1
|
Liu Y, Roccapriore K, Checa M, Valleti SM, Yang JC, Jesse S, Vasudevan RK. AEcroscopy: A Software-Hardware Framework Empowering Microscopy Toward Automated and Autonomous Experimentation. SMALL METHODS 2024:e2301740. [PMID: 38639016 DOI: 10.1002/smtd.202301740] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/15/2023] [Revised: 03/31/2024] [Indexed: 04/20/2024]
Abstract
Microscopy has been pivotal in improving the understanding of structure-function relationships at the nanoscale and is by now ubiquitous in most characterization labs. However, traditional microscopy operations are still limited largely by a human-centric click-and-go paradigm utilizing vendor-provided software, which limits the scope, utility, efficiency, effectiveness, and at times reproducibility of microscopy experiments. Here, a coupled software-hardware platform is developed that consists of a software package termed AEcroscopy (short for Automated Experiments in Microscopy), along with a field-programmable-gate-array device with LabView-built customized acquisition scripts, which overcome these limitations and provide the necessary abstractions toward full automation of microscopy platforms. The platform works across multiple vendor devices on scanning probe microscopes and electron microscopes. It enables customized scan trajectories, processing functions that can be triggered locally or remotely on processing servers, user-defined excitation waveforms, standardization of data models, and completely seamless operation through simple Python commands to enable a plethora of microscopy experiments to be performed in a reproducible, automated manner. This platform can be readily coupled with existing machine-learning libraries and simulations, to provide automated decision-making and active theory-experiment optimization to turn microscopes from characterization tools to instruments capable of autonomous model refinement and physics discovery.
Collapse
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Kevin Roccapriore
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Marti Checa
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Sai Mani Valleti
- Bredesen Center for Interdisciplinary Research, University of Tennessee, Knoxville, TN, 37996, USA
| | - Jan-Chi Yang
- Department of Physics, National Cheng Kung University, Tainan, 70101, Taiwan
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| |
Collapse
|
2
|
Liu Y, Ziatdinov MA, Vasudevan RK, Kalinin SV. Explainability and human intervention in autonomous scanning probe microscopy. PATTERNS (NEW YORK, N.Y.) 2023; 4:100858. [PMID: 38035198 PMCID: PMC10682748 DOI: 10.1016/j.patter.2023.100858] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/28/2023] [Revised: 07/26/2023] [Accepted: 09/15/2023] [Indexed: 12/02/2023]
Abstract
The broad adoption of machine learning (ML)-based autonomous experiments (AEs) in material characterization and synthesis requires strategies development for understanding and intervention in the experimental workflow. Here, we introduce and realize a post-experimental analysis strategy for deep kernel learning-based autonomous scanning probe microscopy. This approach yields real-time and post-experimental indicators for the progression of an active learning process interacting with an experimental system. We further illustrate how this approach can be applied to human-in-the-loop AEs, where human operators make high-level decisions at high latencies setting the policies for AEs, and the ML algorithm performs low-level, fast decisions. The proposed approach is universal and can be extended to other techniques and applications such as combinatorial library analysis.
Collapse
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
| | - Maxim A. Ziatdinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
| | - Rama K. Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
| | - Sergei V. Kalinin
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
| |
Collapse
|
3
|
McCraw MR, Uluutku B, Solomon HD, Anderson MS, Sarkar K, Solares SD. Optimizing the accuracy of viscoelastic characterization with AFM force-distance experiments in the time and frequency domains. SOFT MATTER 2023; 19:451-467. [PMID: 36530043 DOI: 10.1039/d2sm01331b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/17/2023]
Abstract
Atomic Force Microscopy (AFM) force-distance (FD) experiments have emerged as an attractive alternative to traditional micro-rheology measurement techniques owing to their versatility of use in materials of a wide range of mechanical properties. Here, we show that the range of time dependent behaviour which can reliably be resolved from the typical method of FD inversion (fitting constitutive FD relations to FD data) is inherently restricted by the experimental parameters: sampling frequency, experiment length, and strain rate. Specifically, we demonstrate that violating these restrictions can result in errors in the values of the parameters of the complex modulus. In the case of complex materials, such as cells, whose behaviour is not specifically understood a priori, the physical sensibility of these parameters cannot be assessed and may lead to falsely attributing a physical phenomenon to an artifact of the violation of these restrictions. We use arguments from information theory to understand the nature of these inconsistencies as well as devise limits on the range of mechanical parameters which can be reliably obtained from FD experiments. The results further demonstrate that the nature of these restrictions depends on the domain (time or frequency) used in the inversion process, with the time domain being far more restrictive than the frequency domain. Finally, we demonstrate how to use these restrictions to better design FD experiments to target specific timescales of a material's behaviour through our analysis of a polydimethylsiloxane (PDMS) polymer sample.
