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For: Giannuzzi L, Stevie F. A review of focused ion beam milling techniques for TEM specimen preparation. Micron 1999;30:197-204. [DOI: 10.1016/s0968-4328(99)00005-0] [Citation(s) in RCA: 852] [Impact Index Per Article: 32.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
Number Cited by Other Article(s)
101
Li L, Xie L, Pan X. Real-time studies of ferroelectric domain switching: a review. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2019;82:126502. [PMID: 31185460 DOI: 10.1088/1361-6633/ab28de] [Citation(s) in RCA: 27] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
102
Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. MICROMACHINES 2019;10:mi10120799. [PMID: 31766480 PMCID: PMC6952801 DOI: 10.3390/mi10120799] [Citation(s) in RCA: 22] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/22/2019] [Revised: 11/14/2019] [Accepted: 11/18/2019] [Indexed: 11/17/2022]
103
GVK SS, Liu Z, Tan M. Fatigue behavior in Co–Cr–Ni–Mo medical wires drawn with different drawing practices. J Mech Behav Biomed Mater 2019;99:134-152. [DOI: 10.1016/j.jmbbm.2019.07.027] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/25/2019] [Revised: 05/05/2019] [Accepted: 07/22/2019] [Indexed: 10/26/2022]
104
Corbey JF, Reilly DD, Sweet LE, Lach TG. Extraction of plutonium-containing microcrystals from Hanford soil using a focused ion beam for single-crystal X-ray diffraction analysis. J Appl Crystallogr 2019. [DOI: 10.1107/s1600576719012299] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]  Open
105
Wolff N, Hrkac V, Ditto JJ, Duppel V, Mishra YK, Johnson DC, Adelung R, Kienle L. Crystallography at the nanoscale: planar defects in ZnO nanospikes. J Appl Crystallogr 2019;52:1009-1015. [PMID: 31636519 PMCID: PMC6782080 DOI: 10.1107/s1600576719009415] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/12/2019] [Accepted: 07/01/2019] [Indexed: 11/10/2022]  Open
106
Zhong C, Lin L, Qi R, Cheng Y, Gao X, Huang R. Plan-view sample preparation of a buried nanodots array by FIB with accurate EDS positioning in thickness direction. Ultramicroscopy 2019;207:112840. [PMID: 31505397 DOI: 10.1016/j.ultramic.2019.112840] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/14/2019] [Revised: 07/23/2019] [Accepted: 09/02/2019] [Indexed: 11/18/2022]
107
In Situ Preparation of Pr1-xCaxMnO3 and La1-xSrxMnO3 Catalysts Surface for High-Resolution Environmental Transmission Electron Microscopy. Catalysts 2019. [DOI: 10.3390/catal9090751] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]  Open
108
Priebe A, Barnes JP, Edwards TEJ, Pethö L, Balogh I, Michler J. 3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX. Anal Chem 2019;91:11834-11839. [DOI: 10.1021/acs.analchem.9b02545] [Citation(s) in RCA: 20] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
109
Udupa A, Zhu J, Goddard LL. Voxelized topology optimization for fabrication-compatible inverse design of 3D photonic devices. OPTICS EXPRESS 2019;27:21988-21998. [PMID: 31510263 DOI: 10.1364/oe.27.021988] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/15/2019] [Accepted: 07/05/2019] [Indexed: 06/10/2023]
110
An BS, Kwon Y, Oh JS, Shin YJ, Ju JS, Yang CW. Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system. Appl Microsc 2019;49:6. [PMID: 33580325 PMCID: PMC7818281 DOI: 10.1186/s42649-019-0008-2] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/13/2019] [Accepted: 06/18/2019] [Indexed: 11/30/2022]  Open
111
Nicolai L, Gačević Ž, Calleja E, Trampert A. Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires. NANOSCALE RESEARCH LETTERS 2019;14:232. [PMID: 31300916 PMCID: PMC6626086 DOI: 10.1186/s11671-019-3072-1] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/10/2019] [Accepted: 07/01/2019] [Indexed: 06/10/2023]
112
Sundell G, Hulander M, Pihl A, Andersson M. Atom Probe Tomography for 3D Structural and Chemical Analysis of Individual Proteins. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2019;15:e1900316. [PMID: 31058464 DOI: 10.1002/smll.201900316] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/18/2019] [Revised: 04/01/2019] [Indexed: 06/09/2023]
