Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching

The remarkable physical properties of dental enamel can be largely attributed to the structure of the hydroxyapatite (HAp) crystallites on the sub-micrometre scale. Characterising the HAp microstructure is challenging, due to the nanoscale of individual crystallites and practical challenges associated with HAp examination using electron microscopy techniques. Conventional methods for enamel characterisation include imaging using transmission electron microscopy (TEM) or specialised beamline techniques, such as polarisation-dependent imaging contrast (PIC). These provide useful information at the necessary spatial resolution but are not able to measure the full crystallographic orientation of the HAp crystallites. Here we demonstrate the effectiveness of enamel analyses using transmission Kikuchi diffraction (TKD) in the scanning electron microscope, coupled with newly-developed pattern matching methods. The pattern matching approach, using dynamic template matching coupled with subsequent orientation refinement, enables robust indexing of even poor-quality TKD patterns, resulting in significantly improved data quality compared to conventional diffraction pattern indexing methods. The potential of this method for the analysis of nanocrystalline enamel structures is demonstrated by the characterisation of a human enamel TEM sample and the subsequent comparison of the results to high resolution TEM imaging. The TKD - pattern matching approach measures the full HAp crystallographic orientation enabling a quantitative measurement of not just the c-axis orientations, but also the extent of any rotation of the crystal lattice about the c-axis, between and within grains. Results presented here show how this additional information highlights potentially significant aspects of the HAp crystallite structure, including intra-crystallite distortion and the presence of multiple high angle boundaries between adjacent crystallites with rotations about the c-axis. These and other observations enable a more rigorous understanding of the relationship between HAp structures and the physical properties of dental enamel.

Diffraction-Based Multiscale Residual Strain Measurements

Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-based microtexture measurements, offer exciting possibilities of diffraction-based multiscale residual strain measurements. The different techniques differ in scale and resolution, but may also yield significantly different strain values. This study, for example, clearly established that high-resolution electron backscattered diffraction (HR-EBSD) and high-resolution transmission Kikuchi diffraction (HR-TKD) [sensitive to changes in interplanar angle (Δθθ)], provide quantitatively higher residual strains than micro-Laue XRD and transmission electron microscope (TEM) based precession electron diffraction (PED) [sensitive to changes in interplanar spacing (Δdd)]. Even after correcting key known factors affecting the accuracy of HR-EBSD strain measurements, a scaling factor of ∼1.57 (between HR-EBSD and micro-Laue) emerged. We have then conducted "virtual" experiments by systematically deforming an ideal lattice by either changing an interplanar angle (α) or a lattice parameter (a). The patterns were kinematically and dynamically simulated, and corresponding strains were measured by HR-EBSD. These strains showed consistently higher values for lattice(s) distorted by α, than those altered by a. The differences in strain measurements were further emphasized by mapping identical location with HR-TKD and TEM-PED. These measurements exhibited different spatial resolution, but when scaled (with ∼1.57) provided similar lattice distortions numerically.

Exploring the Cathode Active Materials for Sulfide-Based All-Solid-State Lithium Batteries with High Energy Density

All-solid-state lithium batteries (ASSLBs) are considered promising alternatives to current lithium-ion batteries that employ liquid electrolytes due to their high energy density and enhanced safety. Among various types of solid electrolytes, sulfide-based electrolytes are being actively studied, because they exhibit high ionic conductivity and high ductility, which enable good interfacial contacts in solid electrolytes without sintering at high temperatures. To improve the energy density of the sulfide-based ASSLBs, it is essential to increase the loading of active material in the composite cathode. In this study, the Ni-rich LiNix Coy Mn1-x-y O2 (NCM) materials are explored with different Ni content, particle size, and crystalline form to probe suitable cathode active materials for high-performance ASSLBs with high energy density. The results reveal that single-crystalline LiNi0.82 Co0.10 Mn0.08 O2 material with a small particle size exhibits the best cycling performance in the ASSLB assembled with a high mass loaded cathode (active mass loading: 26 mg cm-2 , areal capacity: 5.0 mAh cm-2 ) in terms of discharge capacity, capacity retention, and rate capability.

Electron Microscope Study of the Pressure-Induced Phase Transformation and Microstructure Change of TiO2 Nanocrystals

Microstructure transformation of materials under compression is crucial to understanding their high-pressure phase transformation. However, direct observation of the microstructure of compressive materials is a considerable challenge, which impedes the understanding of the relations among phase transformation, microstructure, and material properties. In this study, we used transmission Kikuchi diffraction and transmission electron microscopy to intuitively characterize pressure-induced phase transformation and microstructure of TiO2. We observed the changes of twin boundaries with increasing pressure and intermediate phase TiO2-I of anatase transformed into TiO2-II (α-PbO2 phase) for the first time. The following changes occur during this transformation: anatase (diameter of ∼100 nm) → anatase twins 60° along the [110] zone axis → intermediate TiO2-I twins 60° along the [010] zone axis → TiO2-II twins 90° along the [010] zone axis. These results directly reveal the crystallographic relation among these structures, enhancing our understanding of the phase transformation in TiO2 nanocrystals.

Transmission electron microscopy study on the phase transformation of metastable precipitates to stable phases

Nanosized precipitates play a critical role in increasing the strength of metallic alloys. There are many reports that the initial precipitates are metastable phases holding a different composition and crystal structure from the equilibrium precipitate. The metastable precipitate transforms to its stable phase during heat treatment. A transmission electron microscope enables researchers to study the phase transition of metastable precipitates to stable phases due to its fine resolution in identifying crystal structures and chemical compositions. This review introduces the various phase transformation mechanisms of metastable precipitates to stable phases obtained from the analysis using a transmission electron microscope. The role of dislocation movement in the phase transition is further discussed.

