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Soliman M, Marchand C, Mahmoudi A, Kumar Rajak N, Taniguchi T, Watanabe K, Gloppe A, Doudin B, Deleruyelle D, O'Connor I, Ouerghi A, Dayen JF. Van der Waals Inverted-Floating-Gate Transistors for Artificial Intelligence Electronics. ACS NANO 2025; 19:18757-18768. [PMID: 40353365 DOI: 10.1021/acsnano.5c03875] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2025]
Abstract
An inverted floating gate device architecture is introduced, demonstrated with all-van-der-Waals technology, targeting both logic and neuromorphic circuits. Integrating a top polymorphic multilayer graphene floating gate improves the electrostatic coupling to the ReS2 semiconductor channel by facilitating efficient dynamic conductance tuning and enabling dual-mode reconfigurable logic and memory operations. The non-volatile capability is used to implement compact logic gates for in-memory computing. The device is also shown to emulate synaptic plasticity, with an accuracy of 92% demonstrated in simple artificial neural network simulations. Moreover, spiking neuron circuits for neural networks through a five-transistor design makes it a versatile building block for artificial intelligence electronics. These findings demonstrate the potential of hybrid integration of van der Waals materials to address the limitations of traditional semiconductor technologies and become key to developments of next-generation electronics.
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Affiliation(s)
- Mohamed Soliman
- Université de Strasbourg, IPCMS-CNRS UMR 7504, 23 Rue du Loess, Strasbourg 67034, France
| | - Cédric Marchand
- Centrale Lyon, INSA Lyon, CNRS, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Ecully 69134, France
| | - Aymen Mahmoudi
- CNRS, Centre de Nanosciences et de Nanotechnologies, Université Paris-Saclay, Palaiseau 91120, France
| | - Neeraj Kumar Rajak
- Université de Strasbourg, IPCMS-CNRS UMR 7504, 23 Rue du Loess, Strasbourg 67034, France
| | - Takashi Taniguchi
- Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Kenji Watanabe
- Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Arnaud Gloppe
- Université de Strasbourg, IPCMS-CNRS UMR 7504, 23 Rue du Loess, Strasbourg 67034, France
| | - Bernard Doudin
- Université de Strasbourg, IPCMS-CNRS UMR 7504, 23 Rue du Loess, Strasbourg 67034, France
| | - Damien Deleruyelle
- INSA Lyon, Centrale Lyon, CNRS, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Villeurbanne 69621, France
| | - Ian O'Connor
- Centrale Lyon, INSA Lyon, CNRS, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Ecully 69134, France
| | - Abdelkarim Ouerghi
- CNRS, Centre de Nanosciences et de Nanotechnologies, Université Paris-Saclay, Palaiseau 91120, France
| | - Jean-Francois Dayen
- Université de Strasbourg, IPCMS-CNRS UMR 7504, 23 Rue du Loess, Strasbourg 67034, France
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2
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Li P, Sa Z, Zang Z, Wang G, Wang M, Liao L, Chen F, Yang ZX. Light-induced tunable threshold voltage and synaptic behavior of a solution-processed indium oxide thin film transistor for logic computing and image denoising. MATERIALS HORIZONS 2025. [PMID: 40351168 DOI: 10.1039/d5mh00102a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2025]
Abstract
Oxygen vacancies (VO) play a crucial role in promising amorphous metal oxide films for next-generation logic and synaptic computing. Here, a simple and reversible annealing-illumination method is introduced to control the concentration of VO in solution-processed amorphous indium oxide thin-film transistors (TFTs), resulting in the precise regulation of the threshold voltage (VTH) in a large range from 1.6 V to -21.7 V. Meanwhile, clear photo-synaptic behaviors are observed. These impressive behaviors result from the VO-related carrier trapping and detrapping processes. With the precise regulation of VTH by illumination, the TFTs are constructed as inverters, displaying tunable voltage gains from 5.7 to 10.6. Owing to the excellent photo-synaptic behavior, the TFTs are employed to demonstrate the optoelectronic logic functions of "OR", "AND", "NOR", and "NAND". Moreover, a 5 × 5 TFTs array is employed to demonstrate the real-time image preprocessing and image denoising functions, displaying an impressive accuracy of 96%. Furthermore, the improvement of the recognition accuracy will increase to a maximum value of 88%. This work shows the potential of amorphous indium oxide TFTs in future multifunctional logic circuits and efficient, all-optical neuromorphic vision systems.
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Affiliation(s)
- Pengsheng Li
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Zixu Sa
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Zeqi Zang
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Guangcan Wang
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Mingxu Wang
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Lei Liao
- College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, 410082, China.
| | - Feng Chen
- School of Physics, Shandong University, Jinan 2510100, China.
| | - Zai-Xing Yang
- School of Physics, Shandong University, Jinan 2510100, China.
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3
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Fan X, Yi J, Deng B, Zhou C, Zhang Z, Yu J, Li W, Li C, Wu G, Zhou X, Sun T, Zhu Y, Zhou J, Xia J, Wang Z, Lai K, Peng Z, Li D, Pan A, Zhou Y. 2D edge-seeded heteroepitaxy of ultrathin high-κ dielectric CaNb 2O 6 for 2D field-effect transistors. Nat Commun 2025; 16:2585. [PMID: 40090951 PMCID: PMC11911405 DOI: 10.1038/s41467-025-57773-y] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/21/2024] [Accepted: 03/04/2025] [Indexed: 03/19/2025] Open
Abstract
The experimental realization of single-crystalline high-κ dielectrics beyond two-dimensional (2D) layered materials is highly desirable for nanoscale field-effect transistors (FETs). However, the scalable synthesis of 2D nonlayered high-κ insulators is currently limited by uncontrolled isotropic three-dimensional growth, hampering the achievement of simultaneous high dielectric constants and low trap densities for small film thicknesses. Herein, we show a 2D edge-seeded heteroepitaxial strategy to synthesize ultrathin nonlayered 2D CaNb2O6 nanosheets by chemical vapor deposition, exhibiting high-crystalline quality, thickness-independent dielectric constant (~ 16) and breakdown field strength up to ~ 12 MV cm-1. The MoS2/CaNb2O6 FETs exhibit an on/off ratio of over ~ 107, a subthreshold swing down to 61 mV/dec and a negligible hysteresis. This work suggests a universal 2D edge-seeded heteroepitaxy and slow kinetic strategy for the scalable growth of 2D nonlayered dielectric and demonstrates 2D CaNb2O6 nanosheets as promising dielectrics for facilitating 2D electronic applications.
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Affiliation(s)
- Xiulian Fan
- School of Physics, State Key Laboratory of Powder Metallurgy, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha, Hunan, China
| | - Jiali Yi
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, Hunan, China
- School of Physics and Electronics, Hunan Normal University, Changsha, China
| | - Bin Deng
- Center for Electron Microscopy, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou, China
| | - Cong Zhou
- Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, China
| | - Zejuan Zhang
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, China
| | - Jia Yu
- Department of Physics, University of Texas at Austin, Austin, TX, USA
| | - Weihan Li
- Department of Mechanical and Materials Engineering, Western University, London, ON, Canada
| | - Cheng Li
- School of Physics, State Key Laboratory of Powder Metallurgy, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha, Hunan, China
| | - Guangcheng Wu
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, Hunan, China
| | - Xilong Zhou
- School of Physics, State Key Laboratory of Powder Metallurgy, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha, Hunan, China
| | - Tulai Sun
- Center for Electron Microscopy, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou, China
| | - Yihan Zhu
- Center for Electron Microscopy, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou, China
| | - Jian Zhou
- Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, China
| | - Juan Xia
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, China
| | - Zenghui Wang
- Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, China
| | - Keji Lai
- Department of Physics, University of Texas at Austin, Austin, TX, USA
| | - Zheng Peng
- School of Physics, State Key Laboratory of Powder Metallurgy, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha, Hunan, China
| | - Dong Li
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, Hunan, China.
| | - Anlian Pan
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration, College of Materials Science and Engineering, Hunan University, Changsha, Hunan, China.
