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Sarkar S, Xu Y, Mathew S, Lal M, Chung JY, Lee HY, Watanabe K, Taniguchi T, Venkatesan T, Gradečak S. Identifying Luminescent Boron Vacancies in h-BN Generated Using Controlled He + Ion Irradiation. NANO LETTERS 2024; 24:43-50. [PMID: 37930062 DOI: 10.1021/acs.nanolett.3c03113] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2023]
Abstract
The defect emission from h-BN at 1.55 eV is interesting as it enables optical readout of spins. It is necessary to identify the nature of the relevant point defects for its controlled introduction. However, it is challenging to engineer point defects in h-BN without changing the local atomic structure. Here, we controllably introduce boron vacancies in h-BN using an ultrahigh spatial resolution and low-energy He+ ion beam. By optimizing the He+ ion irradiation conditions, we control the quantity and location of defects spatially and along the depth of h-BN to achieve a robust photoluminescence emission at 1.55 eV from 10 K to room temperature. We show that as-generated defects activate an additional Raman mode at 1295 cm-1. Electron energy loss spectroscopy confirms introduction of boron vacancies without modification of the local h-BN crystal structure. Our results provide a deterministic strategy to create scalable boron vacancy emitters in h-BN for quantum photonics.
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Affiliation(s)
- Soumya Sarkar
- Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore
| | - Yue Xu
- Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore
| | - Sinu Mathew
- Department of Physics, S.B. College, Mahatma Gandhi University, Kerala 686101, India
| | - Manohar Lal
- Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117583, Singapore
| | - Jing-Yang Chung
- Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore
- Applied Materials - NUS Advanced Materials Corporate Lab, 5A Engineering Drive 1, Singapore 117411, Singapore
| | - Hae Yeon Lee
- Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02141, United States
| | - Kenji Watanabe
- Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Thirumalai Venkatesan
- Center for Quantum Research and Technology (CQRT), and Center of Optimal Materials for Emerging Technologies (COMET), University of Oklahoma, Norman, Oklahoma 73019, United States
| | - Silvija Gradečak
- Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore
- Applied Materials - NUS Advanced Materials Corporate Lab, 5A Engineering Drive 1, Singapore 117411, Singapore
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2
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Kharlamova MV. Advances in Surface-Enhanced and Tip-Enhanced Raman Spectroscopy, Mapping and Methods Combined with Raman Spectroscopy for the Characterization of Perspective Carbon Nanomaterials. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:2495. [PMID: 37687003 PMCID: PMC10490381 DOI: 10.3390/nano13172495] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/11/2023] [Revised: 08/15/2023] [Accepted: 08/21/2023] [Indexed: 09/10/2023]
Abstract
Surface-enhanced Raman spectroscopy (SERS) is based on the effect of the plasmonic enhancement of intensity of the Raman scattering of molecules in cases when they are adsorbed on a substrate [...].
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3
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Brzezińska M, Guan Y, Yazyev OV, Sachdev S, Kruchkov A. Engineering SYK Interactions in Disordered Graphene Flakes under Realistic Experimental Conditions. PHYSICAL REVIEW LETTERS 2023; 131:036503. [PMID: 37540864 DOI: 10.1103/physrevlett.131.036503] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/05/2023] [Accepted: 05/19/2023] [Indexed: 08/06/2023]
Abstract
We model interactions following the Sachdev-Ye-Kitaev (SYK) framework in disordered graphene flakes up to 300 000 atoms in size (∼100 nm in diameter) subjected to an out-of-plane magnetic field B of 5-20 Tesla within the tight-binding formalism. We investigate two sources of disorder: (i) irregularities at the system boundaries, and (ii) bulk vacancies-for a combination of which we find conditions that could be favorable for the formation of the phase with Sachdev-Ye-Kitaev features under realistic experimental conditions above the liquid helium temperature.
