Decay of Interface Correlation in Thin Polymer Films

Microphase Separation of Poly(2-(Dimethylamino)Ethyl Methacrylate)-b-Poly(Tetrahydropyranyl Methacrylate) Diblock Copolymer Thin Films

The microphase separation in diblock copolymer films comprising two chemically similar methacrylate blocks, poly(2-(dimethylamino)ethyl methacrylate) and poly(tetrahydropyranyl methacrylate), is investigated. Four symmetric diblock copolymers, with Mn's ranging from 4300 to 109 700 g mol-1 and narrow molecular weight distributions, are synthesized by group-transfer polymerization, are spin-coated from ethyl lactate solutions and are subsequently solvent vapor annealed. The two lower Mn copolymers dewet the silicon substrates after annealing, whereas the two higher Mn copolymers reveal the formation of holes and islands by optical microscopy, suggesting their microphase separation into lamellae structures orientated parallel to the substrate. The ordering of these weakly segregated diblock copolymers is verified by X-ray reflectivity (XRR) and grazing-incidence small-angle X-ray scattering (GISAXS). XRR provided the film thickness and lamellae spacing by probing along the direction perpendicular to the sample surface, whereas GISAXS probes the nanoscale morphology along the sample plane and the lateral and vertical correlation lengths of the films by analyzing the diffuse scattering. The lamellae thicknesses determined by XRR and GISAXS are in good agreement with those measured by atomic force microscopy. The results hold great promise for the development of highly functional ordered nanostructures in thin film geometries for applications in energy, catalysis, and others.

Investigation of Roughness Correlation in Polymer Brushes via X-ray Scattering

Thin polymer films and coatings are used to tailor the properties of surfaces in various applications such as protection against corrosion, biochemical functionalities or electronic resistors. Polymer brushes are a certain kind of thin polymer films, where polymer chains are covalently grafted to a substrate and straighten up to form a brush structure. Here we report on differences and similarities between polymer brushes and spin-coated polymer films from polystyrene and polymethyl methacrylate with special emphasis on surface roughness and roughness correlation. The phenomenon of roughness correlation or conformality describes the replication of the roughness profile from the substrate surface to the polymer surface. It is of high interest for polymer physics of brush layers as well as applications, in which a homogeneous polymer layer thickness is required. We demonstrate that spin-coated films as well as polymer brushes show roughness correlation, but in contrast to spin-coated films, the correlation in brushes is stable to solvent vapor annealing. Roughness correlation is therefore an intrinsic property of polymer brushes.

Following the Morphological Disruption by an Electrolyte of a Buried Interface

A challenge of broad interest in both materials science and biology is the study of interfaces that are buried within a structure, particularly multilayer structures. Despite the enormous costs of corrosion and many decades of corrosion research, details of the mechanisms of various sorts of corrosion are still not clear, in part due to the difficulty in interrogating the interface between the corroding metal and an organic coating, which is typically used to mitigate corrosion. Generally, the performance of such coatings is evaluated by visual inspection after exposure or by modeling impedance data, which is a process not straightforwardly connected to physical interface structures. "Rocking-curve" X-ray scattering measurements provide a means of probing such interfaces due to the ability of X-rays to penetrate materials. Here, variations in the morphology of an interface between a protective coating and a metal substrate due to exposure to an electrolyte are derived from analysis of rocking-curve data in conjunction with atomic force microscopy imaging of the outer coating surface. The interfaces of cross-linked epoxy coatings with aluminum are irreversibly changed after 12 h of contact between the electrolyte solution and the face of the coating. The character of this change varies with the molecule used to cross-link the coating. Since X-ray off-specular scattering is sensitive to changes on the nanometer scale, it is also able to register interface degradation on time scales shorter than those probed by many other techniques, potentially expediting the evaluation of coatings for protection against degradation of the interface.

Stratification and two glass-like thermal transitions in aged polymer films

Using X-ray reflectivity, spectroscopic ellipsometry and Raman spectroscopy, we have studied the stratified structure and the two glass-like thermal transitions in sufficiently aged glassy polystyrene films. We find that favorable interaction between the solid substrate and the polymer film induces stratification within the film resulting in different densities across the film thickness. Existence of two glass-like thermal transitions (one at 70 °C and the other at 95 °C) is independently confirmed by temperature dependent spectroscopic ellipsometry and Raman spectroscopy measurements. Interestingly, the thermal coefficient of expansion of the polymer film displays anomalous behavior with temperature and is found to have the lowest value over the temperature range 70-95 °C, i.e. between the two observed glass-like thermal transition temperatures.