113
Ivanov YP, Soltan S, Albrecht J, Goering E, Schütz G, Zhang Z, Chuvilin A. The Route to Supercurrent Transparent Ferromagnetic Barriers in Superconducting Matrix. ACS NANO 2019;13:5655-5661. [PMID: 30977633 PMCID: PMC8830211 DOI: 10.1021/acsnano.9b00888] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/31/2019] [Accepted: 04/12/2019] [Indexed: 06/09/2023]
114
Electron beam damage of epoxy resin films studied by scanning transmission X-ray spectromicroscopy. Micron 2019;120:74-79. [DOI: 10.1016/j.micron.2019.02.003] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/03/2018] [Revised: 02/05/2019] [Accepted: 02/06/2019] [Indexed: 11/18/2022]
115
Kizilyaprak C, Stierhof YD, Humbel BM. Volume microscopy in biology: FIB-SEM tomography. Tissue Cell 2019;57:123-128. [DOI: 10.1016/j.tice.2018.09.006] [Citation(s) in RCA: 21] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/06/2018] [Revised: 08/30/2018] [Accepted: 09/20/2018] [Indexed: 01/10/2023]
116
Kim E, Agarwal S, Kim N, Hage FS, Leonardo V, Gelmi A, Stevens MM. Bioinspired Fabrication of DNA-Inorganic Hybrid Composites Using Synthetic DNA. ACS NANO 2019;13:2888-2900. [PMID: 30741535 PMCID: PMC6439439 DOI: 10.1021/acsnano.8b06492] [Citation(s) in RCA: 54] [Impact Index Per Article: 9.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/25/2018] [Accepted: 02/06/2019] [Indexed: 05/19/2023]
117
Examination of focused ion beam-induced damage during platinum deposition in the near-surface region of an aerospace aluminum alloy. Micron 2019;118:43-49. [PMID: 30583220 DOI: 10.1016/j.micron.2018.12.004] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/24/2018] [Revised: 12/10/2018] [Accepted: 12/10/2018] [Indexed: 11/23/2022]
118
Harlow W, Taheri ML. Toward 3D imaging of corrosion at the nanoscale: Cross-sectional analysis of in-situ oxidized TEM samples. Micron 2019;120:91-95. [PMID: 30807984 DOI: 10.1016/j.micron.2019.02.008] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/27/2018] [Revised: 02/16/2019] [Accepted: 02/19/2019] [Indexed: 11/25/2022]
119
Ivanov YP, Leliaert J, Crespo A, Pancaldi M, Tollan C, Kosel J, Chuvilin A, Vavassori P. Design of Intense Nanoscale Stray Fields and Gradients at Magnetic Nanorod Interfaces. ACS APPLIED MATERIALS & INTERFACES 2019;11:4678-4685. [PMID: 30607950 DOI: 10.1021/acsami.8b19873] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
120
Collection of Continuous Rotation MicroED Data from Ion Beam-Milled Crystals of Any Size. Structure 2019;27:545-548.e2. [PMID: 30661853 DOI: 10.1016/j.str.2018.12.003] [Citation(s) in RCA: 57] [Impact Index Per Article: 9.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/05/2018] [Revised: 11/19/2018] [Accepted: 12/05/2018] [Indexed: 11/22/2022]
121
Measuring the mean inner potential of Al2O3 sapphire using off-axis electron holography. Ultramicroscopy 2019;198:18-25. [PMID: 30634077 DOI: 10.1016/j.ultramic.2018.12.017] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/13/2018] [Revised: 11/15/2018] [Accepted: 12/29/2018] [Indexed: 11/24/2022]
122
Plitzko J, Baumeister WP. Cryo-Electron Tomography. SPRINGER HANDBOOK OF MICROSCOPY 2019. [DOI: 10.1007/978-3-030-00069-1_4] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/04/2023]
123
Tsui TY, Logan M, Moussa HI, Aucoin MG. What's Happening on the Other Side? Revealing Nano-Meter Scale Features of Mammalian Cells on Engineered Textured Tantalum Surfaces. MATERIALS (BASEL, SWITZERLAND) 2018;12:E114. [PMID: 30602684 PMCID: PMC6337376 DOI: 10.3390/ma12010114] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/15/2018] [Revised: 12/21/2018] [Accepted: 12/21/2018] [Indexed: 12/14/2022]
124
Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method. Appl Microsc 2018. [DOI: 10.9729/am.2018.48.4.122] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]  Open
125