Transmission Kikuchi Diffraction Mapping Induces Structural Damage in Atom Probe Specimens

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them sufficiently close to the apex of the needle-shaped specimen. However, possible structural damage associated to the energetic electrons used to perform TKD is rarely considered and is hence not well-understood. Here, in two case studies, we evidence damage in APT specimens from TKD mapping. First, we analyze a solid solution, metastable β-Ti-12Mo alloy, in which the Mo is expected to be homogenously distributed. Following TKD, APT reveals a planar segregation of Mo among other elements. Second, specimens were prepared near Σ3 twin boundaries in a high manganese twinning-induced plasticity steel, and subsequently charged with deuterium gas. Beyond a similar planar segregation, voids containing a high concentration of deuterium, i.e., bubbles, are detected in the specimen on which TKD was performed. Both examples showcase damage from TKD mapping leading to artefacts in the distribution of solutes. We propose that the structural damage is created by surface species, including H and C, subjected to recoil from incoming energetic electrons during mapping, thereby getting implanted and causing cascades of structural damage in the sample.

EBSD patterns simulation of dislocation structures based on electron diffraction dynamic theory

Electron backscatter diffraction (EBSD) technology is a powerful tool for materials characterization including crystal orientation mapping, phase identification, and strain analysis. However, it is still challenging for using EBSD to identify crystallographic defects due to the insufficient understanding of the diffraction patterns of different defect structures. In the present work, EBSD patterns of FCC-Fe with 1/2 < 110 > edge dislocation dipole and 1/6 < 11̅2 > screw dislocation quadrupole structures are simulated by the revised real space (RRS) method. Our results showed that the presence of dislocations deteriorates the overall quality of the diffraction pattern and have different effects on different Kikuchi bands and Kikuchi poles. The edges of the Kikuchi band corresponding to the edge dislocation glide plane are sharp and the diffraction details within the band are clear. The sharpness of the edges of the Kikuchi band corresponding to the crystal plane normal to the dislocation Burgers vector is reduced, but the intra-band diffraction details are clear. Other Kikuchi bands show obvious anisotropic blurring. The diffraction details of the Kikuchi pole corresponding to the screw dislocation Burgers vector are clear, the edges of the Kikuchi bands across this pole are sharp, and the diffraction details within the bands are clear in the segments close to this pole and blurred in the segments far away from it. Other Kikuchi bands and Kikuchi poles are blurred. Our results indicate that the EBSD pattern can be simulated based on the electron diffraction dynamic theory and the correlation between dislocation structure and EBSD pattern is revealed, which provides theoretical guidance for the resolution of dislocation structures by the EBSD technique.

Conditions near a crack tip: Advanced experiments for dislocation analysis and local strain measurement

The local stress state and microstructure near the crack-tip singularity control the fracture process. In ductile materials multiple toughening mechanisms are at play that dynamically influence stress and microstructure at the crack tip. In metals, crack-tip shielding is typically associated with the emission of dislocations. Therefore, to understand crack propagation on the most fundamental level, in situ techniques are required that are capable to combine imaging and stress mapping at high resolution. Recent experimental advances in x-ray diffraction, scanning electron microscopy, and transmission electron microscopy enable quantifying deformation stress fields from the bulk level down to the individual dislocation. Furthermore, through modern detector technology the temporal resolution has sufficiently improved to enable stress mapping during in situ experiments.

Massive transformation in FeNi nanopowders with nanotwin-assisted nitridation

L1₀-ordered FeNi alloy (tetrataenite), a promising candidate for rare-earth-free and low-cost permanent magnet applications, is attracting increasing attention from academic and industrial communities. Highly ordered single-phase L1₀-FeNi is difficult to synthesis efficiently because of its low chemical order–disorder transition temperature (200–320 °C). A non-equilibrium synthetic route utilizing a nitrogen topotactic reaction has been considered a valid approach, although the phase transformation mechanism is currently unknown. Herein, we investigated the basis of this reaction, namely the formation mechanism of the tetragonal FeNiN precursor phase during the nitridation of FeNi nanopowders. Detailed microstructure analysis revealed that the FeNiN precursor phase could preferentially nucleate at the nanotwinned region during nitridation and subsequently grow following a massive transformation, with high-index irrational orientation relationships and ledgewise growth motion detected at the migrating phase interface. This is the first report of a massive phase transformation detected in an Fe–Ni–N system and provides new insights into the phase transformation during the nitriding process. This work is expected to promote the synthetic optimization of fully ordered FeNi alloys for various magnetic applications.

Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects

A newly developed microscope prototype, namely npSCOPE, consisting of a Gas Field Ion Source (GFIS) column and a position sensitive Delay-line Detector (DLD) was used to perform Scanning Transmission Ion Microscopy (STIM) using keV He+ ions. One experiment used 25 keV ions and a second experiment used 30 keV ions. STIM imaging of a 50 nm thick free-standing gold membrane exhibited excellent contrast due to ion channelling and revealed rich microstructural features including isolated nanoscale twin bands which matched well with the contrast in the conventional ion-induced Secondary Electron (SE) imaging mode. Transmission Kikuchi Diffraction (TKD) and Backscattered Electron (BSE) imaging were performed on the same areas to correlate and confirm the microstructural features observed in STIM. Monte Carlo simulations of the ion and electron trajectories were performed with parameters similar to the experimental conditions to derive insights related to beam broadening and its effect in the degradation of transmission image resolution. For the experimental conditions used, STIM imaging showed a lateral resolution close to30 nm. Dark twin bands in bright grains as well as bright twin bands in dark grains were observed in STIM. Some of the twin bands were invisible in STIM. For the specific experimental conditions used, the ion transmission efficiency across a particular twin band was found to decrease by a factor of 2.8. Surprisingly, some grains showed contrast reversal when the Field of View (FOV) was changed indicating the sensitivity of the channelling contrast to even small changes in illumination conditions. These observations are discussed using ion channelling conditions and crystallographic orientations of the grains and twin bands. This study demonstrates for the first time the potential of STIM imaging using keV He+ ions to quantitatively investigate channelling in nanoscale structures including isolated crystalline defects.

