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Liu S, Zhong X, Li Y, Guo B, He Z, Wu Z, Liu S, Guo Y, Shi X, Chen W, Duan H, Zeng J, Liu G. A Self-Oscillated Organic Synapse for In-Memory Two-Factor Authentication. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2024; 11:e2401080. [PMID: 38520711 DOI: 10.1002/advs.202401080] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/29/2024] [Revised: 03/02/2024] [Indexed: 03/25/2024]
Abstract
Entering the era of AI 2.0, bio-inspired target recognition facilitates life. However, target recognition may suffer from some risks when the target is hijacked. Therefore, it is significantly important to provide an encryption process prior to neuromorphic computing. In this work, enlightened from time-varied synaptic rule, an in-memory asymmetric encryption as pre-authentication is utilized with subsequent convolutional neural network (ConvNet) for target recognition, achieving in-memory two-factor authentication (IM-2FA). The unipolar self-oscillated synaptic behavior is adopted to function as in-memory asymmetric encryption, which can greatly decrease the complexity of the peripheral circuit compared to bipolar stimulation. Results show that without passing the encryption process with suitable weights at the correct time, the ConvNet for target recognition will not work properly with an extremely low accuracy lower than 0.86%, thus effectively blocking out the potential risks of involuntary access. When a set of correct weights is evolved at a suitable time, a recognition rate as high as 99.82% can be implemented for target recognition, which verifies the effectiveness of the IM-2FA strategy.
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Affiliation(s)
- Shuzhi Liu
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Xiaolong Zhong
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Yuxuan Li
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Bingjie Guo
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Zhilong He
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Zhixin Wu
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Sixian Liu
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Yanbo Guo
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Xiaoling Shi
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Weilin Chen
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Hongxiao Duan
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Jianmin Zeng
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
| | - Gang Liu
- Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
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2
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Stasner P, Kopperberg N, Schnieders K, Hennen T, Wiefels S, Menzel S, Waser R, Wouters DJ. Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices. NANOSCALE HORIZONS 2024; 9:764-774. [PMID: 38511616 DOI: 10.1039/d3nh00520h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 03/22/2024]
Abstract
Write-variability and resistance instability are major reliability concerns impeding implementation of oxide-based memristive devices in neuromorphic systems. The root cause of the reliability issues is the stochastic nature of conductive filament formation and dissolution, whose impact is particularly critical in the high resistive state (HRS). Optimizing the filament stability requires mitigating diffusive processes within the oxide, but these are unaffected by conventional electrode scaling. Here we propose a device design that laterally confines the switching oxide volume and thus the filament to 10 nm, which yields reliability improvements in our measurements and simulations. We demonstrate a 50% decrease in HRS write-variability for an oxide nano-fin device in our full factorial analysis of modulated current-voltage sweeps. Furthermore, we use ionic noise measurements to quantify the HRS filament stability against diffusive processes. The laterally confined filaments exhibit a change in the signal-to-noise ratio distribution with a shift to higher values. Our complementing kinetic Monte Carlo simulation of oxygen vacancy (re-)distribution for confined filaments shows improved noise behavior and elucidates the underlying physical mechanisms. While lateral oxide volume scaling down to filament sizes is challenging, our efforts motivate further examination and awareness of filament confinement effects in regards to reliability.
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Affiliation(s)
- Pascal Stasner
- Institut für Werkstoffe der Elektrotechnik II (IWE2) and JARA-FIT, RWTH Aachen University, Aachen 52074, Germany.
| | - Nils Kopperberg
- Institut für Werkstoffe der Elektrotechnik II (IWE2) and JARA-FIT, RWTH Aachen University, Aachen 52074, Germany.
| | - Kristoffer Schnieders
- Peter-Grünberg-Institut 7 (PGI-7), Forschungszentrum Jülich GmbH, Jülich 52425, Germany
| | - Tyler Hennen
- Institut für Werkstoffe der Elektrotechnik II (IWE2) and JARA-FIT, RWTH Aachen University, Aachen 52074, Germany.
| | - Stefan Wiefels
- Peter-Grünberg-Institut 7 (PGI-7), Forschungszentrum Jülich GmbH, Jülich 52425, Germany
| | - Stephan Menzel
- Peter-Grünberg-Institut 7 (PGI-7), Forschungszentrum Jülich GmbH, Jülich 52425, Germany
| | - Rainer Waser
- Institut für Werkstoffe der Elektrotechnik II (IWE2) and JARA-FIT, RWTH Aachen University, Aachen 52074, Germany.
- Peter-Grünberg-Institut 7 (PGI-7), Forschungszentrum Jülich GmbH, Jülich 52425, Germany
- Peter-Grünberg-Institut 10 (PGI-10), Forschungszentrum Jülich GmbH, Jülich 52425, Germany
| | - Dirk J Wouters
- Institut für Werkstoffe der Elektrotechnik II (IWE2) and JARA-FIT, RWTH Aachen University, Aachen 52074, Germany.
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Jeon J, Eom K, Lee M, Kim S, Lee H. Collective Control of Potential-Constrained Oxygen Vacancies in Oxide Heterostructures for Gradual Resistive Switching. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2023; 19:e2301452. [PMID: 37150870 DOI: 10.1002/smll.202301452] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/17/2023] [Revised: 04/24/2023] [Indexed: 05/09/2023]
Abstract
Filamentary resistive switching in oxides is one of the key strategies for developing next-generation non-volatile memory devices. However, despite numerous advantages, their practical applications in neuromorphic computing are still limited due to non-uniform and indeterministic switching behavior. Given the inherent stochasticity of point defect migration, the pursuit of reliable switching likely demands an innovative approach. Herein, a collective control of oxygen vacancies is introduced in LaAlO3 /SrTiO3 (LAO/STO) heterostructures to achieve reliable and gradual resistive switching. By exploiting an electrostatic potential constraint in ultrathin LAO/STO heterostructures, the formation of conducting filaments is suppressed, but instead precisely control the concentration of oxygen vacancies. Since the conductance of the LAO/STO device is governed by the ensemble concentration of oxygen vacancies, not their individual probabilistic migrations, the resistive switching is more uniform and deterministic compared to conventional filamentary devices. It provides direct evidence for the collective control of oxygen vacancies by spectral noise analysis and modeling by Monte-Carlo simulation. As a proof of concept, the significantly-improved analog switching performance of the filament-free LAO/STO devices is demonstrated, revealing potential for neuromorphic applications. The results establish an approach to store information by point defect concentration, akin to biological ionic channels, for enhancing switching characteristics of oxide materials.