Sharma S, Shyam Kumar CN, Korvink JG, Kübel C. Evolution of Glassy Carbon Microstructure: In Situ Transmission Electron Microscopy of the Pyrolysis Process. Sci Rep 2018;8:16282. [PMID: 30389995 PMCID: PMC6214944 DOI: 10.1038/s41598-018-34644-9] [Citation(s) in RCA: 29] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/20/2018] [Accepted: 10/22/2018] [Indexed: 11/17/2022]  Open
126
Moatti A, Sachan R, Prater J, Narayan J. An optimized sample preparation approach for atomic resolution in situ studies of thin films. Microsc Res Tech 2018;81:1250-1256. [PMID: 30368970 DOI: 10.1002/jemt.23130] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/23/2018] [Revised: 08/03/2018] [Accepted: 08/21/2018] [Indexed: 11/07/2022]
127
Lamellar orientation in isotactic polypropylene thin films: a complement study via grazing incidence X-ray diffraction and surface/cross-sectional imaging. Polym J 2018. [DOI: 10.1038/s41428-018-0138-3] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
128
Dai C, Agarwal K, Cho JH. Ion-Induced Localized Nanoscale Polymer Reflow for Three-Dimensional Self-Assembly. ACS NANO 2018;12:10251-10261. [PMID: 30207695 DOI: 10.1021/acsnano.8b05283] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
129
Li Y, Li Y, Cui Y. Catalyst: How Cryo-EM Shapes the Development of Next-Generation Batteries. Chem 2018. [DOI: 10.1016/j.chempr.2018.09.007] [Citation(s) in RCA: 18] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
130
Hanif I, Camara O, Tunes MA, Harrison RW, Greaves G, Donnelly SE, Hinks JA. Ion-beam-induced bending of semiconductor nanowires. NANOTECHNOLOGY 2018;29:335701. [PMID: 29781443 DOI: 10.1088/1361-6528/aac659] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
131
Electron Microscopy and Spectroscopy in the Analysis of Friction and Wear Mechanisms. LUBRICANTS 2018. [DOI: 10.3390/lubricants6030058] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
132
Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography. Ultramicroscopy 2018;190:1-11. [DOI: 10.1016/j.ultramic.2018.04.002] [Citation(s) in RCA: 50] [Impact Index Per Article: 7.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/12/2017] [Revised: 03/28/2018] [Accepted: 04/04/2018] [Indexed: 01/11/2023]
133
Hao Q, Xu D, Zhao H, Xiao Y, Medina FJ. Thermal Studies of Nanoporous Si Films with Pitches on the Order of 100 nm -Comparison between Different Pore-Drilling Techniques. Sci Rep 2018;8:9056. [PMID: 29899343 PMCID: PMC5998148 DOI: 10.1038/s41598-018-26872-w] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/05/2018] [Accepted: 05/15/2018] [Indexed: 11/09/2022]  Open
134
Garten LM, Dwaraknath S, Walker J, Mangum JS, Ndione PF, Park Y, Beaton DA, Gopalan V, Gorman BP, Schelhas LT, Toney MF, Trolier-McKinstry S, Persson KA, Ginley DS. Theory-Guided Synthesis of a Metastable Lead-Free Piezoelectric Polymorph. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018;30:e1800559. [PMID: 29744947 DOI: 10.1002/adma.201800559] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/25/2018] [Revised: 03/11/2018] [Indexed: 06/08/2023]
135
The coupling effect of slow-rate mechanical motion on the confined etching process in electrochemical mechanical micromachining. Sci China Chem 2018. [DOI: 10.1007/s11426-017-9195-3] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/17/2022]
136
Frank A, Changizi R, Scheu C. Challenges in TEM sample preparation of solvothermally grown CuInS2 films. Micron 2018;109:1-10. [PMID: 29604549 DOI: 10.1016/j.micron.2018.03.003] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/13/2017] [Revised: 03/16/2018] [Accepted: 03/16/2018] [Indexed: 11/28/2022]
137
Zhang L, Liu PF, Li YH, Zu MY, Li X, Jiang Z, Wang Y, Zhao H, Yang HG. N-Modified NiO Surface for Superior Alkaline Hydrogen Evolution. CHEMSUSCHEM 2018;11:1020-1024. [PMID: 29345435 DOI: 10.1002/cssc.201702371] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/14/2017] [Revised: 12/09/2018] [Indexed: 06/07/2023]
138
Mangum JS, Chan LH, Schmidt U, Garten LM, Ginley DS, Gorman BP. Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphs. Ultramicroscopy 2018;188:48-51. [PMID: 29549789 DOI: 10.1016/j.ultramic.2018.02.007] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/12/2017] [Revised: 02/20/2018] [Accepted: 02/22/2018] [Indexed: 11/19/2022]