The Correspondence Theory and Its Application to NiTi Shape Memory Alloys

Martensite crystallography is usually described by the phenomenological theory of martensite crystallography (PTMC). This theory relies on stretch matrices and compatibility equations, but it does not give a global view on the structures of variants, and it masks the relative roles of the symmetries and metrics. Here, we propose an alternative theory called correspondence theory (CT) based on correspondences and symmetries. The compatibility twins between the martensite variants are inherited by correspondence from the symmetry elements of austenite. We show that, for the B2 to B19′ transformation, there is a one-to-one relation between the specific misorientations and the specific inter-correspondences between the variants. For each type of misorientation, the twin of its junction plane can be predicted without calculating the stretch matrices, as in PTMC. The rational elements of the twins do not depend on the metrics; all the transformation twins are thus “generic”. We also introduce the concept of a weak plane that permits to explain the junction planes for polar pairs of variants for which the PTMC compatibility equations cannot be solved. The predictions are validated by comparison with experimental Transmission Kikuchi Diffraction (TKD) maps.

Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction

The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample-to-detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally, the utilisation of a Hough transform-based indexing approach further enhances the sensitivity.

Open and strong-scaling tools for atom-probe crystallography: high-throughput methods for indexing crystal structure and orientation

Volumetric crystal structure indexing and orientation mapping are key data processing steps for virtually any quantitative study of spatial correlations between the local chemical composition features and the microstructure of a material. For electron and X-ray diffraction methods it is possible to develop indexing tools which compare measured and analytically computed patterns to decode the structure and relative orientation within local regions of interest. Consequently, a number of numerically efficient and automated software tools exist to solve the above characterization tasks. For atom-probe tomography (APT) experiments, however, the strategy of making comparisons between measured and analytically computed patterns is less robust because many APT data sets contain substantial noise. Given that sufficiently general predictive models for such noise remain elusive, crystallography tools for APT face several limitations: their robustness to noise is limited, and therefore so too is their capability to identify and distinguish different crystal structures and orientations. In addition, the tools are sequential and demand substantial manual interaction. In combination, this makes robust uncertainty quantification with automated high-throughput studies of the latent crystallographic information a difficult task with APT data. To improve the situation, the existing methods are reviewed and how they link to the methods currently used by the electron and X-ray diffraction communities is discussed. As a result of this, some of the APT methods are modified to yield more robust descriptors of the atomic arrangement. Also reported is how this enables the development of an open-source software tool for strong scaling and automated identification of a crystal structure, and the mapping of crystal orientation in nanocrystalline APT data sets with multiple phases.

Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio

Signal optimization for transmission Kikuchi diffraction (TKD) measurements in the scanning electron microscope is investigated by a comparison of different sample holder designs. An optimized design is presented, which uses a metal shield to efficiently trap the electron beam after transmission through the sample. For comparison, a second holder configuration allows a significant number of the transmitted electrons to scatter back from the surface of the sample holder onto the diffraction camera screen. It is shown that the secondary interaction with the sample holder leads to a significant increase in the background level, as well as to additional noise in the final Kikuchi diffraction signal. The clean TKD signal of the optimized holder design with reduced background scattering makes it possible to use small signal changes in the range of 2% of the camera full dynamic range. As is shown by an analysis of the power spectrum, the signal-to-noise ratio in the processed Kikuchi diffraction patterns is improved by an order of magnitude. As a result, the optimized design allows an increase in pattern signal to noise ratio which may lead to increase in measurement speed and indexing reliability.

Kikuchi pattern simulations of backscattered and transmitted electrons

We discuss a refined simulation approach which treats Kikuchi diffraction patterns in electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD). The model considers the result of two combined mechanisms: (a) the dynamical diffraction of electrons emitted coherently from point sources in a crystal and (b) diffraction effects on incoherent diffuse intensity distributions. Using suitable parameter settings, the refined simulation model allows to reproduce various thickness- and energy-dependent features which are observed in experimental Kikuchi diffraction patterns. Excess-deficiency features are treated by the effect of gradients in the incoherent background intensity. Based on the analytical two-beam approximation to dynamical electron diffraction, a phenomenological model of excess-deficiency features is derived, which can be used for pattern matching applications. The model allows to approximate the effect of the incident beam geometry as a correction signal for template patterns which can be reprojected from pre-calculated reference data. As an application, we find that the accuracy of fitted projection centre coordinates in EBSD and TKD can be affected by changes in the order of 10 - 3 - 10 - 2 if excess-deficiency features are not considered in the theoretical model underlying a best-fit pattern matching approach. Correspondingly, the absolute accuracy of simulation-based EBSD strain determination can suffer from biases of a similar order of magnitude if excess-deficiency effects are neglected in the simulation model.

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM

Cross correlation based high angular resolution EBSD (or HR-EBSD) has been developed for measurement of elastic strains, lattice rotations (and estimating GND density). Recent advances in Transmission Kikuchi diffraction (TKD), especially the on-axis geometry allows the possibility of acquiring patterns at higher spatial resolution. However, some controversy remains as to whether stresses/strains measured after the sample thinning process are still representative of the bulk sample. In this paper, we explore a way of applying the HR-EBSD method to study strains and lattice rotations in an initially bulk sample, that is then progressively thinned down until a similar analysis can be performed on thin (and electron transparent) samples. Thus, HR-TKD will be compared as a possible alternative to HR-EBSD, in scenarios when it is not always possible to perform EBSD on the surface of the sample. An estimate of strain relaxation in the sample as a result of sample thinning is presented.

Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out

Plasma focused ion beam microscopy (PFIB) is a recent nanofabrication technique that is suitable for site-specific atom probe sample preparation. Higher milling rates and fewer artifacts make it superior to Ga+ FIBs for the preparation of samples where large volumes of material must be removed, for example, when trying to avoid lift-out techniques. Transmission Kikuchi diffraction (TKD) is a method that has facilitated phase identification and crystallographic measurements in such electron transparent samples. We propose a procedure for preparing atom probe tomography (APT) tips from mechanically prepared ribbons by using PFIB. This is highly suitable for the preparation of atom probe tips of interfaces such as interphase boundaries from challenging materials where lift-out tips easily fracture. Our method, in combination with TKD, allows the positioning of regions of interest such as interfaces close to the apex of the tip. We showcase the efficacy of the proposed method in a case study on Alloy 718, where the interface between γ-matrix and δ-phase has not been yet extensively explored through APT due to preparation challenges. Results show depletion of γ″-precipitates near the γ/δ interface. A quantitative evaluation of the composition of phases in the bulk versus near the interface is achieved.

A Crystallography-Mediated Reconstruction (CMR) Approach for Atom Probe Tomography: Solution for a Singleton Pole

Spatially accurate atom probe tomography reconstructions are vitally important when quantitative spatial measurements such as distances, volumes and morphologies etc. of nanostructural features are required information for the researcher. It is well known that the crystallographic information contained within the atom probe data of crystalline materials can be used to calibrate the tomographic reconstruction. Specifically, the crystallographic information projected into the field evaporation images is used. This offers a powerful and accurate enhancement of the atom probe technique. However, this is often difficult to do in practice. In previously reported approaches, it was necessary to index at least two poles to compute the image compression factor 'ξ' and observe crystallographic planes in at least one of the pole regions to obtain a measure of the field factor 'k_f' while also manually accounting for a change in reconstruction parameters throughout the dataset. Not only is this error-prone and time consuming, it does not work for materials that exhibit limited crystallographic information in their field evaporation image. Here, we extend the applicability of the crystallographic calibration of atom probe data by proposing a reconstruction methodology where only one pole with observable lattice planes is required in the projected detector image. Our proposal also accounts for dynamic variations in the reconstruction parameters throughout the 3D dataset. The method is simpler and significantly faster to implement and is applicable to more atom probe situations than previously approaches. Our single-pole crystallography mediated reconstruction (SP-CMR) utilizes the Hawkes-Kasper projection model (equivalent to the equidistant-azimuthal projection model) and the direct fourier (DF) fit algorithm to determine the precise reconstruction parameters required to produce flat atomic planes. It is applied to experimental Al and highly Sb-doped Si data. The discrepancies between the spatial dimensions of the SP-CMR reconstructions compared to uncalibrated reconstructions are visually apparent. Consistent plane spacings and angles between crystallographic directions matching the theoretically known values for each crystal structure are demonstrated.

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

Two advanced, automated crystal orientation mapping techniques suited for nanocrystalline materials—precession electron diffraction (PED) in transmission electron microscopy (TEM) and on-axis transmission Kikuchi diffraction (TKD) in scanning electron microscopy (SEM)—are evaluated by comparing the orientation maps obtained from the identical location on a 30 nm-thick nanocrystalline tungsten (W) thin film. A side-by-side comparison of the orientation maps directly showed that the large-scale orientation features are almost identical. However, there are differences in the fine details, which arise from the fundamentally different nature of the spot pattern and Kikuchi line pattern in terms of the excitation volume and the angular resolution. While TEM-PED is more reliable to characterize grains oriented along low-index zone axes, the high angular resolution of SEM-TKD allows the detection of small misorientation between grains and thus yields better quantification and statistical analysis of grain orientation. Given that both TEM-PED and SEM-TKD orientation mapping techniques are complementary tools for nanocrystalline materials, one can be favorably selected depending on the requirements of the analysis, as they have competitive performance in terms of angular resolution and texture quantification.

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection efficiency of the detector and its large array of pixels allow sensitive and accurate detection of Kikuchi bands arising from primary electron beam excitation energies of 4 keV to 28 keV, with the optimal contrast occurring in the range of 8-16 keV. The diffraction pattern acquisition speed is substantially improved via a sparse sampling mode, resulting from the acquisition of a reduced number of pixels on the detector. Standard inpainting algorithms are implemented to effectively estimate the information in the skipped regions in the acquired diffraction pattern. For EBSD mapping, an acquisition speed as high as 5988 scan points per second is demonstrated, with a tolerable fraction of indexed points and accuracy. The collective capabilities spanning from high angular resolution EBSD patterns to high speed pattern acquisition are achieved on the same detector, facilitating simultaneous detection modalities that enable a multitude of advanced EBSD applications, including lattice strain mapping, structural refinement, low-dose characterization, 3D-EBSD and dynamic in situ EBSD.

Microstructure and Fluctuation-Induced Conductivity Analysis of Bi2Sr2CaCu2O8+δ (Bi-2212) Nanowire Fabrics

Resistance measurements were performed on Bi2Sr2CaCu2O8+δ (Bi-2212) fabric-like nanowire networks or nanofiber mats in the temperature interval 3 K ≤T≤ 300 K. The nanowire fabrics were prepared by means of electrospinning, and consist of long (up to 100 μm) individual nanowires with a mean diameter of 250 nm. The microstructure of the nanowire network fiber mats and of the individual nanowires was thoroughly characterized by electron microscopy showing that the nanowires can be as thin as a single Bi-2212 grain. The polycrystalline nanowires are found to have a texture in the direction of the original polymer nanowire. The overall structure of the nanofiber mats is characterized by numerous interconnects among the nanowires, which enable current flow across the whole sample. The fluctuation-induced conductivity (excess conductivity) above the superconducting transition temperature, Tc, was analyzed using the Aslamzov-Larkin model. Four distinct fluctuation regimes (short-wave, two-dimensional, three-dimensional and critical fluctuation regimes) could be identified in the Bi-2212 nanowire fabric samples. These regimes in such nanowire network samples are discussed in detail for the first time. Based on this analysis, we determine several superconducting parameters from the resistance data.