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Affiliation(s)
- Jaeyoung Jeon
- Department of Physics, Ajou University, Suwon, 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon, 16499, Republic of Korea
| | - Kitae Eom
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Republic of Korea
| | - Minkyung Lee
- Department of Physics, Ajou University, Suwon, 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon, 16499, Republic of Korea
| | - Sungkyu Kim
- Department of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, 05006, Republic of Korea
| | - Hyungwoo Lee
- Department of Physics, Ajou University, Suwon, 16499, Republic of Korea
- Department of Energy Systems Research, Ajou University, Suwon, 16499, Republic of Korea
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Lo HY, Huang CW, Chiu CC, Chen JY, Shen FC, Wang CH, Chen YJ, Wang CH, Yang JC, Wu WW. Revealing Resistive Switching Mechanism in CaFeO x Perovskite System with Electroforming-Free and Reset Voltage-Controlled Multilevel Resistance Characteristics. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2205306. [PMID: 36328712 DOI: 10.1002/smll.202205306] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/29/2022] [Revised: 10/11/2022] [Indexed: 06/16/2023]
Abstract
Recently, perovskite (PV) oxides with ABO3 structures have attracted considerable interest from scientists owing to their functionality. In this study, CaFeOx is introduced to reveal the resistive switching properties and mechanism of oxygen vacancy transition in PV and brownmillerite (BM) structures. BM-CaFeO2.5 is grown on an Nb-STO conductive substrate epitaxially. CaFeOx exhibits excellent endurance and reliability. In addition, the CaFeOx also demonstrates an electroforming-free characteristic and multilevel resistance properties. To construct the switching mechanism, high-resolution transmission electron microscopy is used to observe the topotactic phase change in CaFeOx . In addition, scanning TEM and electron energy loss spectroscopy show the structural evolution and valence state variation of CaFeOx after the switching behavior. This study not only reveals the switching mechanism of CaFeOx , but also provides a PV oxide option for the dielectric material in resistive random-access memory (RRAM) devices.
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Affiliation(s)
- Hung-Yang Lo
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
| | - Chun-Wei Huang
- Department of Materials Science and Engineering, Feng Chia University, No. 100, Wenhwa Rd., Seatwen Dist., Taichung City, 407802, Taiwan (R.O.C.)
| | - Chun-Chien Chiu
- Department of Physics, National Cheng Kung University, No.1, University Rd., East Dist., Tainan City, 701, Taiwan (R.O.C.)
| | - Jui-Yuan Chen
- Department of Materials Science and Engineering, National United University, No. 2, Lienda, Miaoli City, Miaoli County, 360302, Taiwan (R.O.C.)
| | - Fang-Chun Shen
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
| | - Che-Hung Wang
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
| | - Yen-Jung Chen
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
| | - Chien-Hua Wang
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
| | - Jan-Chi Yang
- Department of Physics, National Cheng Kung University, No.1, University Rd., East Dist., Tainan City, 701, Taiwan (R.O.C.)
| | - Wen-Wei Wu
- Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, No.1001, University Rd., East Dist., Hsinchu City, 30010, Taiwan (R.O.C.)
- Center for the Intelligent Semiconductor Nano-system Technology Research, National Yang Ming Chiao Tung University, 300, Hsinchu, Taiwan
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5
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Wang Y, Zhou G, Sun B, Wang W, Li J, Duan S, Song Q. Ag/HfO x/Pt Unipolar Memristor for High-Efficiency Logic Operation. J Phys Chem Lett 2022; 13:8019-8025. [PMID: 35993690 DOI: 10.1021/acs.jpclett.2c01906] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Unipolar resistive switching (URS) behavior, known as the SET and RESET operating in a single voltage sweep direction, has shown great potential in the simplification of the peripheral circuit. The URS memristor always involves complicated interfacial engineering and structural design. In this work, a reliable URS behavior is realized using a simple Ag/HfOx/Pt memristor structure. The memristor displays a retention time of >104 s, an ON/OFF ratio of >103, and a good operation voltage. Synergy and competition between the Ag conductive filament formed by redox reaction and the migration of an oxygen vacancy are responsible for the observed URS. By comparison, a 35% power consumption is reduced during the logical operation from 0 to 1 to 0. The operation strategy is demonstrated by exhibiting the ACSII code of the capital letter denoted by eight logic states. This work provides a low-power concept for ultrahigh data storage using the URS memristor.
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Affiliation(s)
- Yuchen Wang
- School of Materials and Energy, Southwest University, Chongqing 400715, China
| | - Guangdong Zhou
- School of Materials and Energy, Southwest University, Chongqing 400715, China
- College of Artificial Intelligence, Southwest University, Chongqing 400715, China
| | - Bai Sun
- Department of Mechanics and Mechatronics Engineering, Centre for Advanced Materials Joining, Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
| | - Wenhua Wang
- School of Materials and Energy, Southwest University, Chongqing 400715, China
| | - Jie Li
- College of Artificial Intelligence, Southwest University, Chongqing 400715, China
| | - Shukai Duan
- College of Artificial Intelligence, Southwest University, Chongqing 400715, China
| | - Qunliang Song
- School of Materials and Energy, Southwest University, Chongqing 400715, China
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6
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Oh I, Pyo J, Kim S. Resistive Switching and Synaptic Characteristics in ZnO/TaON-Based RRAM for Neuromorphic System. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:2185. [PMID: 35808021 PMCID: PMC9268157 DOI: 10.3390/nano12132185] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/01/2022] [Revised: 06/21/2022] [Accepted: 06/23/2022] [Indexed: 12/25/2022]
Abstract
We fabricated an ITO/ZnO/TaON/TaN device as nonvolatile memory (NVM) with resistive switching for complementary metal-oxide-semiconductor (CMOS) compatibility. It is appropriate for the age of big data, which demands high speed and capacity. We produced a TaON layer by depositing a ZnO layer on a TaN layer using an oxygen-reactive radio frequency (RF) sputtering system. The bi-layer formation of ZnO and TaON interferes with the filament rupture after the forming process and then raises the current level slightly. The current levels were divided into high- and low-compliance modes. The retention, endurance, and pulse conductance were verified with a neuromorphic device. This device was stable and less consumed when it was in low mode rather than high mode.
