1
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Abbas Z, Bokhari TH, Rana Z, Ijaz S, Gul E, Zafar A, Javaid S, Gul M, Maaz K, Karim S, Xiang G, Ahmad M, Nisar A. Mesoporous Mo-doped NiCo 2O 4 nanocrystals for enhanced electrochemical kinetics in high-performance lithium-ion batteries. RSC Adv 2025; 15:13552-13560. [PMID: 40296996 PMCID: PMC12035699 DOI: 10.1039/d5ra00918a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/07/2025] [Accepted: 04/13/2025] [Indexed: 04/30/2025] Open
Abstract
Capacity fading at high rates and a reduced cyclic life due to the deterioration of electrode integrity is one of the major problems in the practical applications of lithium-ion batteries. In this regard, the development of efficient and innovative electrode materials with outstanding transport features and electrochemical properties is urgently needed. In this work, mesoporous Mo-doped NiCo2O4 nanocrystals with enhanced electrochemical kinetics were prepared and investigated as an anode material for lithium-ion batteries. Experimental and density functional theory results demonstrated an increase in the specific surface area, creation of defects and enhanced conductivity. These promising features provide an opportunity to boost the lithium-storage capability of Mo-doped NiCo2O4 nanocrystals. The assembled Mo-doped NiCo2O4 electrode delivered a high initial discharge capacity of 1225 mA h g-1 at 50 mA g-1 and an excellent reversible capacity of ∼512 mA h g-1 at 300 mA g-1 with a coulombic efficiency of about 98%. Moreover, the electrode demonstrated high cyclic stability even after 300 cycles and superior rate performance compared with previously reported electrodes. These results prove that the electrochemically boosted Mo-doped NiCo2O4 structure could be an emerging electrode material for future high-performance batteries.
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Affiliation(s)
- Zahid Abbas
- Nanomaterials Research Group, PD, PINSTECH Islamabad 44000 Pakistan
- Department of Chemistry, GC University Faisalabad 38000 Pakistan
| | | | - Zohaib Rana
- State Key Laboratory of Chemical Resource Engineering, Beijing University of Chemical Technology Beijing 100029 PR China
| | - Saman Ijaz
- Department of Chemistry, GC University Faisalabad 38000 Pakistan
| | - Eman Gul
- Institute of Chemical Sciences, University of Peshawar Peshawar 25000 Pakistan
| | | | - Saqib Javaid
- Theoretical Physics Division, PINSTECH Islamabad 44000 Pakistan
| | - Maria Gul
- MFMG, PD, PINSTECH Islamabad 44000 Pakistan
| | - Khan Maaz
- Nanomaterials Research Group, PD, PINSTECH Islamabad 44000 Pakistan
| | - Shafqat Karim
- Nanomaterials Research Group, PD, PINSTECH Islamabad 44000 Pakistan
| | - Guolei Xiang
- State Key Laboratory of Chemical Resource Engineering, Beijing University of Chemical Technology Beijing 100029 PR China
| | - Mashkoor Ahmad
- Nanomaterials Research Group, PD, PINSTECH Islamabad 44000 Pakistan
| | - Amjad Nisar
- Nanomaterials Research Group, PD, PINSTECH Islamabad 44000 Pakistan
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2
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Motai D, Araki H. Fabrication of (Ge 0.42Sn 0.58)S Thin Films via Co-Evaporation and Their Solar Cell Applications. MATERIALS (BASEL, SWITZERLAND) 2024; 17:692. [PMID: 38591533 PMCID: PMC10856387 DOI: 10.3390/ma17030692] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/30/2023] [Revised: 01/28/2024] [Accepted: 01/29/2024] [Indexed: 04/10/2024]
Abstract
In this study, as a novel approach to thin-film solar cells based on tin sulfide, an environmentally friendly material, we attempted to fabricate (Ge, Sn)S thin films for application in multi-junction solar cells. A (Ge0.42 Sn0.58)S thin film was prepared via co-evaporation. The (Ge0.42 Sn0.58)S thin film formed a (Ge, Sn)S solid solution, as confirmed by X-ray diffraction (XRD) and Raman spectroscopy analyses. The open circuit voltage (Voc), short circuit current density (Jsc), fill factor (FF), and power conversion efficiency (PCE) of (Ge0.42 Sn0.58)S thin-film solar cells were 0.29 V, 6.92 mA/cm2, 0.34, and 0.67%, respectively; moreover, the device showed a band gap of 1.42-1.52 eV. We showed that solar cells can be realized even in a composition range with a relatively higher Ge concentration than the (Ge, Sn)S solar cells reported to date. This result enhances the feasibility of multi-junction SnS-system thin-film solar cells.