Collapse
Affiliation(s)
- Marshall R McCraw
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| | - Berkin Uluutku
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| | - Halen D Solomon
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| | - Megan S Anderson
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| | - Kausik Sarkar
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| | - Santiago D Solares
- Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, Washington, District of Columbia, USA.
| |
Collapse
|
4
|
Liu Y, Kelley KP, Vasudevan RK, Zhu W, Hayden J, Maria JP, Funakubo H, Ziatdinov MA, Trolier-McKinstry S, Kalinin SV. Automated Experiments of Local Non-Linear Behavior in Ferroelectric Materials. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2204130. [PMID: 36253123 DOI: 10.1002/smll.202204130] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/05/2022] [Revised: 09/19/2022] [Indexed: 06/16/2023]
Abstract
An automated experiment in multimodal imaging to probe structural, chemical, and functional behaviors in complex materials and elucidate the dominant physical mechanisms that control device function is developed and implemented. Here, the emergence of non-linear electromechanical responses in piezoresponse force microscopy (PFM) is explored. Non-linear responses in PFM can originate from multiple mechanisms, including intrinsic material responses often controlled by domain structure, surface topography that affects the mechanical phenomena at the tip-surface junction, and the presence of surface contaminants. Using an automated experiment to probe the origins of non-linear behavior in ferroelectric lead titanate (PTO) and ferroelectric Al0.93 B0.07 N films, it is found that PTO shows asymmetric nonlinear behavior across a/c domain walls and a broadened high nonlinear response region around c/c domain walls. In contrast, for Al0.93 B0.07 N, well-poled regions show high linear piezoelectric responses, when paired with low non-linear responses regions that are multidomain show low linear responses and high nonlinear responses. It is shown that formulating dissimilar exploration strategies in deep kernel learning as alternative hypotheses allows for establishing the preponderant physical mechanisms behind the non-linear behaviors, suggesting that automated experiments can potentially discern between competing physical mechanisms. This technique can also be extended to electron, probe, and chemical imaging.
Collapse
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Kyle P Kelley
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Wanlin Zhu
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - John Hayden
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Jon-Paul Maria
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
- Center for Dielectrics and Piezoelectrics, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Hiroshi Funakubo
- Department of Material Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan
| | - Maxim A Ziatdinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Susan Trolier-McKinstry
- Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
- Center for Dielectrics and Piezoelectrics, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA
| | - Sergei V Kalinin
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37916, USA
| |
Collapse
|
5
|
Wang S, Luo Z, Liang J, Hu J, Jiang N, He J, Li Q. Polymer Nanocomposite Dielectrics: Understanding the Matrix/Particle Interface. ACS NANO 2022; 16:13612-13656. [PMID: 36107156 DOI: 10.1021/acsnano.2c07404] [Citation(s) in RCA: 9] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Polymer nanocomposite dielectrics possess exceptional electric properties that are absent in the pristine dielectric polymers. The matrix/particle interface in polymer nanocomposite dielectrics is suggested to play decisive roles on the bulk material performance. Herein, we present a critical overview of recent research advances and important insights in understanding the matrix/particle interfacial characteristics in polymer nanocomposite dielectrics. The primary experimental strategies and state-of-the-art characterization techniques for resolving the local property-structure correlation of the matrix/particle interface are dissected in depth, with a focus on the characterization capabilities of each strategy or technique that other approaches cannot compete with. Limitations to each of the experimental strategy are evaluated as well. In the last section of this Review, we summarize and compare the three experimental strategies from multiple aspects and point out their advantages and disadvantages, critical issues, and possible experimental schemes to be established. Finally, the authors' personal viewpoints regarding the challenges of the existing experimental strategies are presented, and potential directions for the interface study are proposed for future research.
Collapse
Affiliation(s)
- Shaojie Wang
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| | - Zhen Luo
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| | - Jiajie Liang
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| | - Jun Hu
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| | - Naisheng Jiang
- School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China
| | - Jinliang He
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| | - Qi Li
- State Key Laboratory of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
| |
Collapse
|
6
|
Breshears MD, Giridharagopal R, Pothoof J, Ginger DS. A Robust Neural Network for Extracting Dynamics from Electrostatic Force Microscopy Data. J Chem Inf Model 2022; 62:4342-4350. [PMID: 36099208 DOI: 10.1021/acs.jcim.2c00738] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Advances in scanning probe microscopy (SPM) methods such as time-resolved electrostatic force microscopy (trEFM) now permit the mapping of fast local dynamic processes with high resolution in both space and time, but such methods can be time-consuming to analyze and calibrate. Here, we design and train a regression neural network (NN) that accelerates and simplifies the extraction of local dynamics from SPM data directly in a cantilever-independent manner, allowing the network to process data taken with different cantilevers. We validate the NN's ability to recover local dynamics with a fidelity equal to or surpassing conventional, more time-consuming, calibrations using both simulated and real microscopy data. We apply this method to extract accurate photoinduced carrier dynamics on n = 1 butylammonium lead iodide, a halide perovskite semiconductor film that is of interest for applications in both solar photovoltaics and quantum light sources. Finally, we use SHapley Additive exPlanations to evaluate the robustness of the trained model, confirm its cantilever-independence, and explore which parts of the trEFM signal are important to the network.