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Affiliation(s)
| | | | - Sungjun Kim
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul 04620, Korea; (I.O.); (J.P.)
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7
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Wang L, Wang Y, Wen D. Tunable biological nonvolatile multilevel data storage devices. Phys Chem Chem Phys 2021; 23:24834-24841. [PMID: 34719695 DOI: 10.1039/d1cp04622e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The speed with which electronic products are updated is continuously increasing. Consequently, since waste electronic products can cause serious environmental pollution, the demand for electronic products made of biological materials is becoming increasingly urgent. Although biological memristors have significant advantages, their electrical characteristics still do not meet the requirements to be used in future nonvolatile memories. Therefore, how to control their electrical characteristics has become a popular topic of research. In this study, tunable biomemristors with an Al/tussah blood (TB)-carbon nanotube (CNT)/indium tin oxide (ITO)/glass structure were fabricated. Such a device exhibits stable bipolar resistance switching behavior and good retention characteristics (104 s). Experimental results show that the ON/OFF current ratio can be effectively controlled by modifying the CNT concentration in the TB-CNT composite film. Multilevel (8 levels, 3 bits per cell) storage capabilities can be achieved in the device by controlling its compliance current in order to achieve high-density storage. The resistance switching behavior originates from the formation and rupture of conductive oxygen vacancy filaments. TB is a promising natural biomaterial in the field of green electronics, and this research could blaze a new trail for the development of biological memory devices. Biomemristors with multilevel resistance states can be used as electronic synapses and are one of the choices for simulating biological synapses.
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Affiliation(s)
- Lu Wang
- School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China. .,HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, 150080, China
| | - Yuting Wang
- School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China. .,HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, 150080, China
| | - Dianzhong Wen
- School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China. .,HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, 150080, China
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8
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Abstract
In this work, we conducted the following analysis of Ni/ZnO (20 nm)/n-type Si RRAM device with three different compliance currents (CCs). We compared I–V curves, including set, reset voltages, and resistance of LRS, HRS states for each CCs. For an accurate comparison of each case, statistical analysis is presented. In each case, the average value and the relative standard deviation (RSD) of resistance are calculated to analyze the characteristics of the distribution. The best variability is observed at higher CC (5 mA). In addition, we validated the non-volatile properties of the device using the retention data for each of the CCs. Based on this comparison, we proposed the most appropriate CC of the device operation. Also, a pulse was applied to measure the current waveform and demonstrate the regular operation of the device. Finally, the resistance of LRS and HRS states was measured by pulse. We statistically compared the measured pulse data with the DC data.
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9
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Salev P, Fratino L, Sasaki D, Berkoun R, Del Valle J, Kalcheim Y, Takamura Y, Rozenberg M, Schuller IK. Transverse barrier formation by electrical triggering of a metal-to-insulator transition. Nat Commun 2021; 12:5499. [PMID: 34535660 PMCID: PMC8448889 DOI: 10.1038/s41467-021-25802-1] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/16/2020] [Accepted: 08/19/2021] [Indexed: 11/08/2022] Open
Abstract
Application of an electric stimulus to a material with a metal-insulator transition can trigger a large resistance change. Resistive switching from an insulating into a metallic phase, which typically occurs by the formation of a conducting filament parallel to the current flow, is a highly active research topic. Using the magneto-optical Kerr imaging, we found that the opposite type of resistive switching, from a metal into an insulator, occurs in a reciprocal characteristic spatial pattern: the formation of an insulating barrier perpendicular to the driving current. This barrier formation leads to an unusual N-type negative differential resistance in the current-voltage characteristics. We further demonstrate that electrically inducing a transverse barrier enables a unique approach to voltage-controlled magnetism. By triggering the metal-to-insulator resistive switching in a magnetic material, local on/off control of ferromagnetism is achieved using a global voltage bias applied to the whole device.
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Affiliation(s)
- Pavel Salev
- Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, CA, USA.
| | - Lorenzo Fratino
- Université Paris-Saclay, CNRS Laboratoire de Physique des Solides, 91405, Orsay, France
| | - Dayne Sasaki
- Department of Materials Science and Engineering, University of California Davis, Davis, CA, USA
| | - Rani Berkoun
- Université Paris-Saclay, CNRS Laboratoire de Physique des Solides, 91405, Orsay, France
| | - Javier Del Valle
- Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, CA, USA
- Department of Quantum Matter Physics, University of Geneva, Geneva, Switzerland
| | - Yoav Kalcheim
- Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, CA, USA
- Department of Materials Science and Engineering, Technion-Israel Institute of Technology, Haifa, Israel
| | - Yayoi Takamura
- Department of Materials Science and Engineering, University of California Davis, Davis, CA, USA
| | - Marcelo Rozenberg
- Université Paris-Saclay, CNRS Laboratoire de Physique des Solides, 91405, Orsay, France
| | - Ivan K Schuller
- Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, CA, USA
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10
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Liu L, Cheng Z, Jiang B, Liu Y, Zhang Y, Yang F, Wang J, Yu XF, Chu PK, Ye C. Optoelectronic Artificial Synapses Based on Two-Dimensional Transitional-Metal Trichalcogenide. ACS APPLIED MATERIALS & INTERFACES 2021; 13:30797-30805. [PMID: 34169714 DOI: 10.1021/acsami.1c03202] [Citation(s) in RCA: 23] [Impact Index Per Article: 7.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
The memristor is a foundational device for an artificial synapse, which is essential to realize next-generation neuromorphic computing. Herein, an optoelectronic memristor based on a two-dimensional (2D) transitional-metal trichalcogenide (TMTC) is designed and demonstrated. Owing to the excellent optical and electrical characteristics of titanium trisulfide (TiS3), the memristor exhibits stable bipolar resistance switching (RS) as a result of the controllable formation and rupturing of the conductive aluminum filaments. Multilevel storage is realized with light of multiple wavelengths between 400 and 808 nm, and the synaptic properties such as conduction modulation and spiking timing-dependent plasticity (STDP) are achieved. On the basis of the photonic potentiation and electrical habitual ability, Pavlovian-associative learning is successfully established on this TiS3-based artificial synapse. All these results reveal the large potential of 2D TMTCs in artificial neuromorphic chips.
