1
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Wei Y, Chen F, Huang R, Zhao J, Zhao H, Wang J, Li M, Zhang J. Fast Response GaN Nanoscale Air Channel Diodes with Highly Stable 10 mA Output Current toward Wafer-Scale Fabrication. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2023:e2206385. [PMID: 37078799 DOI: 10.1002/advs.202206385] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/01/2022] [Revised: 02/14/2023] [Indexed: 05/03/2023]
Abstract
Nanoscale air channel transistors (NACTs) have received significant attention due to their remarkable high-frequency performance and high switching speed, which is enabled by the ballistic transport of electrons in sub-100 nm air channels. Despite these advantages, NACTs are still limited by low currents and instability compared to solid-state devices. GaN, with its low electron affinity, strong thermal and chemical stability, and high breakdown electric field, presents an appealing candidate as a field emission material. Here, a vertical GaN nanoscale air channel diode (NACD) with a 50 nm air channel is reported, fabricated by low-cost IC-compatible manufacturing technologies on a 2-inch sapphire wafer. The device boasts a record field emission current of 11 mA at 10 V in the air and exhibits outstanding stability during cyclic, long-term, and pulsed voltage testing. Additionally, it displays fast switching characteristics and good repeatability with a response time of fewer than 10 ns. Moreover, the temperature-dependent performance of the device can guide the design of GaN NACTs for applications in extreme conditions. The research holds great promise for large current NACTs and will speed up their practical implementation.
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Affiliation(s)
- Yazhou Wei
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
| | - Feiliang Chen
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
- Yangtze Delta Region Institute, University of Electronic Science and Technology of China, Huzhou, 313000, China
| | - Ruihan Huang
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
| | - Jianpeng Zhao
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
| | - Haiquan Zhao
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
| | - Jiachao Wang
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
| | - Mo Li
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
- Yangtze Delta Region Institute, University of Electronic Science and Technology of China, Huzhou, 313000, China
| | - Jian Zhang
- School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China
- Yangtze Delta Region Institute, University of Electronic Science and Technology of China, Huzhou, 313000, China
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2
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Zheng Y, Sen D, Das S, Das S. Graphene Strain-Effect Transistor with Colossal ON/OFF Current Ratio Enabled by Reversible Nanocrack Formation in Metal Electrodes on Piezoelectric Substrates. NANO LETTERS 2023; 23:2536-2543. [PMID: 36996350 DOI: 10.1021/acs.nanolett.2c04519] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/19/2023]
Abstract
Extraordinarily high carrier mobility in graphene has led to many remarkable discoveries in physics and at the same time invoked great interest in graphene-based electronic devices and sensors. However, the poor ON/OFF current ratio observed in graphene field-effect transistors has stymied its use in many applications. Here, we introduce a graphene strain-effect transistor (GSET) with a colossal ON/OFF current ratio in excess of 107 by exploiting strain-induced reversible nanocrack formation in the source/drain metal contacts with the help of a piezoelectric gate stack. GSETs also exhibit steep switching with a subthreshold swing (SS) < 1 mV/decade averaged over ∼6 orders of magnitude change in the source-to-drain current for both electron and hole branch amidst a finite hysteresis window. We also demonstrate high device yield and strain endurance for GSETs. We believe that GSETs can significantly expand the application space for graphene-based technologies beyond what is currently envisioned.
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Affiliation(s)
- Yikai Zheng
- Department of Engineering Science and Mechanics, Penn State University, University Park, Pennsylvania, 16802, United States
| | - Dipanjan Sen
- Department of Engineering Science and Mechanics, Penn State University, University Park, Pennsylvania, 16802, United States
| | - Sarbashis Das
- Department of Electrical Engineering, Penn State University, University Park, Pennsylvania, 16802, United States
| | - Saptarshi Das
- Department of Engineering Science and Mechanics, Penn State University, University Park, Pennsylvania, 16802, United States
- Department of Electrical Engineering, Penn State University, University Park, Pennsylvania, 16802, United States
- Department of Materials Science and Engineering, Penn State University, University Park, Pennsylvania, 16802, United States
- Materials Research Institute, Penn State University, University Park, Pennsylvania, 16802, United States
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3
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Zou X, Yaqoob U, Ahmed S, Wang Y, Salama KN, Fariborzi H. An interconnect-free micro-electromechanical 7-bit arithmetic device for multi-operand programmable computing. MICROSYSTEMS & NANOENGINEERING 2023; 9:42. [PMID: 37025566 PMCID: PMC10070399 DOI: 10.1038/s41378-023-00508-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/29/2022] [Revised: 01/06/2023] [Accepted: 01/31/2023] [Indexed: 06/19/2023]
Abstract
Computational power density and interconnection between transistors have grown to be the dominant challenges for the continued scaling of complementary metal-oxide-semiconductor (CMOS) technology due to limited integration density and computing power. Herein, we designed a novel, hardware-efficient, interconnect-free microelectromechanical 7:3 compressor using three microbeam resonators. Each resonator is configured with seven equal-weighted inputs and multiple driven frequencies, thus defining the transformation rules for transmitting resonance frequency to binary outputs, performing summation operations, and displaying outputs in compact binary format. The device achieves low power consumption and excellent switching reliability even after 3 × 103 repeated cycles. These performance improvements, including enhanced computational power capacity and hardware efficiency, are paramount for moderately downscaling devices. Finally, our proposed paradigm shift for circuit design provides an attractive alternative to traditional electronic digital computing and paves the way for multioperand programmable computing based on electromechanical systems.
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Affiliation(s)
- Xuecui Zou
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
| | - Usman Yaqoob
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
| | - Sally Ahmed
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
| | - Yue Wang
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
| | - Khaled Nabil Salama
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
| | - Hossein Fariborzi
- CEMSE Division, King Abdullah University of Science and Technology, Thuwal, 23955 Saudi Arabia
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4
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Lee YB, Kang MH, Choi PK, Kim SH, Kim TS, Lee SY, Yoon JB. Sub-10 fJ/bit radiation-hard nanoelectromechanical non-volatile memory. Nat Commun 2023; 14:460. [PMID: 36709346 PMCID: PMC9884203 DOI: 10.1038/s41467-023-36076-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/22/2022] [Accepted: 01/12/2023] [Indexed: 01/30/2023] Open
Abstract
With the exponential growth of the semiconductor industry, radiation-hardness has become an indispensable property of memory devices. However, implementation of radiation-hardened semiconductor memory devices inevitably requires various radiation-hardening technologies from the layout level to the system level, and such technologies incur a significant energy overhead. Thus, there is a growing demand for emerging memory devices that are energy-efficient and intrinsically radiation-hard. Here, we report a nanoelectromechanical non-volatile memory (NEM-NVM) with an ultra-low energy consumption and radiation-hardness. To achieve an ultra-low operating energy of less than 10 [Formula: see text], we introduce an out-of-plane electrode configuration and electrothermal erase operation. These approaches enable the NEM-NVM to be programmed with an ultra-low energy of 2.83 [Formula: see text]. Furthermore, due to its mechanically operating mechanisms and radiation-robust structural material, the NEM-NVM retains its superb characteristics without radiation-induced degradation such as increased leakage current, threshold voltage shift, and unintended bit-flip even after 1 Mrad irradiation.
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Affiliation(s)
- Yong-Bok Lee
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Min-Ho Kang
- grid.496766.c0000 0004 0546 0225National NanoFab Center (NNFC), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Pan-Kyu Choi
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea ,Taiwan Semiconductor Manufacturing Company (TSMC) Ltd, Fab 21 Phoenix, AZ USA
| | - Su-Hyun Kim
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea ,grid.419666.a0000 0001 1945 5898SAMSUNG ELECTRONICS Co., Ltd, 1, Samsungjeonja-ro, Hwaseong-si, Gyeonggi-do 18448 Republic of Korea
| | - Tae-Soo Kim
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - So-Young Lee
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
| | - Jun-Bo Yoon
- grid.37172.300000 0001 2292 0500School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu Daejeon, 34141 Republic of Korea
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5
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Guan Y, Guo Z, You L. Ferroelectric Nanogap-Based Steep-Slope Ambipolar Transistor. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2203017. [PMID: 36180410 DOI: 10.1002/smll.202203017] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/15/2022] [Revised: 09/10/2022] [Indexed: 06/16/2023]
Abstract
The subthreshold swing (SS) of metal-oxide-semiconductor field-effect transistors is limited to 60 mV dec-1 at room temperature by the Boltzmann tyranny, which restricts the scaling of the supply voltage. A nanogap-based transistor employs a switchable nanoscale air gap as the channel, offering a steep-slope switching process. Meanwhile, nanogaps featuring even sub-3 nm can efficiently block the current flow, exhibiting the potential for tackling the short-channel effect. Here, an electrically switchable ferroelectric nanogap to construct steep-slope transistors, is exploited. An average SS of 15.9 mV dec-1 across 5 orders and a minimum SS of 13.23 mV dec-1 are obtained in the high current density range. The transistor exhibits excellent performance with near-zero off-state leakage current and a maximum on-state current of 202 µA µm-1 at VDS = 0.5 V. In addition, the transistor can turn off with either a positive or negative increase in the gate voltage, exhibiting ambipolar characteristics.