Collapse
Affiliation(s)
- Madeleine D Breshears
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
| | - Rajiv Giridharagopal
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
| | - Justin Pothoof
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
| | - David S Ginger
- Department of Chemistry, University of Washington, Seattle, Washington 98195, United States
| |
Collapse
|
7
|
Neumayer SM, Zhao Z, O'Hara A, McGuire MA, Susner MA, Pantelides ST, Maksymovych P, Balke N. Nanoscale Control of Polar Surface Phases in Layered van der Waals CuInP 2S 6. ACS NANO 2022; 16:2452-2460. [PMID: 35129970 DOI: 10.1021/acsnano.1c08970] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Antiferroelectric (AFE) materials, in which alternating dipole moments cancel out to a zero net macroscopic polarization, can be used for high-density energy storage and memory applications. The AFE phase can exist in bulk CuInP2Se6, CuBiP2S6, and a few other transition-metal thiophosphates below 200 K. The required low temperature poses challenges for practical applications. In this work, we report the coexistence of ferrielectric (FE) states and a stable surface phase that does not show piezoelectric response ("zero-response phase") in bulk CuInP2S6 at room temperature. Using piezoresponse force microscopy (PFM) tomographic imaging together with density functional theory, we find that direct and alternating voltages can locally and stably convert FE to zero-response phases and vice versa. While PFM loops show pinched hystereses reminiscent of antiferroelectricity, PFM tomography reveals that the zero-response areas form only on top of the FE phase in which the polarization vector is pointing up. Theoretical calculations suggest that the zero-response phase may correspond to AFE ordering where stacked CuInP2S6 layers have alternating polarization orientations thereby leading to a net-zero polarization. Consistent with experimental findings, theory predicts that the FE polarization pointing down is robust up to the top surface, whereas FE polarization pointing up energetically favors the formation of an AFE surface layer, whose thickness is likely to be sensitive to local strains. AFE order is likely to be more robust against detrimental size effects than polar order, therefore providing additional opportunities to create multifunctional heterostructures with 2D electronic materials.
Collapse
Affiliation(s)
- Sabine M Neumayer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Zhenghang Zhao
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Andrew O'Hara
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Michael A McGuire
- Materials Science and Technology Division, Oak Ridge, Tennessee 37831, United States
| | - Michael A Susner
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio 45433, United States
| | - Sokrates T Pantelides
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
- Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Petro Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695-7907, United States
| |
Collapse
|
8
|
Liu Y, Ziatdinov M, Kalinin SV. Exploring Causal Physical Mechanisms via Non-Gaussian Linear Models and Deep Kernel Learning: Applications for Ferroelectric Domain Structures. ACS NANO 2022; 16:1250-1259. [PMID: 34964598 DOI: 10.1021/acsnano.1c09059] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Rapid emergence of multimodal imaging in scanning probe, electron, and optical microscopies has brought forth the challenge of understanding the information contained in these complex data sets, targeting the intrinsic correlations between different channels, and further exploring the underpinning causal physical mechanisms. Here, we develop such an analysis framework for Piezoresponse Force Microscopy. We argue that under certain conditions, we can bootstrap experimental observations with the prior knowledge of materials structure to get information on certain nonobserved properties, and demonstrate linear causal analysis for PFM observables. We further demonstrate that the strength of individual causal links between complex descriptors can be ascertained using the deep kernel learning (DKL) model. In this DKL analysis, we use the prior information on domain structure within the image to predict the physical properties. This analysis demonstrates the correlative relationships between morphology, piezoresponse, elastic property, etc., at nanoscale. The prediction of morphology and other physical parameters illustrates a mutual interaction between surface condition and physical properties in ferroelectric materials. This analysis is universal and can be extended to explore the correlative relationships of other multichannel data sets, and allow for high-fidelity reconstruction of underpinning functionalities and physical mechanisms.
Collapse
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Maxim Ziatdinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| |
Collapse
|
9
|
Kalinin SV, Ziatdinov M, Hinkle J, Jesse S, Ghosh A, Kelley KP, Lupini AR, Sumpter BG, Vasudevan RK. Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy. ACS NANO 2021; 15:12604-12627. [PMID: 34269558 DOI: 10.1021/acsnano.1c02104] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics to self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiments (AE) in imaging. Here, we aim to analyze the major pathways toward AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment and consider the latencies, biases, and prior knowledge of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities, and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of human operators (as is the case for autonomous driving), but rather automation of routine operations such as microscope tuning, etc., prior to the experiment, and conversion of low latency decision making processes on the time scale spanning from image acquisition to human-level high-order experiment planning. Overall, we argue that ML/AI can dramatically alter the (S)TEM and SPM fields; however, this process is likely to be highly nontrivial and initiated by combined human-ML workflows and will bring challenges both from the microscope and ML/AI sides. At the same time, these methods will enable opportunities and paradigms for scientific discovery and nanostructure fabrication.