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Affiliation(s)
- Marta Brzezińska
- Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Yifei Guan
- Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Oleg V Yazyev
- Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Subir Sachdev
- Department of Physics, Harvard University, Cambridge, Massachusetts 02138, USA
| | - Alexander Kruchkov
- Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
- Department of Physics, Harvard University, Cambridge, Massachusetts 02138, USA
- Branco Weiss Society in Science, ETH Zurich, Zurich, CH 8092, Switzerland
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4
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Pavel E, Marinescu V, Lungulescu M. Nanopatterning of monolayer graphene by quantum optical lithography. APPLIED OPTICS 2021; 60:1674-1677. [PMID: 33690504 DOI: 10.1364/ao.419831] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/14/2021] [Accepted: 01/22/2021] [Indexed: 06/12/2023]
Abstract
Quantum optical lithography, a diffraction-unlimited method, was applied to pattern monolayer graphene at 10 nm resolution. In our tests with chemical vapor deposition monolayer graphene samples, we have succeeded in producing flat surfaces of a sandwich of monolayer graphene-resist on Si, Si3N4, or glass substrates. Complex patterns have been written on monolayer graphene samples by a nanoablation process. The method could be used to realize monolayer graphene nanodevices.
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Oliveira BS, Archanjo BS, Valaski R, Achete CA, Cançado LG, Jorio A, Vasconcelos TL. Nanofabrication of plasmon-tunable nanoantennas for tip-enhanced Raman spectroscopy. J Chem Phys 2020; 153:114201. [DOI: 10.1063/5.0021560] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/01/2023] Open
Affiliation(s)
- Bruno S. Oliveira
- Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
| | - Bráulio S. Archanjo
- Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
| | - Rogério Valaski
- Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
| | - Carlos A. Achete
- Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
| | - Luiz Gustavo Cançado
- Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30270-901, Brazil
| | - Ado Jorio
- Electrical Engineering and Innovation Technology Graduate Programs, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30270-901, Brazil
| | - Thiago L. Vasconcelos
- Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
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6
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Surface modification of multilayer FePS 3 by Ga ion irradiation. Sci Rep 2019; 9:15219. [PMID: 31645643 PMCID: PMC6811574 DOI: 10.1038/s41598-019-51714-8] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/13/2019] [Accepted: 10/04/2019] [Indexed: 11/11/2022] Open
Abstract
In order to investigate the modification of the surface structure of FePS3 via Ga+ ion irradiation, we study the effect of thickness and Raman spectrum of multilayer FePS3 irradiated for 0 μs, 30 μs, and 40 μs, respectively. The results demonstrate that the intensity ratio of characteristic Raman peaks are obviously related to the thickness of FePS3. After Ga+ ion irradiation, the FePS3 sample gradually became thinner and the Eu peak and Eg(v11) peak in the Raman spectrum disappeared and the peak intensity ratio of A1g(v2) with respect to A1g(v1) weakened. This trend becomes more apparent while increasing irradiation time. The phenomenon is attributed to the damage of bipyramid structure of [P2S6]4− units and the cleavage of the P-P bands and the P-S bands during Ga+ ion irradiation. The results are of great significance for improving the two-dimensional characteristics of FePS3 by Ga+ ion beam, including structural and optical properties, which pave the way of surface engineering to improve the performance of various two-dimensional layered materials via ion beam irradiation.