Comparison of Orientation Mapping in SEM and TEM

Multiple experimental configurations for performing nanoscale orientation mapping are compared to determine their fidelity to the true microstructure of a sample. Transmission Kikuchi diffraction (TKD) experiments in a scanning electron microscope (SEM) and nanobeam diffraction (NBD) experiments in a transmission electron microscope (TEM) were performed on thin electrodeposited hard Au films with two different microstructures. The Au samples either had a grain size that is >50 or <20 nm. The same regions of the samples were measured with TKD apparatuses at 30 kV in an SEM with detectors in the horizontal and vertical configurations and in the TEM at 300 kV. Under the proper conditions, we demonstrate that all three configurations can produce data of equivalent quality. Each method has strengths and challenges associated with its application and representation of the true microstructure. The conditions needed to obtain high-quality data for each acquisition method and the challenges associated with each are discussed.

Using local GND density to study SCC initiation

Strain and geometric necessary dislocations (GNDs) have been mapped with nm-resolution around grain boundaries affected by stress corrosion cracking (SCC) or intergranular oxidation with the aim of clarifying which local conditions that trigger SCC initiation of Alloy 600 in primary water reactor (PWR) water environment. Regions studied included the cracked and uncracked portion of the same SCC-affected grain boundaries and a comparable grain boundary in the as-received condition. High-resolution "on-axis" Transmission Kikuchi Diffraction (TKD) was used to generate strain and GND density based on the cross-correlation image processing method to probe shifts of specific zone axis in the TKD patterns from all regions. All cracked boundaries analyzed had local GND densities higher than 1 × 10¹⁶ m^-2. Similar grain boundaries, from as-received samples had GNDs of 5 × 10¹⁴ m^-2, while an intermediate level was found in the oxidized but uncracked portion of the same GB. Results, together with a discussion on the advantages and limitations of the approach, will be presented.

What EBSD and TKD Tell Us about the Crystallography of the Martensitic B2-B19′ Transformation in NiTi Shape Memory Alloys

The complex and intricate microstructure of B19′ martensite in shape memory nickel titanium alloys is generally explained with the Phenomenological Theory of Martensitic Crystallography (PTMC). Over the last decade, we have developed an alternative approach that supposes the existence of a “natural” parent–daughter orientation relationship (OR). As the previous TEM studies could not capture the global crystallographic characteristics of the B2→B19′ transformation required to discriminate the models, we used Electron BackScatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD) to investigate a polycrystalline NiTi alloy composed of B19′ martensite. The EBSD maps show the large martensite plates and reveal the coexistence of different ORs. The TKD maps permit us to image the “twins” and confirm the continuum of orientations suspected from EBSD. The results are interpreted with the alternative approach. The predominant OR in EBSD is the “natural” OR for which the dense directions and dense planes of B2 and B19′ phases are parallel—i.e., (010)B19′//(110)B2 and [101]B19′//[ 1 ¯ 11]B2. The natural OR was used to automatically reconstruct the prior parent B2 grains in the EBSD and TKD maps. From the distortion matrix associated with this OR, we calculated that the habit plane could be (1 1 ¯ 2)B2//(10 1 ¯ )B19′. The traces of these planes are in good agreement with the EBSD maps. We interpret the other ORs as “closing-gap” ORs derived from the natural OR to allow the compatibility between the distortion variants. Each of them restores a parent symmetry element between the variants that was lost by distortion but preserved by correspondence.

Obtaining diffraction patterns from annular dark-field STEM-in-SEM images: Towards a better understanding of image contrast

This contribution demonstrates experimentally how a series of annular dark-field transmission images collected in a scanning electron microscope (SEM) with a basic solid-state detector can be used to quantify electron scattering distributions (i.e., diffraction patterns). The technique is demonstrated at different primary electron energies with a polycrystalline aluminum sample and two amorphous samples comprising vastly different mass-thicknesses. Contrast reversal is demonstrated in both amorphous samples, suggesting that intuitive image contrast interpretation is not always straightforward even for ultrathin, low atomic number samples. We briefly address how the scattering distributions obtained here can be used as an aid to interpret contrast in annular dark-field images, and how to set up imaging conditions to obtain intuitively interpretable contrast from samples with regions of significantly different thickness.

Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles

Investigating how grain structure affects the functional properties of nanoparticles requires a robust method for nanoscale grain mapping. In this study, we directly compare the grain mapping ability of transmission Kikuchi diffraction (TKD) in a scanning electron microscope to automated crystal orientation mapping (ACOM) in a transmission electron microscope across multiple nanoparticle materials. Analysis of well-defined Au, ZnO, and ZnSe nanoparticles showed that the grain orientations and GB geometries obtained by TKD are accurate and match those obtained by ACOM. For more complex polycrystalline Cu nanostructures, TKD provided an interpretable grain map whereas ACOM, with or without precession electron diffraction, yielded speckled, uninterpretable maps with orientation errors. Acquisition times for TKD were generally shorter than those for ACOM. Our results validate the use of TKD for characterizing grain orientation and grain boundary distributions in nanoparticles, providing a framework for the broader exploration of how microstructure influences nanoparticle properties.