Collapse
|
10
|
Neumayer SM, Susner MA, McGuire MA, Pantelides ST, Kalnaus S, Maksymovych P, Balke N. Lowering of Tc in Van Der Waals Layered Materials Under In-Plane Strain. IEEE TRANSACTIONS ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL 2021; 68:253-258. [PMID: 32746203 DOI: 10.1109/tuffc.2020.3007290] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
The dependence of electromechanical behavior on strain in ferroelectric materials can be leveraged as parameter to tune ferroelectric properties such as the Curie temperature. For van der Waals materials, a unique opportunity arises because of wrinkling, bubbling, and Moiré phenomena accessible due to structural properties inherent to the van der Waals gap. Here, we use piezoresponse force microscopy and unsupervised machine learning methods to gain insight into the ferroelectric properties of layered CuInP2S6 where local areas are strained in-plane due to a partial delamination, resulting in a topographic bubble feature. We observe significant differences between strained and unstrained areas in piezoresponse images as well as voltage spectroscopy, during which strained areas show a sigmoid-shaped response usually associated with the response measured around the Curie temperature, indicating a lowering of the Curie temperature under tensile strain. These results suggest that strain engineering might be used to further increase the functionality of CuInP2S6 through locally modifying ferroelectric properties on the micro- and nanoscale.
Collapse
|
11
|
Collins L, Celano U. Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force Microscopy. ACS APPLIED MATERIALS & INTERFACES 2020; 12:41659-41665. [PMID: 32870659 DOI: 10.1021/acsami.0c07809] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Hafnium oxide (HfO2)-based ferroelectrics offer remarkable promise for memory and logic devices in view of their compatibility with traditional silicon complementary metal oxide semiconductor (CMOS) technology, high switchable polarization, good endurance, and thickness scalability. These factors have led to a steep rise in the level of research on HfO2 over the past number of years. While measurements on capacitors are promising for understanding macroscopic effects, many open questions regarding the emergence of ferroelectricity and electric field cycling behaviors remain. Continued progress requires information regarding the nanoscale ferroelectric behaviors on the bare surface (i.e., without encapsulation), which is notably absent. To overcome this barrier, we have applied complementary modes of piezoresponse force microscopy with the goal of directly and quantitatively sensing nanoscale ferroelectric behaviors in bare HfO2 thin films. Our results on 8 nm Si-doped HfO2 reveal nanoscale domains of local remnant polarization states exhibiting a weak piezoelectric coupling (deff) in the range 0.6-1.5 pm/V. While we observed localized enhancement of deff during progressive stressing of the bare HfO2 thin film, we did not detect stable polarization switching which is a prerequisite of ferroelectric switching. This result could be explained using polarization switching spectroscopy which revealed antiferroelectric-like switching in the form of pinched hysteresis loops as well as increasing remnant response with repeated cycling. As such, our results offer a promising route for material scientists who want to explore the nanoscale origins of antiferroelectricity and ferroelectric wakeup in HfO2.
Collapse
Affiliation(s)
- Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | | |
Collapse
|
12
|
Neumayer SM, Brehm JA, Tao L, O'Hara A, Ganesh P, Jesse S, Susner MA, McGuire MA, Pantelides ST, Maksymovych P, Balke N. Local Strain and Polarization Mapping in Ferrielectric Materials. ACS APPLIED MATERIALS & INTERFACES 2020; 12:38546-38553. [PMID: 32805973 DOI: 10.1021/acsami.0c09246] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
CuInP2S6 (CIPS) is a van der Waals material that has attracted attention because of its unusual properties. Recently, a combination of density functional theory (DFT) calculations and piezoresponse force microscopy (PFM) showed that CIPS is a uniaxial quadruple-well ferrielectric featuring two polar phases and a total of four polarization states that can be controlled by external strain. Here, we combine DFT and PFM to investigate the stress-dependent piezoelectric properties of CIPS, which have so far remained unexplored. The two different polarization phases are predicted to differ in their mechanical properties and the stress sensitivity of their piezoelectric constants. This knowledge is applied to the interpretation of ferroelectric domain images, which enables investigation of local strain and stress distributions. The interplay of theory and experiment produces polarization maps and layer spacings which we compare to macroscopic X-ray measurements. We found that the sample contains only the low-polarization phase and that domains of one polarization orientation are strained, whereas domains of the opposite polarization direction are fully relaxed. The described nanoscale imaging methodology is applicable to any material for which the relationship between electromechanical and mechanical characteristics is known, providing insight on structural, mechanical, and electromechanical properties down to ∼10 nm length scales.