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Affiliation(s)
- Yaodong Guan
- School of Optical and Electronic Information and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, 430074, China
| | - Zhe Guo
- School of Optical and Electronic Information and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, 430074, China
| | - Long You
- School of Optical and Electronic Information and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, 430074, China
- Wuhan National High Magnetic Field Center, Huazhong University of Science and Technology, Wuhan, 430074, China
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6
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Han J, Nelson Z, Chua MR, Swager TM, Niroui F, Lang JH, Bulović V. Molecular Platform for Fast Low-Voltage Nanoelectromechanical Switching. NANO LETTERS 2021; 21:10244-10251. [PMID: 34874728 DOI: 10.1021/acs.nanolett.1c03214] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
The use of molecules as active components to build nanometer-scale devices inspires emerging device concepts that employ the intrinsic functionality of molecules to address longstanding challenges facing nanoelectronics. Using molecules as controllable-length nanosprings, here we report the design and operation of a nanoelectromechanical (NEM) switch which overcomes the typical challenges of high actuation voltages and slow switching speeds for previous NEM technologies. Our NEM switches are hierarchically assembled using a molecular spacer layer sandwiched between atomically smooth electrodes, which defines a nanometer-scale electrode gap and can be electrostatically compressed to repeatedly modulate the tunneling current. The molecular layer and the top electrode structure serve as two degrees of design freedom with which to independently tailor static and dynamic device characteristics, enabling simultaneous low turn-on voltages (sub-3 V) and short switching delays (2 ns). This molecular platform with inherent nanoscale modularity provides a versatile strategy for engineering diverse high-performance and energy-efficient electromechanical devices.
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Affiliation(s)
- Jinchi Han
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Zachary Nelson
- Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Matthew R Chua
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Timothy M Swager
- Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Farnaz Niroui
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Jeffrey H Lang
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Vladimir Bulović
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
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7
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Jo E, Lee YB, Jung Y, Kim SB, Kang Y, Seo MH, Yoon JB, Kim J. Integration of Gold Nanoparticle-Carbon Nanotube Composite for Enhanced Contact Lifetime of Microelectromechanical Switches with Very Low Contact Resistance. ACS APPLIED MATERIALS & INTERFACES 2021; 13:16959-16967. [PMID: 33797217 DOI: 10.1021/acsami.0c22084] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Electrical circuits require ideal switches with low power consumption for future electronic applications. However, transistors, the most developed electrical switches available currently, have certain fundamental limitations such as increased leakage current and limited subthreshold swing. To overcome these limitations, micromechanical switches have been extensively studied; however, it is challenging to develop micromechanical switches with high endurance and low contact resistance. This study demonstrates highly reliable microelectromechanical switches using nanocomposites. Nanocomposites consisting of gold nanoparticles (Au NPs) and carbon nanotubes (CNTs) are coated on contact electrodes as contact surfaces through a scalable and solution-based fabrication process. While deformable CNTs in the nanocomposite increase the effective contact area under mechanical loads, highly conductive Au NPs provide current paths with low contact resistance between CNTs. Given these advantages, the switches exhibit robust switching operations over 5 × 106 cycles under hot-switching conditions in air. The switches also show low contact resistance without subthreshold region, an extremely small leakage current, and a high on/off ratio.
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Affiliation(s)
- Eunhwan Jo
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Yong-Bok Lee
- School of Electrical Engineering, Korea Advanced Institute of Science Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Yohan Jung
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Su-Bon Kim
- School of Electrical Engineering, Korea Advanced Institute of Science Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Yunsung Kang
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Min-Ho Seo
- School of Biomedical Convergence Engineering, College of Information & Biomedical Engineering, Pusan National University, 49 Busandaehak-ro, Yangsan-si, Gyeongsangnam-do 50612, Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering, Korea Advanced Institute of Science Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Jongbaeg Kim
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
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8
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Niroui F, Saravanapavanantham M, Han J, Patil JJ, Swager TM, Lang JH, Bulović V. Hybrid Approach to Fabricate Uniform and Active Molecular Junctions. NANO LETTERS 2021; 21:1606-1612. [PMID: 33534584 DOI: 10.1021/acs.nanolett.0c04043] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Molecules can serve as ultimate building blocks for extreme nanoscale devices. This requires their precise integration into functional heterojunctions, most commonly in the form of metal-molecule-metal architectures. Structural damage and nonuniformities caused by current fabrication techniques, however, limit their effective incorporation. Here, we present a hybrid fabrication approach enabling uniform and active molecular junctions. A template-stripping technique is developed to form electrodes with sub-nanometer smooth surfaces. Combined with dielectrophoretic trapping of colloidal nanorods, uniform sub-5 nm junctions are achieved. Uniquely, in our design, the top contact is mechanically free to move under an applied stimulus. Using this, we investigate the electromechanical tuning of the junction and its tunneling conduction. Here, the molecules help control sub-nanometer mechanical modulation, which is conventionally challenging due to instabilities caused by surface adhesive forces. Our versatile approach provides a platform to develop and study active molecular junctions for emerging applications in electronics, plasmonics, and electromechanical devices.
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Affiliation(s)
- Farnaz Niroui
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Mayuran Saravanapavanantham
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Jinchi Han
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Jatin J Patil
- Department of Material Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Timothy M Swager
- Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Jeffrey H Lang
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
| | - Vladimir Bulović
- Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
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9
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Fabrication and Characterization of Double- and Single-Clamped CuO Nanowire Based Nanoelectromechanical Switches. NANOMATERIALS 2021; 11:nano11010117. [PMID: 33419203 PMCID: PMC7825539 DOI: 10.3390/nano11010117] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/30/2020] [Revised: 12/22/2020] [Accepted: 01/01/2021] [Indexed: 11/17/2022]
Abstract
Electrostatically actuated nanoelectromechanical (NEM) switches hold promise for operation with sharply defined ON/OFF states, high ON/OFF current ratio, low OFF state power consumption, and a compact design. The present challenge for the development of nanoelectromechanical system (NEMS) technology is fabrication of single nanowire based NEM switches. In this work, we demonstrate the first application of CuO nanowires as NEM switch active elements. We develop bottom-up and top-down approaches for NEM switch fabrication, such as CuO nanowire synthesis, lithography, etching, dielectrophoretic alignment of nanowires on electrodes, and nanomanipulations for building devices that are suitable for scalable production. Theoretical modelling finds the device geometry that is necessary for volatile switching. The modelling results are validated by constructing gateless double-clamped and single-clamped devices on-chip that show robust and repeatable switching. The proposed design and fabrication route enable the scalable integration of bottom-up synthesized nanowires in NEMS.
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10
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Seo MH, Yoo JY, Jo MS, Yoon JB. Geometrically Structured Nanomaterials for Nanosensors, NEMS, and Nanosieves. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2020; 32:e1907082. [PMID: 32253800 DOI: 10.1002/adma.201907082] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/29/2019] [Revised: 12/18/2019] [Indexed: 06/11/2023]
Abstract
Recently, geometrically structured nanomaterials have received great attention due to their unique physical and chemical properties, which originate from the geometric variation in such materials. Indeed, the use of various geometrically structured nanomaterials has been actively reported in enhanced-performance devices in a wide range of applications. Recent significant progress in the development of geometrically structured nanomaterials and associated devices is summarized. First, a brief introduction of advanced nanofabrication methods that enable the fabrication of various geometrically structured nanomaterials is given, and then the performance enhancements achieved in devices utilizing these nanomaterials, namely, i) physical and gas nanosensors, ii) nanoelectromechanical devices, and iii) nanosieves are described. For the device applications, a systematic summary of their structures, working mechanisms, fabrication methods, and output performance is provided. Particular focus is given to how device performance can be enhanced through the geometric structures of the nanomaterials. Finally, perspectives on the development of novel nanomaterial structures and associated devices are presented.
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Affiliation(s)
- Min-Ho Seo
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea
- Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL, 60208, USA
| | - Jae-Young Yoo
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea
| | - Min-Seung Jo
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea
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11
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Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory. Nat Commun 2020; 11:1181. [PMID: 32132542 PMCID: PMC7055292 DOI: 10.1038/s41467-020-14872-2] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/21/2019] [Accepted: 01/31/2020] [Indexed: 11/09/2022] Open
Abstract
Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged as a promising alternative. However, a reliable and scalable non-volatile relay that retains its state when powered off has not been demonstrated. Part of the challenge is electromechanical pull-in instability, causing the beam to snap in after traversing a section of the airgap. Here we demonstrate an electrostatically actuated nanoelectromechanical relay that eliminates electromechanical pull-in instability without restricting the dynamic range of motion. It has several advantages over conventional electrostatic relays, including low actuation voltages without extreme reduction in critical dimensions and near constant actuation airgap while the device moves, for improved electrostatic control. With this nanoelectromechanical relay we demonstrate the first high-temperature non-volatile relay operation, with over 40 non-volatile cycles at 200 ∘C. Designing reliable, scalable and energy efficient data storage systems that can operate in extreme temperatures, remains a challenge. Here, the authors demonstrate a nanoelectromechanical relay that does not exhibit pull-in instability for reliable reprogrammable non-volatile memory operation.
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12
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Meija R, Livshits AI, Kosmaca J, Jasulaneca L, Andzane J, Biswas S, Holmes JD, Erts D. Resonance assisted jump-in voltage reduction for electrostatically actuated nanobeam-based gateless NEM switches. NANOTECHNOLOGY 2019; 30:385203. [PMID: 31216518 DOI: 10.1088/1361-6528/ab2b11] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
Electrostatically actuated nanobeam-based electromechanical switches have shown promise for versatile novel applications, such as low power devices. However, their widespread use is restricted due to poor reliability resulting from high jump-in voltages. This article reports a new method for lowering the jump-in voltage by inducing mechanical oscillations in the active element during the switching ON process, reducing the jump-in voltage by more than three times. Ge0.91Sn0.09 alloy and Bi2Se3 nanowire-based nanoelectromechanical switches were constructed in situ to demonstrate the operation principles and advantages of the proposed method.