Foundation of correlation ellipsometry

An experimental strategy for the detection of fluctuation dynamics at interfaces based on a combination of photon correlation spectroscopy (PCS) with a nulling ellipsometry scheme is investigated theoretically. The intensity description of ellipsometry measurements is generalized to PCS time correlation functions. The nulling ellipsometry procedure is applied for every lag time t of the correlation functions, to extract the dynamics connected to the coherent signal which contains the interface dynamics. The classical ellipsometry parameters Δ and tanΨ are generalized to functions and tan [capital Psi, Greek, tilde]_Q(t). A suitable Siegert relation is derived and employed to show that either field correlation functions or intensity correlation functions after baseline subtraction can be used as the starting point for the nulling ellipsometry procedure.

Sorption of Water and Initial Stages of Swelling of Thin PNIPAM Films Using in Situ GISAXS Microfluidics

The sorption of low-molecular penetrants by thin polymer films, as well as structural changes provoked therein, is of high relevance for many fields of application. Complex permeation, diffusion, swelling, and dissolution processes are often induced within films by solvents or gases. Here, we use a novel in situ microfluidics-grazing incidence small-angle X-ray scattering (GISAXS) setup to examine changes in film thickness and in the surface structure of a thin polymer film that sorbs a good solvent. Thus, this technique is highly complementary to the established techniques on the field of diffusion in polymers. The initial stages of water uptake and swelling are resolved for a 50 nm thin, hydrophilic poly(N-isopropylacrylamide) (PNIPAM) film, before its dissolution sets in. The initial stages of swelling are tentatively described by anomalous swelling induced by a time- and space-dependent diffusion coefficient.

Arrangement of Maghemite Nanoparticles via Wet Chemical Self-Assembly in PS-b-PNIPAM Diblock Copolymer Films

The structure and magnetic behavior of hybrid films composed of maghemite (γ-Fe2O3) nanoparticles (NPs) and an asymmetric diblock copolymer (DBC) polystyrene61-block-polyN-isopropylacrylamide115 are investigated. The NPs are coated with PS chains, which allow for a selective incorporation inside the PS domains at different NP concentrations. Upon incorporation of low amounts of NPs into the DBC thin films, the initial parallel (to film surface) cylinder morphology changes to a well ordered, perpendicularly oriented one. The characteristic domain distance of the DBC is increased due to the swelling of the PS domains with NPs. At higher NP concentrations, the excess NPs which can no longer be embedded in the PS domains, are accumulated at the film surface, and NP aggregates form. Irrespective of NP concentration, a superparamagnetic behavior of the metal oxide-DBC hybrid films is found. Such superparamagnetic properties make the established hybrid films interesting for high density magnetic storage media and thermoresponsive magnetic sensors.

In situ monitoring of laser-induced periodic surface structures formation on polymer films by grazing incidence small-angle X-ray scattering

The formation of laser-induced periodic surface structures (LIPSS) on model spin-coated polymer films has been followed in situ by grazing incidence small-angle X-ray scattering (GISAXS) using synchrotron radiation. The samples were irradiated at different repetition rates ranging from 1 up to 10 Hz by using the fourth harmonic of a Nd:YAG laser (266 nm) with pulses of 8 ns. Simultaneously, GISAXS patterns were acquired during laser irradiation. The variation of both the GISAXS signal with the number of pulses and the LIPSS period with laser irradiation time is revealing key kinetic aspects of the nanostructure formation process. By considering LIPSS as one-dimensional paracrystalline lattice and using a correlation found between the paracrystalline disorder parameter, g, and the number of reflections observed in the GISAXS patterns, the variation of the structural order of LIPSS can be assessed. The role of the laser repetition rate in the nanostructure formation has been clarified. For high pulse repetition rates (i.e., 10 Hz), LIPSS evolve in time to reach the expected period matching the wavelength of the irradiating laser. For lower pulse repetition rates LIPSS formation is less effective, and the period of the ripples never reaches the wavelength value. Results support and provide information on the existence of a feedback mechanism for LIPSS formation in polymer films.

Densification and depression in glass transition temperature in polystyrene thin films

Ellipsometry and X-ray reflectivity were used to characterize the mass density and the glass transition temperature of supported polystyrene (PS) thin films as a function of their thickness. By measuring the critical wave vector (qc) on the plateau of total external reflection, we evidence that PS films get denser in a confined state when the film thickness is below 50 nm. Refractive indices (n) and electron density profiles measurements confirm this statement. The density of a 6 nm (0.4 gyration radius, Rg) thick film is 30% greater than that of a 150 nm (10Rg) film. A depression of 25 °C in glass transition temperature (Tg) was revealed as the film thickness is reduced. In the context of the free volume theory, this result seems to be in apparent contradiction with the fact that thinner films are denser. However, as the thermal expansion of thinner films is found to be greater than the one of thicker films, the increase in free volume is larger for thin films when temperature is raised. Therefore, the free volume reaches a critical value at a lower Tg for thinner films. This critical value corresponds to the onset of large cooperative movements of polymer chains. The link between the densification of ultrathin films and the drop in their Tg is thus reconciled. We finally show that at their respective Tg(h) all films exhibit a critical mass density of about 1.05 g/cm(3) whatever their thickness. The thickness dependent thermal expansion related to the free volume is consequently a key factor to understand the drop in the Tg of ultrathin films.

