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Zhang H, Prado Y, Alchaar R, Lehouelleur H, Cavallo M, Dang TH, Khalili A, Bossavit E, Dabard C, Ledos N, Silly MG, Madouri A, Fournier D, Utterback JK, Pierucci D, Parahyba V, Potet P, Darson D, Ithurria S, Bartłomiej Szafran, Diroll BT, Climente JI, Lhuillier E. Infrared Imaging Using Thermally Stable HgTe/CdS Nanocrystals. Nano Lett 2024. [PMID: 38608158 DOI: 10.1021/acs.nanolett.4c00907] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/14/2024]
Abstract
Transferring nanocrystals (NCs) from the laboratory environment toward practical applications has raised new challenges. HgTe appears as the most spectrally tunable infrared colloidal platform. Its low-temperature synthesis reduces the growth energy cost yet also favors sintering. Once coupled to a read-out circuit, the Joule effect aggregates the particles, leading to a poorly defined optical edge and large dark current. Here, we demonstrate that CdS shells bring the expected thermal stability (no redshift upon annealing, reduced tendency to form amalgams, and preservation of photoconduction after an atomic layer deposition process). The electronic structure of these confined particles is unveiled using k.p self-consistent simulations showing a significant exciton binding energy of ∼200 meV. After shelling, the material displays a p-type behavior that favors the generation of photoconductive gain. The latter is then used to increase the external quantum efficiency of an infrared imager, which now reaches 40% while presenting long-term stability.
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Affiliation(s)
- Huichen Zhang
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Yoann Prado
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Rodolphe Alchaar
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Henri Lehouelleur
- Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France
| | - Mariarosa Cavallo
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Tung Huu Dang
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
- Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Sorbonne Paris Cité, Paris 75005, France
| | - Adrien Khalili
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Erwan Bossavit
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
- Synchrotron SOLEIL, Saint-Aubin 91190, France
| | - Corentin Dabard
- Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France
| | - Nicolas Ledos
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | | | - Ali Madouri
- Centre de Nanosciences et de Nanotechnologies, CNRS, Université Paris-Saclay, C2N, Palaiseau 91120, France
| | - Daniele Fournier
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - James K Utterback
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Debora Pierucci
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
| | - Victor Parahyba
- New Imaging Technologies SA, Verrières le Buisson 91370, France
| | - Pierre Potet
- New Imaging Technologies SA, Verrières le Buisson 91370, France
| | - David Darson
- Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Sorbonne Paris Cité, Paris 75005, France
| | - Sandrine Ithurria
- Laboratoire de Physique et d'Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université, CNRS, Paris 75005, France
| | - Bartłomiej Szafran
- Faculty of Physics and Applied Computer Science, AGH University, Kraków PL-30-059, Poland
| | - Benjamin T Diroll
- Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, United States
| | - Juan I Climente
- Departament de Quimica Fisica i Analitica, Universitat Jaume I, Castello de la Plana E-12080, Spain
| | - Emmanuel Lhuillier
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, Paris 75005, France
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Gréboval C, Darson D, Parahyba V, Alchaar R, Abadie C, Noguier V, Ferré S, Izquierdo E, Khalili A, Prado Y, Potet P, Lhuillier E. Photoconductive focal plane array based on HgTe quantum dots for fast and cost-effective short-wave infrared imaging. Nanoscale 2022; 14:9359-9368. [PMID: 35726871 DOI: 10.1039/d2nr01313d] [Citation(s) in RCA: 9] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/17/2023]
Abstract
HgTe nanocrystals, thanks to quantum confinement, present a broadly tunable band gap all over the infrared spectral range. In addition, significant efforts have been dedicated to the design of infrared sensors with an absorbing layer made of nanocrystals. However, most efforts have been focused on single pixel sensors. Nanocrystals offer an appealing alternative to epitaxially grown semiconductors for infrared imaging by reducing the material growth cost and easing the coupling to the readout circuit. Here we propose a strategy to design an infrared focal plane array from a single fabrication step. The focal plane array (FPA) relies on a specifically designed readout circuit enabling in plane electric field application and operation in photoconductive mode. We demonstrate a VGA format focal plane array with a 15 μm pixel pitch presenting an external quantum efficiency of 4-5% (15% internal quantum efficiency) for a cut-off around 1.8 μm and operation using Peltier cooling only. The FPA is compatible with 200 fps imaging full frame and imaging up to 340 fps is demonstrated by driving a reduced area of the FPA. In the last part of the paper, we discuss the cost of such sensors and show that the latter is only driven by labor costs while we estimate the cost of the NC film to be in the 10-20 € range.
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Affiliation(s)
- Charlie Gréboval
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
| | - David Darson
- Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Université Paris-Diderot, Sorbonne Paris Cité, Paris, France
| | - Victor Parahyba
- New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France
| | - Rodolphe Alchaar
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
| | - Claire Abadie
- ONERA - The French Aerospace Lab, 6, chemin de la Vauve aux Granges, BP 80100, 91123 Palaiseau, France
| | - Vincent Noguier
- New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France
| | - Simon Ferré
- New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France
| | - Eva Izquierdo
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
| | - Adrien Khalili
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
| | - Yoann Prado
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
| | - Pierre Potet
- New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France
| | - Emmanuel Lhuillier
- Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France.
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