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Affiliation(s)
| | - Hideaki Araki
- National Institute of Technology (KOSEN), Nagaoka College, Niigata 940-8532, Japan
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3
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Sun B, Fan J, Tang Z, Shi G, Yi M, Wang Y, Wang X, Guo Y, Zhu S. A Strategy for Studying Environmental Engineering: Simple Hydrothermal Synthesis of Flower-Shaped Stannous Sulfide Nanomaterials for Efficient Cataluminescence Sensing of Diethyl Ether. Molecules 2023; 28:7621. [PMID: 38005342 PMCID: PMC10673495 DOI: 10.3390/molecules28227621] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/13/2023] [Revised: 11/13/2023] [Accepted: 11/14/2023] [Indexed: 11/26/2023] Open
Abstract
In this work, flower-like stannous sulfide (SnS) nanomaterials are synthesized using a hydrothermal method and used as sensitive materials for cataluminescence (CTL)-based detection of diethyl ether. Gas sensors based on SnS nanomaterials are prepared, and the SnS nanomaterials exhibit excellent gas-sensitive behavior towards ether. High sensitivity to ether is achieved at a relatively low operating temperature (153 °C) compared to other common sensors. The response time is 3 s and the recovery time is 8 s. The CTL intensity shows a good linear relationship (R2 = 0.9931) with a detection limit of 0.15 ppm and the concentration of ether in the range of 1.5-60 ppm. The proposed CTL sensor shows good selectivity towards ether. In addition, a highly stable signal is obtained with a relative standard deviation of 1.5%. This study indicates that the SnS-based sensor has excellent gas-sensitive performance and shows potential for applications in the detection of ether.
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Affiliation(s)
- Bai Sun
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
- Environmental Materials and Pollution Control Laboratory, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei 230031, China
| | - Jingjie Fan
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Zhuo Tang
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Guoji Shi
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Mingjian Yi
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Yun Wang
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Xiangxiang Wang
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
| | - Yuxian Guo
- College of Mathematics and Physics, Anhui Jianzhu University, Hefei 230601, China;
| | - Shuguang Zhu
- Anhui Institute of Urban and Rural Green Development and Urban Renewal, College of Environment and Energy Engineering, Anhui Jianzhu University, Hefei 230601, China; (J.F.); (Z.T.); (G.S.); (M.Y.); (X.W.); (S.Z.)
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4
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Wei J, Yu H, He Q, Wu D, Xie Y, Lin C. Broadband SnS/Te photodetector to long-wavelength infrared: breaking the spectrum limit through alloy engineering. OPTICS EXPRESS 2023; 31:32591-32600. [PMID: 37859059 DOI: 10.1364/oe.495083] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/08/2023] [Accepted: 09/05/2023] [Indexed: 10/21/2023]
Abstract
Materials based on group IV chalcogenides, are considered to be one of the most promising materials for high-performance, broadband photodetectors due to their wide bandgap coverage, intriguing chemical bonding and excellent physical properties. However, the reported photodetectors based on SnS are still worked at relatively narrow near-infrared band (as far as 1550 nm) hampered by the nonnegligible bandgap of 1.1-1.5 eV. Here, a novel photodetector based on Te alloyed SnS thin film was demonstrated with an ultra-broadband response up to 10.6 µm. By controlling the Te alloyed concentration in SnS increasing to 37.64%, the bandgap narrows to 0.23 eV, exhibiting a photoresponse potential at long-wavelength infrared excitation. Our results show Te-alloying can remarkably enhance the detection properties of SnS/Te photodetectors. The photoresponsivity and detectivity of 1.59 mA/W and 2.3 × 108 Jones were realized at 10.6 µm at room temperature. Moreover, the nonzero photogain was observed generated by nonlinearly increased photocurrent density, resulting in a superlinear dependency between photoresponsivity and light intensity. Our studies successfully broaden photoresponse spectrum of SnS toward the mid-infrared range for the first time. It also suggests that alloying is an effective technique for tuning the band edges of group IV chalcogenides, contributing deep implications for developing future optoelectronic applications.