Influence of solvent and solvent additive on the morphology of PTB7 films probed via X-ray scattering

Films of the semiconducting polymer poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b']dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl]thieno[3,4-b]thiophenediyl]] with 40% fluorinated monomers, denoted PTB7-F40, are spin coated out of different solvents onto PEDOT:PSS films. The influence of the used solvents chlorobenzene, 1,2-dichlorobenzene, and 1,2,4-trichlorobenzene as well as the influence of the additive 1,8-diiodooctane (DIO) is probed with grazing incidence small- and wide-angle X-ray scattering (GISAXS and GIWAXS). As seen with GISAXS, without DIO, the films are homogeneous and show roughness correlation with the PEDOT:PSS film surface. With DIO, an inner film structure with a size of 50-75 nm is found and the roughness correlations weaken. In addition, as seen in GIWAXS, the crystalline part of the films is influenced by the used solvent if DIO is added.

Evolution of lateral structures during the functional stack build-up of P3HT:PCBM-based bulk heterojunction solar cells

Bulk heterojunction (BHJ) solar cells from 1,2-dichlorobenzene solution processed regioregular poly(3-hexylthiophene-2,5-diyl) (P3HT): phenyl-C61-butyric acid methyl ester (PCBM) are prepared and investigated at different steps of the multilayer stack build-up of the device. The inner structure is probed from the molecular to the mesoscale with grazing incidence small/wide-angle X-ray scattering (GISAXS/GIWAXS) and X-ray reflectivity (XRR). The surface morphology is detected with atomic force microscopy (AFM). Therefore, an in-depth knowledge of the three-dimensional morphology of the bulk heterojunction solar cell, starting from the cleaned ITO substrate up to the final post-treated solar cell, is generated. The active layer structure is influenced by the annealing as well as by the top contact deposition. Structures coarsen during the evaporation of the metal contacts. The P3HT crystal structure strongly depends on the device processing as well. These morphological changes together with the diffusion of aluminum atoms to the active layer are of importance for the device efficiency.

Growth and morphology of sputtered aluminum thin films on P3HT surfaces

Growth and morphology of an aluminum (Al) contact on a poly(3-hexylthiophene) (P3HT) thin film are investigated with X-ray methods and related to the interactions at the Al:P3HT interface. Grazing incidence small-angle scattering (GISAXS) is applied in situ during Al sputter deposition to monitor the growth of the layer. A growth mode is found, in which the polymer surface is wetted and rapidly covered with a continuous layer. This growth type results in a homogeneous film without voids and is explained by the strong chemical interaction between Al and P3HT, which suppresses the formation of three-dimensional cluster structures. A corresponding three stage growth model (surface bonding, agglomeration, and layer growth) is derived. X-ray reflectivity shows the penetration of Al atoms into the P3HT film during deposition and the presence of a 2 nm thick intermixing layer at the Al:P3HT interface.

Debye–Scherrer rings from block copolymer films with powder-like order

The powder-like orientation of lamellar domains in thin films of the diblock copolymer polystyrene-block-poly(methyl methacrylate) is investigated using grazing-incidence small-angle X-ray scattering (GISAXS) and grazing-incidence small-angle neutron scattering (GISANS). Conventional monochromatic GISANS and GISAXS measurements are compared with neutron time-of-flight GISANS. For angles of incidence and exit larger than the critical angle of total external reflection of the polymer, Debye–Scherrer rings are observed. The position of the Debye–Scherrer rings is described quantitatively based on a reduced version of the distorted-wave Born approximation. A strong distortion of the ring shape is caused by refraction and reflections from the film interfaces. Close to the critical angle, the ring shape collapses into a banana shape.

Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB

We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidence small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample information from subnanometer up to micrometer length scales.

Colloidal silver nanoparticle gradient layer prepared by drying between two walls of different wettability

A one-dimensional silver (Ag) nanoparticle gradient layer is prepared from an aqueous colloidal solution upon a polystyrene (PS) coated silicon (Si) substrate. For preparation two walls of different wettability are used. The 40 nm PS-layer exhibits a locally constant film thickness due to the strong roughness correlation with the underlying Si-substrate and is less wettable as compared to the glass plate placed above. The Ag nanoparticles have a triangular prism-like shape. The structural characterization of the obtained complex gradient formed by drying is performed with microbeam grazing incidence small-angle x-ray scattering based on compound refractive lenses. Due to the adsorption from aqueous solution in the selective geometry a double gradient type structure defined by two areas with characteristic lateral lengths and a cross-over regime between both is observed.