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Affiliation(s)
- Lei Liu
- Faculty of Physics and Electronic Science, Hubei Key Laboratory of Ferro- & Piezoelectric Materials and Devices, Hubei University, Wuhan 430062, P.R. China
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Ziqiang Cheng
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
- Department of Applied Physics, East China Jiaotong University, Nanchang 330013, P.R. China
| | - Bei Jiang
- Faculty of Physics and Electronic Science, Hubei Key Laboratory of Ferro- & Piezoelectric Materials and Devices, Hubei University, Wuhan 430062, P.R. China
| | - Yanxin Liu
- Faculty of Physics and Electronic Science, Hubei Key Laboratory of Ferro- & Piezoelectric Materials and Devices, Hubei University, Wuhan 430062, P.R. China
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Yanli Zhang
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Fan Yang
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Jiahong Wang
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Xue-Feng Yu
- Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, P.R. China
| | - Paul K Chu
- Department of Physics, Department of Materials Science and Engineering, and Department of Biomedical Engineering, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong 999077, P.R. China
| | - Cong Ye
- Faculty of Physics and Electronic Science, Hubei Key Laboratory of Ferro- & Piezoelectric Materials and Devices, Hubei University, Wuhan 430062, P.R. China
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11
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Sahu DP, Jetty P, Jammalamadaka SN. Graphene oxide based synaptic memristor device for neuromorphic computing. NANOTECHNOLOGY 2021; 32:155701. [PMID: 33412536 DOI: 10.1088/1361-6528/abd978] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Brain-inspired neuromorphic computing which consist neurons and synapses, with an ability to perform complex information processing has unfolded a new paradigm of computing to overcome the von Neumann bottleneck. Electronic synaptic memristor devices which can compete with the biological synapses are indeed significant for neuromorphic computing. In this work, we demonstrate our efforts to develop and realize the graphene oxide (GO) based memristor device as a synaptic device, which mimic as a biological synapse. Indeed, this device exhibits the essential synaptic learning behavior including analog memory characteristics, potentiation and depression. Furthermore, spike-timing-dependent-plasticity learning rule is mimicked by engineering the pre- and post-synaptic spikes. In addition, non-volatile properties such as endurance, retentivity, multilevel switching of the device are explored. These results suggest that Ag/GO/fluorine-doped tin oxide memristor device would indeed be a potential candidate for future neuromorphic computing applications.
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Affiliation(s)
- Dwipak Prasad Sahu
- Magnetic Materials and Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad, Hyderabad-502 285, India
| | - Prabana Jetty
- Magnetic Materials and Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad, Hyderabad-502 285, India
| | - S Narayana Jammalamadaka
- Magnetic Materials and Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad, Hyderabad-502 285, India
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12
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Ou QF, Xiong BS, Yu L, Wen J, Wang L, Tong Y. In-Memory Logic Operations and Neuromorphic Computing in Non-Volatile Random Access Memory. MATERIALS (BASEL, SWITZERLAND) 2020; 13:E3532. [PMID: 32785179 PMCID: PMC7475900 DOI: 10.3390/ma13163532] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/15/2020] [Revised: 08/03/2020] [Accepted: 08/06/2020] [Indexed: 02/04/2023]
Abstract
Recent progress in the development of artificial intelligence technologies, aided by deep learning algorithms, has led to an unprecedented revolution in neuromorphic circuits, bringing us ever closer to brain-like computers. However, the vast majority of advanced algorithms still have to run on conventional computers. Thus, their capacities are limited by what is known as the von-Neumann bottleneck, where the central processing unit for data computation and the main memory for data storage are separated. Emerging forms of non-volatile random access memory, such as ferroelectric random access memory, phase-change random access memory, magnetic random access memory, and resistive random access memory, are widely considered to offer the best prospect of circumventing the von-Neumann bottleneck. This is due to their ability to merge storage and computational operations, such as Boolean logic. This paper reviews the most common kinds of non-volatile random access memory and their physical principles, together with their relative pros and cons when compared with conventional CMOS-based circuits (Complementary Metal Oxide Semiconductor). Their potential application to Boolean logic computation is then considered in terms of their working mechanism, circuit design and performance metrics. The paper concludes by envisaging the prospects offered by non-volatile devices for future brain-inspired and neuromorphic computation.
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Affiliation(s)
- Qiao-Feng Ou
- School of Information Engineering, Nanchang Hangkong University, Nanchang 330063, China; (Q.-F.O.); (B.-S.X.); (L.Y.); (J.W.)
| | - Bang-Shu Xiong
- School of Information Engineering, Nanchang Hangkong University, Nanchang 330063, China; (Q.-F.O.); (B.-S.X.); (L.Y.); (J.W.)
| | - Lei Yu
- School of Information Engineering, Nanchang Hangkong University, Nanchang 330063, China; (Q.-F.O.); (B.-S.X.); (L.Y.); (J.W.)
| | - Jing Wen
- School of Information Engineering, Nanchang Hangkong University, Nanchang 330063, China; (Q.-F.O.); (B.-S.X.); (L.Y.); (J.W.)
| | - Lei Wang
- School of Information Engineering, Nanchang Hangkong University, Nanchang 330063, China; (Q.-F.O.); (B.-S.X.); (L.Y.); (J.W.)