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Prakash B, Meena A, Saini YK, Mahich S, Singh A, Kumari S, Tripathi CSP, Choudhary BL. Solution-processed CZTS thin films and its simulation study for solar cell applications with ZnTe as the buffer layer. ENVIRONMENTAL SCIENCE AND POLLUTION RESEARCH INTERNATIONAL 2023; 30:98671-98681. [PMID: 36287362 DOI: 10.1007/s11356-022-23664-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/11/2022] [Accepted: 10/12/2022] [Indexed: 06/16/2023]
Abstract
Using zinc tellurium (ZnTe) as the buffer layer in the Cu2ZnSnS4 (CZTS)-based solar cells showed an improvement in overall efficiency. ZnTe is investigated as an alternative to replace the conventional toxic Cd-contained buffer layers. It may also reduce the overall cost of these cells as both layers (ZnTe and CZTS) have eco-friendly and earth-abundant constituents. The sol-gel spin coating method is used for the deposition of CZTS thin films on the corning glass substrates. The X-ray diffraction studies showed the peaks corresponding to (112), (200), (220), and (312) planes which confirmed the formation of the essential kesterite phase. The optical band gap of the deposited films was found at around 1.45 eV by the UV-visible-NIR spectrophotometer. The optimum thickness of the absorber layer (CZTS) and buffer layer (ZnTe) was investigated based on the performance of the ZnO:Al/ZnO/ZnTe/CZTS/Mo cell structure by using the AMPS-1D simulation tool. In contrast, the tool was molded by the experimentally investigated data for the constituent materials of the cell structure. The solar cells' efficiency was increased by 23.47% at 2500 nm and 50 nm thickness of the CZTS and ZnTe layers, respectively. In addition, it was analyzed and found that the current density value showed an improvement with operating temperature as it is one of the requirements in the high solar radiation areas where the temperature even rises more than 50 °C in the summer.
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Affiliation(s)
- Bhanu Prakash
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India
- Department of Physics, Banasthali Vidyapith, Jaipur, Rajasthan, 304022, India
| | - Arti Meena
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India
| | - Yogesh Kumar Saini
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India
| | - Sanju Mahich
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India
| | - Amanpal Singh
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India.
| | - Sarita Kumari
- Department of Physics, University of Rajasthan, Jaipur, 302004, Rajasthan, India
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6
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Liu Y, McNaughter PD, Azough F, Liu X, Skelton JM, Kretinin AV, Lewis DJ, Freer R. Enhanced Thermoelectric Performance of Tin(II) Sulfide Thin Films Prepared by Aerosol Assisted Chemical Vapor Deposition. ACS APPLIED ENERGY MATERIALS 2023; 6:4462-4474. [PMID: 37123105 PMCID: PMC10131136 DOI: 10.1021/acsaem.3c00608] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/07/2023] [Accepted: 03/17/2023] [Indexed: 05/03/2023]
Abstract
Orthorhombic SnS exhibits excellent thermoelectric performance as a consequence its relatively high Seebeck coefficient and low thermal conductivity. In the present work, polycrystalline orthorhombic SnS thin films were prepared by aerosol-assisted chemical vapor deposition (AACVD) using the single source precursor dibutyl-bis(diethyldithiocarbamato)tin(IV) [Sn(C4H9)2(S2CN(C2H5)2)2]. We examined the effects of the processing parameters on the composition, microstructure, and electrical transport properties of the SnS films. Deposition temperature dominates charge transport; the room temperature electrical conductivity increased from 0.003 to 0.19 S·cm-1 as deposition temperature increased from 375 to 445 °C. Similarly, the maximum power factor (PF) increased with deposition temperature, reaching ∼0.22 μW·cm-1·K-2 at 570 K. The power factors for SnS films deposited by AACVD are higher than values from earlier work on SnS bulks and SnS/SnSe films at temperatures up to 520 K. The electronic structure and electrical transport properties of SnS were investigated using density-functional theory to provide an improved understanding of the materials performance. To the best of our knowledge, the thermal conductivity (κ) of SnS film was measured for the first time allowing the figure of merit (zT) for SnS film to be evaluated. A relatively low thermal conductivity of ∼0.41 W·m-1·K-1 was obtained at 550 K for SnS films deposited at 445 °C; the corresponding zT value was ∼0.026. The SnS films are good candidates for thermoelectric applications and AACVD is a promising technique for the preparation of high-performance thermoelectric films.