Dewetting of the thin liquid bilayers on topographically patterned substrates: formation of microchannel and microdot arrays

A long-wave nonlinear analysis of the defect induced instabilities engendered by van der Waals forces in thin (<100 nm) viscous bilayers is presented. The major focus of this study is on generation of periodic patterns and its miniaturization by exploiting the self-organized instabilities of thin bilayers on topographically patterned substrates. A large variety of self-organized interfacial patterns such as periodic arrays of open and closed micro/nanochannels, isolated and encapsulated micro/nanodroplets, and membranes with ordered pores are obtained on different types of prepatterned substrates. In addition, we show that a bilayer can also be a suitable tool for (i) pattern transfer involving replication of the morphology of the lower layer interface to the free surface of the upper layer and (ii) generation of a mold by the upper layer material filling the periodic interstitial spaces formed by dewetting of the lower layer. Simulations suggest a profound influence of the substrate pattern directed lateral confinement, which governs the length scale of the dewetted structure when the substrate pattern periodicity is well below the spinodal length scale of the unstable bilayer. The influence of the initial configuration of the interfaces on the dewetting pathway and the dewetted structures are also shown.

Morphology of multi-component polymer systems: single chain in mean field simulation studies

Recent work exploring phase separation and self-assembly in multicomponent polymer fluids using a particle-based self-consistent field simulation method is reviewed. The computational method is placed in the context of classical molecular dynamics and Monte Carlo simulations as well as field-theoretic approaches. Its potential is illustrated by applications ranging from spinodal decomposition in symmetric polymer blends and the ordering of diblock copolymers in the bulk to more complex phenomena such as solvent evaporation from thin polymer films and the fabrication of three-dimensional bicontinuous diblock copolymer morphologies reconstruction on patterned substrates.

Supported particle track etched polyimide membranes: a grazing incidence small-angle X-ray scattering study

Particle track etched polyimide membranes on silicon substrates covered with a native oxide layer are investigated. Preparation steps similar to the common classical particle track etched membrane production, giving rise to free-standing membranes, are successfully applied to the supported membranes. Polyimide films are used as a starting material for a template preparation based on high energy ion irradiation. The film/membrane structure is probed at different length scales by grazing incidence small-angle X-ray scattering at each individual preparation step. In addition, characterization with atomic force microscopy, variable-angle spectroscopic ellipsometry, Fourier transform infrared transmission, and attenuated total reflection spectroscopy is performed. An amount of 6 +/- 1 vol % pores inside the polyimide film is detected. The pores are oriented perpendicular to the substrate surface and have a conical shape, yielding a slightly reduced pore size at the substrate/film interface.

Structural relaxation of spin-cast glassy polymer thin films as a possible factor in dewetting

Reiter has recently reported a situation in which the dewetting of quasi-solid films is linked to plastic deformation--rather than viscous flow--resulting from capillary forces. Herein we propose that, in thin films of some glassy polymers--especially poly(methyl methacrylate) (PMMA)--prepared by spin-casting from solvent, structural relaxation might impart sufficient stress to cause plastic deformation. We find that PMMA films decrease in thickness by several percent, which is sufficient to create significant stress in those cases in which the film is attached to a rigid substrate. The floating technique, which can take tens of minutes, might allow most of the structural relaxation to occur prior to dewetting experiments.

Grazing incidence small-angle X-ray scattering: an advanced scattering technique for the investigation of nanostructured polymer films

Hamburg workshop on the "application of synchrotron radiation in chemistry"With grazing incidence small-angle X-ray scattering (GISAXS) the limitations of conventional small-angle X-ray scattering with respect to extremely small sample volumes in the thin-film geometry are overcome. GISAXS turned out to be a powerful advanced scattering technique for the investigation of nanostructured polymer films. Similar to atomic force microscopy (AFM), a large interval of length between molecular and mesoscopic scales is detectable with a surface-sensitive scattering method. While with AFM only surface topographies are accessible, with GISAXS the buried structure is also probed. Because a larger surface area is probed, GISAXS also has a much larger statistical significance compared to AFM. Due to the high demand on collimation, GISAXS experiments are based on synchrotron radiation. Nanostructures parallel and perpendicular to the sample surface observable in thin poly(styrene- block-isoprene) diblock copolymer films are presented as an example of the possibilities of GISAXS.