- School of Physics and Electronics, Hunan Normal University, Changsha, China.
| | - Yu Zhou
- School of Physics, State Key Laboratory of Powder Metallurgy, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha, Hunan, China.
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Shi J, Zhang Y, Deng W, Ren X, Qi J, Sheng F, Pan R, Jie J, Zhang X. Low-Power and High-Gain Organic Transistors Achieved Through an Ideal Contact Approaching the Schottky-Mott Limit. ACS APPLIED MATERIALS & INTERFACES 2025; 17:12477-12487. [PMID: 39962972 DOI: 10.1021/acsami.4c17581] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/28/2025]
Abstract
The advancement of flexible electronics necessitates low-power and high-gain organic transistors endowed with the capability to amplify feeble signals, meeting the demands of signal processing and transmission. Despite a myriad of endeavors, the intrinsic gain (Ai) of organic transistors at low supply voltage is conditioned by extrinsic losses attributable to imperfections at the electrical contact. Here, we push the metal-organic semiconductor contact close to the ideal Schottky-Mott model through a blade-coating-induced meniscus extension method, which allows the growth of organic single-crystalline films on multiple and uneven electrode heterointerfaces. Using this approach, our transistor manifests an impeccable gate electrostatic tunability with an ideal subthreshold swing (SS) of 59.6 mV dec-1 and a low average SS of 84.2 mV dec-1 over six decades of current, yielding a high Ai of 1.35 × 105, which is comparable with the reported champion organic thin-film transistors. As a result, an amplifier based on the transistors can operate normally at an extremely low dynamic power consumption of 33.2 pW and reach an ultrahigh voltage gain of 1590 V/V at a low voltage of 5 V. Our study promises to usher in low-power organic electronics reaching the bounds of physical performance.
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Affiliation(s)
- Jialin Shi
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Yujian Zhang
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Wei Deng
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Xiaobin Ren
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Jianchao Qi
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Fangming Sheng
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Rui Pan
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
| | - Jiansheng Jie
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
- Macao Institute of Materials Science and Engineering (MIMSE), MUST-SUDA Joint Research Center for Advanced Functional Materials, Macau University of Science and Technology, Taipa 999078, Macau, China
| | - Xiujuan Zhang
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Soochow University, Suzhou, Jiangsu 215123, China
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5
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Pan J, Zhang Y, Yin J, Guo P, Yang Y, Ren TL. Principles and Applications of Two-Dimensional Semiconductor Material Devices for Reconfigurable Electronics. NANOMATERIALS (BASEL, SWITZERLAND) 2025; 15:201. [PMID: 39940177 PMCID: PMC11820360 DOI: 10.3390/nano15030201] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/29/2024] [Revised: 01/22/2025] [Accepted: 01/24/2025] [Indexed: 02/14/2025]
Abstract
With the advances in edge computing and artificial intelligence, the demands of multifunctional electronics with large area efficiency are increased. As the scaling down of the conventional transistor is restricted by physical limits, reconfigurable electronics are developed to promote the functional integration of integrated circuits. Reconfigurable electronics refer to electronics with switchable functionalities, including reconfigurable logic operation functionalities and reconfigurable responses to electrical or optical signals. Reconfigurable electronics integrate data-processing capabilities with reduced size. Two-dimensional (2D) semiconductor materials exhibit excellent modulation capabilities through electrical and optical signals, and structural designs of 2D material devices achieve versatile and switchable functionalities. 2D semiconductors have great potential to develop advanced reconfigurable electronics. Recent years witnessed the rapid development of 2D material devices for reconfigurable electronics. This work focuses on the working principles of 2D material devices used for reconfigurable electronics, discusses applications of 2D-material-based reconfigurable electronics in logic operation and artificial intelligence, and further provides a future outlook for the development of reconfigurable electronics based on 2D material devices.
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Affiliation(s)
- Jiong Pan
- School of Integrated Circuits, Tsinghua University, Beijing 100084, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
| | - Yike Zhang
- Weiyang College, Tsinghua University, Beijing 100084, China
| | - Jiaju Yin
- School of Integrated Circuits, Tsinghua University, Beijing 100084, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
| | - Pengwen Guo
- School of Integrated Circuits, Tsinghua University, Beijing 100084, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
| | - Yi Yang
- School of Integrated Circuits, Tsinghua University, Beijing 100084, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
| | - Tian-Ling Ren
- School of Integrated Circuits, Tsinghua University, Beijing 100084, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
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Liu X, Chen H, Li Y, Mao Y. Controllable spin rectification behavior of vertical and lateral VSe 2/WSe 2 heterojunction Schottky diodes. Phys Chem Chem Phys 2025; 27:2083-2089. [PMID: 39763401 DOI: 10.1039/d4cp04118f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/23/2025]
Abstract
Heterojunctions (HJs) based on two-dimensional (2D) transition metal dichalcogenides are considered promising candidates for next-generation electronic and optoelectronic devices. Here, vertical (V-type) and lateral (L-type) HJ diodes based on metallic 1T-VSe2 and semiconducting 2H-WSe2 with out-of-plane and in-plane contacts are designed. First-principles quantum transport simulations reveal that both V- and L-type VSe2/WSe2 HJ diodes form p-type Schottky contacts. Under zero gate voltage, V-type VSe2/WSe2 HJ Schottky diodes exhibit superior spin rectification behavior compared to L-type, with rectification ratios approaching 109 and 106, respectively. At 300 K, the ideality factor of the V-type diode is lower than that of the L-type and reaches the ideal state at 478 and 510 K, respectively. Notably, positive gate voltage can reverse the rectification direction in both diodes and weaken the rectifying effect in V-type devices. Conversely, negative gate voltage significantly increases the current in both diodes and enhances the rectification ratio of the L-type device to 109. These findings provide insights into the spin-dependent rectification behavior of V- and L-type VSe2/WSe2 HJs in Schottky diodes, offering theoretical guidance for exploring magnetic nanoscale devices based on 2D materials.
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Affiliation(s)
- Xianghe Liu
- School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105, China.
| | - Hui Chen
- School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105, China.
| | - Yuxuan Li
- School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105, China.
| | - Yuliang Mao
- School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105, China.
- National Center for Applied Mathematics in Hunan, Xiangtan University, Xiangtan 411105, China
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7
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Zhang Y, Wang J, Xie P, Meng Y, Shao H, Jin C, Gao B, Shen Y, Quan Q, Li Y, Wang W, Li D, Wu Z, Li B, Yip S, Sun J, Ho JC. Molecular Reconfiguration of Disordered Tellurium Oxide Transistors with Biomimetic Spectral Selectivity. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024; 36:e2412210. [PMID: 39420657 DOI: 10.1002/adma.202412210] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/17/2024] [Revised: 10/04/2024] [Indexed: 10/19/2024]
Abstract
Reconfigurable devices with field-effect transistor features and neuromorphic behaviors are promising for enhancing data processing capability and reducing power consumption in next-generation semiconductor platforms. However, commonly used 2D materials for reconfigurable devices require additional modulation terminals and suffer from complex and stringent operating rules to obtain specific functionalities. Here, a p-type disordered tellurium oxide is introduced that realizes dual-mode reconfigurability as a logic transistor and a neuromorphic device. Due to the disordered film surface, the enhanced adsorption of oxygen molecules and laser-induced desorption concurrently regulate the carrier concentration in the channel. The device exhibits high-performance p-type characteristics with a field-effect hole mobility of 10.02 cm2 V-1 s-1 and an Ion/Ioff ratio exceeding 106 in the transistor mode. As a neuromorphic device, the vision system exhibits biomimetic bee vision, explicitly responding to the blue-to-ultraviolet light. Finally, in-sensor denoising and invisible image recognition in static and dynamic scenarios are achieved.