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Affiliation(s)
- R Meija
- Institute of Chemical Physics, University of Latvia, Latvia
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13
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Shin DH, Kim H, Lee SW. Nanoelectromechanical graphene switches for the multi-valued logic systems. NANOTECHNOLOGY 2019; 30:364005. [PMID: 31151122 DOI: 10.1088/1361-6528/ab260f] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Graphene based multi-valued nanoelectromechanical switches are suggested and demonstrated. The device structure having multiple contact sites with different heights under the doubly clamped suspended beam provides multiple contacts to be formed sequentially from the taller electrode to the shorter electrode, which results in multiple logic states. Based on the finite element method simulation, we found that our device characteristics, such as turn-on and threshold voltages, are highly governed by the device design. The proof-of-concept device realized by using a newly developed 3D fabrication method based on the e-beam lithography expresses quaternary logic states successfully with a high stability in repetitive operations.
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Affiliation(s)
- Dong Hoon Shin
- Department of Physics, Ewha Womans University, Seoul 03760, Republic of Korea
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14
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Jo E, Seo MH, Pyo S, Ko SD, Kwon DS, Choi J, Yoon JB, Kim J. Integration of a Carbon Nanotube Network on a Microelectromechanical Switch for Ultralong Contact Lifetime. ACS APPLIED MATERIALS & INTERFACES 2019; 11:18617-18625. [PMID: 31018637 DOI: 10.1021/acsami.9b02747] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
Micro-/nanoelectromechanical (MEM/NEM) switches have been extensively studied to address the limitations of transistors, such as the increased standby power consumption and performance dependence on temperature and radiation. However, their lifetimes are limited owing to the degradation of the contact surfaces. Even though several materials and structural designs have been recently developed to improve the lifetime, the production of a microswitch that is compatible with a complementary metal-oxide semiconductor (CMOS) with a long lifetime remains a significant challenge. We demonstrate a vertically actuated MEM switch with extremely high reliability by integrating a carbon nanotube (CNT) network on a gold electrode as the contact material using a low-temperature, CMOS-compatible solution process. In addition to their outstanding mechanical and electrical properties of CNTs, their deformability dramatically increases the effective contact area of the switch, thus resulting in the extension of the lifetime. The CNT-coated MEM switch exhibits a lifetime that is more than 7 × 108 cycles when operated in hot-switching conditions, which is 1.9 × 104 times longer than that of a control device without CNTs. The switch also shows an excellent switching performance, including a low electrical resistance, high on/off ratio, and an extremely small off-state current.
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Affiliation(s)
- Eunhwan Jo
- School of Mechanical Engineering , Yonsei University , 50 Yonsei-ro , Seodaemun-gu, Seoul 03722 , Republic of Korea
| | - Min-Ho Seo
- School of Electrical Engineering , Korea Advanced Institute of Science Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
- Information & Electronics Research Institute , Korea Advanced Institute of Science and Technology (KAIST) , 291, Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Soonjae Pyo
- School of Mechanical Engineering , Yonsei University , 50 Yonsei-ro , Seodaemun-gu, Seoul 03722 , Republic of Korea
| | - Seung-Deok Ko
- Broadcom Limited , 1730 Fox Dr , San Jose , California 95131 , United States
| | - Dae-Sung Kwon
- School of Mechanical Engineering , Yonsei University , 50 Yonsei-ro , Seodaemun-gu, Seoul 03722 , Republic of Korea
| | - Jungwook Choi
- School of Mechanical Engineering , Yeungnam University , 280 Daehak-ro , Gyeongsan , Gyeongbuk 38541 , Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering , Korea Advanced Institute of Science Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Jongbaeg Kim
- School of Mechanical Engineering , Yonsei University , 50 Yonsei-ro , Seodaemun-gu, Seoul 03722 , Republic of Korea
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15
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Yang Y, Gu C, Li J. Sub-5 nm Metal Nanogaps: Physical Properties, Fabrication Methods, and Device Applications. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2019; 15:e1804177. [PMID: 30589217 DOI: 10.1002/smll.201804177] [Citation(s) in RCA: 15] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2018] [Revised: 11/29/2018] [Indexed: 05/26/2023]
Abstract
Sub-5 nm metal nanogaps have attracted widespread attention in physics, chemistry, material sciences, and biology due to their physical properties, including great plasmon-enhanced effects in light-matter interactions and charge tunneling, Coulomb blockade, and the Kondo effect under an electrical stimulus. These properties especially meet the needs of many cutting-edge devices, such as sensing, optical, molecular, and electronic devices. However, fabricating sub-5 nm nanogaps is still challenging at the present, and scaled and reliable fabrication, improved addressability, and multifunction integration are desired for further applications in commercial devices. The aim of this work is to provide a comprehensive overview of sub-5 nm nanogaps and to present recent advancements in metal nanogaps, including their physical properties, fabrication methods, and device applications, with the ultimate aim to further inspire scientists and engineers in their research.
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Affiliation(s)
- Yang Yang
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P. R. China
| | - Changzhi Gu
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P. R. China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100049, P. R. China
| | - Junjie Li
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P. R. China
- School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100049, P. R. China
- Songshan Lake Materials Laboratory, Dongguan, Guangdong, 523808, China
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16
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Riverola M, Torres F, Uranga A, Barniol N. High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer. MICROMACHINES 2018; 9:E579. [PMID: 30405006 PMCID: PMC6266664 DOI: 10.3390/mi9110579] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 09/28/2018] [Revised: 10/23/2018] [Accepted: 11/01/2018] [Indexed: 11/17/2022]
Abstract
In this paper, a seesaw torsional relay monolithically integrated in a standard 0.35 μm complementary metal oxide semiconductor (CMOS) technology is presented. The seesaw relay is fabricated using the Back-End-Of-Line (BEOL) layers available, specifically using the tungsten VIA3 layer of a 0.35 μm CMOS technology. Three different contact materials are studied to discriminate which is the most adequate as a mechanical relay. The robustness of the relay is proved, and its main characteristics as a relay for the three different contact interfaces are provided. The seesaw relay is capable of a double hysteretic switching cycle, providing compactness for mechanical logic processing. The low contact resistance achieved with the TiN/W mechanical contact with high cycling life time is competitive in comparison with the state-of-the art.
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Affiliation(s)
- Martín Riverola
- Department of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.
| | - Francesc Torres
- Department of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.
| | - Arantxa Uranga
- Department of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.
| | - Núria Barniol
- Department of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain.
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17
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Dubois V, Bleiker SJ, Stemme G, Niklaus F. Scalable Manufacturing of Nanogaps. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:e1801124. [PMID: 30156331 DOI: 10.1002/adma.201801124] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/16/2018] [Revised: 04/23/2018] [Indexed: 05/24/2023]
Abstract
The ability to manufacture a nanogap in between two electrodes has proven a powerful catalyst for scientific discoveries in nanoscience and molecular electronics. A wide range of bottom-up and top-down methodologies are now available to fabricate nanogaps that are less than 10 nm wide. However, most available techniques involve time-consuming serial processes that are not compatible with large-scale manufacturing of nanogap devices. The scalable manufacturing of sub-10 nm gaps remains a great technological challenge that currently hinders both experimental nanoscience and the prospects for commercial exploitation of nanogap devices. Here, available nanogap fabrication methodologies are reviewed and a detailed comparison of their merits is provided, with special focus on large-scale and reproducible manufacturing of nanogaps. The most promising approaches that could achieve a breakthrough in research and commercial applications are identified. Emerging scalable nanogap manufacturing methodologies will ultimately enable applications with high scientific and societal impact, including high-speed whole genome sequencing, electromechanical computing, and molecular electronics using nanogap electrodes.
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Affiliation(s)
- Valentin Dubois
- Department of Micro and Nano Systems, KTH Royal Institute of Technology, 100 44, Stockholm, Sweden
| | - Simon J Bleiker
- Department of Micro and Nano Systems, KTH Royal Institute of Technology, 100 44, Stockholm, Sweden
| | - Göran Stemme
- Department of Micro and Nano Systems, KTH Royal Institute of Technology, 100 44, Stockholm, Sweden
| | - Frank Niklaus
- Department of Micro and Nano Systems, KTH Royal Institute of Technology, 100 44, Stockholm, Sweden
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18
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Kim Y, Lim D, Cho J, Kim S. Feedback and tunneling operations of a p +-i-n + silicon nanowire field-effect transistor. NANOTECHNOLOGY 2018; 29:435202. [PMID: 30102245 DOI: 10.1088/1361-6528/aad9df] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
In this paper, we describe the feedback and tunneling operations of a dual top gate field-effect transistor (FET) with a p +-i-n + doped silicon nanowire channel. The transistor functions selectively in either a feedback FET (FBFET) or a tunneling FET mode by modulating the source-to-drain voltage, and it features an outstanding subthreshold swing characteristic of 6.15 mV dec-1 with an on/off current ratio (I on/I off) of approximately 106 in the feedback operating mode and of 41.3 mV dec-1 with I on/I off of ∼107 in the tunneling operating mode. Moreover, our device in the FBFET operation mode has memory characteristics with a retention time of 104 s and a program/erase endurance up to 103 cycles owing to the positive feedback loop in the channel region. This study demonstrates the promising potential of our devices in the development of multifunctional electronics.