Collapse
Affiliation(s)
- Sabine M Neumayer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| | - John A Brehm
- Department of Physics and Astronomy, Vanderbilt University, Nashville, 37235 Tennessee, United States
| | - Lei Tao
- Department of Physics and Astronomy, Vanderbilt University, Nashville, 37235 Tennessee, United States
- Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
| | - Andrew O'Hara
- Department of Physics and Astronomy, Vanderbilt University, Nashville, 37235 Tennessee, United States
| | - Panchapakesan Ganesh
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| | - Michael A Susner
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, 45433 Ohio, United States
| | - Michael A McGuire
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| | - Sokrates T Pantelides
- Department of Physics and Astronomy, Vanderbilt University, Nashville, 37235 Tennessee, United States
| | - Petro Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| | - Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, 37831 Tennessee, United States
| |
Collapse
|
13
|
Neumayer SM, Jesse S, Velarde G, Kholkin AL, Kravchenko I, Martin LW, Balke N, Maksymovych P. To switch or not to switch - a machine learning approach for ferroelectricity. NANOSCALE ADVANCES 2020; 2:2063-2072. [PMID: 36132496 PMCID: PMC9419588 DOI: 10.1039/c9na00731h] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/19/2019] [Accepted: 04/06/2020] [Indexed: 05/11/2023]
Abstract
With the advent of increasingly elaborate experimental techniques in physics, chemistry and materials sciences, measured data are becoming bigger and more complex. The observables are typically a function of several stimuli resulting in multidimensional data sets spanning a range of experimental parameters. As an example, a common approach to study ferroelectric switching is to observe effects of applied electric field, but switching can also be enacted by pressure and is influenced by strain fields, material composition, temperature, time, etc. Moreover, the parameters are usually interdependent, so that their decoupling toward univariate measurements or analysis may not be straightforward. On the other hand, both explicit and hidden parameters provide an opportunity to gain deeper insight into the measured properties, provided there exists a well-defined path to capture and analyze such data. Here, we introduce a new, two-dimensional approach to represent hysteretic response of a material system to applied electric field. Utilizing ferroelectric polarization as a model hysteretic property, we demonstrate how explicit consideration of electromechanical response to two rather than one control voltages enables significantly more transparent and robust interpretation of observed hysteresis, such as differentiating between charge trapping and ferroelectricity. Furthermore, we demonstrate how the new data representation readily fits into a variety of machine-learning methodologies, from unsupervised classification of the origins of hysteretic response via linear clustering algorithms to neural-network-based inference of the sample temperature based on the specific morphology of hysteresis.
Collapse
Affiliation(s)
- Sabine M Neumayer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Gabriel Velarde
- Department of Materials Science and Engineering, University of California Berkeley CA 94720 USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory Berkeley CA 94720 USA
| | - Andrei L Kholkin
- Department of Physics & CICECO - Aveiro Institute of Materials, University of Aveiro Aveiro Portugal
- School of Natural Sciences and Mathematics, Ural Federal University Ekaterinburg Russia
| | - Ivan Kravchenko
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Lane W Martin
- Department of Materials Science and Engineering, University of California Berkeley CA 94720 USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory Berkeley CA 94720 USA
| | - Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Peter Maksymovych
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| |
Collapse
|
14
|
Agar JC, Naul B, Pandya S, van der Walt S, Maher J, Ren Y, Chen LQ, Kalinin SV, Vasudevan RK, Cao Y, Bloom JS, Martin LW. Revealing ferroelectric switching character using deep recurrent neural networks. Nat Commun 2019; 10:4809. [PMID: 31641122 PMCID: PMC6805893 DOI: 10.1038/s41467-019-12750-0] [Citation(s) in RCA: 24] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/18/2019] [Accepted: 09/18/2019] [Indexed: 11/22/2022] Open
Abstract
The ability to manipulate domains underpins function in applications of ferroelectrics. While there have been demonstrations of controlled nanoscale manipulation of domain structures to drive emergent properties, such approaches lack an internal feedback loop required for automatic manipulation. Here, using a deep sequence-to-sequence autoencoder we automate the extraction of latent features of nanoscale ferroelectric switching from piezoresponse force spectroscopy of tensile-strained PbZr0.2Ti0.8O3 with a hierarchical domain structure. We identify characteristic behavior in the piezoresponse and cantilever resonance hysteresis loops, which allows for the classification and quantification of nanoscale-switching mechanisms. Specifically, we identify elastic hardening events which are associated with the nucleation and growth of charged domain walls. This work demonstrates the efficacy of unsupervised neural networks in learning features of a material’s physical response from nanoscale multichannel hyperspectral imagery and provides new capabilities in leveraging in operando spectroscopies that could enable the automated manipulation of nanoscale structures in materials. The scale and dimensionality of imaging data means information is commonly overlooked. Here, using recurrent neural networks we understand temporal dependencies in hyperspectral imagery, enabling the observation of differences in ferroelectric switching mechanisms in PbZr0.2Ti0.8O3 thin films due to formation of charged domain walls.
Collapse
Affiliation(s)
- Joshua C Agar
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA. .,Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA. .,Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015, USA.
