shandong University, 27 South Shanda Road, Jinan, Shandong 250100, P. R. China
| | - Wangyang Zhang
- Institute of Novel Semiconductors, State Key Laboratory of Crystal Materials, Shandong University, 27 South Shanda Road, Jinan, Shandong 250100, P. R. China
| | - Duo Liu
- Institute of Novel Semiconductors, State Key Laboratory of Crystal Materials, Shandong University, 27 South Shanda Road, Jinan, Shandong 250100, P. R. China
- Jinan Institute of Quantum Technology, Jinan, Shandong 250101, P. R. China
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10
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Chen CH, Lai YT, Chen CF, Wu PT, Su KJ, Hsu SY, Dai GJ, Huang ZY, Hsu CL, Lee SY, Shen CH, Chen HY, Lee CC, Hsieh DR, Lin YF, Chao TS, Lo ST. Single-Gate In-Transistor Readout of Current Superposition and Collapse Utilizing Quantum Tunneling and Ferroelectric Switching. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2301206. [PMID: 37282350 DOI: 10.1002/adma.202301206] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/07/2023] [Revised: 06/01/2023] [Indexed: 06/08/2023]
Abstract
In nanostructure assemblies, the superposition of current paths forms microscopic electric circuits, and different circuit networks produce varying results, particularly when utilized as transistor channels for computing applications. However, the intricate nature of assembly networks and the winding paths of commensurate currents hinder standard circuit modeling. Inspired by the quantum collapse of superposition states for information decoding in quantum circuits, the implementation of analogous current path collapse to facilitate the detection of microscopic circuits by modifying their network topology is explored. Here, the superposition and collapse of current paths in gate-all-around polysilicon nanosheet arrays are demonstrated to enrich the computational resources within transistors by engineering the channel length and quantity. Switching the ferroelectric polarization of Hf0.5 Zr0.5 O2 gate dielectric, which drives these transistors out-of-equilibrium, decodes the output polymorphism through circuit topological modifications. Furthermore, a protocol for the single-electron readout of ferroelectric polarization is presented with tailoring the channel coherence. The introduction of lateral path superposition results into intriguing metal-to-insulator transitions due to transient behavior of ferroelectric switching. This ability to adjust the current networks within transistors and their interaction with ferroelectric polarization in polycrystalline nanostructures lays the groundwork for generating diverse current characteristics as potential physical databases for optimization-based computing.
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Affiliation(s)
- Ching-Hung Chen
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Yu-Ting Lai
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Ciao-Fen Chen
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
- Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan
| | - Pei-Tzu Wu
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Kuan-Jung Su
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Sheng-Yang Hsu
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Guo-Jin Dai
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Zan-Yi Huang
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Chien-Lung Hsu
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Shen-Yang Lee
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Chuan-Hui Shen
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Hsin-Yu Chen
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Chia-Chin Lee
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Dong-Ru Hsieh
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Yen-Fu Lin
- Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan
| | - Tien-Sheng Chao
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
| | - Shun-Tsung Lo
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
- Center for Emergent Functional Matter Science, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan
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11
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Leonetti G, Fretto M, Bejtka K, Olivetti ES, Pirri FC, De Leo N, Valov I, Milano G. Resistive switching and role of interfaces in memristive devices based on amorphous NbO x grown by anodic oxidation. Phys Chem Chem Phys 2023; 25:14766-14777. [PMID: 37145117 DOI: 10.1039/d3cp01160g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 05/06/2023]
Abstract
Memristive devices based on the resistive switching mechanism are continuously attracting attention in the framework of neuromorphic computing and next-generation memory devices. Here, we report on a comprehensive analysis of the resistive switching properties of amorphous NbOx grown by anodic oxidation. Besides a detailed chemical, structural and morphological analysis of the involved materials and interfaces, the mechanism of switching in Nb/NbOx/Au resistive switching cells is discussed by investigating the role of metal-metal oxide interfaces in regulating electronic and ionic transport mechanisms. The resistive switching was found to be related to the formation/rupture of conductive nanofilaments in the NbOx layer under the action of an applied electric field, facilitated by the presence of an oxygen scavenger layer at the Nb/NbOx interface. Electrical characterization including device-to-device variability revealed an endurance >103 full-sweep cycles, retention >104 s, and multilevel capabilities. Furthermore, the observation of quantized conductance supports the physical mechanism of switching based on the formation of atomic-scale conductive filaments. Besides providing new insights into the switching properties of NbOx, this work also highlights the perspective of anodic oxidation as a promising method for the realization of resistive switching cells.
