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Mudgal R, Jakhar A, Gupta P, Yadav RS, Biswal B, Sahu P, Bangar H, Kumar A, Chowdhury N, Satpati B, Kumar Nanda BR, Satpathy S, Das S, Muduli PK. Magnetic-Proximity-Induced Efficient Charge-to-Spin Conversion in Large-Area PtSe 2/Ni 80Fe 20 Heterostructures. Nano Lett 2023; 23:11925-11931. [PMID: 38088819 DOI: 10.1021/acs.nanolett.3c04060] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/28/2023]
Abstract
As a topological Dirac semimetal with controllable spin-orbit coupling and conductivity, PtSe2, a transition-metal dichalcogenide, is a promising material for several applications, from optoelectrics to sensors. However, its potential for spintronics applications has yet to be explored. In this work, we demonstrate that the PtSe2/Ni80Fe20 heterostructure can generate large damping-like current-induced spin-orbit torques (SOT), despite the absence of spin-splitting in bulk PtSe2. The efficiency of charge-to-spin conversion is found to be -0.1 ± 0.02 nm-1 in PtSe2/Ni80Fe20, which is 3 times that of the control sample, Ni80Fe20/Pt. Our band structure calculations show that the SOT due to PtSe2 arises from an unexpectedly large spin splitting in the interfacial region of PtSe2 introduced by the proximity magnetic field of the Ni80Fe20 layer. Our results open up the possibilities of using large-area PtSe2 for energy-efficient nanoscale devices by utilizing proximity-induced SOT.
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Affiliation(s)
- Richa Mudgal
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Alka Jakhar
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Pankhuri Gupta
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Ram Singh Yadav
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Bubunu Biswal
- Condensed Matter Theory and Computational Lab, Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
- Center for Atomistic Modelling and Materials Design, Indian Institute of Technology Madras, Chennai 600036, India
| | - Pratik Sahu
- Condensed Matter Theory and Computational Lab, Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
- Department of Physics & Astronomy, University of Missouri, Columbia, Missouri 65211, United States
| | - Himanshu Bangar
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Akash Kumar
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
- Department of Physics, University of Gothenburg, Gothenburg 412 96, Sweden
| | - Niru Chowdhury
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Biswarup Satpati
- Surface Physics & Material Science Division, Saha Institute of Nuclear Physics, A CI of Homi Bhabha National Institute, 1/AF Bidhannagar, Kolkata 700064, India
| | - Birabar Ranjit Kumar Nanda
- Condensed Matter Theory and Computational Lab, Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
- Center for Atomistic Modelling and Materials Design, Indian Institute of Technology Madras, Chennai 600036, India
| | - Sashi Satpathy
- Condensed Matter Theory and Computational Lab, Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
- Center for Atomistic Modelling and Materials Design, Indian Institute of Technology Madras, Chennai 600036, India
- Department of Physics & Astronomy, University of Missouri, Columbia, Missouri 65211, United States
| | - Samaresh Das
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
| | - Pranaba Kishor Muduli
- Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
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Sandhu HK, John JW, Jakhar A, Sharma A, Jain A, Das S. Self-powered, low-noise and high-speed nanolayered MoSe 2/p-GaN heterojunction photodetector from ultraviolet to near-infrared wavelengths. Nanotechnology 2022; 33:305201. [PMID: 35439737 DOI: 10.1088/1361-6528/ac6817] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/28/2022] [Accepted: 04/18/2022] [Indexed: 06/14/2023]
Abstract
Integration of nanolayered metal chalcogenides with wide-bandgap semiconductors forming pn heterojunction leads to the way of high-performance photodetection. This work demonstrates the fabrication of a few nanometer thick Molybdenum diselenide (MoSe2)/Mg-doped Gallium Nitride (p-GaN) heterostructure for light detection purposes. The device exhibits low noise broadband spectral response from ultraviolet to near-infrared range (300-950 nm). The band-alignment and the charge transfer at the MoSe2/p-GaN interface promote self-powered photodetection with high photocurrent to dark current ratio of 2000 and 1000 at 365 nm and 640 nm, respectively. A high responsivity of 130 A W-1, detectivity of 4.8 × 1010Jones, and low noise equivalent power of 18 fW/Hz1/2at 365 nm is achieved at an applied bias of 1 V. Moreover, the transient measurements reveal a fast rise/fall time of 407/710μsec for the fabricated device. These outcomes exemplify the viability of MoSe2/p-GaN heterostructure for high-speed and low-noise broadband photodetector applications.