| | - Brett Naul
- Department of Astronomy, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Shishir Pandya
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Stefan van der Walt
- Berkeley Institute of Data Science, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Joshua Maher
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Yao Ren
- Department of Materials Science and Engineering, The University of Texas at Arlington, Arlington, TX, 76019, USA
| | - Long-Qing Chen
- Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA, 16802-5006, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA
| | - Ye Cao
- Department of Materials Science and Engineering, The University of Texas at Arlington, Arlington, TX, 76019, USA
| | - Joshua S Bloom
- Department of Astronomy, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Lane W Martin
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA. .,Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
| |
Collapse
|
15
|
Kalinin SV, Dyck O, Balke N, Neumayer S, Tsai WY, Vasudevan R, Lingerfelt D, Ahmadi M, Ziatdinov M, McDowell MT, Strelcov E. Toward Electrochemical Studies on the Nanometer and Atomic Scales: Progress, Challenges, and Opportunities. ACS NANO 2019; 13:9735-9780. [PMID: 31433942 DOI: 10.1021/acsnano.9b02687] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Electrochemical reactions and ionic transport underpin the operation of a broad range of devices and applications, from energy storage and conversion to information technologies, as well as biochemical processes, artificial muscles, and soft actuators. Understanding the mechanisms governing function of these applications requires probing local electrochemical phenomena on the relevant time and length scales. Here, we discuss the challenges and opportunities for extending electrochemical characterization probes to the nanometer and ultimately atomic scales, including challenges in down-scaling classical methods, the emergence of novel probes enabled by nanotechnology and based on emergent physics and chemistry of nanoscale systems, and the integration of local data into macroscopic models. Scanning probe microscopy (SPM) methods based on strain detection, potential detection, and hysteretic current measurements are discussed. We further compare SPM to electron beam probes and discuss the applicability of electron beam methods to probe local electrochemical behavior on the mesoscopic and atomic levels. Similar to a SPM tip, the electron beam can be used both for observing behavior and as an active electrode to induce reactions. We briefly discuss new challenges and opportunities for conducting fundamental scientific studies, matter patterning, and atomic manipulation arising in this context.
Collapse
Affiliation(s)
- Sergei V Kalinin
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Ondrej Dyck
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Nina Balke
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Sabine Neumayer
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Wan-Yu Tsai
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Rama Vasudevan
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - David Lingerfelt
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Mahshid Ahmadi
- Joint Institute for Advanced Materials, Department of Materials Science and Engineering , University of Tennessee , Knoxville , Tennessee 37996 , United States
| | - Maxim Ziatdinov
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37831 , United States
| | - Matthew T McDowell
- George W. Woodruff School of Mechanical Engineering and School of Materials Science and Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States
| | - Evgheni Strelcov
- Institute for Research in Electronics and Applied Physics , University of Maryland , College Park , Maryland 20742 , United States
| |
Collapse
|
16
|
Garten LM, Moore DT, Nanayakkara SU, Dwaraknath S, Schulz P, Wands J, Rockett A, Newell B, Persson KA, Trolier-McKinstry S, Ginley DS. The existence and impact of persistent ferroelectric domains in MAPbI 3. SCIENCE ADVANCES 2019; 5:eaas9311. [PMID: 30746434 PMCID: PMC6357725 DOI: 10.1126/sciadv.aas9311] [Citation(s) in RCA: 15] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/05/2018] [Accepted: 12/07/2018] [Indexed: 05/27/2023]
Abstract
Methylammonium lead iodide (MAPbI3) exhibits exceptional photovoltaic performance, but there remains substantial controversy over the existence and impact of ferroelectricity on the photovoltaic response. We confirm ferroelectricity in MAPbI3 single crystals and demonstrate mediation of the electronic response by ferroelectric domain engineering. The ferroelectric response sharply declines above 57°C, consistent with the tetragonal-to-cubic phase transition. Concurrent band excitation piezoresponse force microscopy-contact Kelvin probe force microscopy shows that the measured response is not dominated by spurious electrostatic interactions. Large signal poling (>16 V/cm) orients the permanent polarization into large domains, which show stabilization over weeks. X-ray photoemission spectroscopy results indicate a shift of 400 meV in the binding energy of the iodine core level peaks upon poling, which is reflected in the carrier concentration results from scanning microwave impedance microscopy. The ability to control the ferroelectric response provides routes to increase device stability and photovoltaic performance through domain engineering.
Collapse
Affiliation(s)
| | - David T. Moore
- National Renewable Energy Laboratory, Golden, CO 80401, USA
| | | | - Shyam Dwaraknath
- Lawrence Berkeley National Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720, USA
| | - Philip Schulz
- National Renewable Energy Laboratory, Golden, CO 80401, USA
- CNRS, Institut Photovoltaïque d’Île de France, UMR 9006, 30 route départementale 128, Palaiseau 91120, France
| | - Jake Wands
- Colorado School of Mines, Golden, CO 80401, USA
| | | | - Brian Newell
- Colorado State University, Fort Collins, CO 80523, USA
| | - Kristin A. Persson
- Lawrence Berkeley National Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720, USA
- The Pennsylvania State University, University Park, PA 16802, USA
| | | | | |
Collapse
|
17
|
Belianinov A, Ievlev AV, Lorenz M, Borodinov N, Doughty B, Kalinin SV, Fernández FM, Ovchinnikova OS. Correlated Materials Characterization via Multimodal Chemical and Functional Imaging. ACS NANO 2018; 12:11798-11818. [PMID: 30422627 PMCID: PMC9850281 DOI: 10.1021/acsnano.8b07292] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
Abstract
Multimodal chemical imaging simultaneously offers high-resolution chemical and physical information with nanoscale and, in select cases, atomic resolution. By coupling modalities that collect physical and chemical information, we can address scientific problems in biological systems, battery and fuel cell research, catalysis, pharmaceuticals, photovoltaics, medicine, and many others. The combined systems enable the local correlation of material properties with chemical makeup, making fundamental questions of how chemistry and structure drive functionality approachable. In this Review, we present recent progress and offer a perspective for chemical imaging used to characterize a variety of samples by a number of platforms. Specifically, we present cases of infrared and Raman spectroscopies combined with scanning probe microscopy; optical microscopy and mass spectrometry; nonlinear optical microscopy; and, finally, ion, electron, and probe microscopies with mass spectrometry. We also discuss the challenges associated with the use of data originated by the combinatorial hardware, analysis, and machine learning as well as processing tools necessary for the interpretation of multidimensional data acquired from multimodal studies.