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Affiliation(s)
- Giuseppe Leonetti
- Politecnico di Torino, Department of Applied Science and Technology (DISAT), C.so Duca degli Abruzzi 24, 10129, Turin, Italy
| | - Matteo Fretto
- Istituto Nazionale di Ricerca Metrologica (INRiM), Advanced Materials Metrology and Life Science, Strada delle cacce 91, 10135 Turin, Italy.
| | - Katarzyna Bejtka
- Politecnico di Torino, Department of Applied Science and Technology (DISAT), C.so Duca degli Abruzzi 24, 10129, Turin, Italy
| | - Elena Sonia Olivetti
- Istituto Nazionale di Ricerca Metrologica (INRiM), Advanced Materials Metrology and Life Science, Strada delle cacce 91, 10135 Turin, Italy.
| | - Fabrizio Candido Pirri
- Politecnico di Torino, Department of Applied Science and Technology (DISAT), C.so Duca degli Abruzzi 24, 10129, Turin, Italy
| | - Natascia De Leo
- Istituto Nazionale di Ricerca Metrologica (INRiM), Advanced Materials Metrology and Life Science, Strada delle cacce 91, 10135 Turin, Italy.
| | - Ilia Valov
- Juelich, Institute of Electrochemistry and Energy System, Germany
- Acad. Evgeni Budevski (IEE-BAS, Bulgarian Academy of Sciences (BAS), Acad. G. Bonchev Str., Block 10, 1113 Sofia, Bulgaria
| | - Gianluca Milano
- Istituto Nazionale di Ricerca Metrologica (INRiM), Advanced Materials Metrology and Life Science, Strada delle cacce 91, 10135 Turin, Italy.
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12
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Ariga K. Molecular nanoarchitectonics: unification of nanotechnology and molecular/materials science. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2023; 14:434-453. [PMID: 37091285 PMCID: PMC10113519 DOI: 10.3762/bjnano.14.35] [Citation(s) in RCA: 6] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/08/2023] [Accepted: 03/14/2023] [Indexed: 05/03/2023]
Abstract
The development of nanotechnology has provided an opportunity to integrate a wide range of phenomena and disciplines from the atomic scale, the molecular scale, and the nanoscale into materials. Nanoarchitectonics as a post-nanotechnology concept is a methodology for developing functional material systems using units such as atoms, molecules, and nanomaterials. Especially, molecular nanoarchitectonics has been strongly promoted recently by incorporating nanotechnological methods into organic synthesis. Examples of research that have attracted attention include the direct observation of organic synthesis processes at the molecular level with high resolution, and the control of organic syntheses with probe microscope tips. These can also be considered as starting points for nanoarchitectonics. In this review, these examples of molecular nanoarchitectonics are introduced, and future prospects of nanoarchitectonics are discussed. The fusion of basic science and the application of practical functional materials will complete materials chemistry for everything.
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Affiliation(s)
- Katsuhiko Ariga
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba 305-0044, Japan
- Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
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13
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Aguilera-Pedregosa C, Maldonado D, González MB, Moreno E, Jiménez-Molinos F, Campabadal F, Roldán JB. Thermal Characterization of Conductive Filaments in Unipolar Resistive Memories. MICROMACHINES 2023; 14:630. [PMID: 36985037 PMCID: PMC10057622 DOI: 10.3390/mi14030630] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/14/2023] [Revised: 02/07/2023] [Accepted: 03/06/2023] [Indexed: 06/18/2023]
Abstract
A methodology to estimate the device temperature in resistive random access memories (RRAMs) is presented. Unipolar devices, which are known to be highly influenced by thermal effects in their resistive switching operation, are employed to develop the technique. A 3D RRAM simulator is used to fit experimental data and obtain the maximum and average temperatures of the conductive filaments (CFs) that are responsible for the switching behavior. It is found that the experimental CFs temperature corresponds to the maximum simulated temperatures obtained at the narrowest sections of the CFs. These temperature values can be used to improve compact models for circuit simulation purposes.
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Affiliation(s)
- Cristina Aguilera-Pedregosa
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain
| | - David Maldonado
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain
| | - Mireia B. González
- Institut de Microelectrònica de Barcelona, IMB-CNM (CSIC), Carrer dels Til·lers s/n, Campus UAB, 08193 Bellaterra, Spain
| | - Enrique Moreno
- Departamento de Física y Matemáticas, Facultad de Ciencias, Universidad de Alcalá, Pl. de San Diego s/n, Alcalá de Henares, 28801 Madrid, Spain
| | - Francisco Jiménez-Molinos
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain
| | - Francesca Campabadal
- Institut de Microelectrònica de Barcelona, IMB-CNM (CSIC), Carrer dels Til·lers s/n, Campus UAB, 08193 Bellaterra, Spain
| | - Juan B. Roldán
- Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, Avd. Fuentenueva s/n, 18071 Granada, Spain
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14
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Tappertzhofen S, Braeuninger-Weimer P, Gumprich A, Chirca I, Potočnik T, Alexander-Webber JA, Hofmann S. Transfer-free graphene passivation of sub 100 nm thin Pt and Pt–Cu electrodes for memristive devices. SN APPLIED SCIENCES 2023. [DOI: 10.1007/s42452-023-05314-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/25/2023] Open
Abstract
AbstractMemristive switches are among the most promising building blocks for future neuromorphic computing. These devices are based on a complex interplay of redox reactions on the nanoscale. Nanoionic phenomena enable non-linear and low-power resistance transition in ultra-short programming times. However, when not controlled, the same electrochemical reactions can result in device degradation and instability over time. Two-dimensional barriers have been suggested to precisely manipulate the nanoionic processes. But fabrication-friendly integration of these materials in memristive devices is challenging.Here we report on a novel process for graphene passivation of thin platinum and platinum/copper electrodes. We also studied the level of defects of graphene after deposition of selected oxides that are relevant for memristive switching.
