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For: Tsurumaki-Fukuchi A, Tsubaki K, Katase T, Kamiya T, Arita M, Takahashi Y. Stable and Tunable Current-Induced Phase Transition in Epitaxial Thin Films of Ca2RuO4. ACS Appl Mater Interfaces 2020;12:28368-28374. [PMID: 32460482 DOI: 10.1021/acsami.0c05181] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Number Cited by Other Article(s)
1
Shao Z, Schnitzer N, Ruf J, Gorobtsov OY, Dai C, Goodge BH, Yang T, Nair H, Stoica VA, Freeland JW, Ruff JP, Chen LQ, Schlom DG, Shen KM, Kourkoutis LF, Singer A. Real-space imaging of periodic nanotextures in thin films via phasing of diffraction data. Proc Natl Acad Sci U S A 2023;120:e2303312120. [PMID: 37410867 PMCID: PMC10334741 DOI: 10.1073/pnas.2303312120] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/27/2023] [Accepted: 05/11/2023] [Indexed: 07/08/2023]  Open
2
Kim J, Kim Y, Mun J, Choi W, Chang Y, Kim JR, Gil B, Lee JH, Hahn S, Kim H, Chang SH, Lee GD, Kim M, Kim C, Noh TW. Defect Engineering in A2 BO4 Thin Films via Surface-Reconstructed LaSrAlO4 Substrates. SMALL METHODS 2022;6:e2200880. [PMID: 36250995 DOI: 10.1002/smtd.202200880] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/07/2022] [Revised: 09/30/2022] [Indexed: 06/16/2023]
3
Kim J, Mun J, Palomares García CM, Kim B, Perry RS, Jo Y, Im H, Lee HG, Ko EK, Chang SH, Chung SB, Kim M, Robinson JWA, Yonezawa S, Maeno Y, Wang L, Noh TW. Superconducting Sr2RuO4 Thin Films without Out-of-Phase Boundaries by Higher-Order Ruddlesden-Popper Intergrowth. NANO LETTERS 2021;21:4185-4192. [PMID: 33979525 DOI: 10.1021/acs.nanolett.0c04963] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
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