Collapse
Affiliation(s)
- Alex Belianinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Anton V. Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Matthias Lorenz
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Nikolay Borodinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Benjamin Doughty
- Chemical Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Facundo M. Fernández
- School of Chemistry and Biochemistry, Georgia Institute of Technology and Petit Institute for Biochemistry and Bioscience, Atlanta, Georgia 30332, United States
| | - Olga S. Ovchinnikova
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Corresponding Author:
| |
Collapse
|
18
|
Neumayer SM, Collins L, Vasudevan R, Smith C, Somnath S, Shur VY, Jesse S, Kholkin AL, Kalinin SV, Rodriguez BJ. Decoupling Mesoscale Functional Response in PLZT across the Ferroelectric-Relaxor Phase Transition with Contact Kelvin Probe Force Microscopy and Machine Learning. ACS APPLIED MATERIALS & INTERFACES 2018; 10:42674-42680. [PMID: 30457324 DOI: 10.1021/acsami.8b15872] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromechanical response, polarization rotations, as well as temperature and electric field-driven phase transitions. The origin of this unusual functional behavior remains elusive due to limited knowledge on polarization dynamics at the nanoscale. Piezoresponse force microscopy and associated switching spectroscopy provide access to local electromechanical properties on the micro- and nanoscale, which can help to address some of these gaps in our knowledge. However, these techniques are inherently prone to artefacts caused by signal contributions emanating from electrostatic interactions between tip and sample. Understanding functional behavior of complex, disordered systems like relaxor materials with unknown electromechanical properties therefore requires a technique that allows distinguishing between electromechanical and electrostatic response. Here, contact Kelvin probe force microscopy (cKPFM) is used to gain insight into the evolution of local electromechanical and capacitive properties of a representative relaxor material lead lanthanum zirconate across the phase transition from a ferroelectric to relaxor state. The obtained multidimensional data set was processed using an unsupervised machine learning algorithm to detect variations in functional response across the probed area and temperature range. Further analysis showed the formation of two separate cKPFM response bands below 50 °C, providing evidence for polarization switching. At higher temperatures only one band is observed, indicating an electrostatic origin of the measured response. In addition, the junction potential difference, which was extracted from the cKPFM data, becomes independent of the temperature in the relaxor state. The combination of this multidimensional voltage spectroscopy technique and machine learning allows to identify the origin of the measured functional response and to decouple ferroelectric from electrostatic phenomena necessary to understand the functional behavior of complex, disordered systems like relaxor materials.
Collapse
Affiliation(s)
- Sabine M Neumayer
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
- School of Physics , University College Dublin , Belfield 4 , Dublin 4 , Ireland
| | - Liam Collins
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Rama Vasudevan
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Christopher Smith
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Suhas Somnath
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Vladimir Ya Shur
- School of Natural Sciences and Mathematics , Ural Federal University , 620000 Ekaterinburg , Russia
| | - Stephen Jesse
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Andrei L Kholkin
- School of Natural Sciences and Mathematics , Ural Federal University , 620000 Ekaterinburg , Russia
- Department of Physics , CICECO-Aveiro Institute of Materials , 3810-193 Aveiro , Portugal
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , 1 Bethel Valley Road , Oak Ridge , Tennessee 37831 , United States
| | - Brian J Rodriguez
- School of Physics , University College Dublin , Belfield 4 , Dublin 4 , Ireland
| |
Collapse
|
19
|
Exploring the Magnetoelectric Coupling at the Composite Interfaces of FE/FM/FE Heterostructures. Sci Rep 2018; 8:17381. [PMID: 30478356 PMCID: PMC6255769 DOI: 10.1038/s41598-018-35648-1] [Citation(s) in RCA: 20] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/15/2018] [Accepted: 10/15/2018] [Indexed: 11/08/2022] Open
Abstract
Multiferroic materials have attracted considerable attention as possible candidates for a wide variety of future microelectronic and memory devices, although robust magnetoelectric (ME) coupling between electric and magnetic orders at room temperature still remains difficult to achieve. In order to obtain robust ME coupling at room temperature, we studied the Pb(Fe0.5Nb0.5)O3/Ni0.65Zn0.35Fe2O4/Pb(Fe0.5Nb0.5)O3 (PFN/NZFO/PFN) trilayer structure as a representative FE/FM/FE system. We report the ferroelectric, magnetic and ME properties of PFN/NZFO/PFN trilayer nanoscale heterostructure having dimensions 70/20/70 nm, at room temperature. The presence of only (00l) reflection of PFN and NZFO in the X-ray diffraction (XRD) patterns and electron diffraction patterns in Transmission Electron Microscopy (TEM) confirm the epitaxial growth of multilayer heterostructure. The distribution of the ferroelectric loop area in a wide area has been studied, suggesting that spatial variability of ferroelectric switching behavior is low, and film growth is of high quality. The ferroelectric and magnetic phase transitions of these heterostructures have been found at ~575 K and ~650 K, respectively which are well above room temperature. These nanostructures exhibit low loss tangent, large saturation polarization (Ps ~ 38 µC/cm2) and magnetization (Ms ~ 48 emu/cm3) with strong ME coupling at room temperature revealing them as potential candidates for nanoscale multifunctional and spintronics device applications.