| | - Yi Tong
- College of Electronic and Optical Engineering & College of Microelectronics, Nanjing University of Posts and Telecommunications, Nanjing 210023, China
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13
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Yang H, Wang Z, Guo X, Su H, Sun K, Yang D, Xiao W, Wang Q, He D. Controlled Growth of Fine Multifilaments in Polymer-Based Memristive Devices Via the Conduction Control. ACS APPLIED MATERIALS & INTERFACES 2020; 12:34370-34377. [PMID: 32627526 DOI: 10.1021/acsami.0c07533] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Solid polymer electrolyte (SPE) is one of the choices for many ionic devices, including organic transistors, ion batteries, memristors, and more. However, uncontrollable conductive filament formation seriously affects the performance of the device. In this paper, the PEDOT:PSS was doped to improve the electronic and ionic conductivity of amorphous polymer electrolyte poly(vinylpyrrolidone) (PVP), realizing the transition of the filaments growth from cathode to anode in atomic switch memristors. Based on the difference in ion and electron mobility and scanning electron microscope observation, the in situ reductions of metal ions inside the dielectric layer can effectively prevent the formation of uncontrollable filaments. The formation of uniformly distributed metal particles in the dielectric layer is similar to co-sputter doping technology, which enables the device to exhibit excellent performance, such as smaller set/reset bias distribution, endurance, and retention. Obviously, this innovative way improves the conductive mechanism of ionic devices.
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Affiliation(s)
- Huiyong Yang
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Zheng Wang
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Xiangyu Guo
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Hao Su
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Kai Sun
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Dongliang Yang
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Wei Xiao
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Qi Wang
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
| | - Deyan He
- School of Physical Science and Technology, Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, P. R. China
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14
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Bejtka K, Milano G, Ricciardi C, Pirri CF, Porro S. TEM Nanostructural Investigation of Ag-Conductive Filaments in Polycrystalline ZnO-Based Resistive Switching Devices. ACS APPLIED MATERIALS & INTERFACES 2020; 12:29451-29460. [PMID: 32508083 PMCID: PMC8008384 DOI: 10.1021/acsami.0c05038] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/17/2020] [Accepted: 06/08/2020] [Indexed: 06/01/2023]
Abstract
Memristive devices based on a resistive switching mechanism are considered very promising for nonvolatile memory and unconventional computing applications, even though many details of the switching mechanisms are not yet fully understood. Here, we report a nanostructural study by means of high-resolution transmission electron microscopy and spectroscopy techniques of a Ag/ZnO/Pt memristive device. To ease the localization of the filament position for its characterization, we propose to use the guiding effect of regular perturbation arrays obtained by FIB technology to assist the filament formation. HRTEM and EDX were used to identify the composition and crystalline structure of the so-obtained conductive filaments and surrounding regions. It was determined that the conducting paths are composed mainly of monocrystalline Ag, which remains polycrystalline in some circumstances, including the zone where the switching occurs and at secondary filaments created at the grain boundaries of the polycrystalline ZnO matrix. We also observed that the ZnO matrix shows a degraded quality in the switching zone, while it remains unaltered in the rest of the memristive device.
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Affiliation(s)
- Katarzyna Bejtka
- Center
for Sustainable Future Technologies @ POLITO, Istituto Italiano di Tecnologia, Via Livorno 60, Turin 10144, Italy
| | - Gianluca Milano
- Center
for Sustainable Future Technologies @ POLITO, Istituto Italiano di Tecnologia, Via Livorno 60, Turin 10144, Italy
- Department
of Applied Science and Technology, Politecnico
di Torino, C.so Duca degli Abruzzi 24, Turin 10129, Italy
| | - Carlo Ricciardi
- Department
of Applied Science and Technology, Politecnico
di Torino, C.so Duca degli Abruzzi 24, Turin 10129, Italy
| | - Candido F. Pirri
- Center
for Sustainable Future Technologies @ POLITO, Istituto Italiano di Tecnologia, Via Livorno 60, Turin 10144, Italy
- Department
of Applied Science and Technology, Politecnico
di Torino, C.so Duca degli Abruzzi 24, Turin 10129, Italy
| | - Samuele Porro
- Department
of Applied Science and Technology, Politecnico
di Torino, C.so Duca degli Abruzzi 24, Turin 10129, Italy
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15
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Lv Z, Wang Y, Chen J, Wang J, Zhou Y, Han ST. Semiconductor Quantum Dots for Memories and Neuromorphic Computing Systems. Chem Rev 2020; 120:3941-4006. [DOI: 10.1021/acs.chemrev.9b00730] [Citation(s) in RCA: 114] [Impact Index Per Article: 28.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/13/2022]
Affiliation(s)
- Ziyu Lv
- Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, P. R. China
| | - Yan Wang
- Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, P. R. China
| | - Jingrui Chen
- Institute for Advanced Study, Shenzhen University, Shenzhen 518060, P. R. China
| | - Junjie Wang
- Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, P. R. China
| | - Ye Zhou
- Institute for Advanced Study, Shenzhen University, Shenzhen 518060, P. R. China
| | - Su-Ting Han
- Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, P. R. China
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16
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Wu M, Ting Y, Chen J, Wu W. Low Power Consumption Nanofilamentary ECM and VCM Cells in a Single Sidewall of High-Density VRRAM Arrays. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2019; 6:1902363. [PMID: 31890465 PMCID: PMC6918122 DOI: 10.1002/advs.201902363] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/30/2019] [Revised: 09/19/2019] [Indexed: 06/10/2023]
Abstract
The technologies of 3D vertical architecture have made a major breakthrough in establishing high-density memory structures. Combined with an array structure, a 3D high-density vertical resistive random access memory (VRRAM) cross-point array is demonstrated to efficiently increase the device density. Though electrochemical migration (ECM) resistive random access (RRAM) has the advantage of low power consumption, the stability of the operating voltage requires further improvements due to filament expansions and deterioration. In this work, 3D-VRRAM arrays are designed. Two-layered RRAM cells, with one inert and one active sidewall electrode stacked at a cross-point, are constructed, where the thin film sidewall electrode in the VRRAM structure is beneficial for confining the expansions of the conducting filaments. Thus, the top cell (Pt/ZnO/Pt) and the bottom cell (Ag/ZnO/Pt) in the VRRAM structure, which are switched by different mechanisms, can be analyzed at the same time. The oxygen vacancy filaments in the Pt/ZnO/Pt cell and Ag filaments in the Ag/ZnO/Pt cell are verified. The 40 nm thickness sidewall electrode restricts the filament size to nanoscale, which demonstrates the stability of the operating voltages. Additionally, the 0.3 V operating voltage of Ag/ZnO/Pt ECM VRRAM demonstrates the potential of low power consumption of VRRAM arrays in future applications.