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Affiliation(s)
- Yoonjoong Kim
- Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea
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19
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Kumar A, Balakrishna Pillai P, Song X, De Souza MM. Negative Capacitance beyond Ferroelectric Switches. ACS APPLIED MATERIALS & INTERFACES 2018; 10:19812-19819. [PMID: 29788714 DOI: 10.1021/acsami.8b05093] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Negative capacitance transistors are a unique class of switches capable of operation beyond the Boltzmann limit to realize subthermionic switching. To date, the negative capacitance effect has been predominantly attributed to devices employing an unstable insulator with ferroelectric properties, exhibiting a two-well energy landscape, in accordance with the Landau theory. The theory and operation of a solid electrolyte field effect transistor (SE-FET) of subthreshold swing less than 60 mV/dec in the absence of a ferroelectric gate dielectric are demonstrated in this work. Unlike ferroelectric FETs that rely on a sudden switching of dipoles to achieve negative capacitance, we demonstrate a distinctive mechanism that relies on the accumulation and dispersion of ions at the interfaces of the oxide, leading to a subthreshold slope (SS) as low as 26 mV/dec in these samples. The frequency of operation of these unscaled devices lies in a few millihertz because at higher or lower frequencies, the ions in the insulator are either too fast or too slow to produce voltage amplification. This is unlike Landau switches, where the SS remains below 60 mV/dec even under quasi-static sweep of the gate bias. The proposed FETs show a higher on-current with a thicker oxide in the entire range of gate voltage, clearly distinguishing their scaling laws from those of ferroelectric FETs. Our theory, validated with experiment, demonstrates a new class of devices capable of negative capacitance that opens up alternate methods of steep switching beyond the traditional approach of ferroelectric or memristive FETs.
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Affiliation(s)
- Ashwani Kumar
- Department of Electronic and Electrical Engineering , University of Sheffield , North Campus , S3 7HQ Sheffield , United Kingdom
| | - Premlal Balakrishna Pillai
- Department of Electronic and Electrical Engineering , University of Sheffield , North Campus , S3 7HQ Sheffield , United Kingdom
| | - Xiaoyao Song
- Department of Electronic and Electrical Engineering , University of Sheffield , North Campus , S3 7HQ Sheffield , United Kingdom
| | - Maria Merlyne De Souza
- Department of Electronic and Electrical Engineering , University of Sheffield , North Campus , S3 7HQ Sheffield , United Kingdom
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20
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Seo MH, Choi SJ, Park SH, Yoo JY, Lim SK, Lee JS, Choi KW, Jo MS, Kim ID, Yoon JB. Material-Independent Nanotransfer onto a Flexible Substrate Using Mechanical-Interlocking Structure. ACS NANO 2018; 12:4387-4397. [PMID: 29589909 DOI: 10.1021/acsnano.8b00159] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/15/2023]
Abstract
Nanowire-transfer technology has received much attention thanks to its capability to fabricate high-performance flexible nanodevices with high simplicity and throughput. However, it is still challenging to extend the conventional nanowire-transfer method to the fabrication of a wide range of devices since a chemical-adhesion-based nanowire-transfer mechanism is complex and time-consuming, hindering successful transfer of diverse nanowires made of various materials. Here, we introduce a material-independent mechanical-interlocking-based nanowire-transfer (MINT) method, fabricating ultralong and fully aligned nanowires on a large flexible substrate (2.5 × 2 cm2) in a highly robust manner. For the material-independent nanotransfer, we developed a mechanics-based nanotransfer method, which employs a dry-removable amorphous carbon (a-C) sacrificial layer between a vacuum-deposited nanowire and the underlying master mold. The controlled etching of the sacrificial layer enables the formation of a mechanical-interlocking structure under the nanowire, facilitating peeling off of the nanowire from the master mold robustly and reliably. Using the developed MINT method, we successfully fabricated various metallic and semiconductor nanowire arrays on flexible substrates. We further demonstrated that the developed method is well suited to the reliable fabrication of highly flexible and high-performance nanoelectronic devices. As examples, a fully aligned gold (Au) microheater array exhibited high bending stability (106 cycling) and ultrafast (∼220 ms) heating operation up to ∼100 °C. An ultralong Au heater-embedded cuprous-oxide (Cu2O) nanowire chemical gas sensor showed significantly improved reversible reaction kinetics toward NO2 with 10-fold enhancement in sensitivity at 100 °C.
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Affiliation(s)
- Min-Ho Seo
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Seon-Jin Choi
- Department of Chemistry , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States
| | - Sang Hyun Park
- National NanoFab Center (NNFC) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Jae-Young Yoo
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Sung Kyu Lim
- National NanoFab Center (NNFC) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Jae-Shin Lee
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Kwang-Wook Choi
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Min-Seung Jo
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Il-Doo Kim
- Department of Materials Science and Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering , Korea Advanced Institute of Science and Technology (KAIST) , 291 Daehak-ro , Yuseong-gu, Daejeon 34141 , Republic of Korea
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21
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Bishop ZK, Foster AP, Royall B, Bentham C, Clarke E, Skolnick MS, Wilson LR. Electro-mechanical control of an on-chip optical beam splitter containing an embedded quantum emitter. OPTICS LETTERS 2018; 43:2142-2145. [PMID: 29714766 DOI: 10.1364/ol.43.002142] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/07/2018] [Accepted: 03/29/2018] [Indexed: 05/28/2023]
Abstract
We demonstrate electro-mechanical control of an on-chip GaAs optical beam splitter containing a quantum dot single-photon source. The beam splitter consists of two nanobeam waveguides, which form a directional coupler (DC). The splitting ratio of the DC is controlled by varying the out-of-plane separation of the two waveguides using electromechanical actuation. We reversibly tune the beam splitter between an initial state, with emission into both output arms, and a final state with photons emitted into a single output arm. The device represents a compact and scalable tuning approach for use in III-V semiconductor integrated quantum optical circuits.
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22
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Dong K, Choe HS, Wang X, Liu H, Saha B, Ko C, Deng Y, Tom KB, Lou S, Wang L, Grigoropoulos CP, You Z, Yao J, Wu J. A 0.2 V Micro-Electromechanical Switch Enabled by a Phase Transition. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2018; 14:e1703621. [PMID: 29479803 DOI: 10.1002/smll.201703621] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/17/2017] [Revised: 12/06/2017] [Indexed: 06/08/2023]
Abstract
Micro-electromechanical (MEM) switches, with advantages such as quasi-zero leakage current, emerge as attractive candidates for overcoming the physical limits of complementary metal-oxide semiconductor (CMOS) devices. To practically integrate MEM switches into CMOS circuits, two major challenges must be addressed: sub 1 V operating voltage to match the voltage levels in current circuit systems and being able to deliver at least millions of operating cycles. However, existing sub 1 V mechanical switches are mostly subject to significant body bias and/or limited lifetimes, thus failing to meet both limitations simultaneously. Here 0.2 V MEM switching devices with ≳106 safe operating cycles in ambient air are reported, which achieve the lowest operating voltage in mechanical switches without body bias reported to date. The ultralow operating voltage is mainly enabled by the abrupt phase transition of nanolayered vanadium dioxide (VO2 ) slightly above room temperature. The phase-transition MEM switches open possibilities for sub 1 V hybrid integrated devices/circuits/systems, as well as ultralow power consumption sensors for Internet of Things applications.
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Affiliation(s)
- Kaichen Dong
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, P. R. China
| | - Hwan Sung Choe
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Xi Wang
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
| | - Huili Liu
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Bivas Saha
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Changhyun Ko
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Yang Deng
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
| | - Kyle B Tom
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Shuai Lou
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
| | - Letian Wang
- Department of Mechanical Engineering, University of California, Berkeley, CA, 94720, USA
| | - Costas P Grigoropoulos
- Department of Mechanical Engineering, University of California, Berkeley, CA, 94720, USA
| | - Zheng You
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, P. R. China
| | - Jie Yao
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Junqiao Wu
- Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
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23
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Wang X, Dong K, Choe HS, Liu H, Lou S, Tom KB, Bechtel HA, You Z, Wu J, Yao J. Multifunctional Microelectro-Opto-mechanical Platform Based on Phase-Transition Materials. NANO LETTERS 2018; 18:1637-1643. [PMID: 29400972 DOI: 10.1021/acs.nanolett.7b04477] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Along with the rapid development of hybrid electronic-photonic systems, multifunctional devices with dynamic responses have been widely investigated for improving many optoelectronic applications. For years, microelectro-opto-mechanical systems (MEOMS), one of the major approaches to realizing multifunctionality, have demonstrated profound reconfigurability and great reliability. However, modern MEOMS still suffer from limitations in modulation depth, actuation voltage, or miniaturization. Here, we demonstrate a new MEOMS multifunctional platform with greater than 50% optical modulation depth over a broad wavelength range. This platform is realized by a specially designed cantilever array, with each cantilever consisting of vanadium dioxide, chromium, and gold nanolayers. The abrupt structural phase transition of the embedded vanadium dioxide enables the reconfigurability of the platform. Diverse stimuli, such as temperature variation or electric current, can be utilized to control the platform, promising CMOS-compatible operating voltage. Multiple functionalities, including an active enhanced absorber and a reprogrammable electro-optic logic gate, are experimentally demonstrated to address the versatile applications of the MEOMS platform in fields such as communication, energy harvesting, and optical computing.