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Schleberger M, Kotakoski J. 2D Material Science: Defect Engineering by Particle Irradiation. MATERIALS (BASEL, SWITZERLAND) 2018; 11:E1885. [PMID: 30279366 PMCID: PMC6212862 DOI: 10.3390/ma11101885] [Citation(s) in RCA: 35] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/27/2018] [Revised: 08/02/2018] [Accepted: 08/09/2018] [Indexed: 12/12/2022]
Abstract
Two-dimensional (2D) materials are at the heart of many novel devices due to their unique and often superior properties. For simplicity, 2D materials are often assumed to exist in their text-book form, i.e., as an ideal solid with no imperfections. However, defects are ubiquitous in macroscopic samples and play an important ⁻ if not imperative ⁻ role for the performance of any device. Thus, many independent studies have targeted the artificial introduction of defects into 2D materials by particle irradiation. In our view it would be beneficial to develop general defect engineering strategies for 2D materials based on a thorough understanding of the defect creation mechanisms, which may significantly vary from the ones relevant for 3D materials. This paper reviews the state-of-the-art in defect engineering of 2D materials by electron and ion irradiation with a clear focus on defect creation on the atomic scale and by individual impacts. Whenever possible we compile reported experimental data alongside corresponding theoretical studies. We show that, on the one hand, defect engineering by particle irradiation covers a wide range of defect types that can be fabricated with great precision in the most commonly investigated 2D materials. On the other hand, gaining a complete understanding still remains a challenge, that can be met by combining advanced theoretical methods and improved experimental set-ups, both of which only now begin to emerge. In conjunction with novel 2D materials, this challenge promises attractive future opportunities for researchers in this field.
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Affiliation(s)
- Marika Schleberger
- Fakultät für Physik and Cenide, Universität Duisburg-Essen, Lotharstraße 1, 47057 Duisburg, Germany.
| | - Jani Kotakoski
- Fakultät für Physik, Universität Wien, Boltzmanngasse 5, 1090 Wien, Austria.
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8
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Yeo S, Han J, Bae S, Lee DS. Coherence in defect evolution data for the ion beam irradiated graphene. Sci Rep 2018; 8:13973. [PMID: 30228358 PMCID: PMC6143521 DOI: 10.1038/s41598-018-32300-w] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/09/2018] [Accepted: 09/05/2018] [Indexed: 11/09/2022] Open
Abstract
The defect evolution in graphene produced by ion beam bombardment is investigated by changing the ion species, irradiation energy and dose. Raman spectroscopy is performed to examine the defect yield produced under various ion beam bombardment conditions. The defect yields of the vacancy-type defect are well described by the linear energy transfer (L) and dose (d). By increasing Ld, the defect yields exhibit similar behaviours for all ion species. As a consequence, all the defect yields can be collapsed into a single curve by multiplying them by a single parameter, suggesting that the defect evolution under various ion beam bombardment conditions can be described in a simple formula.
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Affiliation(s)
- Sunmog Yeo
- Korea Multi-purpose Accelerator Complex, Korea Atomic Energy Research Institute, Gyeongju, Gyeongbuk, 38180, Republic of Korea
| | - Jiyoon Han
- Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Wanju-gun, Jeonbuk, 55324, Republic of Korea
| | - Sukang Bae
- Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Wanju-gun, Jeonbuk, 55324, Republic of Korea
| | - Dong Su Lee
- Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Wanju-gun, Jeonbuk, 55324, Republic of Korea.
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9
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Kretschmer S, Maslov M, Ghaderzadeh S, Ghorbani-Asl M, Hlawacek G, Krasheninnikov AV. Supported Two-Dimensional Materials under Ion Irradiation: The Substrate Governs Defect Production. ACS APPLIED MATERIALS & INTERFACES 2018; 10:30827-30836. [PMID: 30117320 DOI: 10.1021/acsami.8b08471] [Citation(s) in RCA: 31] [Impact Index Per Article: 5.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Abstract
Focused ion beams perfectly suit for patterning two-dimensional (2D) materials, but the optimization of irradiation parameters requires full microscopic understanding of defect production mechanisms. In contrast to freestanding 2D systems, the details of damage creation in supported 2D materials are not fully understood, whereas the majority of experiments have been carried out for 2D targets deposited on substrates. Here, we suggest a universal and computationally efficient scheme to model the irradiation of supported 2D materials, which combines analytical potential molecular dynamics with Monte Carlo simulations and makes it possible to independently assess the contributions to the damage from backscattered ions and atoms sputtered from the substrate. Using the scheme, we study the defect production in graphene and MoS2 sheets, which are the two most important and wide-spread 2D materials, deposited on a SiO2 substrate. For helium and neon ions with a wide range of initial ion energies including those used in a commercial helium ion microscope (HIM), we demonstrate that depending on the ion energy and mass, the defect production in 2D systems can be dominated by backscattered ions and sputtered substrate atoms rather than by the direct ion impacts and that the amount of damage in 2D materials heavily depends on whether a substrate is present or not. We also study the factors which limit the spatial resolution of the patterning process. Our results, which agree well with the available experimental data, provide not only insights into defect production but also quantitative information, which can be used for the minimization of damage during imaging in HIM or optimization of the patterning process.