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Affiliation(s)
- Min‐Ci Wu
- Department of Materials Science and EngineeringNational Chiao Tung UniversityNo. 1001, University Rd., East Dist.Hsinchu City30010Taiwan
| | - Yi‐Hsin Ting
- Department of Materials Science and EngineeringNational Chiao Tung UniversityNo. 1001, University Rd., East Dist.Hsinchu City30010Taiwan
| | - Jui‐Yuan Chen
- Department of Materials Science and EngineeringNational United UniversityNo. 1, GongjingMiaoli CityMiaoli County360Taiwan
| | - Wen‐Wei Wu
- Department of Materials Science and EngineeringNational Chiao Tung UniversityNo. 1001, University Rd., East Dist.Hsinchu City30010Taiwan
- Center for the Intelligent Semiconductor Nano‐System Technology ResearchNational Chiao Tung UniversityHsinchu City30010Taiwan
- Frontier Research Center on Fundamental and Applied Sciences of MattersNational Tsing Hua UniversityHsinchu City30013Taiwan
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17
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Chang SJ, Chen SY, Chen PW, Huang SJ, Tseng YC. Pulse-Driven Nonvolatile Perovskite Memory with Photovoltaic Read-Out Characteristics. ACS APPLIED MATERIALS & INTERFACES 2019; 11:33803-33810. [PMID: 31456402 DOI: 10.1021/acsami.9b08766] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
This paper presents a unique GdFe0.8Ni0.2O3 perovskite thin film for use in pulse-controlled nonvolatile memory devices (combined with a SrTiO3 (STO) substrate) without the need for an electrical-stressing read-out process. The use of pulse voltage imposes permanent downward/upward polarization states on GFNO, which enables greater energy density and higher energy efficiency than the unpoled state for memory. The two polarization states produce carrier migrations in opposing directions across the GFNO/STO interface, which alter the depletion region of the device, as reflected in photovoltaic short-circuit current density (Jsc) values. Modulating the duration (varying the number of sequential pulses but fixing the pulse width and delay time) and direction of continuous pulse voltage is an effective method for controlling Jsc, thereby allowing the fabrication of nondestructive, light-tunable, nonvolatile memory devices. In experiments, Jsc in the downward polarized state was approximately 6 times greater than that in the upward polarized state. It is promising that more memory states can be enabled by the proposed heterostructure by selecting appropriate pulse trains. Real-time interfacial changes (relative to the nonvolatile characteristics of the device) were obtained by applying synchrotron X-ray techniques simultaneously with pulse characterization. This made it possible to separately probe the electronic and chemical states of the GFNO (a p-type-like semiconductor) and STO (an n-type-like semiconductor) while varying the pulse direction, thereby making it possible to identify the mechanisms underlying the observed phenomena.
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Affiliation(s)
| | | | - Po-Wen Chen
- Division of Physics , Institute of Nuclear Energy Research , Taoyuan 32546 , Taiwan , ROC
| | - Szu-Jung Huang
- Department of Engineering and System Science , National Tsing Hua University , Hsinchu , 30043 , Taiwan , ROC
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18
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Ding X, Feng Y, Huang P, Liu L, Kang J. Low-Power Resistive Switching Characteristic in HfO 2/TiO x Bi-Layer Resistive Random-Access Memory. NANOSCALE RESEARCH LETTERS 2019; 14:157. [PMID: 31073774 PMCID: PMC6509306 DOI: 10.1186/s11671-019-2956-4] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/31/2018] [Accepted: 03/22/2019] [Indexed: 06/09/2023]
Abstract
Resistive random-access memory devices with atomic layer deposition HfO2 and radio frequency sputtering TiOx as resistive switching layers were fabricated successfully. Low-power characteristic with 1.52 μW set power (1 μA@1.52 V) and 1.12 μW reset power (1 μA@1.12 V) was obtained in the HfO2/TiOx resistive random-access memory (RRAM) devices by controlling the oxygen content of the TiOx layer. Besides, the influence of oxygen content during the TiOx sputtering process on the resistive switching properties would be discussed in detail. The investigations indicated that "soft breakdown" occurred easily during the electrical forming/set process in the HfO2/TiOx RRAM devices with high oxygen content of the TiOx layer, resulting in high resistive switching power. Low-power characteristic was obtained in HfO2/TiOx RRAM devices with appropriately high oxygen vacancy density of TiOx layer, suggesting that the appropriate oxygen vacancy density in the TiOx layer could avoid "soft breakdown" through the whole dielectric layers during forming/set process, thus limiting the current flowing through the RRAM device and decreasing operating power consumption.
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Affiliation(s)
- Xiangxiang Ding
- Institute of Microelectronics, Peking University, Beijing, 100871 China
| | - Yulin Feng
- Institute of Microelectronics, Peking University, Beijing, 100871 China
| | - Peng Huang
- Institute of Microelectronics, Peking University, Beijing, 100871 China
| | - Lifeng Liu
- Institute of Microelectronics, Peking University, Beijing, 100871 China
| | - Jinfeng Kang
- Institute of Microelectronics, Peking University, Beijing, 100871 China
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19
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Solid-State Electrochemical Process and Performance Optimization of Memristive Materials and Devices. CHEMISTRY 2019. [DOI: 10.3390/chemistry1010005] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022] Open
Abstract
As an emerging technology, memristors are nanoionic-based electrochemical systems that retains their resistance state based on the history of the applied voltage/current. They can be used for on-chip memory and storage, biologically inspired computing, and in-memory computing. However, the underlying physicochemical processes of memristors still need deeper understanding for the optimization of the device properties to meet the practical application requirements. Herein, we review recent progress in understanding the memristive mechanisms and influential factors for the optimization of memristive switching performances. We first describe the working mechanisms of memristors, including the dynamic processes of active metal ions, native oxygen ions and other active ions in ECM cells, VCM devices and ion gel-based devices, and the switching mechanisms in organic devices, along with discussions on the influential factors of the device performances. The optimization of device properties by electrode/interface engineering, types/configurations of dielectric materials and bias scheme is then illustrated. Finally, we discuss the current challenges and the future development of the memristor.