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Affiliation(s)
- Xi Wang
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | - Kaichen Dong
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument , Tsinghua University , Beijing 100084 , People's Republic of China
| | - Hwan Sung Choe
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | - Huili Liu
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | - Shuai Lou
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | - Kyle B Tom
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | | | - Zheng You
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument , Tsinghua University , Beijing 100084 , People's Republic of China
| | - Junqiao Wu
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
| | - Jie Yao
- Department of Materials Science and Engineering , University of California , Berkeley , California 94720 , United States
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24
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Seo MH, Ko JH, Lee JO, Ko SD, Mun JH, Cho BJ, Kim YH, Yoon JB. >1000-Fold Lifetime Extension of a Nickel Electromechanical Contact Device via Graphene. ACS APPLIED MATERIALS & INTERFACES 2018; 10:9085-9093. [PMID: 29461033 DOI: 10.1021/acsami.7b15772] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Micro-/nano-electromechanical (M/NEM) switches have received significant attention as promising switching devices for a wide range of applications such as computing, radio frequency communication, and power gating devices. However, M/NEM switches still suffer from unacceptably low reliability because of irreversible degradation at the contacting interfaces, hindering adoption in practical applications and further development. Here, we evaluate and verify graphene as a contact material for reliability-enhanced M/NEM switching devices. Atomic force microscopy experiments and quantum mechanics calculations reveal that energy-efficient mechanical contact-separation characteristics are achieved when a few layers of graphene are used as a contact material on a nickel surface, reducing the energy dissipation by 96.6% relative to that of a bare nickel surface. Importantly, graphene displays almost elastic contact-separation, indicating that little atomic-scale wear, including plastic deformation, fracture, and atomic attrition, is generated. We also develop a feasible fabrication method to demonstrate a MEM switch, which has high-quality graphene as the contact material, and verify that the devices with graphene show mechanically stable and elastic-like contact properties, consistent with our nanoscale contact experiment. The graphene coating extends the switch lifetime >103 times under hot switching conditions.
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25
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Pan R, Yang Y, Wang Y, Li S, Liu Z, Su Y, Quan B, Li Y, Gu C, Li J. Nanocracking and metallization doubly defined large-scale 3D plasmonic sub-10 nm-gap arrays as extremely sensitive SERS substrates. NANOSCALE 2018; 10:3171-3180. [PMID: 29364303 DOI: 10.1039/c7nr08646f] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Considering the technological difficulties in the existing approaches to form nanoscale gaps, a convenient method to fabricate three-dimensional (3D) sub-10 nm Ag/SiNx gap arrays has been demonstrated in this study, controlled by a combination of stress-induced nanocracking of a SiNx nanobridge and Ag nanofilm deposition. This scalable 3D plasmonic nanogap is specially suspended above a substrate, having a tunable nanogap width and large height-to-width ratio to form a nanocavity underneath. As a surface-enhanced Raman scattering (SERS) substrate, the 3D Ag/SiNx nanogap shows a large Raman enhancement factor of ∼108 and extremely high sensitivity for the detection of Rhodamine 6G (R6G) molecules, even down to 10-16 M, indicating an extraordinary capability for single-molecule detection. Further, we verified that the Fabry-Perot resonance occurred in the deep SiNx nanocavity under the Ag nanogap and contributed prominently to a tremendous enhancement of the local field in the Ag-nanogap zone and hence ultrasensitive SERS detection. This method circumvents the technological limitations to fabricate a sub-10 nm metal nanogap with unique features for wide applications in important scientific and technological areas.
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Affiliation(s)
- Ruhao Pan
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.
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26
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Jasulaneca L, Kosmaca J, Meija R, Andzane J, Erts D. Review: Electrostatically actuated nanobeam-based nanoelectromechanical switches - materials solutions and operational conditions. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2018; 9:271-300. [PMID: 29441272 PMCID: PMC5789396 DOI: 10.3762/bjnano.9.29] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/20/2017] [Accepted: 12/25/2017] [Indexed: 05/08/2023]
Abstract
This review summarizes relevant research in the field of electrostatically actuated nanobeam-based nanoelectromechanical (NEM) switches. The main switch architectures and structural elements are briefly described and compared. Investigation methods that allow for exploring coupled electromechanical interactions as well as studies of mechanically or electrically induced effects are covered. An examination of the complex nanocontact behaviour during various stages of the switching cycle is provided. The choice of the switching element and the electrode is addressed from the materials perspective, detailing the benefits and drawbacks for each. An overview of experimentally demonstrated NEM switching devices is provided, and together with their operational parameters, the reliability issues and impact of the operating environment are discussed. Finally, the most common NEM switch failure modes and the physical mechanisms behind them are reviewed and solutions proposed.
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Affiliation(s)
| | | | | | | | - Donats Erts
- Institute of Chemical Physics
- Department of Chemistry, University of Latvia, Raina Blvd. 19, Riga, LV-1586, Latvia
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27
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Berger C, Phillips R, Centeno A, Zurutuza A, Vijayaraghavan A. Capacitive pressure sensing with suspended graphene-polymer heterostructure membranes. NANOSCALE 2017; 9:17439-17449. [PMID: 29105718 DOI: 10.1039/c7nr04621a] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/12/2023]
Abstract
We describe the fabrication and characterisation of a capacitive pressure sensor formed by an ultra-thin graphene-polymer heterostructure membrane spanning a large array of micro-cavities each up to 30 μm in diameter with 100% yield. Sensors covering an area of just 1 mm2 show reproducible pressure transduction under static and dynamic loading up to pressures of 250 kPa. The measured capacitance change in response to pressure is in good agreement with calculations. Further, we demonstrate high-sensitivity pressure sensors by applying a novel strained membrane transfer and optimising the sensor architecture. This method enables suspended structures with less than 50 nm of air dielectric gap, giving a pressure sensitivity of 123 aF Pa-1 mm-2 over a pressure range of 0 to 100 kPa.
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Affiliation(s)
- Christian Berger
- School of Materials and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK.
| | - Rory Phillips
- School of Materials and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK.
| | - Alba Centeno
- Graphenea S.A., 20018 Donostia-San Sebastián, Spain
| | | | - Aravind Vijayaraghavan
- School of Materials and National Graphene Institute, University of Manchester, Manchester, M13 9PL, UK.
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Qian Z, Kang S, Rajaram V, Cassella C, McGruer NE, Rinaldi M. Zero-power infrared digitizers based on plasmonically enhanced micromechanical photoswitches. NATURE NANOTECHNOLOGY 2017; 12:969-973. [PMID: 28892101 DOI: 10.1038/nnano.2017.147] [Citation(s) in RCA: 42] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/18/2016] [Accepted: 06/20/2017] [Indexed: 05/27/2023]
Abstract
State-of-the-art sensors use active electronics to detect and discriminate light, sound, vibration and other signals. They consume power constantly, even when there is no relevant data to be detected, which limits their lifetime and results in high costs of deployment and maintenance for unattended sensor networks. Here we propose a device concept that fundamentally breaks this paradigm-the sensors remain dormant with near-zero power consumption until awakened by a specific physical signature associated with an event of interest. In particular, we demonstrate infrared digitizing sensors that consist of plasmonically enhanced micromechanical photoswitches (PMPs) that selectively harvest the impinging electromagnetic energy in design-defined spectral bands of interest, and use it to create mechanically a conducting channel between two electrical contacts, without the need for any additional power source. Our zero-power digitizing sensor prototypes produce a digitized output bit (that is, a large and sharp off-to-on state transition with an on/off conductance ratio >1012 and subthreshold slope >9 dec nW-1) when exposed to infrared radiation in a specific narrow spectral band (∼900 nm bandwidth in the mid-infrared) with the intensity above a power threshold of only ∼500 nW, which is not achievable with any existing photoswitch technologies.
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Affiliation(s)
- Zhenyun Qian
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
| | - Sungho Kang
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
| | - Vageeswar Rajaram
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
| | - Cristian Cassella
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
| | - Nicol E McGruer
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
| | - Matteo Rinaldi
- Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA
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Lee JO, Choi KW, Choi SJ, Kang MH, Seo MH, Kim ID, Yu K, Yoon JB. Nanomechanical Encoding Method Using Enhanced Thermal Concentration on a Metallic Nanobridge. ACS NANO 2017; 11:7781-7789. [PMID: 28708372 DOI: 10.1021/acsnano.7b01475] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
We present a fast, energy-efficient nano-thermomechanical encoding scheme for digital information storage and retrieval. Digital encoding processes are conducted by the bistable electrothermal actuation of a scalable nanobridge device. The electrothermal energy is highly concentrated by enhanced electron/phonon scattering and heat insulation in a sub-100 nm metallic layer. The efficient conversion of electrothermal energy into mechanical strain allows digital switching and programming processes within 60 ns at 0.75 V with a programming energy of only 54 pJ. Furthermore, this encoding scheme together with the thermally robust design enables data retention at temperatures up to 400 °C. These results suggest that the proposed nano-thermomechanical encoding method could contribute to low-power electronics and robust information storage/retrieval systems.
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Affiliation(s)
| | | | | | - Min-Ho Kang
- National NanoFab Center (NNFC) , 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
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Buchnev O, Podoliak N, Frank T, Kaczmarek M, Jiang L, Fedotov VA. Controlling Stiction in Nano-Electro-Mechanical Systems Using Liquid Crystals. ACS NANO 2016; 10:11519-11524. [PMID: 28024385 DOI: 10.1021/acsnano.6b07495] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Stiction is one of the major reliability issues limiting practical application of nano-electro-mechanical systems (NEMS), an emerging device technology that exploits mechanical movements on the scale of an integrated electronic circuit. We report on a discovery that stiction can be eliminated by infiltrating NEMS with nematic liquid crystals. We demonstrate this experimentally using a NEMS-based tunable photonic metamaterial, where reliable switching of optical response was achieved for the entire range of nanoscopic structural displacements admitted by the metamaterial design. Being a more straightforward and easy-to-implement alternative to the existing antistiction solutions, our approach also introduces an active mechanism of stiction control, which enables toggling between stiction-free and the usual (stiction-limited) regimes of NEMS operation. It is expected to greatly expand the functionality of electro-mechanical devices and enable the development of adaptive and smart nanosystems.