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Affiliation(s)
- Yuxuan Zhang
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Jingwen Wang
- Hunan Key Laboratory for Supermicrostructure and Ultrafast Process, School of Physics and Electronics, Central South University Changsha, Hunan, 410083, P. R. China
| | - Pengshan Xie
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - You Meng
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
- State Key Laboratory of Terahertz and Millimeter Waves, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - He Shao
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - ChenXing Jin
- Hunan Key Laboratory for Supermicrostructure and Ultrafast Process, School of Physics and Electronics, Central South University Changsha, Hunan, 410083, P. R. China
| | - Boxiang Gao
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Yi Shen
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Quan Quan
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Yezhan Li
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Weijun Wang
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Dengji Li
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Zenghui Wu
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - Bowen Li
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
| | - SenPo Yip
- Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka, 816 8580, Japan
| | - Jia Sun
- Hunan Key Laboratory for Supermicrostructure and Ultrafast Process, School of Physics and Electronics, Central South University Changsha, Hunan, 410083, P. R. China
- State Key Laboratory of Transducer Technology, Shanghai Institute of Microsystem and Information Technology, Shanghai, 200050, P. R. China
| | - Johnny C Ho
- Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
- State Key Laboratory of Terahertz and Millimeter Waves, City University of Hong Kong, Hong Kong SAR, 999077, P. R. China
- Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka, 816 8580, Japan
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Devnath A, Bae J, Alimkhanuly B, Lee G, Lee S, Kadyrov A, Patil S, Lee DS. Ultralow-Power Circuit and Sensing Applications Based on Subthermionic Threshold Switching Transistors. ACS NANO 2024; 18:30497-30511. [PMID: 39451007 DOI: 10.1021/acsnano.4c08650] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/26/2024]
Abstract
The most recent breakthrough in state-of-the-art electronics and optoelectronics involves the adoption of steep-slope field-effect transistors (FETs), promoting sub-60 mV/dec subthreshold swing (SS) at ambient temperature, effectively overcoming "Boltzmann limit" to minimize power consumption. Here, a series integration of nanoscale copper-based resistive-filamentary threshold switch (TS) with the IGZO channel-based FET is used to develop a TS-FET, in which the turn-on characteristics exhibit an abrupt transition over five decades, with an extremely low SS of 7 mV/dec, a high on/off ratio (>109), and ultralow leakage current (40-fold decrease), ensuring excellent repeatability and device yield. Unlike previous device-centric studies, this work highlights potential circuit applications (logic-inverter, pulse-sensor amplification, and photodetector) based on TS-FET. The sharp transition behavior of TS-FET enables the establishment of logic inverters with a high voltage gain of ≈800, with a circuit-level demonstration achieving a bias-independent record-high intrinsic gain (>1000). A wearable pulse sensor integrated with an amplifier circuit ensured the precise amplification of electrophysical signals by 450 times. In addition, the application of a TS-FET-based photodetector features high responsivity (1.08 × 104 mA/W) and detectivity (1.03 × 1020 Jones). The low-power strategy of TS-FETs is promising for the development of energy-efficient integrated circuits alongside sensor-interconnected biomedical applications in wearable technology.
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Affiliation(s)
- Anupom Devnath
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Junseong Bae
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Batyrbek Alimkhanuly
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Gisung Lee
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Seunghyun Lee
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Arman Kadyrov
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Shubham Patil
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
| | - Dr Seunghyun Lee
- Department of Electronics and Information Convergence Engineering, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
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9
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Pan J, Wu F, Wang Z, Liu S, Guo P, Yin J, Zhao B, Tian H, Yang Y, Ren TL. Multibarrier Collaborative Modulation Devices with Ultra-High Logic Operation Density. ACS NANO 2024; 18:28189-28197. [PMID: 39361333 DOI: 10.1021/acsnano.4c08009] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/16/2024]
Abstract
The demands for highly miniaturized and multifunctional electronics are rapidly increasing. As scaling-down processes of transistors are restricted by physical limits, reconfigurable electronics with switchable operation functions for different tasks are developed for higher function integration based on split- or vertical-dual-gate structures. To promote the present reconfigurable electronics and exceed the function integration limit, the critical issue is to integrate complex operations into simple circuit forms by establishing more control dimensions. This work proposes a multibarrier collaborative (MBC) modulation architecture to increase the control dimension by multiple forms of potential barriers and achieves combinational and reconfigurable logic operations by a single MBC device. The MBC architecture exhibits ultrahigh logic operation density, including 58.8% area reduction for multiplexer operations and 71.4% area reduction for 4-logic reconfigurable operations. Besides, a hardware security module composed of 4 MBC devices implementing 8 types of logic operations is demonstrated. This work reveals an effective design of function integration for next-generation electronics.
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Affiliation(s)
- Jiong Pan
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Fan Wu
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Zeda Wang
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Shangjian Liu
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Pengwen Guo
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Jiaju Yin
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Bingchen Zhao
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - He Tian
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Yi Yang
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
| | - Tian-Ling Ren
- School of Integrated Circuits, Tsinghua University, 100084 Beijing, China
- Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, 100084 Beijing, China
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10
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Kim YH, Jiang W, Lee D, Moon D, Choi HY, Shin JC, Jeong Y, Kim JC, Lee J, Huh W, Han CY, So JP, Kim TS, Kim SB, Koo HC, Wang G, Kang K, Park HG, Jeong HY, Im S, Lee GH, Low T, Lee CH. Boltzmann Switching MoS 2 Metal-Semiconductor Field-Effect Transistors Enabled by Monolithic-Oxide-Gapped Metal Gates at the Schottky-Mott Limit. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024; 36:e2314274. [PMID: 38647521 DOI: 10.1002/adma.202314274] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/28/2023] [Revised: 04/07/2024] [Indexed: 04/25/2024]
Abstract
A gate stack that facilitates a high-quality interface and tight electrostatic control is crucial for realizing high-performance and low-power field-effect transistors (FETs). However, when constructing conventional metal-oxide-semiconductor structures with two-dimensional (2D) transition metal dichalcogenide channels, achieving these requirements becomes challenging due to inherent difficulties in obtaining high-quality gate dielectrics through native oxidation or film deposition. Here, a gate-dielectric-less device architecture of van der Waals Schottky gated metal-semiconductor FETs (vdW-SG MESFETs) using a molybdenum disulfide (MoS2) channel and surface-oxidized metal gates such as nickel and copper is reported. Benefiting from the strong SG coupling, these MESFETs operate at remarkably low gate voltages, <0.5 V. Notably, they also exhibit Boltzmann-limited switching behavior featured by a subthreshold swing of ≈60 mV dec-1 and negligible hysteresis. These ideal FET characteristics are attributed to the formation of a Fermi-level (EF) pinning-free gate stack at the Schottky-Mott limit. Furthermore, authors experimentally and theoretically confirm that EF depinning can be achieved by suppressing both metal-induced and disorder-induced gap states at the interface between the monolithic-oxide-gapped metal gate and the MoS2 channel. This work paves a new route for designing high-performance and energy-efficient 2D electronics.