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20
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Lee BR, Park JH, Lee TH, Kim TG. Highly Flexible and Transparent Memristive Devices Using Cross-Stacked Oxide/Metal/Oxide Electrode Layers. ACS APPLIED MATERIALS & INTERFACES 2019; 11:5215-5222. [PMID: 30623639 DOI: 10.1021/acsami.8b17700] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/19/2023]
Abstract
Flexible and transparent memristive (FT memristors) devices are considered to be among the promising candidates for future nonvolatile memories. To realize these devices, it is essential to achieve flexible and transparent conductive electrodes (TCEs). However, conventionally used TCEs such as indium tin oxide, gallium zinc oxide, and indium zinc oxide are not so flexible and even necessitate thermal annealing for high conductivity and optical transmittance. Here, we introduce Ag/ZnO/Ag- and Ag/Al2O3/Ag-based FT memristors using cross-stacked oxide/metal/oxide electrode layers (i.e., ZnO/Ag/ZnO + ZnO/Ag/ZnO and Al2O3/Ag/Al2O3 + Al2O3/Ag/Al2O3) without using any annealing process on poly(ethylene terephthalate) substrates (PETs). Both Ag/ZnO/Ag- and Ag/Al2O3/Ag-based FT memristors on PETs exhibited excellent properties, including high transmittance (>86% in the visible region), high on/off current ratios (>103), and long retention times (>105 s). In addition, they showed very stable and flexible characteristics on PETs even after 2500 bending cycles with a bending radius of 8.1 mm. Finally, we analyzed transmission electron microscopy images and time-of-flight secondary ion mass spectroscopy profiles to identify switching mechanisms in these devices.
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Affiliation(s)
- Byeong Ryong Lee
- School of Electrical Engineering , Korea University , 145 Anam-ro, Sungbuk-gu , Seoul 02841 , Republic of Korea
| | - Ju Hyun Park
- School of Electrical Engineering , Korea University , 145 Anam-ro, Sungbuk-gu , Seoul 02841 , Republic of Korea
| | - Tae Ho Lee
- School of Electrical Engineering , Korea University , 145 Anam-ro, Sungbuk-gu , Seoul 02841 , Republic of Korea
| | - Tae Geun Kim
- School of Electrical Engineering , Korea University , 145 Anam-ro, Sungbuk-gu , Seoul 02841 , Republic of Korea
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21
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Gao S, Yi X, Shang J, Liu G, Li RW. Organic and hybrid resistive switching materials and devices. Chem Soc Rev 2019; 48:1531-1565. [DOI: 10.1039/c8cs00614h] [Citation(s) in RCA: 211] [Impact Index Per Article: 42.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
Abstract
This review presents a timely and comprehensive summary of organic and hybrid materials for nonvolatile resistive switching memory applications in the “More than Moore” era, with particular attention on their designing principles for electronic property tuning and flexible memory performance.
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Affiliation(s)
- Shuang Gao
- CAS Key Laboratory of Magnetic Materials and Devices
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- China
| | - Xiaohui Yi
- CAS Key Laboratory of Magnetic Materials and Devices
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- China
| | - Jie Shang
- CAS Key Laboratory of Magnetic Materials and Devices
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- China
| | - Gang Liu
- CAS Key Laboratory of Magnetic Materials and Devices
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- China
| | - Run-Wei Li
- CAS Key Laboratory of Magnetic Materials and Devices
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- China
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22
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Xu J, Zhao X, Wang Z, Xu H, Hu J, Ma J, Liu Y. Biodegradable Natural Pectin-Based Flexible Multilevel Resistive Switching Memory for Transient Electronics. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2019; 15:e1803970. [PMID: 30500108 DOI: 10.1002/smll.201803970] [Citation(s) in RCA: 38] [Impact Index Per Article: 7.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/25/2018] [Revised: 11/09/2018] [Indexed: 05/05/2023]
Abstract
Transient electronics that can physically vanish in solution can offer opportunities to address the ecological challenges for dealing with the rapidly growing electronic waste. As one important component, it is desirable that memory devices combined with the transient feature can also be developed as secrecy information storage systems besides the above advantage. Resistive switching (RS) memory is one of the most promising technologies for next-generation memory. Herein, the biocompatible pectin extracted from natural orange peel is introduced to fabricate RS memory devices (Ag/pectin/indium tin oxides (ITO)), which exhibit excellent RS characteristics, such as forming free characteristic, low operating voltages (≈1.1 V), fast switching speed (<70 ns), long retention time (>104 s), and multilevel RS behaviors. The device performance is not degraded after 104 bending cycles, which will be beneficial for flexible memory applications. Additionally, instead of using acid solution, the Ag/pectin/ITO memory device can be dissolved rapidly in deionized water within 10 min thanks to the good solubility arising from ionization of its carboxylic groups, which shows promising application for green electronics. The present biocompatible memory devices based on natural pectin suggest promising material candidates toward enabling high-density secure information storage systems applications, flexible electronics, and green electronics.
