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Zhou C, Li H, Huang Z, Wan CY, Jin Z, Liu J, Wang J. Probing Electronic Band Structure of Monolayer MoS 2 in Gate-Controlled Resonant Tunneling Diodes. ACS APPLIED MATERIALS & INTERFACES 2025; 17:25915-25921. [PMID: 40231925 PMCID: PMC12051169 DOI: 10.1021/acsami.4c21712] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/16/2024] [Revised: 04/03/2025] [Accepted: 04/08/2025] [Indexed: 04/16/2025]
Abstract
Experimental determination of band structures of monolayer transition metal dichalcogenides (TMDCs) is crucially important in the design and tailoring of the properties of TMDCs. Resonant tunneling spectroscopy (RTS) is an effective technique to probe the band structures of low-dimensional systems by measuring the density of states (DOS) and energy dispersions. Here, we report the investigation of the band structure of monolayer MoS2 (ML-MoS2) in a gate-controlled resonant tunneling diode. Three distinct resonant tunneling kinks are observed in the characteristic current-voltage curves at 0.47, 0.70, and 0.81 V, respectively, which correspond to the conduction band local minimum of ML-MoS2 at K, Q1, and Q2 points. When applying a large positive gate voltage to enhance ML-MoS2 conductivity, the three resonant kinks shift to lower bias at 0.10, 0.32, and 0.39 V, respectively, which is in excellent agreement with the theoretical calculations. Our work offers an effective and more precise way to explore the electronic band structures of TMDCs using RTS.
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Affiliation(s)
- Chengjie Zhou
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
| | - Hui Li
- National
Key Laboratory of Optoelectronic Information Acquisition and Protection
Technology and Institute of Physical Science and Information Technology, Anhui University, Hefei 230601, China
| | - Zhenqiao Huang
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
| | - Chun Yu Wan
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
| | - Zijing Jin
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
| | - Junwei Liu
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
| | - Jiannong Wang
- Department
of Physics, The Hong Kong University of
Science and Technology, Hong Kong, China
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2
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Feng G, Liu Y, Zhu Q, Feng Z, Luo S, Qin C, Chen L, Xu Y, Wang H, Zubair M, Qu K, Yang C, Hao S, Yue F, Duan C, Chu J, Tian B. Giant tunnel electroresistance through a Van der Waals junction by external ferroelectric polarization. Nat Commun 2024; 15:9701. [PMID: 39516220 PMCID: PMC11549478 DOI: 10.1038/s41467-024-54114-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/23/2024] [Accepted: 11/02/2024] [Indexed: 11/16/2024] Open
Abstract
The burgeoning interest in two-dimensional semiconductors stems from their potential as ultrathin platforms for next-generation transistors. Nonetheless, there persist formidable challenges in fully obtaining high-performance complementary logic components and the underlying mechanisms for the polarity modulation of transistors are not yet fully understood. Here, we exploit both ferroelectric domain-based nonvolatile modulation of Fermi level in transitional metal dichalcogenides (MoS2) and quantum tunneling through nanoscale hexagonal boron nitride (h-BN). Our prototype devices, termed as vertical tunneling ferroelectric field-effect transistor, utilizes a Van der Waals MoS2/h-BN/metal tunnel junction as the channel. The Fermi level of MoS2 is bipolarly tuned by ferroelectric domains and sensitively detected by the direct quantum tunneling strength across the junction, demonstrating an impressive electroresistance ratio of up to 109 in the vertical tunneling ferroelectric field-effect transistor. It consumes only 0.16 fJ of energy to open a ratio window exceeding 104. This work not only validates the effectiveness of tailored tunnel barriers in manipulating electronic flow but also highlights a new avenue for the design flexibility and functional versatility of advanced ferroelectric memory technology.
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Affiliation(s)
- Guangdi Feng
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Chongqing Key Laboratory of Precision Optics, Chongqing Institute of East China Normal University, Chongqing, 401120, China
| | - Yifei Liu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Qiuxiang Zhu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China.
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China.
| | - Zhenyu Feng
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Shengwen Luo
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Cuijie Qin
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Luqiu Chen
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Yu Xu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Haonan Wang
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Muhammad Zubair
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Ke Qu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Chang Yang
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Shenglan Hao
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Fangyu Yue
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Chungang Duan
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Collaborative Innovation Center of Extreme Optics, Shanxi University, Shanxi, 030006, China
| | - Junhao Chu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Institute of Optoelectronics, Fudan University, Shanghai, 200433, China
| | - Bobo Tian
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China.
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China.
- Chongqing Key Laboratory of Precision Optics, Chongqing Institute of East China Normal University, Chongqing, 401120, China.
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3
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Zhang X, Huang C, Li Z, Fu J, Tian J, Ouyang Z, Yang Y, Shao X, Han Y, Qiao Z, Zeng H. Reliable wafer-scale integration of two-dimensional materials and metal electrodes with van der Waals contacts. Nat Commun 2024; 15:4619. [PMID: 38816431 PMCID: PMC11139895 DOI: 10.1038/s41467-024-49058-7] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/26/2024] [Accepted: 05/23/2024] [Indexed: 06/01/2024] Open
Abstract
Since the first report on single-layer MoS2 based transistor, rapid progress has been achieved in two-dimensional (2D) material-based atomically thin electronics, providing an alternative approach to solve the bottleneck in silicon device miniaturization. In this scenario, reliable contact between the metal electrodes and the subnanometer-thick 2D materials becomes crucial in determining the device performance. Here, utilizing the quasi-van der Waals (vdW) epitaxy of metals on fluorophlogopite mica, we demonstrate an all-stacking method for the fabrication of 2D devices with high-quality vdW contacts by mechanically transferring pre-deposited metal electrodes. This technique is applicable for complex device integration with sizes up to the wafer scale and is also capable of tuning the electric characteristics of the interfacial junctions by transferring selective metals. Our results provide an efficient, scalable, and low-cost technique for 2D electronics, allowing high-density device integration as well as a handy tool for fundamental research in vdW materials.
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Affiliation(s)
- Xiaodong Zhang
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Chenxi Huang
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
- Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Zeyu Li
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Jun Fu
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Jiaran Tian
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Zhuping Ouyang
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Yuliang Yang
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Xiang Shao
- Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Yulei Han
- Department of Physics, Fuzhou University, Fuzhou, China
| | - Zhenhua Qiao
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China
| | - Hualing Zeng
- International Center for Quantum Design of Functional Materials (ICQD), Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, China.
- Hefei National Laboratory, University of Science and Technology of China, Hefei, China.
- CAS Key Laboratory of Strongly Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei, Anhui, China.
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4
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Meng J, Lee C, Li Z. Adjustment methods of Schottky barrier height in one- and two-dimensional semiconductor devices. Sci Bull (Beijing) 2024; 69:1342-1352. [PMID: 38490891 DOI: 10.1016/j.scib.2024.03.003] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/01/2023] [Revised: 01/10/2024] [Accepted: 02/02/2024] [Indexed: 03/17/2024]
Abstract
The Schottky contact which is a crucial interface between semiconductors and metals is becoming increasingly significant in nano-semiconductor devices. A Schottky barrier, also known as the energy barrier, controls the depletion width and carrier transport across the metal-semiconductor interface. Controlling or adjusting Schottky barrier height (SBH) has always been a vital issue in the successful operation of any semiconductor device. This review provides a comprehensive overview of the static and dynamic adjustment methods of SBH, with a particular focus on the recent advancements in nano-semiconductor devices. These methods encompass the work function of the metals, interface gap states, surface modification, image-lowering effect, external electric field, light illumination, and piezotronic effect. We also discuss strategies to overcome the Fermi-level pinning effect caused by interface gap states, including van der Waals contact and 1D edge metal contact. Finally, this review concludes with future perspectives in this field.