139
TEM Sample Preparation Using Focused Ion Beam - Capabilities And Limits. ACTA ACUST UNITED AC 2018. [DOI: 10.1017/s1551929500052457] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
140
Aramesh M, Mayamei Y, Wolff A, Ostrikov KK. Superplastic nanoscale pore shaping by ion irradiation. Nat Commun 2018;9:835. [PMID: 29483582 PMCID: PMC5827561 DOI: 10.1038/s41467-018-03316-7] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2017] [Accepted: 02/05/2018] [Indexed: 11/11/2022]  Open
141
Azarsa P, Gupta R. Specimen preparation for nano-scale investigation of cementitious repair material. Micron 2018;107:43-54. [PMID: 29414135 DOI: 10.1016/j.micron.2018.01.007] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/31/2017] [Revised: 01/17/2018] [Accepted: 01/17/2018] [Indexed: 11/30/2022]
142
Li C, Habler G, Baldwin LC, Abart R. An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry. Ultramicroscopy 2018;184:310-317. [PMID: 29096249 DOI: 10.1016/j.ultramic.2017.09.011] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/30/2017] [Revised: 09/19/2017] [Accepted: 09/26/2017] [Indexed: 10/18/2022]
143
Zhang K, Dong T, Xie G, Guan L, Guo B, Xiang Q, Dai Y, Tian L, Batool A, Jan SU, Boddula R, Thebo AA, Gong JR. Sacrificial Interlayer for Promoting Charge Transport in Hematite Photoanode. ACS APPLIED MATERIALS & INTERFACES 2017;9:42723-42733. [PMID: 29193959 DOI: 10.1021/acsami.7b13163] [Citation(s) in RCA: 21] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
144
Haggerty JES, Schelhas LT, Kitchaev DA, Mangum JS, Garten LM, Sun W, Stone KH, Perkins JD, Toney MF, Ceder G, Ginley DS, Gorman BP, Tate J. High-fraction brookite films from amorphous precursors. Sci Rep 2017;7:15232. [PMID: 29123137 PMCID: PMC5680313 DOI: 10.1038/s41598-017-15364-y] [Citation(s) in RCA: 23] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/07/2017] [Accepted: 10/25/2017] [Indexed: 11/26/2022]  Open
145
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses. Ultramicroscopy 2017;184:284-292. [PMID: 29054043 DOI: 10.1016/j.ultramic.2017.10.007] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/21/2017] [Revised: 10/06/2017] [Accepted: 10/10/2017] [Indexed: 11/21/2022]
146
Lee JG, An S, Kim TG, Kim MW, Jo HS, Swihart MT, Yarin AL, Yoon SS. Self-Cleaning Anticondensing Glass via Supersonic Spraying of Silver Nanowires, Silica, and Polystyrene Nanoparticles. ACS APPLIED MATERIALS & INTERFACES 2017;9:35325-35332. [PMID: 28945338 DOI: 10.1021/acsami.7b10013] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
147
Optimized pre-thinning procedures of ion-beam thinning for TEM sample preparation by magnetorheological polishing. Ultramicroscopy 2017;181:165-172. [DOI: 10.1016/j.ultramic.2017.05.016] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/22/2016] [Revised: 03/25/2017] [Accepted: 05/19/2017] [Indexed: 11/23/2022]
148
Detecting dynamic responses of materials and devices under an alternating electric potential by phase-locked transmission electron microscopy. Ultramicroscopy 2017;181:27-41. [DOI: 10.1016/j.ultramic.2017.04.018] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/22/2016] [Revised: 04/19/2017] [Accepted: 04/28/2017] [Indexed: 11/18/2022]
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Custom-Designed Glassy Carbon Tips for Atomic Force Microscopy. MICROMACHINES 2017;8:mi8090285. [PMID: 30400475 PMCID: PMC6190046 DOI: 10.3390/mi8090285] [Citation(s) in RCA: 24] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/21/2017] [Revised: 09/08/2017] [Accepted: 09/16/2017] [Indexed: 11/29/2022]
150
Shin K, Lee H, Sung M, Lee SH, Shin H, Moon W. A scanning probe mounted on a field-effect transistor: Characterization of ion damage in Si. Micron 2017;101:197-205. [PMID: 28797948 DOI: 10.1016/j.micron.2017.07.011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/01/2017] [Revised: 07/21/2017] [Accepted: 07/21/2017] [Indexed: 10/19/2022]
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