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Affiliation(s)
- Yu Liu
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Paul D. McNaughter
- Department
of Chemistry, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Feridoon Azough
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Xiaodong Liu
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Jonathan M. Skelton
- Department
of Chemistry, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Andrey V. Kretinin
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
- National
Graphene Institute, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - David J. Lewis
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
| | - Robert Freer
- Department
of Materials, University of Manchester, Oxford Road, Manchester, M13 9PL, U.K.
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7
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Dragoman M, Dragoman D, Dinescu A, Avram A, Vulpe S, Aldrigo M, Braniste T, Suman V, Rusu E, Tiginyanu I. Ultralow voltage (1 μV) electrical switching of SnS thin films driven by a vertical electric field. NANOTECHNOLOGY 2023; 34:175203. [PMID: 36706454 DOI: 10.1088/1361-6528/acb69e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/08/2022] [Accepted: 01/27/2023] [Indexed: 06/18/2023]
Abstract
In this paper, we show in a series of experiments on 10 nm thick SnS thin film-based back-gate transistors that in the absence of the gate voltage, the drain current versus drain voltage (ID-VD) dependence is characterized by a weak drain current and by an ambipolar transport mechanism. When we apply a gate voltage as low as 1μV, the current increases by several orders of magnitude and theID-VDdependence changes drastically, with the SnS behaving as ap-type semiconductor. This happens because the current flows from the source (S) to the drain (D) electrode through a discontinuous superficial region of the SnS film when no gate voltage is applied. On the contrary, when minute gate voltages are applied, the vertical electric field applied to the multilayer SnS induces a change in the flow path of the charge carriers, involving the inner and continuous SnS layer in the electrical conduction. Moreover, we show that high gate voltages can tune significantly the SnS bandgap.
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Affiliation(s)
- Mircea Dragoman
- National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Voluntari (Ilfov), Romania
| | - Daniela Dragoman
- Univ. of Bucharest, Physics Faculty, PO Box MG-11, 077125 Bucharest, Romania
- Academy of Romanian Scientists, Str. Ilfov 3, 050044 Bucharest, Romania
| | - Adrian Dinescu
- National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Voluntari (Ilfov), Romania
| | - Andrei Avram
- National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Voluntari (Ilfov), Romania
| | - Silviu Vulpe
- National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Voluntari (Ilfov), Romania
| | - Martino Aldrigo
- National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Voluntari (Ilfov), Romania
| | - Tudor Braniste
- National Center for Materials Study and Testing, Technical University of Moldova, 168 Stefan cel Mare Av., 2004 Chisinau, Moldova
| | - Victor Suman
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Emil Rusu
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Ion Tiginyanu
- National Center for Materials Study and Testing, Technical University of Moldova, 168 Stefan cel Mare Av., 2004 Chisinau, Moldova
- Academy of Sciences of Moldova, 1 Stefan cel Mare Av., 2004 Chisinau, Moldova
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8
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Agoro MA, Meyer EL. The formation of SnS nanorods orthorhombic phases grown from different molecular precursors. RESULTS IN CHEMISTRY 2022. [DOI: 10.1016/j.rechem.2022.100690] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022] Open
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9
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Dragoman M, Dinescu A, Avram A, Dragoman D, Vulpe S, Aldrigo M, Braniste T, Suman V, Rusu E, Tiginyanu I. Ultrathin tin sulfide field-effect transistors with subthreshold slope below 60 mV/decade. NANOTECHNOLOGY 2022; 33:405207. [PMID: 35767973 DOI: 10.1088/1361-6528/ac7cf8] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/03/2022] [Accepted: 06/29/2022] [Indexed: 06/15/2023]
Abstract
In this paper, we present for the first time a field-effect-transistor (FET) having a 10 nm thick tin sulfide (SnS) channel fabricated at the wafer scale with high reproducibility. SnS-based FETs are in on-state for increasing positive back-gate voltages up to 6 V, whereas the off-state is attained for negative back-gate voltages not exceeding -6 V, the on/off ratio being in the range 102-103depending on FET dimensions. The SnS FETs show a subthreshold slope (SS) below 60 mV/decade thanks to the in-plane ferroelectricity of SnS and attaining a minimum value SS = 21 mV/decade. Moreover, the low SS values can be explained by the existence of a negative value of the capacitance of the SnS thin film up to 10 GHz (for any DC bias voltage between 1 and 5 V), with the minimum value being -12.87 pF at 0.1 GHz.