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Affiliation(s)
- Yeon Ho Kim
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
| | - Wei Jiang
- Department of Electrical and Computer Engineering, University of Minnesota, Minnesota, 55455, USA
| | - Donghun Lee
- Department of Chemistry, Kookmin University, Seoul, 02707, Republic of Korea
| | - Donghoon Moon
- Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, Republic of Korea
| | - Hyun-Young Choi
- Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, Republic of Korea
| | - June-Chul Shin
- Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, Republic of Korea
| | - Yeonsu Jeong
- Department of Physics, Yonsei University, Seoul, 03722, Republic of Korea
| | - Jong Chan Kim
- UNIST Central Research Facilities (UCRF) and Department of Materials Science and Engineering, UNIST, Ulsan, 44919, Republic of Korea
| | - Jaeho Lee
- Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea
| | - Woong Huh
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
| | - Chang Yong Han
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
| | - Jae-Pil So
- Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Republic of Korea
| | - Tae Soo Kim
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea
| | - Seong Been Kim
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
- Center for Spintronics, Korea Institute of Science and Technology, Seoul, 02792, South Korea
| | - Hyun Cheol Koo
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
- Center for Spintronics, Korea Institute of Science and Technology, Seoul, 02792, South Korea
| | - Gunuk Wang
- KU-KIST Graduate School of Converging Science & Technology, Korea University, Seoul, 02841, Republic of Korea
| | - Kibum Kang
- Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea
| | - Hong-Gyu Park
- Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Republic of Korea
| | - Hu Young Jeong
- UNIST Central Research Facilities (UCRF) and Department of Materials Science and Engineering, UNIST, Ulsan, 44919, Republic of Korea
| | - Seongil Im
- Department of Physics, Yonsei University, Seoul, 03722, Republic of Korea
| | - Gwan-Hyoung Lee
- Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, Republic of Korea
| | - Tony Low
- Department of Electrical and Computer Engineering, University of Minnesota, Minnesota, 55455, USA
| | - Chul-Ho Lee
- Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea
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11
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Liu A, Zhang X, Liu Z, Li Y, Peng X, Li X, Qin Y, Hu C, Qiu Y, Jiang H, Wang Y, Li Y, Tang J, Liu J, Guo H, Deng T, Peng S, Tian H, Ren TL. The Roadmap of 2D Materials and Devices Toward Chips. NANO-MICRO LETTERS 2024; 16:119. [PMID: 38363512 PMCID: PMC10873265 DOI: 10.1007/s40820-023-01273-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/30/2023] [Accepted: 10/30/2023] [Indexed: 02/17/2024]
Abstract
Due to the constraints imposed by physical effects and performance degradation, silicon-based chip technology is facing certain limitations in sustaining the advancement of Moore's law. Two-dimensional (2D) materials have emerged as highly promising candidates for the post-Moore era, offering significant potential in domains such as integrated circuits and next-generation computing. Here, in this review, the progress of 2D semiconductors in process engineering and various electronic applications are summarized. A careful introduction of material synthesis, transistor engineering focused on device configuration, dielectric engineering, contact engineering, and material integration are given first. Then 2D transistors for certain electronic applications including digital and analog circuits, heterogeneous integration chips, and sensing circuits are discussed. Moreover, several promising applications (artificial intelligence chips and quantum chips) based on specific mechanism devices are introduced. Finally, the challenges for 2D materials encountered in achieving circuit-level or system-level applications are analyzed, and potential development pathways or roadmaps are further speculated and outlooked.
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Affiliation(s)
- Anhan Liu
- School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100049, People's Republic of China
| | - Xiaowei Zhang
- School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100049, People's Republic of China
| | - Ziyu Liu
- School of Microelectronics, Fudan University, Shanghai, 200433, People's Republic of China
| | - Yuning Li
- School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing, 100044, People's Republic of China
| | - Xueyang Peng
- High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, People's Republic of China
- School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing, 100049, People's Republic of China
| | - Xin Li
- State Key Laboratory of Dynamic Measurement Technology, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, 030051, People's Republic of China
| | - Yue Qin
- State Key Laboratory of Dynamic Measurement Technology, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, 030051, People's Republic of China
| | - Chen Hu
- High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, People's Republic of China
- School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing, 100049, People's Republic of China
| | - Yanqing Qiu
- High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, People's Republic of China
- School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing, 100049, People's Republic of China
| | - Han Jiang
- School of Microelectronics, Fudan University, Shanghai, 200433, People's Republic of China
| | - Yang Wang
- School of Microelectronics, Fudan University, Shanghai, 200433, People's Republic of China
| | - Yifan Li
- School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100049, People's Republic of China
| | - Jun Tang
- State Key Laboratory of Dynamic Measurement Technology, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, 030051, People's Republic of China
| | - Jun Liu
- State Key Laboratory of Dynamic Measurement Technology, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, 030051, People's Republic of China
| | - Hao Guo
- State Key Laboratory of Dynamic Measurement Technology, Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan, 030051, People's Republic of China.
| | - Tao Deng
- School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing, 100044, People's Republic of China.
| | - Songang Peng
- High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, People's Republic of China.
- IMECAS-HKUST-Joint Laboratory of Microelectronics, Beijing, 100029, People's Republic of China.
| | - He Tian
- School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100049, People's Republic of China.
| | - Tian-Ling Ren
- School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100049, People's Republic of China.
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12
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Jeon Y, Kim S, Seo J, Yoo H. Contributions of Light to Novel Logic Concepts Using Optoelectronic Materials. SMALL METHODS 2024; 8:e2300391. [PMID: 37231569 DOI: 10.1002/smtd.202300391] [Citation(s) in RCA: 6] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/24/2023] [Revised: 04/29/2023] [Indexed: 05/27/2023]
Abstract
Instead of the current method of transmitting voltage or current signals in electronic circuit operation, light offers an alternative to conventional logic, allowing for the implementation of new logic concepts through interaction with light. This manuscript examines the use of light in implementing new logic concepts as an alternative to traditional logic circuits and as a future technology. This article provides an overview of how to implement logic operations using light rather than voltage or current signals using optoelectronic materials such as 2D materials, metal-oxides, carbon structures, polymers, small molecules, and perovskites. This review covers the various technologies and applications of using light to dope devices, implement logic gates, control logic circuits, and generate light as an output signal. Recent research on logic and the use of light to implement new functions is summarized. This review also highlights the potential of optoelectronic logic for future technological advancements.
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Affiliation(s)
- Yunchae Jeon
- Department of Electronic Engineering, Gachon University, 1342 Seongnam-daero, Seongnam, 13120, Republic of Korea
| | - Somi Kim
- Department of Electronic Engineering, Gachon University, 1342 Seongnam-daero, Seongnam, 13120, Republic of Korea
| | - Juhyung Seo
- Department of Electronic Engineering, Gachon University, 1342 Seongnam-daero, Seongnam, 13120, Republic of Korea
| | - Hocheon Yoo
- Department of Electronic Engineering, Gachon University, 1342 Seongnam-daero, Seongnam, 13120, Republic of Korea
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13
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Li L, Yuan P, Ma Z, He M, Jiang Y, Wang T, Xia C, Li X. Two-dimensional HfS 2-ZrS 2 lateral heterojunction FETs with high rectification and photocurrent. NANOSCALE 2023; 15:17633-17641. [PMID: 37878025 DOI: 10.1039/d3nr03017b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/26/2023]
Abstract
Multifunctional devices are an indispensable choice to fulfil the increasing demand for miniaturized and integrated circuit systems. However, bulk material-based devices encounter the challenge of miniaturized all-in-one systems with multiple functions. In this study, we designed a field effect transistor (FET) based on a monolayer HfS2-ZrS2 lateral heterojunction. It possesses simultaneous and obvious rectifying behavior and photodetection characteristics in the visible light region, such as the rectification ratio of ∼1012, photocurrent density of 13.3 nA m-1, responsivity of 57 mA W-1, and extinction ratio of 108. Notably, the rectification ratio of the single-gate FET is larger than that of the dual-gate FET under the negative gate voltage. These results indicate that monolayer lateral heterojunction-based FETs can provide an effective route to integrate rectifying and photodetection functions in single optoelectronic nanodevices.
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Affiliation(s)
- Lin Li
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
- College of Physics and Optoelectronic Engineering, Zhengzhou Key Laboratory of Low-Dimensional Quantum Materials and Devices, Zhongyuan University of Technology, Zhengzhou, 450007, China
| | - Peize Yuan
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Zinan Ma
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Mengjie He
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Yurong Jiang
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Tianxing Wang
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Congxin Xia
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
| | - Xueping Li
- School of Physics, Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, Henan Normal University, Xinxiang, Henan 453007, China.