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Affiliation(s)
- Jianping Meng
- Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing 101400, China; School of Nanoscience and Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
| | - Chengkuo Lee
- Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583, Singapore; Center for Intelligent Sensors and MEMS, National University of Singapore, Singapore 117608, Singapore.
| | - Zhou Li
- Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing 101400, China; School of Nanoscience and Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
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5
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Mondal A, Biswas C, Park S, Cha W, Kang SH, Yoon M, Choi SH, Kim KK, Lee YH. Low Ohmic contact resistance and high on/off ratio in transition metal dichalcogenides field-effect transistors via residue-free transfer. NATURE NANOTECHNOLOGY 2023:10.1038/s41565-023-01497-x. [PMID: 37666942 DOI: 10.1038/s41565-023-01497-x] [Citation(s) in RCA: 36] [Impact Index Per Article: 18.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/14/2022] [Accepted: 08/01/2023] [Indexed: 09/06/2023]
Abstract
Beyond-silicon technology demands ultrahigh performance field-effect transistors. Transition metal dichalcogenides provide an ideal material platform, but the device performances such as the contact resistance, on/off ratio and mobility are often limited by the presence of interfacial residues caused by transfer procedures. Here, we show an ideal residue-free transfer approach using polypropylene carbonate with a negligible residue coverage of ~0.08% for monolayer MoS2 at the centimetre scale. By incorporating a bismuth semimetal contact with an atomically clean monolayer MoS2 field-effect transistor on hexagonal boron nitride substrate, we obtain an ultralow Ohmic contact resistance of ~78 Ω µm, approaching the quantum limit, and a record-high on/off ratio of ~1011 at 15 K. Such an ultra-clean fabrication approach could be the ideal platform for high-performance electrical devices using large-area semiconducting transition metal dichalcogenides.
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Affiliation(s)
- Ashok Mondal
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea
- Department of Energy Science, Sungkyunkwan University, Suwon, Republic of Korea
| | - Chandan Biswas
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea.
| | - Sehwan Park
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea
- Department of Energy Science, Sungkyunkwan University, Suwon, Republic of Korea
| | - Wujoon Cha
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea
| | - Seoung-Hun Kang
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Mina Yoon
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Soo Ho Choi
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea
- Department of Energy Science, Sungkyunkwan University, Suwon, Republic of Korea
| | - Ki Kang Kim
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea
- Department of Energy Science, Sungkyunkwan University, Suwon, Republic of Korea
| | - Young Hee Lee
- Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, Republic of Korea.
- Department of Energy Science, Sungkyunkwan University, Suwon, Republic of Korea.
- Department of Physics, Sungkyunkwan University, Suwon, Republic of Korea.
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6
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Zhou Y, Tong L, Chen Z, Tao L, Pang Y, Xu JB. Contact-engineered reconfigurable two-dimensional Schottky junction field-effect transistor with low leakage currents. Nat Commun 2023; 14:4270. [PMID: 37460531 DOI: 10.1038/s41467-023-39705-w] [Citation(s) in RCA: 18] [Impact Index Per Article: 9.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/16/2023] [Accepted: 06/26/2023] [Indexed: 07/20/2023] Open
Abstract
Two-dimensional (2D) materials have been considered promising candidates for future low power-dissipation and reconfigurable integrated circuit applications. However, 2D transistors with intrinsic ambipolar transport polarity are usually affected by large off-state leakage currents and small on/off ratios. Here, we report the realization of a reconfigurable Schottky junction field-effect transistor (SJFET) in an asymmetric van der Waals contact geometry, showing a balanced and switchable n- and p-unipolarity with the Ids on/off ratio kept >106. Meanwhile, the static leakage power consumption was suppressed to 10-5 nW. The SJFET worked as a reversible Schottky rectifier with an ideality factor of ~1.0 and a tuned rectifying ratio from 3 × 106 to 2.5 × 10-6. This empowered the SJFET with a reconfigurable photovoltaic performance in which the sign of the open-circuit voltage and photo-responsivity were substantially switched. This polarity-reversible SJFET paves an alternative way to develop reconfigurable 2D devices for low-power-consumption photovoltaic logic circuits.
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Affiliation(s)
- Yaoqiang Zhou
- Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, SAR, China
| | - Lei Tong
- Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, SAR, China
| | - Zefeng Chen
- School of Optoelectronic Science and Engineering and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, 215006, Suzhou, China
| | - Li Tao
- Key Lab of Advanced Optoelectronic Quantum Architecture and Measurement (Ministry of Education), School of Physics, Beijing Institute of Technology, 100081, Beijing, China
| | - Yue Pang
- Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, SAR, China
| | - Jian-Bin Xu
- Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, SAR, China.
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7
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Shen Y, Dong Z, Sun Y, Guo H, Wu F, Li X, Tang J, Liu J, Wu X, Tian H, Ren TL. The Trend of 2D Transistors toward Integrated Circuits: Scaling Down and New Mechanisms. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2201916. [PMID: 35535757 DOI: 10.1002/adma.202201916] [Citation(s) in RCA: 29] [Impact Index Per Article: 9.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/28/2022] [Revised: 04/12/2022] [Indexed: 06/14/2023]
Abstract
2D transition metal chalcogenide (TMDC) materials, such as MoS2 , have recently attracted considerable research interest in the context of their use in ultrascaled devices owing to their excellent electronic properties. Microprocessors and neural network circuits based on MoS2 have been developed at a large scale but still do not have an advantage over silicon in terms of their integrated density. In this study, the current structures, contact engineering, and doping methods for 2D TMDC materials for the scaling-down process and performance optimization are reviewed. Devices are introduced according to a new mechanism to provide the comprehensive prospects for the use of MoS2 beyond the traditional complementary-metal-oxide semiconductor in order to summarize obstacles to the goal of developing high-density and low-power integrated circuits (ICs). Finally, prospects for the use of MoS2 in large-scale ICs from the perspectives of the material, system performance, and application to nonlogic functionalities such as sensor circuits and analogous circuits, are briefly analyzed. The latter issue is along the direction of "more than Moore" research.
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Affiliation(s)
- Yang Shen
- Institute of Microelectronics and Beijing National Research Center for Information Science and Technology (BNRist) School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, China
| | - Zuoyuan Dong
- Shanghai Key Laboratory of Multidimensional Information Processing, School of Communication and Electronic Engineering, East China Normal University, Shanghai, 200241, China
| | - Yabin Sun
- Shanghai Key Laboratory of Multidimensional Information Processing, School of Communication and Electronic Engineering, East China Normal University, Shanghai, 200241, China
| | - Hao Guo
- Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, School of Instrument and Electronics, North University of China, Taiyuan, Shanxi, 030051, China
| | - Fan Wu
- Institute of Microelectronics and Beijing National Research Center for Information Science and Technology (BNRist) School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, China
| | - Xianglong Li
- Shanghai Key Laboratory of Multidimensional Information Processing, School of Communication and Electronic Engineering, East China Normal University, Shanghai, 200241, China
| | - Jun Tang
- Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, School of Instrument and Electronics, North University of China, Taiyuan, Shanxi, 030051, China
| | - Jun Liu
- Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, School of Instrument and Electronics, North University of China, Taiyuan, Shanxi, 030051, China
| | - Xing Wu
- Shanghai Key Laboratory of Multidimensional Information Processing, School of Communication and Electronic Engineering, East China Normal University, Shanghai, 200241, China
| | - He Tian
- Institute of Microelectronics and Beijing National Research Center for Information Science and Technology (BNRist) School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, China
| | - Tian-Ling Ren
- Institute of Microelectronics and Beijing National Research Center for Information Science and Technology (BNRist) School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, China
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8
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Dong X, Chen T, Liu G, Xie L, Zhou G, Long M. Multifunctional 2D g-C 4N 3/MoS 2 vdW Heterostructure-Based Nanodevices: Spin Filtering and Gas Sensing Properties. ACS Sens 2022; 7:3450-3460. [DOI: 10.1021/acssensors.2c01785] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Xiansheng Dong
- School of Energy and Mechanical Engineering, Energy Materials Computing Center, Jiangxi University of Science and Technology, Nanchang330013, China
| | - Tong Chen
- School of Energy and Mechanical Engineering, Energy Materials Computing Center, Jiangxi University of Science and Technology, Nanchang330013, China
- State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai200433, P. R. China
| | - Guogang Liu
- School of Energy and Mechanical Engineering, Energy Materials Computing Center, Jiangxi University of Science and Technology, Nanchang330013, China
| | - Luzhen Xie
- School of Energy and Mechanical Engineering, Energy Materials Computing Center, Jiangxi University of Science and Technology, Nanchang330013, China
| | - Guanghui Zhou
- School of Sciences, Shaoyang University, Shaoyang422001, China
- Department of Physics and Key Laboratory for Low-Dimensional Structures and Quantum Manipulation (Ministry of Education), Hunan Normal University, Changsha410081, China
| | - Mengqiu Long
- Hunan Key Laboratory of Super Micro-structure and Ultrafast Process, Central South University, Changsha410083, China
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9
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Knobloch T, Selberherr S, Grasser T. Challenges for Nanoscale CMOS Logic Based on Two-Dimensional Materials. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:nano12203548. [PMID: 36296740 PMCID: PMC9609734 DOI: 10.3390/nano12203548] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/01/2022] [Revised: 09/30/2022] [Accepted: 10/03/2022] [Indexed: 06/02/2023]
Abstract
For ultra-scaled technology nodes at channel lengths below 12 nm, two-dimensional (2D) materials are a potential replacement for silicon since even atomically thin 2D semiconductors can maintain sizable mobilities and provide enhanced gate control in a stacked channel nanosheet transistor geometry. While theoretical projections and available experimental prototypes indicate great potential for 2D field effect transistors (FETs), several major challenges must be solved to realize CMOS logic circuits based on 2D materials at the wafer scale. This review discusses the most critical issues and benchmarks against the targets outlined for the 0.7 nm node in the International Roadmap for Devices and Systems scheduled for 2034. These issues are grouped into four areas; device scaling, the formation of low-resistive contacts to 2D semiconductors, gate stack design, and wafer-scale process integration. Here, we summarize recent developments in these areas and identify the most important future research questions which will have to be solved to allow for industrial adaptation of the 2D technology.
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10
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Wang H, Wang W, Zhong Y, Li D, Li Z, Xu X, Song X, Chen Y, Huang P, Mei A, Han H, Zhai T, Zhou X. Approaching the External Quantum Efficiency Limit in 2D Photovoltaic Devices. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2206122. [PMID: 35953088 DOI: 10.1002/adma.202206122] [Citation(s) in RCA: 15] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/05/2022] [Revised: 08/01/2022] [Indexed: 06/15/2023]
Abstract
2D transition metal dichalcogenides (TMDs) are promising candidates for realizing ultrathin and high-performance photovoltaic devices. However, the external quantum efficiency (EQE) and power conversion efficiency (PCE) of most 2D photovoltaic devices face great challenges in exceeding 50% and 3%, respectively, due to the low efficiency of photocarrier separation and collection. Here, this study demonstrates photovoltaic devices with defect-free interface and recombination-free channel based on 2D WS2 , showing high EQE of 92% approaching the theoretical limit and high PCE of 5.0%. The high performances are attributed to the van der Waals metal contact without interface defects and Fermi-level pinning, and the fully depleted channel without photocarrier recombination, leading to intrinsic photocarrier separation and collection with high efficiency. Furthermore, this study demonstrates that the strategy can be extended to other TMDs such as MoSe2 and WSe2 with EQE of 92% and 94%, respectively. This work proposes a universal strategy for building high-performance 2D photovoltaic devices. The nearly ideal EQE provides great potential for PCE approaching the Shockley-Queisser limit.
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Affiliation(s)
- Haoyun Wang
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Wei Wang
- Michael Grätzel Center for Mesoscopic Solar Cells, Wuhan National Laboratory for Optoelectronics, Key Laboratory of Materials Chemistry for Energy Conversion and Storage of Ministry of Education, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Yongle Zhong
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, P. R. China
| | - Dongyan Li
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Zexin Li
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Xiang Xu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Xingyu Song
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Yunxin Chen
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Pu Huang
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, P. R. China
| | - Anyi Mei
- Michael Grätzel Center for Mesoscopic Solar Cells, Wuhan National Laboratory for Optoelectronics, Key Laboratory of Materials Chemistry for Energy Conversion and Storage of Ministry of Education, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Hongwei Han
- Michael Grätzel Center for Mesoscopic Solar Cells, Wuhan National Laboratory for Optoelectronics, Key Laboratory of Materials Chemistry for Energy Conversion and Storage of Ministry of Education, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Tianyou Zhai
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Xing Zhou
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
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11
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Imaging tunable quantum Hall broken-symmetry orders in graphene. Nature 2022; 605:51-56. [PMID: 35508777 DOI: 10.1038/s41586-022-04513-7] [Citation(s) in RCA: 20] [Impact Index Per Article: 6.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/24/2021] [Accepted: 02/03/2022] [Indexed: 11/09/2022]
Abstract
ABSTARCT When electrons populate a flat band their kinetic energy becomes negligible, forcing them to organize in exotic many-body states to minimize their Coulomb energy1-5. The zeroth Landau level of graphene under a magnetic field is a particularly interesting strongly interacting flat band because interelectron interactions are predicted to induce a rich variety of broken-symmetry states with distinct topological and lattice-scale orders6-11. Evidence for these states stems mostly from indirect transport experiments that suggest that broken-symmetry states are tunable by boosting the Zeeman energy12 or by dielectric screening of the Coulomb interaction13. However, confirming the existence of these ground states requires a direct visualization of their lattice-scale orders14. Here we image three distinct broken-symmetry phases in graphene using scanning tunnelling spectroscopy. We explore the phase diagram by tuning the screening of the Coulomb interaction by a low- or high-dielectric-constant environment, and with a magnetic field. In the unscreened case, we find a Kekulé bond order, consistent with observations of an insulating state undergoing a magnetic-field driven Kosterlitz-Thouless transition15,16. Under dielectric screening, a sublattice-unpolarized ground state13 emerges at low magnetic fields, and transits to a charge-density-wave order with partial sublattice polarization at higher magnetic fields. The Kekulé and charge-density-wave orders furthermore coexist with additional, secondary lattice-scale orders that enrich the phase diagram beyond current theory predictions6-10. This screening-induced tunability of broken-symmetry orders may prove valuable to uncover correlated phases of matter in other quantum materials.
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12
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Liu X, Choi MS, Hwang E, Yoo WJ, Sun J. Fermi Level Pinning Dependent 2D Semiconductor Devices: Challenges and Prospects. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2108425. [PMID: 34913205 DOI: 10.1002/adma.202108425] [Citation(s) in RCA: 67] [Impact Index Per Article: 22.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/20/2021] [Revised: 11/29/2021] [Indexed: 06/14/2023]
Abstract
Motivated by the high expectation for efficient electrostatic modulation of charge transport at very low voltages, atomically thin 2D materials with a range of bandgaps are investigated extensively for use in future semiconductor devices. However, researchers face formidable challenges in 2D device processing mainly originated from the out-of-plane van der Waals (vdW) structure of ultrathin 2D materials. As major challenges, untunable Schottky barrier height and the corresponding strong Fermi level pinning (FLP) at metal interfaces are observed unexpectedly with 2D vdW materials, giving rise to unmodulated semiconductor polarity, high contact resistance, and lowered device mobility. Here, FLP observed from recently developed 2D semiconductor devices is addressed differently from those observed from conventional semiconductor devices. It is understood that the observed FLP is attributed to inefficient doping into 2D materials, vdW gap present at the metal interface, and hybridized compounds formed under contacting metals. To provide readers with practical guidelines for the design of 2D devices, the impact of FLP occurring in 2D semiconductor devices is further reviewed by exploring various origins responsible for the FLP, effects of FLP on 2D device performances, and methods for improving metallic contact to 2D materials.
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Affiliation(s)
- Xiaochi Liu
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Min Sup Choi
- SKKU Advanced Institute of Nano Technology, Sungkyunkwan University, Suwon, 16419, South Korea
| | - Euyheon Hwang
- SKKU Advanced Institute of Nano Technology, Sungkyunkwan University, Suwon, 16419, South Korea
| | - Won Jong Yoo
- SKKU Advanced Institute of Nano Technology, Sungkyunkwan University, Suwon, 16419, South Korea
| | - Jian Sun
- School of Physics and Electronics, Central South University, Changsha, 410083, China
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13
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Dai JQ, Yuan J, Ke C. Controllable band offset in monolayer MoSe2 driven by surface termination and ferroelectric field of BiFeO3(0001) substrate. J SOLID STATE CHEM 2021. [DOI: 10.1016/j.jssc.2021.122571] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/20/2022]
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14
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Kim SH, Park MU, Lee C, Yi SG, Kim M, Choi Y, Cho JH, Yoo KH. Rectifying optoelectronic memory based on WSe 2/graphene heterostructures. NANOSCALE ADVANCES 2021; 3:4952-4960. [PMID: 36132353 PMCID: PMC9419859 DOI: 10.1039/d1na00504a] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/29/2021] [Accepted: 07/17/2021] [Indexed: 06/15/2023]
Abstract
van der Waals heterostructures composed of two-dimensional materials vertically stacked have been extensively studied to develop various multifunctional devices. Here, we report WSe2/graphene heterostructure devices with a top floating gate that can serve as multifunctional devices. They exhibit gate-controlled rectification inversion, rectified nonvolatile memory effects, and multilevel optoelectronic memory effects. Depending on the polarity of the gate voltage pulses (V Gp), electrons or holes can be trapped in the floating gate, resulting in rectified nonvolatile memory properties. Furthermore, upon repeated illumination with laser pulses, positive or negative staircase photoconductivity is observed depending on the history of V Gp, which is ascribed to the tunneling of electrons or holes between the WSe2 channel and the floating gate. These multifunctional devices can be used to emulate excitatory and inhibitory synapses that have different neurotransmitters. Various synaptic functions, such as potentiation/depression curves and spike-timing-dependent plasticity, have been also implemented using these devices. In particular, 128 optoelectronic memory states with nonlinearity less than 1 can be achieved by controlling applied laser pulses and V Gp, suggesting that the WSe2/graphene heterostructure devices with a top floating gate can be applied to optoelectronic synapse devices.
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Affiliation(s)
- Sung Hyun Kim
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Myung Uk Park
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - ChangJun Lee
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Sum-Gyun Yi
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Myeongjin Kim
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Yongsuk Choi
- Department of Chemical and Biomolecular Engineering, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Jeong Ho Cho
- Department of Chemical and Biomolecular Engineering, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
| | - Kyung-Hwa Yoo
- Department of Physics, Yonsei University 50 Yonsei-ro Seoul 03722 Republic of Korea
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15
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Yan Y, Li S, Du J, Yang H, Wang X, Song X, Li L, Li X, Xia C, Liu Y, Li J, Wei Z. Reversible Half Wave Rectifier Based on 2D InSe/GeSe Heterostructure with Near-Broken Band Alignment. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2021; 8:1903252. [PMID: 33643781 PMCID: PMC7887575 DOI: 10.1002/advs.201903252] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/15/2019] [Revised: 09/27/2020] [Indexed: 05/19/2023]
Abstract
2D van der Waals heterostructures (vdWHs) offer tremendous opportunities in designing multifunctional electronic devices. Due to the ultrathin nature of 2D materials, the gate-induced change in charge density makes amplitude control possible, creating a new programmable unilateral rectifier. The study of 2D vdWHs-based reversible unilateral rectifier is lacking, although it can give rise to a new degree of freedom for modulating the output state. Here, a InSe/GeSe vdWH-FET is constructed as a gate-controllable half wave rectifier. The device exhibits stepless adjustment from forward to backward rectifying performance, leading to multiple operation states of output level. Near-broken band alignment in the InSe/GeSe vdWH-FET is a crucial feature for high-performance reversible rectifier, which is shown to have backward and forward rectification ratio of 1:38 and 963:1, respectively. Being further explored as a new bridge rectifier, the InSe/GeSe device has great potential in future gate-controllable alternating current/direct current convertor. These results indicate that 2D vdWHs with near-broken band alignment can offer a pathway to simplify the commutating circuit and regulating speed circuit.
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Affiliation(s)
- Yong Yan
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
| | - Shasha Li
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
| | - Juan Du
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
- State Key Laboratory for Artificial Microstructures and Mesoscopic Physics, School of PhysicsPeking UniversityBeijing100871China
| | - Huai Yang
- State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics EngineeringUniversity of Chinese Academy of SciencesBeijing100083China
| | - Xiaoting Wang
- State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics EngineeringUniversity of Chinese Academy of SciencesBeijing100083China
| | - Xiaohui Song
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
| | - Lixia Li
- Henan Key Laboratory of Infrared Materials & Spectrum Measures and ApplicationsHenan Normal UniversityXinxiang453007China
| | - Xueping Li
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
| | - Congxin Xia
- Henan Key Laboratory of Photovoltaic Materials, School of PhysicsHenan Normal UniversityXinxiang453007China
| | - Yufang Liu
- Henan Key Laboratory of Infrared Materials & Spectrum Measures and ApplicationsHenan Normal UniversityXinxiang453007China
| | - Jingbo Li
- Institute of SemiconductorsSouth China Normal UniversityGuangzhou510631China
| | - Zhongming Wei
- State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences & Center of Materials Science and Optoelectronics EngineeringUniversity of Chinese Academy of SciencesBeijing100083China
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16
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Hu W, Sheng Z, Hou X, Chen H, Zhang Z, Zhang DW, Zhou P. Ambipolar 2D Semiconductors and Emerging Device Applications. SMALL METHODS 2021; 5:e2000837. [PMID: 34927812 DOI: 10.1002/smtd.202000837] [Citation(s) in RCA: 26] [Impact Index Per Article: 6.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/07/2020] [Revised: 10/12/2020] [Indexed: 06/14/2023]
Abstract
With the rise of 2D materials, new physics and new processing techniques have emerged, triggering possibilities for the innovation of electronic and optoelectronic devices. Among them, ambipolar 2D semiconductors are of excellent gate-controlled capability and distinctive physical characteristic that the major charge carriers can be dynamically, reversibly and rapidly tuned between holes and electrons by electrostatic field. Based on such properties, novel devices, like ambipolar field-effect transistors, light-emitting transistors, electrostatic-field-charging PN diodes, are developed and show great advantages in logic and reconfigurable circuits, integrated optoelectronic circuits, and artificial neural network image sensors, enriching the functions of conventional devices and bringing breakthroughs to build new architectures. This review first focuses on the basic knowledge including fundamental principle of ambipolar semiconductors, basic material preparation techniques, and how to obtain the ambipolar behavior through electrical contact engineering. Then, the current ambipolar 2D semiconductors and their preparation approaches and main properties are summarized. Finally, the emerging new device structures are overviewed in detail, along with their novel electronic and optoelectronic applications. It is expected to shed light on the future development of ambipolar 2D semiconductors, exploring more new devices with novel functions and promoting the applications of 2D materials.
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Affiliation(s)
- Wennan Hu
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - Zhe Sheng
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - Xiang Hou
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - Huawei Chen
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - Zengxing Zhang
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - David Wei Zhang
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
| | - Peng Zhou
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
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17
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Liu J, Ren JC, Shen T, Liu X, Butch CJ, Li S, Liu W. Asymmetric Schottky Contacts in van der Waals Metal-Semiconductor-Metal Structures Based on Two-Dimensional Janus Materials. RESEARCH 2020; 2020:6727524. [PMID: 33623908 PMCID: PMC7877374 DOI: 10.34133/2020/6727524] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/26/2020] [Accepted: 09/24/2020] [Indexed: 11/06/2022]
Abstract
Physical and electronic asymmetry plays a crucial role in rectifiers and other devices with a directionally variant current-voltage (I-V) ratio. Several strategies for practically creating asymmetry in nanoscale components have been demonstrated, but complex fabrication procedures, high cost, and incomplete mechanistic understanding have significantly limited large-scale applications of these components. In this work, we present density functional theory calculations which demonstrate asymmetric electronic properties in a metal-semiconductor-metal (MSM) interface composed of stacked van der Waals (vdW) heterostructures. Janus MoSSe has an intrinsic dipole due to its asymmetric structure and, consequently, can act as either an n-type or p-type diode depending on the face at the interior of the stacked structure (SeMoS-SMoS vs. SMoSe-SMoS). In each configuration, vdW forces dominate the interfacial interactions, and thus, Fermi level pinning is largely suppressed. Our transport calculations show that not only does the intrinsic dipole cause asymmetric I-V characteristics in the MSM structure but also that different transmission mechanisms are involved across the S-S (direct tunneling) and S-Se interface (thermionic excitation). This work illustrates a simple and practical method to introduce asymmetric Schottky barriers into an MSM structure and provides a conceptual framework which can be extended to other 2D Janus semiconductors.
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Affiliation(s)
- Jia Liu
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Ji-Chang Ren
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Tao Shen
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Xinyi Liu
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Christopher J Butch
- Department of Biomedical Engineering, Nanjing University, Nanjing, China.,Blue Marble Space Institute of Science, Seattle, Washington, USA
| | - Shuang Li
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
| | - Wei Liu
- Nano and Heterogeneous Materials Center, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
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18
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Qiu J, Li M, Xu J, Zhang XF, Yao J. Bismuth sulfide bridged hierarchical Bi 2S 3/BiOCl@ZnIn 2S 4 for efficient photocatalytic Cr(VI) reduction. JOURNAL OF HAZARDOUS MATERIALS 2020; 389:121858. [PMID: 31874763 DOI: 10.1016/j.jhazmat.2019.121858] [Citation(s) in RCA: 52] [Impact Index Per Article: 10.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/22/2019] [Revised: 12/03/2019] [Accepted: 12/08/2019] [Indexed: 06/10/2023]
Abstract
Delicate construction based on 2D epitaxial heterostructure can be an effective route to adequately excavate and utilize its superiorities. Here, a core-shell Bi2S3/BiOCl@ZnIn2S4 hierarchical heterostructure is rationally designed and built by Bi2S3 epitaxial growth on two-dimensional template-like BiOCl and ZnIn2S4 nanosheets in-situ growth. The epitaxial growth of Bi2S3 on BiOCl endows the tight contact between them. More importantly, Bi2S3 as the interlayer could offer an extra intimate junction to ZnIn2S4 due to the chemical interaction of S2- between Bi2S3 and ZnIn2S4. Such a Bi2S3/BiOCl@ZnIn2S4 composite was explored for visible-light-driven reduction of Cr(VI), and much satisfactory performance was achieved, which is about 3.3 and 24.1-fold increase compared to that of ZnIn2S4 and Bi2S3/BiOCl respectively. Efficient generation, separation and transfer of photo-generated charge carriers inherited from this ternary hierarchical composite made significant contributions to the highly elevated photocatalytic activity. This work may stimulate the construction of multiple hierarchical composites based on 2D epitaxial heterostructure material for efficient photocatalysis or other optoelectronics.
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Affiliation(s)
- Jianhao Qiu
- College of Chemical Engineering, Jiangsu Co-Innovation Center of Efficient Processing and Utilization of Forest Resources, Jiangsu Key Lab for the Chemistry & Utilization of Agricultural and Forest Biomass, Nanjing Forestry University, Nanjing, Jiangsu 210037, China
| | - Ming Li
- College of Chemical Engineering, Jiangsu Co-Innovation Center of Efficient Processing and Utilization of Forest Resources, Jiangsu Key Lab for the Chemistry & Utilization of Agricultural and Forest Biomass, Nanjing Forestry University, Nanjing, Jiangsu 210037, China
| | - Jie Xu
- College of Chemical Engineering, Jiangsu Co-Innovation Center of Efficient Processing and Utilization of Forest Resources, Jiangsu Key Lab for the Chemistry & Utilization of Agricultural and Forest Biomass, Nanjing Forestry University, Nanjing, Jiangsu 210037, China
| | - Xiong-Fei Zhang
- College of Chemical Engineering, Jiangsu Co-Innovation Center of Efficient Processing and Utilization of Forest Resources, Jiangsu Key Lab for the Chemistry & Utilization of Agricultural and Forest Biomass, Nanjing Forestry University, Nanjing, Jiangsu 210037, China
| | - Jianfeng Yao
- College of Chemical Engineering, Jiangsu Co-Innovation Center of Efficient Processing and Utilization of Forest Resources, Jiangsu Key Lab for the Chemistry & Utilization of Agricultural and Forest Biomass, Nanjing Forestry University, Nanjing, Jiangsu 210037, China.
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19
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Introducing Electrode Contact by Controlled Micro-Alloying in Few-Layered GaTe Field Effect Transistors. CRYSTALS 2020. [DOI: 10.3390/cryst10030144] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
Recently, gallium telluride (GaTe) has triggered much attention for its unique properties and offers excellent opportunities for nanoelectronics. Yet it is a challenge to bridge the semiconducting few-layered GaTe crystals with metallic electrodes for device applications. Here, we report a method on fabricating electrode contacts to few-layered GaTe field effect transistors (FETs) by controlled micro-alloying. The devices show linear I-V curves and on/off ratio of ∼10 4 on HfO 2 substrates. Kelvin probe force microscope (KPFM) and energy dispersion spectrum (EDS) are performed to characterize the electrode contacts, suggesting that the lowered Schottky barrier by the diffusion of Pd element into the GaTe conduction channel may play an important role. Our findings provide a strategy for the engineering of electrode contact for future device applications based on 2DLMs.
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20
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Gao L, Liao Q, Zhang X, Liu X, Gu L, Liu B, Du J, Ou Y, Xiao J, Kang Z, Zhang Z, Zhang Y. Defect-Engineered Atomically Thin MoS 2 Homogeneous Electronics for Logic Inverters. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2020; 32:e1906646. [PMID: 31743525 DOI: 10.1002/adma.201906646] [Citation(s) in RCA: 47] [Impact Index Per Article: 9.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2019] [Revised: 10/28/2019] [Indexed: 06/10/2023]
Abstract
Ultrathin molybdenum disulfide (MoS2 ) presents ideal properties for building next-generation atomically thin circuitry. However, it is difficult to construct logic units of MoS2 monolayer using traditional silicon-based doping schemes, such as atomic substitution and ion implantation, as they cause lattice disruption and doping instability. An accurate and feasible electronic structure modulation strategy from defect engineering is proposed to construct homogeneous electronics for MoS2 monolayer logic inverters. By utilizing the energy-matched electron induction of the solution process, numerous pure and lattice-stable monosulfur vacancies (Vmonos ) are introduced to modulate the electronic structure of monolayer MoS2 via a shallow trapping effect. The resulting modulation effectively reduces the electronic concentration of MoS2 and improves the work function by 100 meV. Under modulation of Vmonos , an atomically thin homogenous monolayer MoS2 logic inverter with a voltage gain of 4 is successfully constructed. A brand-new and practical design route of defect modulation for 2D-based circuit development is provided.
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Affiliation(s)
- Li Gao
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Qingliang Liao
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Xiankun Zhang
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Xiaozhi Liu
- Collaborative Innovation Center of Quantum Matter, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
| | - Lin Gu
- Collaborative Innovation Center of Quantum Matter, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
| | - Baishan Liu
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Junli Du
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Yang Ou
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Jiankun Xiao
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Zhuo Kang
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Zheng Zhang
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
| | - Yue Zhang
- Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Key Laboratory for Advanced Energy Materials and Technologies, University of Science and Technology Beijing, Beijing, 100083, P. R. China
- State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, P. R. China
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21
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Chen Y, Yin C, Wang X, Jiang Y, Wang H, Wu B, Shen H, Lin T, Hu W, Meng X, Du P, Chu J, Wang Z, Wang J. Multimode Signal Processor Unit Based on the Ambipolar WSe 2-Cr Schottky Junction. ACS APPLIED MATERIALS & INTERFACES 2019; 11:38895-38901. [PMID: 31556289 DOI: 10.1021/acsami.9b10698] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
A Schottky barrier is a double-edged sword in electronic and optoelectronic devices, especially devices based on two-dimensional materials. It may restrict the carrier transport in devices, but it can also realize multifunctional devices by architecture design. We designed a simple but novel device structure based on theWSe2-Cr Schottky junction with an asymmetric Schottky contact area of the source and drain. A significant rectification ratio over 105 and multiple rectifying states (e.g., full pass, forward pass, off, and backward pass) were achieved in the single Schottky junction tuned by gate voltage. Furthermore, switching characteristic, rectification characteristic, and amplitude of a sin wave can be effectively modulated by the electrical field or light illumination in a signal process circuit based on the WSe2-Cr Schottky junction. The highly tunable Schottky junction working as a multimode signal processor unit has great potential in future optoelectronic-integrated chips.
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Affiliation(s)
- Yan Chen
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
- University of Chinese Academy of Sciences , 19 Yuquan Road , Beijing 100049 , China
| | - Chong Yin
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering , Zhejiang University , 38 Zhe Da Road , Hangzhou 310007 , China
| | - Xudong Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Yiyang Jiang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Haoliang Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Binmin Wu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Hong Shen
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Tie Lin
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Weida Hu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Xiangjian Meng
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Piyi Du
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering , Zhejiang University , 38 Zhe Da Road , Hangzhou 310007 , China
| | - Junhao Chu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
| | - Zongrong Wang
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering , Zhejiang University , 38 Zhe Da Road , Hangzhou 310007 , China
| | - Jianlu Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics , Chinese Academy of Sciences , 500 Yu Tian Road , Shanghai 200083 , China
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22
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Kim C, Lee KY, Moon I, Issarapanacheewin S, Yoo WJ. Metallic contact induced van der Waals gap in a MoS 2 FET. NANOSCALE 2019; 11:18246-18254. [PMID: 31565703 DOI: 10.1039/c9nr04567h] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Electrical metal contacts formed with 2D materials strongly affect device performance. Here, we used scanning transmission electron microscopy (STEM) and energy-dispersive spectroscopy (EDS) to characterize the interfacial structure formed and physical damage induced between MoS2 and the most commonly used metals, Ti, Cr, Au, and Pd. We further correlated the electrical performance with physical defects observed at the 2D interfacial structure. The contact resistances were higher in the order of Ti, Au, Pd, and Cr contacts, but all 4-point probe mobilities measured with metals in contact with identical quadrilayer MoS2 were ∼65 cm2 V-1 s-1, confirming the reliability of the devices. According to the STEM and EDS analyses, the Ti contact gave rise to a van der Waals gap between the clean quadrilayer MoS2 and the Ti contact. By contrast, Cr migrated into MoS2 while Mo and S counter-migrated into the SiO2 substrate. Au and Pd formed glassy layers that resulted in the migration of Mo and S into the Au and Pd electrodes. These interfacial structures between MoS2 and contact metals strongly correlated with the electrical performance of 2D MoS2 FETs, providing practical guidelines to form van der Waals contacts.
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Affiliation(s)
- Changsik Kim
- SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University (SKKU), 2066, Seobu-ro, Jangan-gu, Suwon-si, Gyeonggi-do, 16419, Republic of Korea.
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23
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Li Z, Qian M, Song L, Ma L, Qiu H, Zeng XC. Tuning electronic structure of monolayer InP3 in contact with graphene or Ni: effect of a buffer layer and intrinsic In and P-vacancy. Phys Chem Chem Phys 2019; 21:1285-1293. [DOI: 10.1039/c8cp06478d] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Ohmic contact in m-InP3 and G or Ni interface is achieved by introducing intrinsic defects and inserting a buffer layer.