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Affiliation(s)
- Jiaqi Xu
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Xiaoning Zhao
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Zhongqiang Wang
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Haiyang Xu
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Junli Hu
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Jiangang Ma
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
| | - Yichun Liu
- Key Laboratory for UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun, 130024, China
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23
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Chen QL, Liu G, Tang MH, Chen XH, Zhang YJ, Zheng XJ, Li RW. A univariate ternary logic and three-valued multiplier implemented in a nano-columnar crystalline zinc oxide memristor. RSC Adv 2019; 9:24595-24602. [PMID: 35527853 PMCID: PMC9069711 DOI: 10.1039/c9ra04119b] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/31/2019] [Accepted: 07/22/2019] [Indexed: 11/21/2022] Open
Abstract
Memristors, which feature small sizes, fast speeds, low power, CMOS compatibility and nonvolatile modulation of device resistance, are promising candidates for next-generation data storage and in-memory computing paradigms. Compared to the binary logics enabled by memristor devices, ternary logics with larger information-carrying capacity can provide higher computation efficiency with simple operation schemes, reduced circuit complexity and smaller chip areas. In this study, we report the fabrication of memristor devices based on nano-columnar crystalline ZnO thin films; they show symmetric and reliable multi-level resistive switching characteristics over three hundred cycles, which benefits the implementation of univariate ternary logic operations. Experimental results demonstrate that a three-valued logic complete set can be realized by the univariate operations of the present ZnO memristor device, and a ternary multiplier unit circuit is designed for potential applications. The present methodology can be beneficial for constructing future high-performance computation architectures. Memristors, which feature small sizes, fast speeds, low power, CMOS compatibility and nonvolatile modulation of device resistance, are promising candidates for next-generation data storage and in-memory computing paradigms.![]()
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Affiliation(s)
- Qi-Lai Chen
- School of Mechanical Engineering
- Xiangtan University
- Xiangtan
- 411105 China
- School of Chemical and Chemical Engineering
| | - Gang Liu
- School of Chemical and Chemical Engineering
- Shanghai Jiao Tong University
- Shanghai
- China
- Ningbo Institute of Materials Technology and Engineering
| | - Ming-Hua Tang
- School of Materials Science and Engineering
- Xiangtan University
- Xiangtan
- 411105 China
| | - Xin-Hui Chen
- School of Chemical and Chemical Engineering
- Shanghai Jiao Tong University
- Shanghai
- China
- Ningbo Institute of Materials Technology and Engineering
| | - Yue-Jun Zhang
- Faculty of Electrical Engineering and Computer Science
- Ningbo University
- Ningbo
- 315211 China
| | - Xue-Jun Zheng
- School of Mechanical Engineering
- Xiangtan University
- Xiangtan
- 411105 China
| | - Run-Wei Li
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- 315201 China
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24
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Vishwanath SK, Woo H, Jeon S. Effect of dysprosium and lutetium metal buffer layers on the resistive switching characteristics of Cu-Sn alloy-based conductive-bridge random access memory. NANOTECHNOLOGY 2018; 29:385207. [PMID: 29911987 DOI: 10.1088/1361-6528/aacd35] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
The conductive-bridge random access memory (CBRAM) has become one of the most suitable candidates for non-volatile memory in next-generation information and communication technology. The resistive switching (RS) mechanism of CBRAM depends on the formation/annihilation of the conductive filament (CF) between the active metal electrode and the inert electrode. However, excessive ion injection from the active electrode into the solid electrolyte reduces the uniformity and reliability of the RS devices. To solve this problem, we investigated the RS characteristics of a CuSn alloy active electrode with different compositions of Cux-Sn1-x (0.13 < X < 0.55). The RS characteristics were further improved by inserting a dysprosium (Dy) or lutetium (Lu) buffer layer at the interface of Cux-Sn1-x/Al2O3. Electrical analysis of the optimal Cu0.4-Sn0.73/Lu-based CBRAM exhibited stable RS behavior with low operation voltage (SET: 0.7 V and RESET: -0.3 V), a high on state/off state resistive ratio (106), AC cyclic endurance (>104), and stable retention (85 °C/10 years). To achieve these performance parameters, CFs were locally formed inside the electrolyte using a modified CuSn active electrode, and the amount of Cu-ion injection was reduced by inserting the Dy or Lu buffer layer between the CuSn active electrode and the electrolyte. In particular, conductive-atomic force microscopy results at the Dy or Lu/Al2O3 interface directly showed and defined the diameter of the CF.
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Affiliation(s)
- Sujaya Kumar Vishwanath
- Korea Advanced Institute of Science and Technology (KAIST), School of Electrical Engineering, Daejeon, 34141, Republic of Korea
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25
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Kim S, Jung HJ, Kim JC, Lee KS, Park SS, Dravid VP, He K, Jeong HY. In Situ Observation of Resistive Switching in an Asymmetric Graphene Oxide Bilayer Structure. ACS NANO 2018; 12:7335-7342. [PMID: 29985600 DOI: 10.1021/acsnano.8b03806] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Graphene oxide decorated with oxygen functional groups is a promising candidate as an active layer in resistive switching devices due to its controllable physical-chemical properties, high flexibility, and transparency. However, the origin of conductive channels and their growth dynamics remain a major challenge. We use in situ transmission electron microscopy techniques to demonstrate that nanoscale graphene oxide sheets bonded with oxygen dynamically change their physical and chemical structures upon an applied electric field. Artificially engineered bilayer reduced graphene oxide films with asymmetric oxygen content exhibit nonvolatile write-once-read-many memory behaviors without experiencing the bubble destruction due to the efficient migration of oxygen ions. We clearly observe that a conductive graphitic channel with a conical shape evolves from the upper oxygen-rich region to the lower oxygen-poor region. These findings provide fundamental guidance for understanding the oxygen motions of oxygen-containing carbon materials for future carbon-based nanoelectronics.
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Affiliation(s)
- Sungkyu Kim
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- Department of Materials Science and Engineering , Clemson University , Clemson , South Carolina 29634 , United States
| | - Hee Joon Jung
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- International Institute of Nanotechnology, Evanston , Illinois 60208 , United States
| | - Jong Chan Kim
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
| | - Kyung-Sun Lee
- UNIST Central Research Facilities (UCRF) , UNIST , Ulsan 44919 , Republic of Korea
| | - Sung Soo Park
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
| | - Vinayak P Dravid
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- International Institute of Nanotechnology, Evanston , Illinois 60208 , United States
| | - Kai He
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- Department of Materials Science and Engineering , Clemson University , Clemson , South Carolina 29634 , United States
| | - Hu Young Jeong
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
- UNIST Central Research Facilities (UCRF) , UNIST , Ulsan 44919 , Republic of Korea
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