- College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, Henan 453007, China
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14
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Tseng R, Wang ST, Ahmed T, Pan YY, Chen SC, Shih CC, Tsai WW, Chen HC, Kei CC, Chou TT, Hung WC, Chen JC, Kuo YH, Lin CL, Woon WY, Liao SS, Lien DH. Wide-range and area-selective threshold voltage tunability in ultrathin indium oxide transistors. Nat Commun 2023; 14:5243. [PMID: 37640725 PMCID: PMC10462674 DOI: 10.1038/s41467-023-41041-y] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/25/2023] [Accepted: 08/21/2023] [Indexed: 08/31/2023] Open
Abstract
The scaling of transistors with thinner channel thicknesses has led to a surge in research on two-dimensional (2D) and quasi-2D semiconductors. However, modulating the threshold voltage (VT) in ultrathin transistors is challenging, as traditional doping methods are not readily applicable. In this work, we introduce a optical-thermal method, combining ultraviolet (UV) illumination and oxygen annealing, to achieve broad-range VT tunability in ultrathin In2O3. This method can achieve both positive and negative VT tuning and is reversible. The modulation of sheet carrier density, which corresponds to VT shift, is comparable to that obtained using other doping and capacitive charging techniques in other ultrathin transistors, including 2D semiconductors. With the controllability of VT, we successfully demonstrate the realization of depletion-load inverter and multi-state logic devices, as well as wafer-scale VT modulation via an automated laser system, showcasing its potential for low-power circuit design and non-von Neumann computing applications.
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Affiliation(s)
- Robert Tseng
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Sung-Tsun Wang
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Tanveer Ahmed
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Yi-Yu Pan
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Shih-Chieh Chen
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Che-Chi Shih
- Research & Development, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
| | - Wu-Wei Tsai
- Research & Development, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
| | - Hai-Ching Chen
- Research & Development, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
| | - Chi-Chung Kei
- Taiwan Instrument Research Institute, National Applied Research Laboratories, Hsinchu, Taiwan
| | - Tsung-Te Chou
- Taiwan Instrument Research Institute, National Applied Research Laboratories, Hsinchu, Taiwan
| | - Wen-Ching Hung
- Department of Mechanical Engineering, National Central University, Jhongli City, Taiwan
- K-Jet Laser Tek Inc., Hsinchu, Taiwan
| | - Jyh-Chen Chen
- Department of Mechanical Engineering, National Central University, Jhongli City, Taiwan
| | - Yi-Hou Kuo
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Chun-Liang Lin
- Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
| | - Wei-Yen Woon
- Research & Development, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.
| | - Szuya Sandy Liao
- Research & Development, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
| | - Der-Hsien Lien
- Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan.
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15
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Li X, Zhou P, Hu X, Rivers E, Watanabe K, Taniguchi T, Akinwande D, Friedman JS, Incorvia JAC. Cascaded Logic Gates Based on High-Performance Ambipolar Dual-Gate WSe 2 Thin Film Transistors. ACS NANO 2023. [PMID: 37377371 DOI: 10.1021/acsnano.3c03932] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/29/2023]
Abstract
Ambipolar dual-gate transistors based on low-dimensional materials, such as graphene, carbon nanotubes, black phosphorus, and certain transition metal dichalcogenides (TMDs), enable reconfigurable logic circuits with a suppressed off-state current. These circuits achieve the same logical output as complementary metal-oxide semiconductor (CMOS) with fewer transistors and offer greater flexibility in design. The primary challenge lies in the cascadability and power consumption of these logic gates with static CMOS-like connections. In this article, high-performance ambipolar dual-gate transistors based on tungsten diselenide (WSe2) are fabricated. A high on-off ratio of 108 and 106, a low off-state current of 100 to 300 fA, a negligible hysteresis, and an ideal subthreshold swing of 62 and 63 mV/dec are measured in the p- and n-type transport, respectively. We demonstrate cascadable and cascaded logic gates using ambipolar TMD transistors with minimal static power consumption, including inverters, XOR, NAND, NOR, and buffers made by cascaded inverters. A thorough study of both the control gate and the polarity gate behavior is conducted. The noise margin of the logic gates is measured and analyzed. The large noise margin enables the implementation of VT-drop circuits, a type of logic with reduced transistor number and simplified circuit design. Finally, the speed performance of the VT-drop and other circuits built by dual-gate devices is qualitatively analyzed. This work makes advancements in the field of ambipolar dual-gate TMD transistors, showing their potential for low-power, high-speed, and more flexible logic circuits.
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Affiliation(s)
- Xintong Li
- Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States
| | - Peng Zhou
- Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080-3021, United States
| | - Xuan Hu
- Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080-3021, United States
| | - Ethan Rivers
- Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States
| | - Kenji Watanabe
- Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Deji Akinwande
- Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States
| | - Joseph S Friedman
- Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080-3021, United States
| | - Jean Anne C Incorvia
- Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States
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16
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Abstract
As the size of the transistor scales down, this strategy has confronted challenges because of the fundamental limits of silicon materials. Besides, more and more energy and time are consumed by the data transmission out of transistor computing because of the speed mismatching between the computing and memory. To meet the energy efficiency demands of big data computing, the transistor should have a smaller feature size and store data faster to overcome the energy burden of computing and data transfer. Electron transport in two-dimensional (2D) materials is constrained within a 2D plane and different materials are assembled by the van der Waals force. Owning to the atomic thickness and dangling-bond-free surface, 2D materials have demonstrated advantages in transistor scaling-down and heterogeneous structure innovation. In this review, from the performance breakthrough of 2D transistors, we discuss the opportunities, progress and challenges of 2D materials in transistor applications.
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Affiliation(s)
- Qing Zhang
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China
| | - Chunsen Liu
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China
- Frontier Institute of Chip and System, Fudan University, Shanghai 200433, China
| | - Peng Zhou
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China
- Frontier Institute of Chip and System, Fudan University, Shanghai 200433, China
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17
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Dong MM, He H, Wang CK, Fu XX. Two-dimensional MoSi 2As 4-based field-effect transistors integrating switching and gas-sensing functions. NANOSCALE 2023; 15:9106-9115. [PMID: 37133349 DOI: 10.1039/d3nr00637a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/04/2023]
Abstract
Multifunctional nanoscale devices integrating multiple functions are of great importance for meeting the requirements of next-generation electronics. Herein, using first-principles calculations, we propose multifunctional devices based on the two-dimensional monolayer MoSi2As4, where a single-gate field-effect transistor (FET) and FET-type gas sensor are integrated. After introducing the optimizing strategies, such as underlap structures and dielectrics with a high dielectric constant (κ), we designed a 5 nm gate-length MoSi2As4 FET, whose performance fulfilled the key criteria of the International Technology Roadmap for Semiconductors (ITRS) for high-performance semiconductors. Under the joint adjustment of the underlap structure and high-κ dielectric material, the on/off ratio of the 5 nm gate-length FET reached up to 1.38 × 104. In addition, driven by the high-performance FET, the MoSi2As4-based FET-type gas sensor showed a sensitivity of 38% for NH3 and 46% for NO2. Moreover, the weak interaction between NH3 (NO2) and MoSi2As4 favored the recycling of the sensor. Furthermore, the sensitivity of the sensor could be effectively improved by the gate voltage, and was increased up to 67% (74%) for NH3 (NO2). Our work provides theoretical guidance for the fabrication of multifunctional devices combining a high-performance FET and sensitive gas sensor.
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Affiliation(s)
- Mi-Mi Dong
- Shandong Key Laboratory of Medical Physics and Image Processing & Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan 250358, China.
| | - Hang He
- Shandong Key Laboratory of Medical Physics and Image Processing & Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan 250358, China.
| | - Chuan-Kui Wang
- Shandong Key Laboratory of Medical Physics and Image Processing & Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan 250358, China.
| | - Xiao-Xiao Fu
- Shandong Key Laboratory of Medical Physics and Image Processing & Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan 250358, China.