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Affiliation(s)
- Zhongjun Li
- School of Electronic Science and Applied Physics
- Hefei University of Technology
- Hefei
- China
- Department of Chemistry
| | - Mingzhi Qian
- School of Electronic Science and Applied Physics
- Hefei University of Technology
- Hefei
- China
| | - Lingling Song
- School of Electronic Science and Applied Physics
- Hefei University of Technology
- Hefei
- China
| | - Liang Ma
- Department of Chemistry
- University of Nebraska-Lincoln
- Lincoln
- USA
- School of Physics
| | - Huaili Qiu
- School of Electronic Science and Applied Physics
- Hefei University of Technology
- Hefei
- China
| | - Xiao Cheng Zeng
- Department of Chemistry
- University of Nebraska-Lincoln
- Lincoln
- USA
- Department of Chemical & Biomolecular Engineering and Department of Mechanical and Materials Engineering
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24
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Bo M, Li J, Yao C, Huang Z, Li L, Sun CQ, Peng C. Electronic structure of two-dimensional In and Bi metal on BN nanosheets. RSC Adv 2019; 9:9342-9347. [PMID: 35520743 PMCID: PMC9062056 DOI: 10.1039/c9ra00673g] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/25/2019] [Accepted: 03/18/2019] [Indexed: 01/09/2023] Open
Abstract
The electronic structures of two-dimensional (2D) indium (In) and bismuth (Bi) metal on BN nanosheets are systematically studied using hybrid density functional theory (DFT). We found that 2D In and Bi metal effectively modulate the band gap of a BN nanosheet. We also found that the indirect band gap of the 2D In and Bi metal electronic structures are 0.70 and 0.09 eV, respectively. This modulation originates from the charge transfer between the 2D metal and BN nanosheet interfaces, as well as from the electron redistribution of the In/BN and Bi/BN heterojunctions of the s and p orbitals. Our results provide an insight into 2D In/BN and Bi/BN heterojunctions, which should be useful in the design of 2D In and Bi metal–semiconductor-based devices. The electronic structures of two-dimensional (2D) indium (In) and bismuth (Bi) metal on BN nanosheets are systematically studied using hybrid density functional theory (DFT).![]()
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Affiliation(s)
- Maolin Bo
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
| | - Jibiao Li
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
| | - Chuang Yao
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
| | - Zhongkai Huang
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
| | - Lei Li
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
| | - Chang Q. Sun
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
- NOVITAS
| | - Cheng Peng
- Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM) of Chongqing
- Yangtze Normal University
- Chongqing 408100
- China
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25
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Wang F, Tu B, He P, Wang Z, Yin L, Cheng R, Wang J, Fang Q, He J. Uncovering the Conduction Behavior of van der Waals Ambipolar Semiconductors. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2019; 31:e1805317. [PMID: 30370951 DOI: 10.1002/adma.201805317] [Citation(s) in RCA: 13] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2018] [Revised: 09/23/2018] [Indexed: 06/08/2023]
Abstract
A long-standing puzzle about van der Waals semiconductors (vdWS) is regarding the origin(s) of the conduction behavior they exhibit. Of particular interest are those with ambipolar conduction, which may provide an alternative choice for practical applications when considering the difficulties of doping the ultrathin bodies of vdWS. Here, the conduction behavior of ambipolar vdWS is analytically and theoretically studied. Using numerical simulation, it is shown that ambipolar vdWS can be fully captured by a Schottky-barrier FET model. Based on this, it is found that the widely observed conduction polarity transition while changing the body thickness mainly comes from the tuning of band alignment at the metal/vdWS interfaces. This transition can be suppressed/inversed by introducing an inert hBN layer between the vdWS and the substrate. Through first-principles calculations, it is demonstrated that metal/vdWS/substrate interactions play a crucial role in tuning the Schottky-barrier heights, which finally determines the conduction behavior that ambipolar vdWS exhibit.
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Affiliation(s)
- Feng Wang
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
- Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, No. A35, QingHua East Road, Haidian District, Beijing, 100083, China
| | - Bin Tu
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Peng He
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
- University of Chinese Academy of Sciences, No. 19A Yuquan Road, Beijing, 100049, China
| | - Zhenxing Wang
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Lei Yin
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
- University of Chinese Academy of Sciences, No. 19A Yuquan Road, Beijing, 100049, China
| | - Ruiqing Cheng
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
- University of Chinese Academy of Sciences, No. 19A Yuquan Road, Beijing, 100049, China
| | - Junjun Wang
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
- University of Chinese Academy of Sciences, No. 19A Yuquan Road, Beijing, 100049, China
| | - Qiaojun Fang
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Jun He
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, China
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26
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Effects of electrode type and anchoring group on transport properties of a single molecule electronic device. Chem Phys Lett 2018. [DOI: 10.1016/j.cplett.2018.10.013] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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27
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Durán Retamal JR, Periyanagounder D, Ke JJ, Tsai ML, He JH. Charge carrier injection and transport engineering in two-dimensional transition metal dichalcogenides. Chem Sci 2018; 9:7727-7745. [PMID: 30429982 PMCID: PMC6194502 DOI: 10.1039/c8sc02609b] [Citation(s) in RCA: 24] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/13/2018] [Accepted: 09/23/2018] [Indexed: 11/30/2022] Open
Abstract
Ever since two dimensional-transition (2D) metal dichalcogenides (TMDs) were discovered, their fascinating electronic properties have attracted a great deal of attention for harnessing them as critical components in novel electronic devices. 2D-TMDs endowed with an atomically thin structure, dangling bond-free nature, electrostatic integrity, and tunable wide band gaps enable low power consumption, low leakage, ambipolar transport, high mobility, superconductivity, robustness against short channel effects and tunneling in highly scaled devices. However, the progress of 2D-TMDs has been hampered by severe charge transport issues arising from undesired phenomena occurring at the surfaces and interfaces. Therefore, this review provides three distinct engineering strategies embodied with distinct innovative approaches to optimize both carrier injection and transport. First, contact engineering involves 2D-metal contacts and tunneling interlayers to overcome metal-induced interface states and the Fermi level pinning effect caused by low vacancy energy formation. Second, dielectric engineering covers high-k dielectrics, ionic liquids or 2D-insulators to screen scattering centers caused by carrier traps, imperfections and rough substrates, to finely tune the Fermi level across the band gap, and to provide dangling bond-free media. Third, material engineering focuses on charge transfer via substitutional, chemical and plasma doping to precisely modulate the carrier concentration and to passivate defects while preserving material integrity. Finally, we provide an outlook of the conceptual and technical achievements in 2D-TMDs to give a prospective view of the future development of highly scaled nanoelectronic devices.
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Affiliation(s)
- José Ramón Durán Retamal
- Computer, Electrical and Mathematical Sciences and Engineering , King Abdullah University of Science and Technology , Thuwal , 23955-6900 , Kingdom of Saudi Arabia .
| | - Dharmaraj Periyanagounder
- Computer, Electrical and Mathematical Sciences and Engineering , King Abdullah University of Science and Technology , Thuwal , 23955-6900 , Kingdom of Saudi Arabia .
| | - Jr-Jian Ke
- Computer, Electrical and Mathematical Sciences and Engineering , King Abdullah University of Science and Technology , Thuwal , 23955-6900 , Kingdom of Saudi Arabia .
| | - Meng-Lin Tsai
- Computer, Electrical and Mathematical Sciences and Engineering , King Abdullah University of Science and Technology , Thuwal , 23955-6900 , Kingdom of Saudi Arabia .
| | - Jr-Hau He
- Computer, Electrical and Mathematical Sciences and Engineering , King Abdullah University of Science and Technology , Thuwal , 23955-6900 , Kingdom of Saudi Arabia .