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Affiliation(s)
- Silvan Kretschmer
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
| | - Mikhail Maslov
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
- Moscow Institute of Physics and Technology , 141700 Dolgoprudny , Russia
| | - Sadegh Ghaderzadeh
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
| | - Mahdi Ghorbani-Asl
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
| | - Gregor Hlawacek
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
| | - Arkady V Krasheninnikov
- Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf , 01328 Dresden , Germany
- Department of Applied Physics , Aalto University , 00076 Aalto , Finland
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10
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Amjadipour M, MacLeod J, Lipton-Duffin J, Iacopi F, Motta N. Epitaxial graphene growth on FIB patterned 3C-SiC nanostructures on Si (111): reducing milling damage. NANOTECHNOLOGY 2017; 28:345602. [PMID: 28548043 DOI: 10.1088/1361-6528/aa752e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Epitaxial growth of graphene on SiC is a scalable procedure that does not require any further transfer step, making this an ideal platform for graphene nanostructure fabrication. Focused ion beam (FIB) is a very promising tool for exploring the reduction of the lateral dimension of graphene on SiC to the nanometre scale. However, exposure of graphene to the Ga+ beam causes significant surface damage through amorphisation and contamination, preventing epitaxial graphene growth. In this paper we demonstrate that combining a protective silicon layer with FIB patterning implemented prior to graphene growth can significantly reduce the damage associated with FIB milling. Using this approach, we successfully achieved graphene growth over 3C-SiC/Si FIB patterned nanostructures.
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Affiliation(s)
- Mojtaba Amjadipour
- School of Chemistry, Physics and Mechanical Engineering, Science and Engineering Faculty, Queensland University of Technology, QLD, Australia
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11
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Trung TN, Kim DO, Lee JH, Dao VD, Choi HS, Kim ET. Simple and Reliable Lift-Off Patterning Approach for Graphene and Graphene-Ag Nanowire Hybrid Films. ACS APPLIED MATERIALS & INTERFACES 2017; 9:21406-21412. [PMID: 28573859 DOI: 10.1021/acsami.7b05790] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
We present a simple, ultrasonic vibration-assisted lift-off-based patterning approach for graphene and graphene-Ag nanowire (NW) hybrid films. A 20 μm width pattern with uniform and smooth pattern edges was neatly defined on various rigid and flexible substrates. The patterned graphene-Ag NW electrodes showed a low sheet resistance of 19 Ω/sq with a high transmittance of 93% at 550 nm, a robust stability against oxidation, and a high reliability under a bending test. The electrodes also exhibited markedly higher performance than that of commercial fluorine-doped tin oxide electrodes for dye-sensitized solar cells. Given its low-cost, high throughput, and nondamaging effect, this simple and reliable patterning approach stimulates the practical applications of graphene-based flexible transparent electrodes in soft electronic and optoelectronic devices.
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Affiliation(s)
- Tran Nam Trung
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
| | - Dong-Ok Kim
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
| | - Jin-Hyung Lee
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
| | - Van-Duong Dao
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
| | - Ho-Suk Choi
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
| | - Eui-Tae Kim
- Department of Materials Science & Engineering and ‡Department of Chemical Engineering & Applied Chemistry, Chungnam National University , Daejeon 305-764, Korea
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12
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Buchheim J, Wyss RM, Shorubalko I, Park HG. Understanding the interaction between energetic ions and freestanding graphene towards practical 2D perforation. NANOSCALE 2016; 8:8345-54. [PMID: 27043304 DOI: 10.1039/c6nr00154h] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
We report experimentally and theoretically the behavior of freestanding graphene subjected to bombardment of energetic ions, investigating the capability of large-scale patterning of freestanding graphene with nanometer sized features by focused ion beam technology. A precise control over the He(+) and Ga(+) irradiation offered by focused ion beam techniques enables investigating the interaction of the energetic particles and graphene suspended with no support and allows determining sputter yields of the 2D lattice. We found a strong dependency of the 2D sputter yield on the species and kinetic energy of the incident ion beams. Freestanding graphene shows material semi-transparency to He(+) at high energies (10-30 keV) allowing the passage of >97% He(+) particles without creating destructive lattice vacancy. Large Ga(+) ions (5-30 keV), in contrast, collide far more often with the graphene lattice to impart a significantly higher sputter yield of ∼50%. Binary collision theory applied to monolayer and few-layer graphene can successfully elucidate this collision mechanism, in great agreement with experiments. Raman spectroscopy analysis corroborates the passage of a large fraction of He(+) ions across graphene without much damaging the lattice whereas several colliding ions create single vacancy defects. Physical understanding of the interaction between energetic particles and suspended graphene can practically lead to reproducible and efficient pattern generation of unprecedentedly small features on 2D materials by design, manifested by our perforation of sub-5 nm pore arrays. This capability of nanometer-scale precision patterning of freestanding 2D lattices shows the practical applicability of focused ion beam technology to 2D material processing for device fabrication and integration.
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Affiliation(s)
- Jakob Buchheim
- Nanoscience for Energy Technology and Sustainability, Department of Mechanical and Process Engineering, Eidgenössische Technische Hochschule (ETH) Zürich, Tannenstrasse 3, CH-8092 Zürich, Switzerland.
| | - Roman M Wyss
- Nanoscience for Energy Technology and Sustainability, Department of Mechanical and Process Engineering, Eidgenössische Technische Hochschule (ETH) Zürich, Tannenstrasse 3, CH-8092 Zürich, Switzerland.
| | - Ivan Shorubalko
- Laboratory for Reliability Science and Technology, Empa (Swiss Federal Laboratories for Materials Science and Technology), Überlandstrasse 129, CH-8600 Dübendorf, Switzerland.
| | - Hyung Gyu Park
- Nanoscience for Energy Technology and Sustainability, Department of Mechanical and Process Engineering, Eidgenössische Technische Hochschule (ETH) Zürich, Tannenstrasse 3, CH-8092 Zürich, Switzerland.
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13
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Iberi V, Ievlev AV, Vlassiouk I, Jesse S, Kalinin SV, Joy DC, Rondinone AJ, Belianinov A, Ovchinnikova OS. Graphene engineering by neon ion beams. NANOTECHNOLOGY 2016; 27:125302. [PMID: 26890062 DOI: 10.1088/0957-4484/27/12/125302] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He(+) and Ne(+) beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne(+) beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface.
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Affiliation(s)
- Vighter Iberi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. Department of Materials Science & Engineering, University of Tennessee Knoxville, TN 37996, USA
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14
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Li Z, Wang C, Tian L, Bai J, Yao H, Zhao Y, Zhang X, Cao S, Qi W, Wang S, Shi K, Xu Y, Mingliang Z, Liu B, Qiu H, Liu J, Wu W, Wang X, Wenzhen A. An embryo of protocells: The capsule of graphene with selective ion channels. Sci Rep 2015; 5:10258. [PMID: 25989440 PMCID: PMC4437305 DOI: 10.1038/srep10258] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/17/2014] [Accepted: 04/07/2015] [Indexed: 01/14/2023] Open
Abstract
The synthesis of artificial cell is a route for searching the origin of protocell. Here, we create a novel cell model of graphene capsules with selective ion channels, indicating that graphene might be an embryo of protocell membrane. Firstly, we found that the highly oxidized graphene and phospholipid-graphene oxide composite would curl into capsules under a strongly acidic saturated solution of heavy metallic salt solution at low temperature. Secondly, L-amino acids exhibited higher reactivity than D-amino acids on graphene oxides to form peptides, and the formed peptides in the influence of graphene would be transformed into a secondary structure, promoting the formation of left-handed proteins. Lastly, monolayer nanoporous graphene, prepared by unfocused (84)Kr(25+), has a high selectivity for permeation of the monovalent metal ions ( Rb(+) > K(+) > Cs(+) > Na(+) > Li(+), based on permeation concentration), but does not allow Cl(-) go through. It is similar to K(+) channels, which would cause an influx of K(+) into capsule of graphene with the increase of pH in the primitive ocean, creating a suitable inner condition for the origin of life. Therefore, we built a model cell of graphene, which would provide a route for reproducing the origin of life.
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Affiliation(s)
- Zhan Li
- Key Laboratory of Chemistry of Northwestern Plant Resources, Key Laboratory for Natural Medicine of Gansu Province, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
- Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Chunmei Wang
- Lanzhou Institute of Husbandry and Pharmaceutical Sciences of CAAS, Lanzhou, 730050, P.R. China
| | - Longlong Tian
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Jing Bai
- Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Huijun Yao
- Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Yang Zhao
- Department of Chemistry, State Key Lab of Molecular Engineering of Polymers, Shanghai Key Lab of Molecular Catalysis and Innovative Materials, and Collaborative Innovation Center of Chemistry for Energy Materials, Fudan University, Shanghai 200433, P. R. China
- School of Nuclear Science and Technology, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Xin Zhang
- Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Shiwei Cao
- Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Wei Qi
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Suomin Wang
- State Key Laboratory of Grassland Agro-ecosystems, College of Pastoral Agriculture Science and Technology, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Keliang Shi
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Youwen Xu
- Brookhaven National Laboratory Medical Department, Building 901, Room 106, Upton, NY 11973
| | - Zhang Mingliang
- Key Laboratory of Chemistry of Northwestern Plant Resources, Key Laboratory for Natural Medicine of Gansu Province, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Bo Liu
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Hongdeng Qiu
- Key Laboratory of Chemistry of Northwestern Plant Resources, Key Laboratory for Natural Medicine of Gansu Province, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou, 730000, P.R. China
| | - Jie Liu
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Wangsuo Wu
- Radiochemistry Laboratory, Lanzhou University, Lanzhou, 730000, P.R. China
| | - Xiaoli Wang
- Lanzhou Institute of Husbandry and Pharmaceutical Sciences of CAAS, Lanzhou, 730050, P.R. China
| | - An Wenzhen
- School of life science, Lanzhou University, Lanzhou, 730000, P.R. China
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15
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Sommer B, Sonntag J, Ganczarczyk A, Braam D, Prinz G, Lorke A, Geller M. Electron-beam induced nano-etching of suspended graphene. Sci Rep 2015; 5:7781. [PMID: 25586495 PMCID: PMC4293590 DOI: 10.1038/srep07781] [Citation(s) in RCA: 55] [Impact Index Per Article: 6.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/10/2014] [Accepted: 12/12/2014] [Indexed: 12/02/2022] Open
Abstract
Besides its interesting physical properties, graphene as a two-dimensional lattice of carbon atoms promises to realize devices with exceptional electronic properties, where freely suspended graphene without contact to any substrate is the ultimate, truly two-dimensional system. The practical realization of nano-devices from suspended graphene, however, relies heavily on finding a structuring method which is minimally invasive. Here, we report on the first electron beam-induced nano-etching of suspended graphene and demonstrate high-resolution etching down to ~7 nm for line-cuts into the monolayer graphene. We investigate the structural quality of the etched graphene layer using two-dimensional (2D) Raman maps and demonstrate its high electronic quality in a nano-device: A 25 nm-wide suspended graphene nanoribbon (GNR) that shows a transport gap with a corresponding energy of ~60 meV. This is an important step towards fast and reliable patterning of suspended graphene for future ballistic transport, nano-electronic and nano-mechanical devices.
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Affiliation(s)
- Benedikt Sommer
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Jens Sonntag
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Arkadius Ganczarczyk
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Daniel Braam
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Günther Prinz
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Axel Lorke
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
| | - Martin Geller
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Duisburg 47048, Germany
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16
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Margapoti E, Strobel P, Asmar MM, Seifert M, Li J, Sachsenhauser M, Ceylan O, Palma CA, Barth JV, Garrido JA, Cattani-Scholz A, Ulloa SE, Finley JJ. Emergence of photoswitchable states in a graphene-azobenzene-Au platform. NANO LETTERS 2014; 14:6823-6827. [PMID: 25414977 DOI: 10.1021/nl503681z] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The perfect transmission of charge carriers through potential barriers in graphene (Klein tunneling) is a direct consequence of the Dirac equation that governs the low-energy carrier dynamics. As a result, localized states do not exist in unpatterned graphene, but quasibound states can occur for potentials with closed integrable dynamics. Here, we report the observation of resonance states in photoswitchable self-assembled molecular(SAM)-graphene hybrid. Conductive AFM measurements performed at room temperature reveal strong current resonances, the strength of which can be reversibly gated on- and off- by optically switching the molecular conformation of the mSAM. Comparisons of the voltage separation between current resonances (∼ 70-120 mV) with solutions of the Dirac equation indicate that the radius of the gating potential is ∼ 7 ± 2 nm with a strength ≥ 0.5 eV. Our results and methods might provide a route toward optically programmable carrier dynamics and transport in graphene nanomaterials.
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Affiliation(s)
- Emanuela Margapoti
- Walter Schottky Institute - ZNN, Physik Department and NIM, Technische Universität München , Am Coulombwall 4, 80333 Garching, Germany
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17
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Zhang Y, Hui C, Sun R, Li K, He K, Ma X, Liu F. A large-area 15 nm graphene nanoribbon array patterned by a focused ion beam. NANOTECHNOLOGY 2014; 25:135301. [PMID: 24583466 DOI: 10.1088/0957-4484/25/13/135301] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Using a focused ion beam, we patterned epitaxial graphene on SiC into an array of graphene nanoribbons as narrow as 15 nm by optimizing the Ga(+) ion beam current, acceleration voltage, dwell time, beam center-to-center distance and ion dose. The ion dose required to completely etch away graphene on SiC was determined and compared with the Monte Carlo simulation result. In addition, a photodetector using an array of 300 20 nm graphene nanoribbons was fabricated and its photoresponse was studied.
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Affiliation(s)
- Ye Zhang
- Department of Materials Science and Engineering, University of Utah, Salt Lake City, UT 84112, USA
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18
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In Situ Microfabrication and Measurements of Bi 2Se 3 Ultrathin Films in a Multichamber System with a Focused Ion Beam, Molecular Beam Epitaxy, and Four-Tip Scanning Tunneling Microscope. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2014. [DOI: 10.1380/ejssnt.2014.423] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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19
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Jorio A, Cançado LG. Perspectives on Raman spectroscopy of graphene-based systems: from the perfect two-dimensional surface to charcoal. Phys Chem Chem Phys 2012; 14:15246-56. [DOI: 10.1039/c2cp42621h] [Citation(s) in RCA: 43] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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