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Affiliation(s)
- Harmanpreet Kaur Sandhu
- Centre for Applied Research in Electronics, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India
- Solid State Physics Laboratory, Lucknow Road, Timarpur, Delhi-110054, India
| | - John Wellington John
- Centre for Applied Research in Electronics, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India
| | - Alka Jakhar
- Centre for Applied Research in Electronics, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India
| | - Abhishek Sharma
- Solid State Physics Laboratory, Lucknow Road, Timarpur, Delhi-110054, India
| | - Alok Jain
- Solid State Physics Laboratory, Lucknow Road, Timarpur, Delhi-110054, India
- Centre for Personnel Talent Management, Metcalfe House, Delhi-110054, India
| | - Samaresh Das
- Centre for Applied Research in Electronics, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India
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Jakhar A, Kumar P, Husain S, Dhyani V, Chouksey A, Rai PK, Rawat JS, Das S. Bilayer MoS2 on silicon for higher terahertz amplitude modulation. Nano Ex 2021. [DOI: 10.1088/2632-959x/ac1ef6] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/29/2023]
Abstract
Abstract
The terahertz (THz) amplitude modulation has been experimentally demonstrated by employing bilayer molybdenum disulfide (MoS2) on high-resistivity silicon (Si). The Raman spectroscopy and x-ray photoelectron spectra confirm the formation of bilayer MoS2 film. The THz transmission measurements are carried out using a continuous wave (CW) frequency-domain THz system. This reveals the higher modulation depth covering wide THz spectra of 0.1–1 THz at low optical pumping power. The modulation depth up to 72.3% at 0.1 THz and 62.8% at 0.9 THz under low power optical excitation is achieved. After annealing, the strong built-in electric field is induced at the MoS2–Si interface due to p-type doping in MoS2. This improves modulation depth to 86.4% and 79.7%, respectively. The finite-difference time-domain (FDTD) based numerical simulations match well with the experimental results. The higher modulation depth at low optical power, broadband response, low insertion losses, and simplicity in the design are the key attributes of this THz modulator.
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John JW, Dhyani V, Singh S, Jakhar A, Sarkar A, Das S, Ray SK. Low-noise, high-detectivity, polarization-sensitive, room-temperature infrared photodetectors based on Ge quantum dot-decorated Si-on-insulator nanowire field-effect transistors. Nanotechnology 2021; 32:315205. [PMID: 33845466 DOI: 10.1088/1361-6528/abf6f0] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/25/2021] [Accepted: 04/12/2021] [Indexed: 06/12/2023]
Abstract
A CMOS-compatible infrared (IR; 1200-1700 nm) detector based on Ge quantum dots (QDs) decorated on a single Si-nanowire channel on a silicon-on-insulator (SOI) platform with a superior detectivity at room temperature is presented. The spectral response of a single nanowire device measured in a back-gated field-effect transistor geometry displays a very high value of peak detectivity ∼9.33 × 1011Jones at ∼1500 nm with a relatively low dark current (∼20 pA), which is attributed to the fully depleted Si nanowire channel on SOI substrates. The noise power spectrum of the devices exhibits a1/fγ,with the exponent,γshowing two different values of 0.9 and 1.8 owing to mobility fluctuations and generation-recombination of carriers, respectively. Ge QD-decorated nanowire devices exhibit a novel polarization anisotropy with a remarkably high photoconductive gain of ∼104. The superior performance of a Ge QDs/Si nanowire phototransistor in IR wavelengths is potentially attractive to integrate electro-optical devices into Si for on-chip optical communications.
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Affiliation(s)
- John Wellington John
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110061, India
| | - Veerendra Dhyani
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110061, India
| | - Sudarshan Singh
- Department of Physics, Indian Institute of Technology Kharagpur, Kharagpur-721302, India
| | - Alka Jakhar
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110061, India
| | - Arijit Sarkar
- Advanced Technology Development Center, Indian Institute of Technology Kharagpur, Kharagpur-721302, India
| | - Samaresh Das
- Center for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110061, India
| | - Samit K Ray
- Department of Physics, Indian Institute of Technology Kharagpur, Kharagpur-721302, India
- S N Bose National Centre for Basic Sciences, Salt Lake City, Kolkata-106, India
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