Low energy nano diffraction (LEND) - A versatile diffraction technique in SEM

Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a 'diffraction mode' in SEM using a fluorescent screen and a dedicated in vacuo camera. With this setup spot-like nano-beam diffraction patterns of thin samples can be acquired with electron energies as low as 500 eV. We therefore coin the name Low Energy Nano Diffraction (LEND). Diffraction patterns can be recorded from single positions on the sample or integrated over selected areas by adjustable scan patterns. Besides showing the principal application of the technique to standard materials such as gold and silicon we also explore the application to graphene and other 2D materials. Besides single pattern measurements, also full 4D-STEM diffraction mappings are demonstrated. Finally, we show how the integration of a versatile diffraction mode in SEM enables a thorough analysis performed with a single instrument.

Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction

High resolution electron backscatter diffraction (HREBSD), an SEM-based diffraction technique, may be used to measure the lattice distortion of a crystalline material and to infer the geometrically necessary dislocation content. Uncertainty in the image correlation process used to compare diffraction patterns leads to an uneven distribution of measurement noise in terms of the lattice distortion, which results in erroneous identification of dislocation type and density. This work presents a method of reducing noise in HREBSD dislocation measurements by removing the effect of the most problematic components of the measured distortion. The method is then validated by comparing with TEM analysis of dislocation pile-ups near a twin boundary in austenitic stainless steel and with ECCI analysis near a nano-indentation on a tantalum oligocrystal. The HREBSD dislocation microscopy technique is able to resolve individual dislocations visible in TEM and ECCI and correctly identify their Burgers vectors.

Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX software

Relating a crystal's microscopic structure-such as orientation and size-to a material's macroscopic properties is of great importance in materials science. Although most crystal orientation microscopy is performed in the scanning electron microscope (SEM), transmission electron microscopy (TEM)-based methods have a number of benefits, including higher spatial resolution. Current TEM orientation methods have either specific hardware requirements or use software that has limited scope, utility, or availability. In this article, a technique is described for orientation mapping using Kikuchi diffraction patterns generated from a focused STEM probe. One key advantage is that indexing and analysis of the patterns and maps occurs in the robust OIM Analysis software, currently widely used for electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) analysis. It was found that with minimal to no image processing and by changing only a few software parameters, reliable indexing of Kikuchi patterns is possible. Three samples, a deformed β-Titanium (Ti), a medium carbon heat-treated steel, and BaCe_0.8Y_0.2O_3-δ were tested to determine the effectiveness of the approach. In all three measurements the algorithms effectively and reliably determined the phases and the crystal orientations of the features measured. For the two orientation maps produced, less than 5% of the patterns were misindexed including boundary areas where overlapping patterns existed. An angular resolution of 0.15° was achieved while features <25 nm were able to be spatially resolved.

Tuneable Magneto-Resistance by Severe Plastic Deformation

Bulk metallic samples were synthesized from different binary powder mixtures consisting of elemental Cu, Co, and Fe using severe plastic deformation. Small particles of the ferromagnetic phase originate in the conductive Cu phase, either by incomplete dissolution or by segregation phenomena during the deformation process. These small particles are known to give rise to granular giant magneto-resistance. Taking advantage of the simple production process, it is possible to perform a systematic study on the influence of processing parameters and material compositions on the magneto-resistance. Furthermore, it is feasible to tune the magneto-resistive behavior as a function of the specimens’ chemical composition. It was found that specimens of low ferromagnetic content show an almost isotropic drop in resistance in a magnetic field. With increasing ferromagnetic content, percolating ferromagnetic phases cause an anisotropy of the magneto-resistance. By changing the parameters of the high pressure torsion process, i.e., sample size, deformation temperature, and strain rate, it is possible to tailor the magnitude of giant magneto-resistance. A decrease in room temperature resistivity of ~3.5% was found for a bulk specimen containing an approximately equiatomic fraction of Co and Cu.

Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods

Spatial resolution is one of the key factors in orientation microscopy, as it determines the accuracy of grain size investigation and phase identification. We determined the spatial resolutions of on-axis and off-axis transmission Kikuchi diffraction (TKD) methods by calculating correlation coefficients using only the effective parts of on-axis and off-axis transmission Kikuchi patterns. During the calculation, we used average filtering to evaluate the spatial resolution more accurately. The spatial resolutions of both on-axis and off-axis TKD methods were determined in the same scanning electron microscope at different accelerating voltages and specimen thicknesses. The spatial resolution of the on-axis TKD was higher than that of the off-axis TKD at the same parameters. Furthermore, with an increase in accelerating voltage or a decrease in specimen thickness, the spatial resolutions of the two configurations could be significantly improved, from tens of nanometers to below 10 nm. At a voltage of 30 kV and sample thickness of 74 nm, both on-axis and off-axis TKD methods exhibited the highest resolutions of 6.2 and 9.7 nm, respectively.

Automated Reconstruction of Spherical Kikuchi Maps

An automated approach to fully reconstruct spherical Kikuchi maps from experimentally collected electron backscatter diffraction patterns and overlay each pattern onto its corresponding position on a simulated Kikuchi sphere is presented in this study. This work demonstrates the feasibility of warping any Kikuchi pattern onto its corresponding location of a simulated Kikuchi sphere and reconstructing a spherical Kikuchi map of a known phase based on any set of experimental patterns. This method consists of the following steps after pattern collection: (1) pattern selection based on multiple threshold values; (2) extraction of multiple scan parameters and phase information; (3) generation of a kinematically simulated Kikuchi sphere as the "skeleton" of the spherical Kikuchi map; and (4) overlaying the inverse gnomonic projection of multiple selected patterns after appropriate pattern center calibration and refinement. The proposed method is the first automated approach to reconstructing spherical Kikuchi maps from experimental Kikuchi patterns. It potentially enables more accurate orientation calculation, new pattern center refinement methods, improved dictionary-based pattern matching, and phase identification in the future.