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18
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Combination of Polymer Gate Dielectric and Two-Dimensional Semiconductor for Emerging Field-Effect Transistors. Polymers (Basel) 2023; 15:polym15061395. [PMID: 36987175 PMCID: PMC10051946 DOI: 10.3390/polym15061395] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/01/2023] [Revised: 03/04/2023] [Accepted: 03/08/2023] [Indexed: 03/16/2023] Open
Abstract
Two-dimensional (2D) materials are considered attractive semiconducting layers for emerging field-effect transistors owing to their unique electronic and optoelectronic properties. Polymers have been utilized in combination with 2D semiconductors as gate dielectric layers in field-effect transistors (FETs). Despite their distinctive advantages, the applicability of polymer gate dielectric materials for 2D semiconductor FETs has rarely been discussed in a comprehensive manner. Therefore, this paper reviews recent progress relating to 2D semiconductor FETs based on a wide range of polymeric gate dielectric materials, including (1) solution-based polymer dielectrics, (2) vacuum-deposited polymer dielectrics, (3) ferroelectric polymers, and (4) ion gels. Exploiting appropriate materials and corresponding processes, polymer gate dielectrics have enhanced the performance of 2D semiconductor FETs and enabled the development of versatile device structures in energy-efficient ways. Furthermore, FET-based functional electronic devices, such as flash memory devices, photodetectors, ferroelectric memory devices, and flexible electronics, are highlighted in this review. This paper also outlines challenges and opportunities in order to help develop high-performance FETs based on 2D semiconductors and polymer gate dielectrics and realize their practical applications.
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19
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Jeon DY, Park J, Park SJ, Kim GT. Junctionless Electric-Double-Layer MoS 2 Field-Effect Transistor with a Sub-5 nm Thick Electrostatically Highly Doped Channel. ACS APPLIED MATERIALS & INTERFACES 2023; 15:8298-8304. [PMID: 36740775 DOI: 10.1021/acsami.2c19596] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Abstract
Junctionless transistors are suitable for sub-3 nm applications because of their extremely simple structure and high electrical performance, which compensate for short-channel effects. Two-dimensional semiconductor transition-metal dichalcogenide materials, such as MoS2, may also resolve technical and fundamental issues for Si-based technology. Here, we present the first junctionless electric-double-layer field-effect transistor with an electrostatically highly doped 5 nm thick MoS2 channel. A double-gated MoS2 transistor with an ionic-liquid top gate and a conventional bottom gate demonstrated good transfer characteristics with a 104 on-off current ratio, a 70 mV dec-1 subthreshold swing at a 0 V bottom-gate bias, and drain-current versus top-gate-voltage characteristics were shifted left significantly with increasing bottom-gate bias due to an electrostatically increased overall charge carrier concentration in the MoS2 channel. When a bottom-gate bias of 80 V was applied, a shoulder and two clear peak features were identified in the transconductance and its derivative, respectively; this outcome is typical of Si-based junctionless transistors. Furthermore, the decrease in electron mobility induced by a transverse electric field was reduced with increasing bottom-gate bias. Numerical simulations and analytical models were used to support these findings, which clarify the operation of junctionless MoS2 transistors with an electrostatically highly doped channel.
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Affiliation(s)
- Dae-Young Jeon
- Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Joellabuk-do55324, South Korea
- Department of Electrical Engineering, Gyeongsang National University, Jinju52828, Gyeongnam, South Korea
| | - Jimin Park
- Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Joellabuk-do55324, South Korea
| | - So Jeong Park
- School of Electrical Engineering, Korea University, Seoul136-701, South Korea
| | - Gyu-Tae Kim
- School of Electrical Engineering, Korea University, Seoul136-701, South Korea
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20
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Wang X, Chen X, Ma J, Gou S, Guo X, Tong L, Zhu J, Xia Y, Wang D, Sheng C, Chen H, Sun Z, Ma S, Riaud A, Xu Z, Cong C, Qiu Z, Zhou P, Xie Y, Bian L, Bao W. Pass-Transistor Logic Circuits Based on Wafer-Scale 2D Semiconductors. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2202472. [PMID: 35728050 DOI: 10.1002/adma.202202472] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/17/2022] [Revised: 06/09/2022] [Indexed: 06/15/2023]
Abstract
2D semiconductors, such as molybdenum disulfide (MoS2 ), have attracted tremendous attention in constructing advanced monolithic integrated circuits (ICs) for future flexible and energy-efficient electronics. However, the development of large-scale ICs based on 2D materials is still in its early stage, mainly due to the non-uniformity of the individual devices and little investigation of device and circuit-level optimization. Herein, a 4-inch high-quality monolayer MoS2 film is successfully synthesized, which is then used to fabricate top-gated (TG) MoS2 field-effect transistors with wafer-scale uniformity. Some basic circuits such as static random access memory and ring oscillators are examined. A pass-transistor logic configuration based on pseudo-NMOS is then employed to design more complex MoS2 logic circuits, which are successfully fabricated with proper logic functions tested. These preliminary integration efforts show the promising potential of wafer-scale 2D semiconductors for application in complex ICs.
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Affiliation(s)
- Xinyu Wang
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Xinyu Chen
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Jingyi Ma
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Saifei Gou
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Xiaojiao Guo
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Ling Tong
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Junqiang Zhu
- School of Information Science and Engineering, Fudan University, Shanghai, 200433, China
| | - Yin Xia
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Die Wang
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Chuming Sheng
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Honglei Chen
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Zhengzong Sun
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Shunli Ma
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Antoine Riaud
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Zihan Xu
- Shenzhen Six Carbon Technology, Shenzhen, 518055, China
| | - Chunxiao Cong
- School of Information Science and Engineering, Fudan University, Shanghai, 200433, China
| | - Zhijun Qiu
- School of Information Science and Engineering, Fudan University, Shanghai, 200433, China
| | - Peng Zhou
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Yufeng Xie
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
| | - Lifeng Bian
- Frontier Institute of Chip and System, Fudan University, Shanghai, 200433, China
| | - Wenzhong Bao
- State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China
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21
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Cho KG, Seol KH, Kim MS, Hong K, Lee KH. Tuning Threshold Voltage of Electrolyte-Gated Transistors by Binary Ion Doping. ACS APPLIED MATERIALS & INTERFACES 2022; 14:50004-50012. [PMID: 36301020 DOI: 10.1021/acsami.2c15229] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
Electrolyte-gated transistors (EGTs) operating at low voltages have attracted significant attention in widespread applications, including neuromorphic devices, nonvolatile memories, chemical/biosensors, and printed electronics. To increase the practicality of the EGTs in electronic circuits, systematic control of threshold voltage (Vth), which determines the power consumption and noise margin of the circuits, is essential. In this study, we present a simple strategy for systematically tuning Vth to almost half of the operating potential range of the EGT by controlling the electrochemical doping of electrolyte ions into organic p-type semiconductors. The type of anion in the ionogel determines Vth as well as other transistor characteristics, such as the subthreshold swing and mobility, because the positive hole carriers are the majority carriers. More importantly, Vth can be finely controlled by binary anion doping using ionogels with two anions with varying molar fractions at a fixed cation. In addition, the binary anion doping successfully controls the inversion characteristics of ion-gated inverters. As unlimited combinations of ion pairs are possible for ionogels, this study opens a route for controlling the device characteristics to expand the practicality and applicability of ionogel-based EGTs for next-generation ionic/electronic devices.