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Affiliation(s)
- Mircea Dragoman
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Adrian Dinescu
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Andrei Avram
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Daniela Dragoman
- Univ. of Bucharest, Physics Faculty, PO Box MG-11, 077125 Bucharest, Romania
- Academy of Romanian Scientists, Str. Ilfov 3, 050044 Bucharest, Romania
| | - Silviu Vulpe
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Martino Aldrigo
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Tudor Braniste
- National Center for Materials Study and Testing, Technical University of Moldova, 168 Stefan cel Mare Av., 2004 Chisinau, Moldova
| | - Victor Suman
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Emil Rusu
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Ion Tiginyanu
- National Center for Materials Study and Testing, Technical University of Moldova, 168 Stefan cel Mare Av., 2004 Chisinau, Moldova
- Academy of Sciences of Moldova, 1 Stefan cel Mare Av., 2004 Chisinau, Moldova
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10
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Kawamura F, Song Y, Murata H, Tampo H, Nagai T, Koida T, Imura M, Yamada N. Tunability of the bandgap of SnS by variation of the cell volume by alloying with A.E. elements. Sci Rep 2022; 12:7434. [PMID: 35523826 PMCID: PMC9076691 DOI: 10.1038/s41598-022-11074-2] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/02/2021] [Accepted: 04/18/2022] [Indexed: 11/23/2022] Open
Abstract
We clarified that the bandgap of inorganic materials is strongly correlated with their effective coordination number (ECoN) via first-principles calculations and experimental confirmations. Tin mono-sulphide (Pnma) and germanium mono-sulphide (Pnma) were selected as model cases since these materials successively alter the ECoN as the cell volume changes and show an uncommon relationship between cell volume and bandgap. Contrary to the common semiconductors, the bandgaps of SnS (Pnma) and GeS (Pnma) have a positive relationship with respect to cell volume. This unique phenomenon was explained by incorporating the concept of ECoN into the theoretical studies. The theory proposed in this study is widely applicable to semiconductors with low-symmetry structures. Further, we experimentally demonstrated that the bandgap of SnS (Pnma) can be broadly tuned by changing the unit cell volume via alloying with alkali-earth (A.E.) metals, which could allow SnS to be applied to Si-based tandem photovoltaics. Alloying with A.E. elements also stabilised Cl as an n-type donor, which enabled n-type conduction in the bandgap-widened SnS film in the SnS-based semiconductors.
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Affiliation(s)
- Fumio Kawamura
- Research Center for Functional Materials, High Pressure Group, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.
| | - Yelim Song
- Research Center for Functional Materials, High Pressure Group, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.
| | - Hidenobu Murata
- Department of Materials Science, Osaka Prefecture University, 1-1 Gakuencho, Naka-ku, Sakai, Osaka, 599-8531, Japan.
| | - Hitoshi Tampo
- National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan
| | - Takehiko Nagai
- National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan
| | - Takashi Koida
- National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan
| | - Masataka Imura
- Next-Generation Semiconductor Group, National Institute for Materials Science (NIMS), Namiki 1-1, Tsukuba, Ibaraki, 305-0044, Japan
| | - Naoomi Yamada
- Department of Applied Chemistry, Chubu University, 1200 Matsumoto, Kasugai, Aichi, 487-8501, Japan
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11
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Dragoman M, Aldrigo M, Dinescu A, Iordanescu S, Romanitan C, Vulpe S, Dragoman D, Braniste T, Suman V, Rusu E, Tiginyanu I. The microwave properties of tin sulfide thin films prepared by RF magnetron sputtering techniques. NANOTECHNOLOGY 2022; 33:235705. [PMID: 35235921 DOI: 10.1088/1361-6528/ac59e3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/01/2021] [Accepted: 03/02/2022] [Indexed: 06/14/2023]
Abstract
In this paper we present the microwave properties of tin sulfide (SnS) thin films with the thickness of just 10 nm, grown by RF magnetron sputtering techniques on a 4 inch silicon dioxide/high-resistivity silicon wafer. In this respect, interdigitated capacitors in coplanar waveguide technology were fabricated directly on the SnS film to be used as both phase shifters and detectors, depending on the ferroelectric or semiconductor behaviour of the SnS material. The ferroelectricity of the semiconducting thin layer manifests itself in a strong dependence of the electrical permittivity on the applied DC bias voltage, which induces a phase shift of 30 degrees mm-1at 1 GHz and of 8 degrees mm-1at 10 GHz, whereas the transmission losses are less than 2 dB in the frequency range 2-20 GHz. We have also investigated the microwave detection properties of SnS, obtaining at 1 GHz a voltage responsivity of about 30 mV mW-1in the unbiased case and with an input power level of only 16μW.