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15
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Milano G, Miranda E, Fretto M, Valov I, Ricciardi C. Experimental and Modeling Study of Metal-Insulator Interfaces to Control the Electronic Transport in Single Nanowire Memristive Devices. ACS APPLIED MATERIALS & INTERFACES 2022; 14:53027-53037. [PMID: 36396122 PMCID: PMC9716557 DOI: 10.1021/acsami.2c11022] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/21/2022] [Accepted: 08/25/2022] [Indexed: 06/16/2023]
Abstract
Memristive devices relying on redox-based resistive switching mechanisms represent promising candidates for the development of novel computing paradigms beyond von Neumann architecture. Recent advancements in understanding physicochemical phenomena underlying resistive switching have shed new light on the importance of an appropriate selection of material properties required to optimize the performance of devices. However, despite great attention has been devoted to unveiling the role of doping concentration, impurity type, adsorbed moisture, and catalytic activity at the interfaces, specific studies concerning the effect of the counter electrode in regulating the electronic flow in memristive cells are scarce. In this work, the influence of the metal-insulator Schottky interfaces in electrochemical metallization memory (ECM) memristive cell model systems based on single-crystalline ZnO nanowires (NWs) is investigated following a combined experimental and modeling approach. By comparing and simulating the electrical characteristics of single NW devices with different contact configurations and by considering Ag and Pt electrodes as representative of electrochemically active and inert electrodes, respectively, we highlight the importance of an appropriate choice of electrode materials by taking into account the Schottky barrier height and interface chemistry at the metal-insulator interfaces. In particular, we show that a clever choice of metal-insulator interfaces allows to reshape the hysteretic conduction characteristics of the device and to increase the device performance by tuning its resistance window. These results obtained from single NW-based devices provide new insights into the selection criteria for materials and interfaces in connection with the design of advanced ECM cells.
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Affiliation(s)
- Gianluca Milano
- Advanced
Materials Metrology and Life Sciences Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, 10135Torino, Italy
| | - Enrique Miranda
- Departament
d’Enginyeria Electrònica, Universitat Autònoma de Barcelona (UAB), 08193Cerdanyola del Vallès, Spain
| | - Matteo Fretto
- Advanced
Materials Metrology and Life Sciences Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, 10135Torino, Italy
| | - Ilia Valov
- JARA—Fundamentals
for Future Information Technology, 52425Jülich, Germany
- Peter-Grünberg-Institut
(PGI 7), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425Jülich, Germany
| | - Carlo Ricciardi
- Department
of Applied Science and Technology, Politecnico
di Torino, C.so Duca degli Abruzzi 24, 10129Torino, Italy
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16
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Lee Y, Park J, Chung D, Lee K, Kim S. Multi-level Cells and Quantized Conductance Characteristics of Al 2O 3-Based RRAM Device for Neuromorphic System. NANOSCALE RESEARCH LETTERS 2022; 17:84. [PMID: 36057011 PMCID: PMC9440974 DOI: 10.1186/s11671-022-03722-3] [Citation(s) in RCA: 9] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/26/2022] [Accepted: 08/24/2022] [Indexed: 06/15/2023]
Abstract
Recently, various resistance-based memory devices are being studied to replace charge-based memory devices to satisfy high-performance memory requirements. Resistance random access memory (RRAM) shows superior performances such as fast switching speed, structural scalability, and long retention. This work presented the different filament control by the DC voltages and verified its characteristics as a synaptic device by pulse measurement. Firstly, two current-voltage (I-V) curves are characterized by controlling a range of DC voltages. The retention and endurance for each different I-V curve were measured to prove the reliability of the RRAM device. The detailed voltage manipulation confirmed the characteristics of multi-level cell (MLC) and conductance quantization. Lastly, synaptic functions such as potentiation and depression, paired-pulse depression, excitatory post-synaptic current, and spike-timing-dependent plasticity were verified. Collectively, we concluded that Pt/Al2O3/TaN is appropriate for the neuromorphic device.
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Affiliation(s)
- Yunseok Lee
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea
| | - Jongmin Park
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea
| | - Daewon Chung
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea
| | - Kisong Lee
- Department of Information and Communication Engineering, Dongguk University, Seoul, 04620, Republic of Korea
| | - Sungjun Kim
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea.
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