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Affiliation(s)
- Kyung Gook Cho
- Department of Chemistry and Chemical Engineering, Education and Research Center for Smart Energy and Materials, Inha University, Incheon22212, Republic of Korea
| | - Kyoung Hwan Seol
- Department of Chemistry and Chemical Engineering, Education and Research Center for Smart Energy and Materials, Inha University, Incheon22212, Republic of Korea
| | - Min Su Kim
- Department of Chemistry and Chemical Engineering, Education and Research Center for Smart Energy and Materials, Inha University, Incheon22212, Republic of Korea
| | - Kihyon Hong
- Department of Materials Science and Engineering, Chungnam National University (CNU), Daejeon34134, Republic of Korea
| | - Keun Hyung Lee
- Department of Chemistry and Chemical Engineering, Education and Research Center for Smart Energy and Materials, Inha University, Incheon22212, Republic of Korea
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22
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Wang C, Song Y, Huang H. Evolution Application of Two-Dimensional MoS 2-Based Field-Effect Transistors. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:nano12183233. [PMID: 36145022 PMCID: PMC9504544 DOI: 10.3390/nano12183233] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/21/2022] [Revised: 09/12/2022] [Accepted: 09/15/2022] [Indexed: 06/12/2023]
Abstract
High-performance and low-power field-effect transistors (FETs) are the basis of integrated circuit fields, which undoubtedly require researchers to find better film channel layer materials and improve device structure technology. MoS2 has recently shown a special two-dimensional (2D) structure and superior photoelectric performance, and it has shown new potential for next-generation electronics. However, the natural atomic layer thickness and large specific surface area of MoS2 make the contact interface and dielectric interface have a great influence on the performance of MoS2 FET. Thus, we focus on its main performance improvement strategies, including optimizing the contact behavior, regulating the conductive channel, and rationalizing the dielectric layer. On this basis, we summarize the applications of 2D MoS2 FETs in key and emerging fields, specifically involving logic, RF circuits, optoelectronic devices, biosensors, piezoelectric devices, and synaptic transistors. As a whole, we discuss the state-of-the-art, key merits, and limitations of each of these 2D MoS2-based FET systems, and prospects in the future.
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Affiliation(s)
- Chunlan Wang
- School of Science, Xi’an Polytechnic University, Xi’an 710048, China
| | - Yongle Song
- School of Science, Xi’an Polytechnic University, Xi’an 710048, China
| | - Hao Huang
- Guangxi Key Laboratory of Processing for Nonferrous Metals and Featured Material, School of Resources, Environment and Materials, Guangxi University, Nanning 530004, China
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23
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Hayakawa R, Takeiri S, Yamada Y, Wakayama Y, Fukumoto K. Carrier-Transport Mechanism in Organic Antiambipolar Transistors Unveiled by Operando Photoemission Electron Microscopy. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2201277. [PMID: 35637610 DOI: 10.1002/adma.202201277] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/08/2022] [Revised: 05/25/2022] [Indexed: 06/15/2023]
Abstract
Organic antiambipolar transistors (AATs) have partially overlapped p-n junctions. At room temperature, this p-n junction induces a negative differential transconductance in an AAT. However, the detailed carrier-transport mechanism remains unclear. Herein, an operando photoemission electron microscopy is used to tackle this issue owing to the technique's ability to visualize conductive electrons in real time during transistor operation. Notably, it is observed that when the AAT is on, a depletion layer forms at the lateral p-n junction. The visualized depletion layer shows that both p- and n-type channels have pinch-off states in the gate voltage range when the AAT is in on state. The steep potential gradient at the lateral p-n interface enhances the electron conduction from n-type to p-type semiconductor. Another significant finding is that most electrons are considered to recombine with the accumulated holes in the p-type semiconductor, affording the reduction of photoemission intensity by ≈80%. This technique provides a thorough understanding of carrier transport in AATs, further improving the device performance.
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Affiliation(s)
- Ryoma Hayakawa
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
| | - Soichiro Takeiri
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
- Institute of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, 305-8573, Japan
| | - Yoichi Yamada
- Institute of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, 305-8573, Japan
| | - Yutaka Wakayama
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan
| | - Keiki Fukumoto
- High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki, 305-0801, Japan
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24
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Knobloch T, Uzlu B, Illarionov YY, Wang Z, Otto M, Filipovic L, Waltl M, Neumaier D, Lemme MC, Grasser T. Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning. NATURE ELECTRONICS 2022; 5:356-366. [PMID: 35783488 PMCID: PMC9236902 DOI: 10.1038/s41928-022-00768-0] [Citation(s) in RCA: 18] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/15/2021] [Accepted: 04/22/2022] [Indexed: 06/02/2023]
Abstract
Electronic devices based on two-dimensional semiconductors suffer from limited electrical stability because charge carriers originating from the semiconductors interact with defects in the surrounding insulators. In field-effect transistors, the resulting trapped charges can lead to large hysteresis and device drifts, particularly when common amorphous gate oxides (such as silicon or hafnium dioxide) are used, hindering stable circuit operation. Here, we show that device stability in graphene-based field-effect transistors with amorphous gate oxides can be improved by Fermi-level tuning. We deliberately tune the Fermi level of the channel to maximize the energy distance between the charge carriers in the channel and the defect bands in the amorphous aluminium gate oxide. Charge trapping is highly sensitive to the energetic alignment of the Fermi level of the channel with the defect band in the insulator, and thus, our approach minimizes the amount of electrically active border traps without the need to reduce the total number of traps in the insulator.
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Affiliation(s)
| | - Burkay Uzlu
- AMO GmbH, Aachen, Germany
- Chair of Electronic Devices, RWTH Aachen University, Aachen, Germany
| | - Yury Yu. Illarionov
- Institute for Microelectronics, TU Wien, Vienna, Austria
- Ioffe Institute, Saint Petersburg, Russia
| | | | | | - Lado Filipovic
- Institute for Microelectronics, TU Wien, Vienna, Austria
| | - Michael Waltl
- Christian Doppler Laboratory for Single-Defect Spectroscopy in Semiconductor Devices at the Institute for Microelectronics, TU Wien, Vienna, Austria
| | - Daniel Neumaier
- AMO GmbH, Aachen, Germany
- Chair of Smart Sensor Systems, University of Wuppertal, Wuppertal, Germany
| | - Max C. Lemme
- AMO GmbH, Aachen, Germany
- Chair of Electronic Devices, RWTH Aachen University, Aachen, Germany
| | - Tibor Grasser
- Institute for Microelectronics, TU Wien, Vienna, Austria
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25
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Yang P, Zha J, Gao G, Zheng L, Huang H, Xia Y, Xu S, Xiong T, Zhang Z, Yang Z, Chen Y, Ki DK, Liou JJ, Liao W, Tan C. Growth of Tellurium Nanobelts on h-BN for p-type Transistors with Ultrahigh Hole Mobility. NANO-MICRO LETTERS 2022; 14:109. [PMID: 35441245 PMCID: PMC9018950 DOI: 10.1007/s40820-022-00852-2] [Citation(s) in RCA: 26] [Impact Index Per Article: 8.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/14/2022] [Accepted: 03/24/2022] [Indexed: 05/15/2023]
Abstract
The lack of stable p-type van der Waals (vdW) semiconductors with high hole mobility severely impedes the step of low-dimensional materials entering the industrial circle. Although p-type black phosphorus (bP) and tellurium (Te) have shown promising hole mobilities, the instability under ambient conditions of bP and relatively low hole mobility of Te remain as daunting issues. Here we report the growth of high-quality Te nanobelts on atomically flat hexagonal boron nitride (h-BN) for high-performance p-type field-effect transistors (FETs). Importantly, the Te-based FET exhibits an ultrahigh hole mobility up to 1370 cm2 V-1 s-1 at room temperature, that may lay the foundation for the future high-performance p-type 2D FET and metal-oxide-semiconductor (p-MOS) inverter. The vdW h-BN dielectric substrate not only provides an ultra-flat surface without dangling bonds for growth of high-quality Te nanobelts, but also reduces the scattering centers at the interface between the channel material and the dielectric layer, thus resulting in the ultrahigh hole mobility .
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Affiliation(s)
- Peng Yang
- College of Electronics and Information Engineering, Shenzhen University, Shenzhen, 518060, People's Republic of China
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Jiajia Zha
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China.
| | - Guoyun Gao
- Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong SAR, People's Republic of China
| | - Long Zheng
- Department of Chemistry, The Chinese University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Haoxin Huang
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Yunpeng Xia
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Songcen Xu
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Tengfei Xiong
- Department of Chemistry, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Zhuomin Zhang
- Department of Mechanical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Zhengbao Yang
- Department of Mechanical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Ye Chen
- Department of Chemistry, The Chinese University of Hong Kong, Hong Kong SAR, People's Republic of China
| | - Dong-Keun Ki
- Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong SAR, People's Republic of China
| | - Juin J Liou
- College of Electronics and Information Engineering, Shenzhen University, Shenzhen, 518060, People's Republic of China
| | - Wugang Liao
- College of Electronics and Information Engineering, Shenzhen University, Shenzhen, 518060, People's Republic of China.
| | - Chaoliang Tan
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, People's Republic of China.