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Affiliation(s)
- Mircea Dragoman
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Martino Aldrigo
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Adrian Dinescu
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Sergiu Iordanescu
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Cosmin Romanitan
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Silviu Vulpe
- National Institute for Research and Development in Microtechnologies, 126A Erou Iancu Nicolae Street, 077190 Voluntari (Ilfov), Romania
| | - Daniela Dragoman
- Univ. of Bucharest, Physics Faculty, PO Box MG-11, 077125 Bucharest, Romania
- Academy of Romanian Scientists, Str. Ilfov 3, 050044 Bucharest, Romania
| | - Tudor Braniste
- National Center for Materials Study and Testing, Technical University of Moldova, 168 Stefan cel Mare Av., 2004 Chisinau, Moldova
| | - Victor Suman
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Emil Rusu
- Institute of Electronic Engineering and Nanotechnologies, Academiei Street 3/3, 2028 Chisinau, Moldova
| | - Ion Tiginyanu
- Academy of Sciences of Moldova, 1 Stefan cel Mare Av., 2004 Chisinau, Moldova
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12
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Zi Y, Zhu J, Hu L, Wang M, Huang W. Nanoengineering of Tin Monosulfide (SnS)‐Based Structures for Emerging Applications. SMALL SCIENCE 2021. [DOI: 10.1002/smsc.202100098] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/15/2022] Open
Affiliation(s)
- You Zi
- School of Chemistry and Chemical Engineering Nantong University Nantong Jiangsu 226019 P. R. China
| | - Jun Zhu
- School of Chemistry and Chemical Engineering Nantong University Nantong Jiangsu 226019 P. R. China
| | - Lanping Hu
- School of Chemistry and Chemical Engineering Nantong University Nantong Jiangsu 226019 P. R. China
| | - Mengke Wang
- School of Chemistry and Chemical Engineering Nantong University Nantong Jiangsu 226019 P. R. China
| | - Weichun Huang
- School of Chemistry and Chemical Engineering Nantong University Nantong Jiangsu 226019 P. R. China
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13
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Norton K, Jacobs J, Neilson J, Hopkinson D, Mokhtar MZ, Curry RJ, Lewis DJ. Preparation of solution processed photodetectors comprised of two-dimensional tin(ii) sulfide nanosheet thin films assembled via the Langmuir-Blodgett method. RSC Adv 2021; 11:26813-26819. [PMID: 35479979 PMCID: PMC9037678 DOI: 10.1039/d1ra04470b] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/09/2021] [Accepted: 07/30/2021] [Indexed: 01/09/2023] Open
Abstract
We report the manufacture of fully solution processed photodetectors based on two-dimensional tin(ii) sulfide assembled via the Langmuir-Blodgett method. The method we propose can coat a variety of substrates including paper, Si/SiO2 and flexible polymer allowing for a potentially wide range of applications in future optoelectronic devices.
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Affiliation(s)
- Kane Norton
- Department of Materials, University of Manchester Oxford Road Manchester M13 9PL UK
| | - Janet Jacobs
- Photon Science Institute, Department of Electrical and Electronic Engineering, University of Manchester Oxford Road Manchester M13 9PL UK
| | - Joseph Neilson
- Department of Materials, University of Manchester Oxford Road Manchester M13 9PL UK
| | - David Hopkinson
- Department of Materials, University of Manchester Oxford Road Manchester M13 9PL UK
| | - Mohammad Z Mokhtar
- Department of Materials, University of Manchester Oxford Road Manchester M13 9PL UK
| | - Richard J Curry
- Photon Science Institute, Department of Electrical and Electronic Engineering, University of Manchester Oxford Road Manchester M13 9PL UK
| | - David J Lewis
- Department of Materials, University of Manchester Oxford Road Manchester M13 9PL UK
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