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Affiliation(s)
- Oleksandr Buchnev
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
| | - Nina Podoliak
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
| | - Thomas Frank
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
| | - Malgosia Kaczmarek
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
| | - Liudi Jiang
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
| | - Vassili A Fedotov
- Optoelectronics Research Centre and Centre for Photonic Metamaterials, ‡Physics and Astronomy, and §Faculty of Engineering and the Environment, University of Southampton , Southampton, SO17 1BJ, U.K
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Suga H, Suzuki H, Shinomura Y, Kashiwabara S, Tsukagoshi K, Shimizu T, Naitoh Y. Highly stable, extremely high-temperature, nonvolatile memory based on resistance switching in polycrystalline Pt nanogaps. Sci Rep 2016; 6:34961. [PMID: 27725705 PMCID: PMC5057135 DOI: 10.1038/srep34961] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/07/2016] [Accepted: 09/22/2016] [Indexed: 11/30/2022] Open
Abstract
Highly stable, nonvolatile, high-temperature memory based on resistance switching was realized using a polycrystalline platinum (Pt) nanogap. The operating temperature of the memory can be drastically increased by the presence of a sharp-edged Pt crystal facet in the nanogap. A short distance between the facet edges maintains the nanogap shape at high temperature, and the sharp shape of the nanogap densifies the electric field to maintain a stable current flow due to field migration. Even at 873 K, which is a significantly higher temperature than feasible for conventional semiconductor memory, the nonvolatility of the proposed memory allows stable ON and OFF currents, with fluctuations of less than or equal to 10%, to be maintained for longer than eight hours. An advantage of this nanogap scheme for high-temperature memory is its secure operation achieved through the assembly and disassembly of a Pt needle in a high electric field.
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Affiliation(s)
- Hiroshi Suga
- Department of Technology of Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino, Chiba 275-0016, Japan
| | - Hiroya Suzuki
- Department of Technology of Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino, Chiba 275-0016, Japan
| | - Yuma Shinomura
- Department of Technology of Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino, Chiba 275-0016, Japan
| | - Shota Kashiwabara
- Department of Technology of Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino, Chiba 275-0016, Japan
| | - Kazuhito Tsukagoshi
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
| | - Tetsuo Shimizu
- Nanomaterials Research Institute, Department of Materials and Chemistry, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1 Tsukuba, Ibaraki 305-8562, Japan
| | - Yasuhisa Naitoh
- Nanoelectronics Research Institute, Department of Electronics and Manufacturing, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1 Tsukuba, Ibaraki 305-8562, Japan
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PI3K-GLUT4 Signal Pathway Associated with Effects of EX-B3 Electroacupuncture on Hyperglycemia and Insulin Resistance of T2DM Rats. EVIDENCE-BASED COMPLEMENTARY AND ALTERNATIVE MEDICINE 2016; 2016:7914387. [PMID: 27656242 PMCID: PMC5021857 DOI: 10.1155/2016/7914387] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/24/2016] [Revised: 07/21/2016] [Accepted: 08/03/2016] [Indexed: 11/17/2022]
Abstract
Objectives. To explore electroacupuncture's (EA's) effects on fasting blood glucose (FBG) and insulin resistance of type 2 diabetic mellitus (T2DM) model rats and give a possible explanation for the effects. Method. It takes high fat diet and intraperitoneal injection of streptozotocin (STZ, 30 mg/kg) for model preparation. Model rats were randomly divided into T2DM Model group, EA weiwanxiashu (EX-B3) group, and sham EA group (n = 12/group). EA (2 Hz continuous wave, 2 mA, 20 min/day, 6 days/week, 4 weeks) was applied as intervention. FBG, area under curve (AUC) of oral glucose tolerance test (OGTT), insulin resistance index (HOMA-IR), pancreatic B cell function index (HOMA-B), skeletal muscle phosphorylated phosphatidylinositol-3-kinase (PI3K), glucose transporter 4 (GLUT4), and membrane GLUT4 protein expression were measured. Results. EA weiwanxiashu (EX-B3) can greatly upregulate model rat's significantly reduced skeletal muscle PI3K (Y607) and membrane GLUT4 protein expression (P < 0.01), effectively reducing model rats' FBG and AUC of OGTT (P < 0.01). The effects are far superior to sham EA group. Conclusion. EA weiwanxiashu (EX-B3) can upregulate skeletal muscle phosphorylated PI3K protein expression, to stimulate membrane translocation of GLUT4 and thereby increase skeletal muscle glucose intake to treat T2DM.
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Sun J, Schmidt ME, Muruganathan M, Chong HMH, Mizuta H. Large-scale nanoelectromechanical switches based on directly deposited nanocrystalline graphene on insulating substrates. NANOSCALE 2016; 8:6659-65. [PMID: 26948477 DOI: 10.1039/c6nr00253f] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
The direct growth of graphene on insulating substrate is highly desirable for the commercial scale integration of graphene due to the potential lower cost and better process control. We report a simple, direct deposition of nanocrystalline graphene (NCG) on insulating substrates via catalyst-free plasma-enhanced chemical vapor deposition at relatively low temperature of ∼800 °C. The parametric study of the process conditions that we conducted reveals the deposition mechanism and allows us to grow high quality films. Based on such film, we demonstrate the fabrication of a large-scale array of nanoelectromechanical (NEM) switches using regular thin film process techniques, with no transfer required. Thanks to ultra-low thickness, good uniformity, and high Young's modulus of ∼0.86 TPa, NCG is considered as a promising material for high performance NEM devices. The high performance is highlighted for the NCG switches, e.g. low pull-in voltage <3 V, reversible operations, minimal leakage current of ∼1 pA, and high on/off ratio of ∼10(5).
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Affiliation(s)
- Jian Sun
- School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1211, Japan.
| | - Marek E Schmidt
- School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1211, Japan.
| | - Manoharan Muruganathan
- School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1211, Japan.
| | - Harold M H Chong
- Nanoelectronics and Nanotechnologies Research Group, University of Southampton, Southampton, SO17 1BJ, UK
| | - Hiroshi Mizuta
- School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1211, Japan. and Nanoelectronics and Nanotechnologies Research Group, University of Southampton, Southampton, SO17 1BJ, UK
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Qi Y, Yang J, Rappe AM. Theoretical Modeling of Tribochemical Reaction on Pt and Au Contacts: Mechanical Load and Catalysis. ACS APPLIED MATERIALS & INTERFACES 2016; 8:7529-7535. [PMID: 26910803 DOI: 10.1021/acsami.5b12350] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Microelectromechanical system and nanoelectromechanical system (MEMS and NEMS) transistors are considered promising for size-reducing and power-maximizing electronic devices. However, the tribopolymer which forms due to the mechanical load to the contacts affects the conductivity dramatically. This is one of the challenging problems that prevents the widespread practical use of these otherwise promising devices. Here, we use density functional theory (DFT) to investigate the mechanisms of tribopolymer formation, including normal mechanical load and the catalytic effect, as well as the electrochemical effect of the metal contacts. We select benzene as the background gas, because it is one of the most common and severe hydrocarbon contaminants. Two adsorption cases are considered: one is benzene on the reactive metal surface, Pt(111), and the other is benzene on the noble metal, Au(111). We demonstrate that the formation of tribopolymer is induced by both the mechanical load and the catalytic effect of the contact. First, benzene molecules are adsorbed on the Pt surfaces. Then, due to the closure of the Pt contacts, stress is applied to the adsorbates, making the C-H bonds more fragile. As the stress increases further, H atoms are pressed close to the Pt substrate and begin to bond with Pt atoms. Thus, Pt acts as a catalyst, accelerating the dehydrogenation process. When there is voltage applied across the contacts, the catalytic effect is enhanced by electrochemistry. Finally, due to the loss of H atoms, C atoms become more reactive and link together or pile up to form tribopolymer. By understanding these mechanisms, we provide guidance on designing strategies for suppressing tribopolymer formation.
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Affiliation(s)
- Yubo Qi
- The Makineni Theoretical Laboratories, Department of Chemistry, University of Pennsylvania , Philadelphia, Pennsylvania 19104-6323, United States
| | - Jing Yang
- The Makineni Theoretical Laboratories, Department of Chemistry, University of Pennsylvania , Philadelphia, Pennsylvania 19104-6323, United States
| | - Andrew M Rappe
- The Makineni Theoretical Laboratories, Department of Chemistry, University of Pennsylvania , Philadelphia, Pennsylvania 19104-6323, United States
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Dubois V, Niklaus F, Stemme G. Crack-Defined Electronic Nanogaps. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2016; 28:2178-82. [PMID: 26784270 DOI: 10.1002/adma.201504569] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/16/2015] [Revised: 12/03/2015] [Indexed: 05/24/2023]
Abstract
Achieving near-atomic-scale electronic nanogaps in a reliable and scalable manner will facilitate fundamental advances in molecular detection, plasmonics, and nanoelectronics. Here, a method is shown for realizing crack-defined nanogaps separating TiN electrodes, allowing parallel and scalable fabrication of arrays of sub-10 nm electronic nanogaps featuring individually defined gap widths.
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Affiliation(s)
- Valentin Dubois
- Department of Micro and Nanosystems, School of Electrical Engineering, KTH Royal Institute of Technology, SE-10044, Stockholm, Sweden
| | - Frank Niklaus
- Department of Micro and Nanosystems, School of Electrical Engineering, KTH Royal Institute of Technology, SE-10044, Stockholm, Sweden
| | - Göran Stemme
- Department of Micro and Nanosystems, School of Electrical Engineering, KTH Royal Institute of Technology, SE-10044, Stockholm, Sweden
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Muñoz-Gamarra JL, Uranga A, Barniol N. CMOS-NEMS Copper Switches Monolithically Integrated Using a 65 nm CMOS Technology. MICROMACHINES 2016; 7:mi7020030. [PMID: 30407403 PMCID: PMC6190103 DOI: 10.3390/mi7020030] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/21/2015] [Revised: 01/21/2016] [Accepted: 02/02/2016] [Indexed: 12/01/2022]
Abstract
This work demonstrates the feasibility to obtain copper nanoelectromechanical (NEMS) relays using a commercial complementary metal oxide semiconductor (CMOS) technology (ST 65 nm) following an intra CMOS-MEMS approach. We report experimental demonstration of contact-mode nano-electromechanical switches obtaining low operating voltage (5.5 V), good ION/IOFF (103) ratio, abrupt subthreshold swing (4.3 mV/decade) and minimum dimensions (3.50 μm × 100 nm × 180 nm, and gap of 100 nm). With these dimensions, the operable Cell area of the switch will be 3.5 μm (length) × 0.2 μm (100 nm width + 100 nm gap) = 0.7 μm2 which is the smallest reported one using a top-down fabrication approach.