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28
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Resta GV, Balaji Y, Lin D, Radu IP, Catthoor F, Gaillardon PE, De Micheli G. Doping-Free Complementary Logic Gates Enabled by Two-Dimensional Polarity-Controllable Transistors. ACS NANO 2018; 12:7039-7047. [PMID: 29956911 DOI: 10.1021/acsnano.8b02739] [Citation(s) in RCA: 40] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Atomically thin two-dimensional (2D) materials belonging to transition metal dichalcogenides, due to their physical and electrical properties, are an exceptional vector for the exploration of next-generation semiconductor devices. Among them, due to the possibility of ambipolar conduction, tungsten diselenide (WSe2) provides a platform for the efficient implementation of polarity-controllable transistors. These transistors use an additional gate, named polarity gate, that, due to the electrostatic doping of the Schottky junctions, provides a device-level dynamic control of their polarity, that is, n- or p-type. Here, we experimentally demonstrate a complete doping-free standard cell library realized on WSe2 without the use of either chemical or physical doping. We show a functionally complete family of complementary logic gates (INV, NAND, NOR, 2-input XOR, 3-input XOR, and MAJ) and, due to the reconfigurable capabilities of the single devices, achieve the realization of highly expressive logic gates, such as exclusive-OR (XOR) and majority (MAJ), with fewer transistors than possible in conventional complementary metal-oxide-semiconductor logic. Our work shows a path to enable doping-free low-power electronics on 2D semiconductors, going beyond the concept of unipolar physically doped devices, while suggesting a road to achieve higher computational densities in two-dimensional electronics.
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Affiliation(s)
- Giovanni V Resta
- Integrated System Laboratory (LSI), School of Engineering , École Polytechnique Fédérale de Lausanne (EPFL) , CH-1015 Lausanne , Switzerland
| | - Yashwanth Balaji
- IMEC , Kapeldreef 75 , B-3001 Leuven , Belgium
- KU Leuven , Celestijnenlaan 200D , B-3001 Leuven , Belgium
| | - Dennis Lin
- IMEC , Kapeldreef 75 , B-3001 Leuven , Belgium
| | | | - Francky Catthoor
- IMEC , Kapeldreef 75 , B-3001 Leuven , Belgium
- KU Leuven , Celestijnenlaan 200D , B-3001 Leuven , Belgium
| | - Pierre-Emmanuel Gaillardon
- Laboratory of NanoIntegrated Systems (LNIS), Department of Electrical and Computer Engineering , University of Utah , Salt Lake City , Utah 84112 , United States
| | - Giovanni De Micheli
- Integrated System Laboratory (LSI), School of Engineering , École Polytechnique Fédérale de Lausanne (EPFL) , CH-1015 Lausanne , Switzerland
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29
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Zou X, Xu J, Huang H, Zhu Z, Wang H, Li B, Liao L, Fang G. A comparative study on top-gated and bottom-gated multilayer MoS 2 transistors with gate stacked dielectric of Al 2O 3/HfO 2. NANOTECHNOLOGY 2018; 29:245201. [PMID: 29582776 DOI: 10.1088/1361-6528/aab9cb] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Top-gated and bottom-gated transistors with multilayer MoS2 channel fully encapsulated by stacked Al2O3/HfO2 (9 nm/6 nm) were fabricated and comparatively studied. Excellent electrical properties are demonstrated for the TG transistors with high on-off current ratio of 108, high field-effect mobility of 102 cm2 V-1 s-1, and low subthreshold swing of 93 mV dec-1. Also, enhanced reliability has been achieved for the TG transistors with threshold voltage shift of 10-3-10-2 V MV-1 cm-1 after 6 MV cm-1 gate-biased stressing. All improvement for the TG device can be ascribed to the formed device structure and dielectric environment. Degradation of the performance for the BG transistors should be attributed to reduced gate capacitance density and deteriorated interface properties related to vdW gap with a thickness about 0.4 nm. So, the TG transistor with MoS2 channel fully encapsulated by stacked Al2O3/HfO2 is a promising way to fabricate high-performance ML MoS2 field-effect transistors for practical electron device applications.
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Affiliation(s)
- Xiao Zou
- Department of Electromachine Engineering, Jianghan University, Wuhan 430056, People's Republic of China
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30
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Chen Y, Huang S, Ji X, Adepalli K, Yin K, Ling X, Wang X, Xue J, Dresselhaus M, Kong J, Yildiz B. Tuning Electronic Structure of Single Layer MoS 2 through Defect and Interface Engineering. ACS NANO 2018; 12:2569-2579. [PMID: 29397692 DOI: 10.1021/acsnano.7b08418] [Citation(s) in RCA: 95] [Impact Index Per Article: 13.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Transition-metal dichalcogenides (TMDs) have emerged in recent years as a special group of two-dimensional materials and have attracted tremendous attention. Among these TMD materials, molybdenum disulfide (MoS2) has shown promising applications in electronics, photonics, energy, and electrochemistry. In particular, the defects in MoS2 play an essential role in altering the electronic, magnetic, optical, and catalytic properties of MoS2, presenting a useful way to engineer the performance of MoS2. The mechanisms by which lattice defects affect the MoS2 properties are unsettled. In this work, we reveal systematically how lattice defects and substrate interface affect MoS2 electronic structure. We fabricated single-layer MoS2 by chemical vapor deposition and then transferred onto Au, single-layer graphene, hexagonal boron nitride, and CeO2 as substrates and created defects in MoS2 by ion irradiation. We assessed how these defects and substrates affect the electronic structure of MoS2 by performing X-ray photoelectron spectroscopy, Raman and photoluminescence spectroscopies, and scanning tunneling microscopy/spectroscopy measurements. Molecular dynamics and first-principles based simulations allowed us to conclude the predominant lattice defects upon ion irradiation and associate those with the experimentally obtained electronic structure. We found that the substrates can tune the electronic energy levels in MoS2 due to charge transfer at the interface. Furthermore, the reduction state of CeO2 as an oxide substrate affects the interface charge transfer with MoS2. The irradiated MoS2 had a faster hydrogen evolution kinetics compared to the as-prepared MoS2, demonstrating the concept of defect controlled reactivity in this phase. Our findings provide effective probes for energy band and defects in MoS2 and show the importance of defect engineering in tuning the functionalities of MoS2 and other TMDs in electronics, optoelectronics, and electrochemistry.
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Affiliation(s)
| | - Shengxi Huang
- Department of Electrical Engineering , The Pennsylvania State University , University Park , Pennsylvania 16802 , United States
| | | | | | - Kedi Yin
- State Key Laboratory of Nuclear Physics and Technology, School of Physics , Peking University , Beijing 100871 , P. R. China
| | - Xi Ling
- Department of Chemistry, Division of Materials Science and Engineering, and The Photonics Center , Boston University , Boston , Massachusetts 02215 , United States
| | - Xinwei Wang
- School of Advanced Materials, Shenzhen Graduate School , Peking University , Shenzhen 518055 , P. R. China
| | - Jianmin Xue
- State Key Laboratory of Nuclear Physics and Technology, School of Physics , Peking University , Beijing 100871 , P. R. China
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31
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Chemical Vapor Transport Deposition of Molybdenum Disulfide Layers Using H2O Vapor as the Transport Agent. COATINGS 2018. [DOI: 10.3390/coatings8020078] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]
Abstract
Molybdenum disulfide (MoS2) layers show excellent optical and electrical properties and have many potential applications. However, the growth of high-quality MoS2 layers is a major bottleneck in the development of MoS2-based devices. In this paper, we report a chemical vapor transport deposition method to investigate the growth behavior of monolayer/multi-layer MoS2 using water (H2O) as the transport agent. It was shown that the introduction of H2O vapor promoted the growth of MoS2 by increasing the nucleation density and continuous monolayer growth. Moreover, the growth mechanism is discussed.
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