Toward high-throughput defect density quantification: A comparison of techniques for irradiated samples

Transmission electron microscopy (TEM) is an established tool used for the investigation of defects in materials. Traditionally, diffraction contrast techniques-two-beam bright-field and weak-beam dark-field-have been used to image defects due to contrast sensitivity from weak lattice strains. Use of these methods entail an intricate tilt series of imaging using different diffracting vectors, g, to verify the g•b invisibility criterion relative to the different defect types and habit planes inherent to the material. Recently, the addition of down-zone imaging and STEM imaging has also proven to be effective imaging techniques for defect density analysis. Interest in nanocrystalline (NC) materials, spurred by their conjectured superior properties compared to their coarse-grain counterparts, has been thriving and the investigation of their defect morphologies is essential. Maneuvering within NC samples in the TEM adds another layer of difficulty making the aforementioned techniques not practical for application to specimens with complex microstructures. For this reason, we have devised a protocol for identifying NC grains optimally oriented for quantitative analysis using NanoMegas ASTAR automated crystal orientation mapping (ACOM) in the TEM. In this work, we conduct a series of experiments assessing the effectiveness of conventional two-beam bright-field, weak-beam dark-field, and down-zone STEM imaging. We also evaluate an ACOM-assisted multibeam imaging method and compare defect density results obtained using each technique in an irradiated nanocrystalline Au sample.

On the depth resolution of transmission Kikuchi diffraction (TKD) analysis

In this paper, we have analyzed the depth resolution that can be achieved by on-axis transmission Kikuchi diffraction (TKD) using a Zr-Nb alloy. The results indicate that the signals contributing to detectable Kikuchi bands originate from a depth of approximately the mean free path of thermal diffuse scattering (λ_TDS) from the bottom surface of a thin foil sample. This existing surface sensitivity can thus lead to the observation of different grain structures when opposite sides of a nano-crystalline foil are facing the incident electron beam. These results also provide a guideline for the ideal sample thickness for TKD analysis of ≤ 6λ_TDS, or 21 times the elastic scattering mean free path (λ_MFP) for samples of high crystal symmetry. For samples of lower symmetry, a smaller thickness ≤ 3λ_TDS, or ≤ 10λ_MFP is suggested.

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we review the use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others.

High throughput crystal structure and composition mapping of crystalline nanoprecipitates in alloys by transmission Kikuchi diffraction and analytical electron microscopy

Statistically significant crystal structure and composition identification of nanocrystalline features such as nanoparticles/nanoprecipitates in materials chemistry and alloy designing using electron microscopy remains a grand challenge. In this paper, we reveal that differing crystallographic phases of nanoprecipitates in alloys can be mapped with unprecedented statistics using transmission Kikuchi diffraction (TKD), on typical carbon-based electron-transparent samples. Using a case of multiphase, multicomponent nanoprecipitates extracted from an improved version of 9% chromium Eurofer-97 reduced-activation ferritic-martensitic steel we show that TKD successfully identified more than thousand M₂₃C₆, MX, M₇C_3, and M₂X (M=Fe, Cr, W, V, Ta; X = C, N) nanoprecipitates in a single scan, something that is currently unachievable using a transmission electron microscope (TEM) without incorporating a precision electron diffraction (PED) system. Precipitates as small as ∼20-25 nm were successfully phase identified by TKD. We verified the TKD phase identification using high-resolution transmission electron microscopy (HRTEM) and convergent beam electron diffraction (CBED) pattern analysis of a few precipitates that were identified by TKD on same sample. TKD study was combined with state-of-art analytical scanning transmission electron microscopy (STEM)-energy dispersive X-ray (EDX) spectroscopy and multivariate statistical analysis (MVSA) which provided the complete crystal structure and distinct chemistries of the precipitates in the steel in a high throughput automated way. This technique should be applicable to characterizing any multiphase crystalline nanoparticles or nanomaterials. The results highlight that combining phase identification by TKD with analytical STEM and modern data analytics may open new pathways in big data material characterization at nanoscale that may be highly beneficial for characterizing existing materials and in designing new materials.

Introducing a Crystallography-Mediated Reconstruction (CMR) Approach to Atom Probe Tomography

Current approaches to reconstruction in atom probe tomography produce results that exhibit substantial distortions throughout the analysis depth. This is largely because of the need to apply a multitude of assumptions when estimating the evolution of the tip shape, and other pseudo-empirical reconstruction factors, which vary both across the face of the tip and throughout the analysis depth. We introduce a new crystallography-mediated reconstruction to improve the spatial accuracy and dramatically reduce these in-depth variations. To achieve this, we developed a barycentric transform to directly relate atomic positions in detector space to real space. This is mediated by novel crystallographic analysis techniques, including: (1) calculating the orientation of a crystal directly from the field evaporation map, (2) tracking pole locations throughout the evaporation sequence, and (3) accounting for the evolving tip radius in a manner that removes the dependence on the geometric field factor. By improving the in-depth spatial accuracy of the atom probe reconstruction, a greater accuracy of the atomic neighborhood relationships is available. This is critical in modern materials science and engineering, where an understanding of the solid solution architecture, precipitate dispersions, and descriptions of the interfaces between phases or grains are key inputs to microstructure-property relationships.