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Affiliation(s)
- Jose Luis Muñoz-Gamarra
- Department of Electronics Engineering, Universitat Autònoma de Barcelona (UAB), Barcelona 08193, Spain.
| | - Arantxa Uranga
- Department of Electronics Engineering, Universitat Autònoma de Barcelona (UAB), Barcelona 08193, Spain.
| | - Nuria Barniol
- Department of Electronics Engineering, Universitat Autònoma de Barcelona (UAB), Barcelona 08193, Spain.
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Dedong H, Ying-Kai L, Yu DP. Multicolor Photodetector of a Single Er(3+)-Doped CdS Nanoribbon. NANOSCALE RESEARCH LETTERS 2015; 10:975. [PMID: 26153123 PMCID: PMC4495098 DOI: 10.1186/s11671-015-0975-3] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/21/2015] [Accepted: 06/12/2015] [Indexed: 05/26/2023]
Abstract
Er(3+)-doped CdS nanoribbons (Er-CdS NRs) are synthesized by thermal evaporation and then characterized by field emission scanning electron microscopy (FE-SEM), high-resolution transmission electron microscopy (HRTEM), photoluminescence (PL), and absorption spectra. The Er-CdS NR photodetector is studied systematically, including spectral response, light intensity response, and photoconductance (G) versus temperature (T). It is found that Er-CdS NR has the ability of detecting multicolor light including blue, red, and near-infrared light with higher responsivity (R λ ) and external quantum efficiency (η). The conductance of Er-CdS NR under dark conditions decreases with increasing temperature in the range of 87-237 K, while its conductance increases with increasing temperature in the range of 237-297 K when T is larger than 237 K. These results indicated that ionized impurities and the intrinsic excitation are responsible for the conductance change of Er-CdS NR in the dark. The superior performance of the Er-CdS NR device offers an avenue to develop highly sensitive multicolor photodetector applications.
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Affiliation(s)
- Hou Dedong
- />Institute of Physics and Electronic Information, Yunnan Normal University, No. 768 Juxian Street, Chenggong New District, Kunming, 650500 People’s Republic of China
- />Key Laboratory of Yunnan Higher Education Institutes for Optoelectric Information & Technology, Kunming, 650500 People’s Republic of China
- />Key Laboratory of Yunnan Normal University for Photoelectric Materials & Device, Kunming, 650500 People’s Republic of China
| | - Liu Ying-Kai
- />Institute of Physics and Electronic Information, Yunnan Normal University, No. 768 Juxian Street, Chenggong New District, Kunming, 650500 People’s Republic of China
- />Key Laboratory of Yunnan Higher Education Institutes for Optoelectric Information & Technology, Kunming, 650500 People’s Republic of China
- />Key Laboratory of Yunnan Normal University for Photoelectric Materials & Device, Kunming, 650500 People’s Republic of China
| | - De-Peng Yu
- />Key Laboratory of Yunnan Normal University for Photoelectric Materials & Device, Kunming, 650500 People’s Republic of China
- />State Key Laboratory for Mesoscopic Physics, Department of Physics, Peking University, No. 5 Yiheyuan Road, Haidian District, Beijing, 100871 People’s Republic of China
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Tao X, Fan Z, Nelson BJ, Dharuman G, Zhang W, Dong L, Li X. Internal Electron Tunneling Enabled Ultrasensitive Position/Force Peapod Sensors. NANO LETTERS 2015; 15:7281-7287. [PMID: 26457662 DOI: 10.1021/acs.nanolett.5b02362] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
The electron quantum tunneling effect guarantees the ultrahigh spatial resolution of the scanning tunneling microscope (STM), but there have been no other significant applications of this effect after the invention of STM. Here we report the implementation of electron-tunneling-based high sensitivity transducers using a peapod B4C nanowire, where discrete Ni6Si2B nanorods are embedded in the nanowire in a peapod form. The deformation of the nanowire provides a higher order scaling effect between conductivity and deformation strain, thus allowing the potentials of position and force sensing at the picoscale.
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Affiliation(s)
- Xinyong Tao
- Department of Mechanical Engineering, University of South Carolina , 300 Main Street, Columbia, South Carolina 29208, United States
- College of Materials Science and Engineering, Zhejiang University of Technology , Hangzhou 310014, China
| | - Zheng Fan
- Department of Electrical and Computer Engineering, Michigan State University , East Lansing, Michigan 48824-1226, United States
| | - Bradley J Nelson
- Institute of Robotics and Intelligent Systems, ETH Zurich , CH-8092 Zurich, Switzerland
| | - Gautham Dharuman
- Department of Electrical and Computer Engineering, Michigan State University , East Lansing, Michigan 48824-1226, United States
| | - Wenkui Zhang
- College of Materials Science and Engineering, Zhejiang University of Technology , Hangzhou 310014, China
| | - Lixin Dong
- Department of Electrical and Computer Engineering, Michigan State University , East Lansing, Michigan 48824-1226, United States
| | - Xiaodong Li
- Department of Mechanical Engineering, University of South Carolina , 300 Main Street, Columbia, South Carolina 29208, United States
- Department of Mechanical and Aerospace Engineering, University of Virginia , Charlottesville, Virginia 22904-4746, United States
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Niroui F, Wang AI, Sletten EM, Song Y, Kong J, Yablonovitch E, Swager TM, Lang JH, Bulović V. Tunneling Nanoelectromechanical Switches Based on Compressible Molecular Thin Films. ACS NANO 2015; 9:7886-94. [PMID: 26244821 DOI: 10.1021/acsnano.5b02476] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
Abrupt switching behavior and near-zero leakage current of nanoelectromechanical (NEM) switches are advantageous properties through which NEMs can outperform conventional semiconductor electrical switches. To date, however, typical NEMs structures require high actuation voltages and can prematurely fail through permanent adhesion (defined as stiction) of device components. To overcome these challenges, in the present work we propose a NEM switch, termed a "squitch," which is designed to electromechanically modulate the tunneling current through a nanometer-scale gap defined by an organic molecular film sandwiched between two electrodes. When voltage is applied across the electrodes, the generated electrostatic force compresses the sandwiched molecular layer, thereby reducing the tunneling gap and causing an exponential increase in the current through the device. The presence of the molecular layer avoids direct contact of the electrodes during the switching process. Furthermore, as the layer is compressed, the increasing surface adhesion forces are balanced by the elastic restoring force of the deformed molecules which can promote zero net stiction and recoverable switching. Through numerical analysis, we demonstrate the potential of optimizing squitch design to enable large on-off ratios beyond 6 orders of magnitude with operation in the sub-1 V regime and with nanoseconds switching times. Our preliminary experimental results based on metal-molecule-graphene devices suggest the feasibility of the proposed tunneling switching mechanism. With optimization of device design and material engineering, squitches can give rise to a broad range of low-power electronic applications.
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Affiliation(s)
| | | | | | | | | | - Eli Yablonovitch
- Department of Electrical Engineering and Computer Science, University of California , Berkeley, California 94720, United States
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Qian Z, Liu F, Hui Y, Kar S, Rinaldi M. Graphene as a Massless Electrode for Ultrahigh-Frequency Piezoelectric Nanoelectromechanical Systems. NANO LETTERS 2015; 15:4599-604. [PMID: 26029960 DOI: 10.1021/acs.nanolett.5b01208] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
Abstract
Designing "ideal electrodes" that simultaneously guarantee low mechanical damping and electrical loss as well as high electromechanical coupling in ultralow-volume piezoelectric nanomechanical structures can be considered to be a key challenge in the NEMS field. We show that mechanically transferred graphene, floating at van der Waals proximity, closely mimics "ideal electrodes" for ultrahigh frequency (0.2 GHz < f0 < 2.6 GHz) piezoelectric nanoelectromechanical resonators with negligible mechanical mass and interfacial strain and perfect radio frequency electric field confinement. These unique attributes enable graphene-electrode-based piezoelectric nanoelectromechanical resonators to operate at their theoretically "unloaded" frequency-limits with significantly improved electromechanical performance compared to metal-electrode counterparts, despite their reduced volumes. This represents a spectacular trend inversion in the scaling of piezoelectric electromechanical resonators, opening up new possibilities for the implementation of nanoelectromechanical systems with unprecedented performance.
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Affiliation(s)
- Zhenyun Qian
- †Department of Electrical and Computer Engineering and ‡Department of Physics, Northeastern University, Boston, Massachusetts 02115, United States
| | - Fangze Liu
- †Department of Electrical and Computer Engineering and ‡Department of Physics, Northeastern University, Boston, Massachusetts 02115, United States
| | - Yu Hui
- †Department of Electrical and Computer Engineering and ‡Department of Physics, Northeastern University, Boston, Massachusetts 02115, United States
| | - Swastik Kar
- †Department of Electrical and Computer Engineering and ‡Department of Physics, Northeastern University, Boston, Massachusetts 02115, United States
| | - Matteo Rinaldi
- †Department of Electrical and Computer Engineering and ‡Department of Physics, Northeastern University, Boston, Massachusetts 02115, United States
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Song YH, Ahn SJK, Kim MW, Lee JO, Hwang CS, Pi JE, Ko SD, Choi KW, Park SHK, Yoon JB. High-performance hybrid complementary logic inverter through monolithic integration of a MEMS switch and an oxide TFT. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2015; 11:1390-1395. [PMID: 25418881 DOI: 10.1002/smll.201402841] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/23/2014] [Revised: 10/15/2014] [Indexed: 06/04/2023]
Abstract
A hybrid complementary logic inverter consisting of a microelectromechanical system switch as a promising alternative for the p-type oxide thin film transistor (TFT) and an n-type oxide TFT is presented for ultralow power integrated circuits. These heterogeneous microdevices are monolithically integrated. The resulting logic device shows a distinctive voltage transfer characteristic curve, very low static leakage, zero-short circuit current, and exceedingly high voltage gain.