- Center of Super-Diamond and Advanced Films (COSDAF), City University of Hong Kong, Hong Kong SAR, People's Republic of China.
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26
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Hayakawa R, Honma K, Nakaharai S, Kanai K, Wakayama Y. Electrically Reconfigurable Organic Logic Gates: A Promising Perspective on a Dual-Gate Antiambipolar Transistor. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2109491. [PMID: 35146811 DOI: 10.1002/adma.202109491] [Citation(s) in RCA: 16] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/22/2021] [Revised: 01/26/2022] [Indexed: 06/14/2023]
Abstract
Electrically reconfigurable organic logic circuits are promising candidates for realizing new computation architectures, such as artificial intelligence and neuromorphic devices. In this study, multiple logic gate operations are attained based on a dual-gate organic antiambipolar transistor (DG-OAAT). The transistor exhibits a Λ-shaped transfer curve, namely, a negative differential transconductance at room temperature. It is important to note that the peak voltage of the drain current is precisely tuned by three input signals: bottom-gate, top-gate, and drain voltages. This distinctive feature enables multiple logic gate operations with "only a single DG-OAAT," which are not obtainable in conventional transistors. Five logic gate operations, which correspond to AND, OR, NAND, NOR, and XOR, are demonstrated by adjusting the bottom-gate and top-gate voltages. Moreover, varying the drain voltage makes it possible to reversibly switch two logic gates, e.g., NAND/NOR and OR/XOR. In addition, the DG-OAATs show a high degree of stability and reliability. The logic gate operations are observed even months later. The hysteresis in the transfer curves is also negligible. Thus, the device concept is promising for realizing multifunctional logic circuits with a simple transistor configuration. Hence, these findings are expected to surpass the current limitations in complementary metal-oxide-semiconductor devices.
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Affiliation(s)
- Ryoma Hayakawa
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
| | - Kosuke Honma
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
- Department of Physics, Faculty of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba, 278-8510, Japan
| | - Shu Nakaharai
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
| | - Kaname Kanai
- Department of Physics, Faculty of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba, 278-8510, Japan
| | - Yutaka Wakayama
- International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
- Department of Physics, Faculty of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba, 278-8510, Japan
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27
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Pham PV, Bodepudi SC, Shehzad K, Liu Y, Xu Y, Yu B, Duan X. 2D Heterostructures for Ubiquitous Electronics and Optoelectronics: Principles, Opportunities, and Challenges. Chem Rev 2022; 122:6514-6613. [PMID: 35133801 DOI: 10.1021/acs.chemrev.1c00735] [Citation(s) in RCA: 159] [Impact Index Per Article: 53.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Abstract
A grand family of two-dimensional (2D) materials and their heterostructures have been discovered through the extensive experimental and theoretical efforts of chemists, material scientists, physicists, and technologists. These pioneering works contribute to realizing the fundamental platforms to explore and analyze new physical/chemical properties and technological phenomena at the micro-nano-pico scales. Engineering 2D van der Waals (vdW) materials and their heterostructures via chemical and physical methods with a suitable choice of stacking order, thickness, and interlayer interactions enable exotic carrier dynamics, showing potential in high-frequency electronics, broadband optoelectronics, low-power neuromorphic computing, and ubiquitous electronics. This comprehensive review addresses recent advances in terms of representative 2D materials, the general fabrication methods, and characterization techniques and the vital role of the physical parameters affecting the quality of 2D heterostructures. The main emphasis is on 2D heterostructures and 3D-bulk (3D) hybrid systems exhibiting intrinsic quantum mechanical responses in the optical, valley, and topological states. Finally, we discuss the universality of 2D heterostructures with representative applications and trends for future electronics and optoelectronics (FEO) under the challenges and opportunities from physical, nanotechnological, and material synthesis perspectives.
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Affiliation(s)
- Phuong V Pham
- School of Micro-Nano Electronics, Hangzhou Global Scientific and Technological Innovation Center (HIC), Zhejiang University, Xiaoshan 311200, China.,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China.,ZJU-UIUC Joint Institute, Zhejiang University, Jiaxing 314400, China
| | - Srikrishna Chanakya Bodepudi
- School of Micro-Nano Electronics, Hangzhou Global Scientific and Technological Innovation Center (HIC), Zhejiang University, Xiaoshan 311200, China.,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China.,ZJU-UIUC Joint Institute, Zhejiang University, Jiaxing 314400, China
| | - Khurram Shehzad
- School of Micro-Nano Electronics, Hangzhou Global Scientific and Technological Innovation Center (HIC), Zhejiang University, Xiaoshan 311200, China.,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China.,ZJU-UIUC Joint Institute, Zhejiang University, Jiaxing 314400, China
| | - Yuan Liu
- School of Physics and Electronics, Hunan University, Hunan 410082, China
| | - Yang Xu
- School of Micro-Nano Electronics, Hangzhou Global Scientific and Technological Innovation Center (HIC), Zhejiang University, Xiaoshan 311200, China.,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China.,ZJU-UIUC Joint Institute, Zhejiang University, Jiaxing 314400, China
| | - Bin Yu
- School of Micro-Nano Electronics, Hangzhou Global Scientific and Technological Innovation Center (HIC), Zhejiang University, Xiaoshan 311200, China.,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China.,ZJU-UIUC Joint Institute, Zhejiang University, Jiaxing 314400, China
| | - Xiangfeng Duan
- Department of Chemistry and Biochemistry, University of California, Los Angeles (UCLA), Los Angeles, California 90095-1569, United States
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28
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Liu L, Gong P, Liu K, Nie A, Liu Z, Yang S, Xu Y, Liu T, Zhao Y, Huang L, Li H, Zhai T. Scalable Van der Waals Encapsulation by Inorganic Molecular Crystals. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2106041. [PMID: 34865248 DOI: 10.1002/adma.202106041] [Citation(s) in RCA: 15] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/03/2021] [Revised: 11/22/2021] [Indexed: 06/13/2023]
Abstract
Encapsulation is critical for devices to guarantee their stability and reliability. It becomes an even more essential requirement for devices based on 2D materials with atomic thinness and far inferior stability compared to their bulk counterparts. Here a general van der Waals (vdW) encapsulation method for 2D materials using Sb2 O3 layer of inorganic molecular crystal fabricated via thermal evaporation deposition is reported. It is demonstrated that such a scalable encapsulation method not only maintains the intrinsic properties of typical air-susceptible 2D materials due to their vdW interactions but also remarkably improves their environmental stability. Specifically, the encapsulated black phosphorus (BP) exhibits greatly enhanced structural stability of over 80 days and more sustaining-electrical properties of 19 days, while the bare BP undergoes degradation within hours. Moreover, the encapsulation layer can be facilely removed by sublimation in vacuum without damaging the underlying materials. This scalable encapsulation method shows a promising pathway to effectively enhance the environmental stability of 2D materials, which may further boost their practical application in novel (opto)electronic devices.
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Affiliation(s)
- Lixin Liu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Penglai Gong
- Department of Physics, Southern University of Science and Technology, Shenzhen, 5158055, P. R. China
- Key Laboratory of Optic-Electronic Information and Materials of Hebei Province, Institute of Life Science and Green Development, College of Physics Science and Technology, Hebei University, Baoding, 071002, P. R. China
| | - Kailang Liu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Anmin Nie
- State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao, 066004, P. R. China
| | - Zhongyuan Liu
- State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao, 066004, P. R. China
| | - Sanjun Yang
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Yongshan Xu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Teng Liu
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Yinghe Zhao
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Li Huang
- Department of Physics, Southern University of Science and Technology, Shenzhen, 5158055, P. R. China
| | - Huiqiao Li
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
| | - Tianyou Zhai
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
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