Analysis of the microstructure of bulk MgB2 using TEM, EBSD and t-EBSD

EBSD analysis can provide information about grain orientation, texture and grain boundary misorientation of bulk superconducting MgB₂ samples intended for supermagnet applications. However, as the grain size of the MgB₂ bulks is preferably in the 100-200 nm range, the common EBSD technique operating in reflection mode works only properly on highly dense samples. In order to achieve reasonably good Kikuchi pattern quality on all types of MgB₂ samples, we apply here the newly developed transmission EBSD (t-EBSD) technique to spark-plasma sintered MgB₂ samples. This method requires the preparation of TEM slices by means of focused ion-beam milling, which are then analysed within the SEM, operating with a custom-built sample holder. To obtain multiphase scans, we identified the Kikuchi pattern of the MgB₄ phase which appears at higher reaction temperatures and may act as additional flux pinning sites. We present here for the first time EBSD mappings of multiple phases, which include MgB₂ , MgB₄ and MgO. LAY DESCRIPTION: The electron backscatter diffraction (EBSD) technique operating in the scanning electron microscope provides information on the crystallographic orientation the material by recording Kikuchi patterns. In polycrystalline samples, it becomes possible to analyse the orientations of the grains to each other. The metallic superconductor with the currently highest superconducting transition temperature, MgB₂ with a T_c of 38.5 K, can be used in applications in polycrystalline form. One such application of interest are trapped field magnets or supermagnets, where the superconductor cooled in an applied magnetic field can trap the magnetic field as vortices at numerous flux pinning sites in the sample. When the external magnetic field is removed, the sample will stay magnetised as long as it is kept cool, and importantly, the trapped magnetic fields can be much higher as for any permanent magnet. However, the small size of the MgB₂ grains in the 100-200 nanometre range requires a different approach when using the EBSD technique on such samples. The recently developed EBSD technique working in transmission mode (t-EBSD) helps considerably to image such materials. In this approach, a tiny TEM slice has to be milled out from the original sample by using focused ion beam milling. To understand the properties of the flux pinning in the spark-plasma sintered MgB2 sample, we had to identify the Kikuchi pattern of MgB₄ , which is another, non-superconducting phase appearing at higher reaction temperatures required to compact the material. Using this information, we could perform EBSD scans using three different phases, MgB₂ , MgB₄ and MgO. The EBSD mappings enable to see where the secondary phase particles are located in the sample, and to judge if the particles could work as flux pinning sites.

Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale

It is challenging to quantify the geometrically necessary dislocation (GND) density at the nanoscale using conventional electron backscatter diffraction due to its limited spatial resolution. To overcome this problem, in this study, the transmission Kikuchi diffraction (TKD) technique is used to measure lattice orientation and to calculate the corresponding nanoscale GND density. Using the TKD method, a variation of GND density from 6 × 10¹⁴ to 10¹⁶ m^-2 has been measured in a welded super duplex stainless steel sample. The distribution of dislocation density is shown to be in good agreement with transmission electron microscope (TEM) result. Compared with dislocation measurements obtained by TEM, the TKD-GND method is revealed to be a relatively accurate, fast and accessible method.

Resolution of transmission electron backscatter diffraction in aluminum and silver: Effect of the atomic number

This work aims to investigate the influence of intrinsic and extrinsic factors on the physical resolution of the transmission electron backscattered diffraction technique (t-EBSD) in aluminum and silver. Here, we focus on the intrinsic factors, namely, atomic number and thickness of the specimen, and extrinsic set-up factors, which include the electron beam voltage, working distance, and specimen tilt. The working distance and tilt angle, which are selected as 12 mm and 60° for Al and 12 mm and 50° for Ag, respectively, reveal a sharp pattern with high contrast. The physical resolutions at the lateral and longitudinal directions depend on the depth resolution. The depth and lateral and longitudinal resolutions increase in Al but decrease in Ag with increased accelerating voltage. The decrease in specimen thickness for Al and Ag from 400 nm to 100 nm reduces the lateral and longitudinal resolutions. The most ideal depth and lateral and longitudinal resolutions obtained under a thickness of 100 nm are 22.7, 18.9, and 33.7 nm at 30 kV for Ag and 34.7, 22.8, and 36.6 nm at 15 kV for Al, respectively.

Monte Carlo simulation and theoretical calculation of SEM image intensity and its application in thickness measurement

The intensity profiles of backscattered and secondary electrons from a pure Mg sample have shown a variation with sample thickness and acceleration voltage in the range of 5-30 kV, depending on the specimen holder used. The intensities of backscattered electron (BSE) and secondary electron (SE) signals increases with the sample thickness until saturation when using a scanning transmission electron microscopy (STEM) holder with a closed tube below the sample. However the SE signal increases to the maximum and then decreases with the sample thickness when using a transmission Kikuchi diffraction (TKD) holder with no shielding below the sample whereas the BSE signal again increases until saturation. The influence of the holder on the SE signals is caused by the fact that secondary electrons emitted from the bottom surface could be detected only when using the TKD holder but not the STEM holder. The experimental results obtained are consistent with the Monte Carlo simulation results. Application of the magnitude of the SE and BSE signals to measurement of sample thickness has been considered and the BSE image profile shows a reasonably good accuracy.

Characterization by Scanning Precession Electron Diffraction of an Aggregate of Bridgmanite and Ferropericlase Deformed at HP-HT

Scanning precession electron diffraction is an emerging promising technique for mapping phases and crystal orientations with short acquisition times (10-20 ms/pixel) in a transmission electron microscope similarly to the Electron Backscattered Diffraction (EBSD) or Transmission Kikuchi Diffraction (TKD) techniques in a scanning electron microscope. In this study, we apply this technique to the characterization of deformation microstructures in an aggregate of bridgmanite and ferropericlase deformed at 27 GPa and 2,130 K. Such a sample is challenging for microstructural characterization for two reasons: (i) the bridgmanite is very unstable under electron irradiation, (ii) under high stress conditions, the dislocation density is so large that standard characterization by diffraction contrast are limited, or impossible. Here we show that detailed analysis of intracrystalline misorientations sheds some light on the deformation mechanisms of both phases. In bridgmanite, deformation is accommodated by localized, amorphous, shear deformation lamellae whereas ferropericlase undergoes large strains leading to grain elongation in response to intense dislocation activity with no evidence for recrystallization. Plastic strain in ferropericlase can be semiquantitatively assessed by following kernel average misorientation distributions.