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Affiliation(s)
- Yong-Ha Song
- Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 305-701, Republic of Korea
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Kim K, Guo J, Xu X, Fan D(E. Micromotors with step-motor characteristics by controlled magnetic interactions among assembled components. ACS NANO 2015; 9:548-54. [PMID: 25536023 PMCID: PMC4310638 DOI: 10.1021/nn505798w] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2014] [Accepted: 12/23/2014] [Indexed: 05/24/2023]
Abstract
In this study, we investigated the control of the rotation dynamics of an innovative type of rotary micromotors with desired performances by tuning the magnetic interactions among the assembled micro/nanoscale components. The micromotors are made of metallic nanowires as rotors, patterned magnetic nanodisks as bearings and actuated by external electric fields. The magnetic forces for anchoring the rotors on the bearings play an essential role in the rotation dynamics of the micromotors. By varying the moment, orientation, and dimension of the magnetic components, distinct rotation behaviors can be observed, including repeatable wobbling and rolling in addition to rotation. We understood the rotation behaviors by analytical modeling, designed and realized micromotors with step-motor characteristics. The outcome of this research could inspire the development of high-performance nanomachines assembled from synthetic nanoentities, relevant to nanorobotics, microfluidics, and biomedical research.
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Affiliation(s)
- Kwanoh Kim
- Department of Mechanical Engineering, the University of Texas at Austin, Austin, Texas 78712, United States
| | - Jianhe Guo
- Materials Science and Engineering Program, the University of Texas at Austin, Austin, Texas 78712, United States
| | - Xiaobin Xu
- Materials Science and Engineering Program, the University of Texas at Austin, Austin, Texas 78712, United States
| | - Donglei (Emma) Fan
- Department of Mechanical Engineering, the University of Texas at Austin, Austin, Texas 78712, United States
- Materials Science and Engineering Program, the University of Texas at Austin, Austin, Texas 78712, United States
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Sun Z, Wang D, Xiang J. Self-bridging of vertical silicon nanowires and a universal capacitive force model for spontaneous attraction in nanostructures. ACS NANO 2014; 8:11261-11267. [PMID: 25329454 DOI: 10.1021/nn503924s] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Spontaneous attractions between free-standing nanostructures have often caused adhesion or stiction that affects a wide range of nanoscale devices, particularly nano/microelectromechanical systems. Previous understandings of the attraction mechanisms have included capillary force, van der Waals/Casimir forces, and surface polar charges. However, none of these mechanisms universally applies to simple semiconductor structures such as silicon nanowire arrays that often exhibit bunching or adhesions. Here we propose a simple capacitive force model to quantitatively study the universal spontaneous attraction that often causes stiction among semiconductor or metallic nanostructures such as vertical nanowire arrays with inevitably nonuniform size variations due to fabrication. When nanostructures are uniform in size, they share the same substrate potential. The presence of slight size differences will break the symmetry in the capacitive network formed between the nanowires, substrate, and their environment, giving rise to electrostatic attraction forces due to the relative potential difference between neighboring wires. Our model is experimentally verified using arrays of vertical silicon nanowire pairs with varied spacing, diameter, and size differences. Threshold nanowire spacing, diameter, or size difference between the nearest neighbors has been identified beyond which the nanowires start to exhibit spontaneous attraction that leads to bridging when electrostatic forces overcome elastic restoration forces. This work illustrates a universal understanding of spontaneous attraction that will impact the design, fabrication, and reliable operation of nanoscale devices and systems.
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Affiliation(s)
- Zhelin Sun
- Department of Electrical and Computer Engineering, ‡Materials Science and Engineering Program, and §Qualcomm Institute, University of California-San Diego , La Jolla, California 92093, United States
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Arcamone J, Dupré C, Arndt G, Colinet E, Hentz S, Ollier E, Duraffourg L. VHF NEMS-CMOS piezoresistive resonators for advanced sensing applications. NANOTECHNOLOGY 2014; 25:435501. [PMID: 25288224 DOI: 10.1088/0957-4484/25/43/435501] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
This work reports on top-down nanoelectromechanical resonators, which are among the smallest resonators listed in the literature. To overcome the fact that their electromechanical transduction is intrinsically very challenging due to their very high frequency (100 MHz) and ultimate size (each resonator is a 1.2 μm long, 100 nm wide, 20 nm thick silicon beam with 100 nm long and 30 nm wide piezoresistive lateral nanowire gauges), they have been monolithically integrated with an advanced fully depleted SOI CMOS technology. By advantageously combining the unique benefits of nanomechanics and nanoelectronics, this hybrid NEMS-CMOS device paves the way for novel breakthrough applications, such as NEMS-based mass spectrometry or hybrid NEMS/CMOS logic, which cannot be fully implemented without this association.
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Affiliation(s)
- Julien Arcamone
- Univ. Grenoble Alpes, F-38000 Grenoble, France. CEA, LETI, Minatec Campus, 17 rue des Martyrs, F-38054 Grenoble, France
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Kim MW, Song YH, Ko SD, Ahn SJ, Yoon JB. Ultra-low voltage MEMS switch using a folded hinge structure. MICRO AND NANO SYSTEMS LETTERS 2014. [DOI: 10.1186/s40486-014-0002-y] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Abstract
Abstract
An ultra-low voltage microelectromechanical system (MEMS) switch for low-power integrated circuit (IC) applications is proposed, fabricated and demonstrated. The folded hinge structure allows a large beam structure to be suspended with a designed air gap, effectively suppressing unwanted deflection. The actuation voltage of the switch was measured to be 1.7 V, the lowest among electrostatic switches. There was no variation in the actuation voltage until 106 cyclic actuations, showing the stability of a low actuation voltage in electrostatic actuation for the first time. The contact resistance was around 12 Ω, caused by a low contact force below 1 μN despite an Au–Au contact.
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Masuduzzaman M, Alam MA. Effective nanometer airgap of NEMS devices using negative capacitance of ferroelectric materials. NANO LETTERS 2014; 14:3160-3165. [PMID: 24797732 DOI: 10.1021/nl5004416] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Nanoelectromechnical system (NEMS) is seen as one of the most promising candidates for next generation extreme low power electronics that can operate as a versatile switch/memory/sensor/display element. One of the main challenges toward this goal lies in the fabrication difficulties of ultrascaled NEMS required for high density integrated circuits. It is generally understood that fabricating and operating a NEMS with an airgap below a few nanometer will be extremely challenging due to surface roughness, nonideal forces, tunneling, etc. Here, we show that by cascading a NEMS with a ferroelectric capacitor, operating in the negative capacitance regime, the effective airgap can be reduced by almost an order of magnitude, without the need to reduce the airgap physically. This would not only reduce the pull-in voltage to sub-1 V regime, but also would offer a set of characteristics which are difficult/impossible to achieve otherwise. For example, one can reduce/increase the classical travel range, flip the traditional stable-unstable regime of the electrode, get a negative pull-out voltage, and thus, center the hysteresis around zero volt. Moreover, one can also operate the combination as an effective ferroelectric memory with much reduced switching voltages. These characteristics promise dramatic saving in power for NEMS-based switching, memory, and other related applications.
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Affiliation(s)
- Muhammad Masuduzzaman
- School of Electrical and Computer Engineering, Purdue University , West Lafayette, Indiana 47907, United States
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Qian Y, Soon BW, Singh P, Campanella H, Lee C. All metal nanoelectromechanical switch working at 300 °C for rugged electronics applications. NANOSCALE 2014; 6:5606-11. [PMID: 24741680 DOI: 10.1039/c3nr05255a] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
An all metal based electrostatic nanoelectromechanical switch has been fabricated using a one mask process. High temperature cycling behavior is demonstrated in a vacuum chamber at 300 °C for more than 28 hours. The compelling results indicate that the design is promising for the realization of rugged electronics with three-dimensional integration.
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Affiliation(s)
- You Qian
- Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576.
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Kim JH, Chen ZCY, Kwon S, Xiang J. Three-terminal nanoelectromechanical field effect transistor with abrupt subthreshold slope. NANO LETTERS 2014; 14:1687-1691. [PMID: 24568680 DOI: 10.1021/nl5006355] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We report the first experimental demonstration of a three-terminal nanoelectromechanical field effect transistor (NEMFET) with measurable subthreshold slope as small as 6 mV/dec at room temperature and a switching voltage window of under 2 V. The device operates by modulating drain current through a suspended nanowire channel via an insulated gate electrode, thus eliminating the need for a conducting moving electrode, and yields devices that reliably switch on/off for up to 130 cycles. Radio-frequency measurements have confirmed operation at 125 MHz. Our measurements and simulations suggest that the NEMFET design is scalable toward sub-1 V ultrahigh-frequency operation for future low-power computing systems.
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Affiliation(s)
- Ji-Hun Kim
- Department of Electrical and Computer Engineering and ‡Materials Science and Engineering Program, University of California, San Diego , 9500 Gilman Dr., La Jolla, California 92093-0407, United States
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