Collapse
|
20
|
Liu Y, Collins L, Proksch R, Kim S, Watson BR, Doughty B, Calhoun TR, Ahmadi M, Ievlev AV, Jesse S, Retterer ST, Belianinov A, Xiao K, Huang J, Sumpter BG, Kalinin SV, Hu B, Ovchinnikova OS. Chemical nature of ferroelastic twin domains in CH 3NH 3PbI 3 perovskite. NATURE MATERIALS 2018; 17:1013-1019. [PMID: 30150621 DOI: 10.1038/s41563-018-0152-z] [Citation(s) in RCA: 34] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/13/2018] [Accepted: 07/25/2018] [Indexed: 05/09/2023]
Abstract
The extraordinary optoelectronic performance of hybrid organic-inorganic perovskites has resulted in extensive efforts to unravel their properties. Recently, observations of ferroic twin domains in methylammonium lead triiodide drew significant attention as a possible explanation for the current-voltage hysteretic behaviour in these materials. However, the properties of the twin domains, their local chemistry and the chemical impact on optoelectronic performance remain unclear. Here, using multimodal chemical and functional imaging methods, we unveil the mechanical origin of the twin domain contrast observed with piezoresponse force microscopy in methylammonium lead triiodide. By combining experimental results with first principles simulations we reveal an inherent coupling between ferroelastic twin domains and chemical segregation. These results reveal an interplay of ferroic properties and chemical segregation on the optoelectronic performance of hybrid organic-inorganic perovskites, and offer an exploratory path to improving functional devices.
Collapse
Affiliation(s)
- Yongtao Liu
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Roger Proksch
- Asylum Research an Oxford Instruments Company, Santa Barbara, CA, USA
| | - Songkil Kim
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- School of Mechanical Engineering, Pusan National University, Busan, South Korea
| | - Brianna R Watson
- Department of Chemistry, University of Tennessee, Knoxville, TN, USA
| | - Benjamin Doughty
- Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Tessa R Calhoun
- Department of Chemistry, University of Tennessee, Knoxville, TN, USA
| | - Mahshid Ahmadi
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Anton V Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Scott T Retterer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Alex Belianinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Kai Xiao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Jingsong Huang
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Bobby G Sumpter
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
| | - Bin Hu
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
| | - Olga S Ovchinnikova
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
| |
Collapse
|
21
|
Li T, Zeng K. Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:e1803064. [PMID: 30306656 DOI: 10.1002/adma.201803064] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/13/2018] [Revised: 07/22/2018] [Indexed: 06/08/2023]
Abstract
The characterization of the local multifield coupling phenomenon (MCP) in various functional/structural materials by using scanning probe microscopy (SPM)-based techniques is comprehensively reviewed. Understanding MCP has great scientific and engineering significance in materials science and engineering, as in many practical applications, materials and devices are operated under a combination of multiple physical fields, such as electric, magnetic, optical, chemical and force fields, and working environments, such as different atmospheres, large temperature fluctuations, humidity, or acidic space. The materials' responses to the synergetic effects of the multifield (physical and environmental) determine the functionalities, performance, lifetime of the materials, and even the devices' manufacturing. SPM techniques are effective and powerful tools to characterize the local effects of MCP. Here, an introduction of the local MCP, the descriptions of several important SPM techniques, especially the electrical, mechanical, chemical, and optical related techniques, and the applications of SPM techniques to investigate the local phenomena and mechanisms in oxide materials, energy materials, biomaterials, and supramolecular materials are covered. Finally, an outlook of the MCP and SPM techniques in materials research is discussed.
Collapse
Affiliation(s)
- Tao Li
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117576, Singapore
- Center for Spintronics and Quantum System, State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Shaanxi, 710049, Xi'an, China
| | - Kaiyang Zeng
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117576, Singapore
| |
Collapse
|
22
|
Neumayer SM, Ievlev AV, Collins L, Vasudevan R, Baghban MA, Ovchinnikova O, Jesse S, Gallo K, Rodriguez BJ, Kalinin SV. Surface Chemistry Controls Anomalous Ferroelectric Behavior in Lithium Niobate. ACS APPLIED MATERIALS & INTERFACES 2018; 10:29153-29160. [PMID: 30062871 DOI: 10.1021/acsami.8b09513] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
Polarization switching in ferroelectric materials underpins a multitude of applications ranging from nonvolatile memories to data storage to ferroelectric lithography. While traditionally considered to be a functionality of the material only, basic theoretical considerations suggest that switching is expected to be intrinsically linked to changes in the electrochemical state of the surface. Hence, the properties and dynamics of the screening charges can affect or control the switching dynamics. