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Wang K, Song L, Wang C, Ren Z, Zhao G, Dou J, Di J, Barbastathis G, Zhou R, Zhao J, Lam EY. On the use of deep learning for phase recovery. LIGHT, SCIENCE & APPLICATIONS 2024; 13:4. [PMID: 38161203 PMCID: PMC10758000 DOI: 10.1038/s41377-023-01340-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/31/2023] [Revised: 11/13/2023] [Accepted: 11/16/2023] [Indexed: 01/03/2024]
Abstract
Phase recovery (PR) refers to calculating the phase of the light field from its intensity measurements. As exemplified from quantitative phase imaging and coherent diffraction imaging to adaptive optics, PR is essential for reconstructing the refractive index distribution or topography of an object and correcting the aberration of an imaging system. In recent years, deep learning (DL), often implemented through deep neural networks, has provided unprecedented support for computational imaging, leading to more efficient solutions for various PR problems. In this review, we first briefly introduce conventional methods for PR. Then, we review how DL provides support for PR from the following three stages, namely, pre-processing, in-processing, and post-processing. We also review how DL is used in phase image processing. Finally, we summarize the work in DL for PR and provide an outlook on how to better use DL to improve the reliability and efficiency of PR. Furthermore, we present a live-updating resource ( https://github.com/kqwang/phase-recovery ) for readers to learn more about PR.
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Affiliation(s)
- Kaiqiang Wang
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong SAR, China.
- School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, China.
- Department of Biomedical Engineering, The Chinese University of Hong Kong, Hong Kong SAR, China.
| | - Li Song
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong SAR, China
| | - Chutian Wang
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong SAR, China
| | - Zhenbo Ren
- School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, China
| | - Guangyuan Zhao
- Department of Biomedical Engineering, The Chinese University of Hong Kong, Hong Kong SAR, China
| | - Jiazhen Dou
- School of Information Engineering, Guangdong University of Technology, Guangzhou, China
| | - Jianglei Di
- School of Information Engineering, Guangdong University of Technology, Guangzhou, China
| | - George Barbastathis
- Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Renjie Zhou
- Department of Biomedical Engineering, The Chinese University of Hong Kong, Hong Kong SAR, China
| | - Jianlin Zhao
- School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, China.
| | - Edmund Y Lam
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong SAR, China.
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2
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Hoidn O, Mishra AA, Mehta A. Physics constrained unsupervised deep learning for rapid, high resolution scanning coherent diffraction reconstruction. Sci Rep 2023; 13:22789. [PMID: 38123573 PMCID: PMC10733394 DOI: 10.1038/s41598-023-48351-7] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/23/2023] [Accepted: 11/25/2023] [Indexed: 12/23/2023] Open
Abstract
By circumventing the resolution limitations of optics, coherent diffractive imaging (CDI) and ptychography are making their way into scientific fields ranging from X-ray imaging to astronomy. Yet, the need for time consuming iterative phase recovery hampers real-time imaging. While supervised deep learning strategies have increased reconstruction speed, they sacrifice image quality. Furthermore, these methods' demand for extensive labeled training data is experimentally burdensome. Here, we propose an unsupervised physics-informed neural network reconstruction method, PtychoPINN, that retains the factor of 100-to-1000 speedup of deep learning-based reconstruction while improving reconstruction quality by combining the diffraction forward map with real-space constraints from overlapping measurements. In particular, PtychoPINN gains a factor of 4 in linear resolution and an 8 dB improvement in PSNR while also accruing improvements in generalizability and robustness. This blend of performance and computational efficiency offers exciting prospects for high-resolution real-time imaging in high-throughput environments such as X-ray free electron lasers (XFELs) and diffraction-limited light sources.
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Affiliation(s)
- Oliver Hoidn
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA.
| | | | - Apurva Mehta
- SLAC National Accelerator Laboratory, Menlo Park, CA, USA
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3
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Pelz PM, Griffin SM, Stonemeyer S, Popple D, DeVyldere H, Ercius P, Zettl A, Scott MC, Ophus C. Solving complex nanostructures with ptychographic atomic electron tomography. Nat Commun 2023; 14:7906. [PMID: 38036516 PMCID: PMC10689721 DOI: 10.1038/s41467-023-43634-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/16/2023] [Accepted: 11/15/2023] [Indexed: 12/02/2023] Open
Abstract
Transmission electron microscopy (TEM) is essential for determining atomic scale structures in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined from thousands of identical particles using phase-contrast TEM. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform ptychographic electron tomography from 34.5 million diffraction patterns to reconstruct an atomic resolution tilt series of a double wall-carbon nanotube (DW-CNT) encapsulating a complex ZrTe sandwich structure. Class averaging the resulting tilt series images and subpixel localization of the atomic peaks reveals a Zr11Te50 structure containing a previously unobserved ZrTe2 phase in the core. The experimental realization of atomic resolution ptychographic electron tomography will allow for the structural determination of a wide range of beam-sensitive nanomaterials containing light elements.
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Affiliation(s)
- Philipp M Pelz
- Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich Alexander-Universität Erlangen-Nürnberg, IZNF, 91058, Erlangen, Germany.
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, 94720, USA.
- The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
| | - Sinéad M Griffin
- The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Scott Stonemeyer
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- Kavli Energy NanoSciences Institute at the University of California at Berkeley, Berkeley, CA, 94720, USA
- Department of Chemistry, University of California at Berkeley, Berkeley, CA, 94720, USA
- Department of Physics, University of California at Berkeley, Berkeley, CA, 94720, USA
| | - Derek Popple
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- Kavli Energy NanoSciences Institute at the University of California at Berkeley, Berkeley, CA, 94720, USA
- Department of Chemistry, University of California at Berkeley, Berkeley, CA, 94720, USA
- Department of Physics, University of California at Berkeley, Berkeley, CA, 94720, USA
| | - Hannah DeVyldere
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, 94720, USA
| | - Peter Ercius
- The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Alex Zettl
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- Kavli Energy NanoSciences Institute at the University of California at Berkeley, Berkeley, CA, 94720, USA
- Department of Physics, University of California at Berkeley, Berkeley, CA, 94720, USA
| | - Mary C Scott
- Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA, 94720, USA
- The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Colin Ophus
- The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
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4
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Babu AV, Zhou T, Kandel S, Bicer T, Liu Z, Judge W, Ching DJ, Jiang Y, Veseli S, Henke S, Chard R, Yao Y, Sirazitdinova E, Gupta G, Holt MV, Foster IT, Miceli A, Cherukara MJ. Deep learning at the edge enables real-time streaming ptychographic imaging. Nat Commun 2023; 14:7059. [PMID: 37923741 PMCID: PMC10624836 DOI: 10.1038/s41467-023-41496-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/13/2023] [Accepted: 09/06/2023] [Indexed: 11/06/2023] Open
Abstract
Coherent imaging techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of brighter sources and high-rate detectors, coherent imaging methods like ptychography are poised to revolutionize nanoscale materials characterization. However, these advancements are accompanied by significant increase in data and compute needs, which precludes real-time imaging, feedback and decision-making capabilities with conventional approaches. Here, we demonstrate a workflow that leverages artificial intelligence at the edge and high-performance computing to enable real-time inversion on X-ray ptychography data streamed directly from a detector at up to 2 kHz. The proposed AI-enabled workflow eliminates the oversampling constraints, allowing low-dose imaging using orders of magnitude less data than required by traditional methods.
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Affiliation(s)
- Anakha V Babu
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
- KLA Corporation, Ann Arbor, MI, USA
| | - Tao Zhou
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Saugat Kandel
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Tekin Bicer
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Zhengchun Liu
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - William Judge
- Department of Chemistry, University of Illinois, Chicago, IL, USA
| | - Daniel J Ching
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Yi Jiang
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Sinisa Veseli
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Steven Henke
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Ryan Chard
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Yudong Yao
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | | | | | - Martin V Holt
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Ian T Foster
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA
| | - Antonino Miceli
- Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL, USA.
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Jeong J, Jung C, Kim T, Cho DD. Using machine learning to improve multi-qubit state discrimination of trapped ions from uncertain EMCCD measurements. OPTICS EXPRESS 2023; 31:35113-35130. [PMID: 37859250 DOI: 10.1364/oe.491301] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/18/2023] [Accepted: 08/15/2023] [Indexed: 10/21/2023]
Abstract
This paper proposes a residual network (ResNet)-based convolutional neural network (CNN) model to improve multi-qubit state measurements using an electron-multiplying charge-coupled device (EMCCD). The CNN model is developed to simultaneously use the intensity of pixel values and the shape of ion images in determining the quantum states of ions. In contrast, conventional methods use only the intensity values. In our experiments, the proposed model achieved a 99.53±0.14% mean individual measurement fidelity (MIMF) of 4 trapped ions, reducing the error by 46% when compared to the MIMF of maximum likelihood estimation method of 99.13±0.08%. In addition, it is experimentally shown that the model is also robust against the ion image drift, which was tested by intentionally shifting the ion images.
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6
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Li G, Zhang H, Han Y. Applications of Transmission Electron Microscopy in Phase Engineering of Nanomaterials. Chem Rev 2023; 123:10728-10749. [PMID: 37642645 DOI: 10.1021/acs.chemrev.3c00364] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 08/31/2023]
Abstract
Phase engineering of nanomaterials (PEN) is an emerging field that aims to tailor the physicochemical properties of nanomaterials by precisely manipulating their crystal phases. To advance PEN effectively, it is vital to possess the capability of characterizing the structures and compositions of nanomaterials with precision. Transmission electron microscopy (TEM) is a versatile tool that combines reciprocal-space diffraction, real-space imaging, and spectroscopic techniques, allowing for comprehensive characterization with exceptional resolution in the domains of time, space, momentum, and, increasingly, even energy. In this Review, we first introduce the fundamental mechanisms behind various TEM-related techniques, along with their respective application scopes and limitations. Subsequently, we review notable applications of TEM in PEN research, including applications in fields such as metallic nanostructures, carbon allotropes, low-dimensional materials, and nanoporous materials. Specifically, we underscore its efficacy in phase identification, composition and chemical state analysis, in situ observations of phase evolution, as well as the challenges encountered when dealing with beam-sensitive materials. Furthermore, we discuss the potential generation of artifacts during TEM imaging, particularly in scanning modes, and propose methods to minimize their occurrence. Finally, we offer our insights into the present state and future trends of this field, discussing emerging technologies including four-dimensional scanning TEM, three-dimensional atomic-resolution imaging, and electron microscopy automation while highlighting the significance and feasibility of these advancements.
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Affiliation(s)
- Guanxing Li
- Advanced Membranes and Porous Materials Center, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
| | - Hui Zhang
- Electron Microscopy Center, South China University of Technology, Guangzhou 510640, China
- School of Emergent Soft Matter, South China University of Technology, Guangzhou 510640, China
| | - Yu Han
- Advanced Membranes and Porous Materials Center, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
- Electron Microscopy Center, South China University of Technology, Guangzhou 510640, China
- School of Emergent Soft Matter, South China University of Technology, Guangzhou 510640, China
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Tao W, Yu W, Zou X, Chen W. Machine learning assisted interpretation of 2D solid-state nuclear magnetic resonance spectra. JOURNAL OF MAGNETIC RESONANCE (SAN DIEGO, CALIF. : 1997) 2023; 353:107492. [PMID: 37302236 DOI: 10.1016/j.jmr.2023.107492] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/12/2023] [Revised: 05/22/2023] [Accepted: 05/25/2023] [Indexed: 06/13/2023]
Abstract
A machine learning methodology using deep neural network (DNN) for interpreting multidimensional solid-state nuclear magnetic resonance (SSNMR) of various synthetic and natural polymers is presented. The separated local field (SLF) SSNMR which correlates local well-defined heteronuclear dipolar with the tensor orientation of the chemical shift anisotropy (CSA) of spin in the solid state can provide valuable structure and molecular dynamics information of synthetic and biopolymers. Compared with the traditional linear least-square fitting, the proposed DNN-based methodology can efficiently and accurately determine the tensor orientation of CSA of both 13C and 15N in all four samples. The method achieves prediction precisions of the Euler angles with < ±5° and is characterized by low training costs and high efficiency (<1 s). The feasibility and robustness of the DNN-based analysis methodology are confirmed by comparison to reported-literature values. This strategy is expected to aid in the interpretation of complex multidimensional NMR spectra of complicated polymer system.
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Affiliation(s)
- Wei Tao
- National Synchrotron Radiation Laboratory, Anhui Provincial Engineering Laboratory of Advanced Functional Polymer Film, CAS Key Laboratory of Soft Matter Chemistry, University of Science and Technology of China, Hefei 230026, China
| | - Wancheng Yu
- National Synchrotron Radiation Laboratory, Anhui Provincial Engineering Laboratory of Advanced Functional Polymer Film, CAS Key Laboratory of Soft Matter Chemistry, University of Science and Technology of China, Hefei 230026, China
| | - Xiangyu Zou
- Department of Accelerator Science and Engineering Physics, School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230026, China
| | - Wei Chen
- National Synchrotron Radiation Laboratory, Anhui Provincial Engineering Laboratory of Advanced Functional Polymer Film, CAS Key Laboratory of Soft Matter Chemistry, University of Science and Technology of China, Hefei 230026, China; Department of Accelerator Science and Engineering Physics, School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230026, China.
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8
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O'Leary CM, Chang DJ, Ercius P, Nellist PD, Kirkland AI, Miao J. Confessions of a Ptychopath: Detection, Dimensions, Damage and Despair. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:432-433. [PMID: 37613186 DOI: 10.1093/micmic/ozad067.204] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Affiliation(s)
- Colum M O'Leary
- Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
| | - Dillan J Chang
- Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
| | - Peter Ercius
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
| | | | - Angus I Kirkland
- Department of Materials, University of Oxford, Oxford, UK
- Electron Physical Science Imaging Centre (ePSIC), Diamond Light Source, Didcot, UK
- The Rosalind Franklin Institute, Harwell Campus, Didcot, UK
| | - Jianwei Miao
- Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
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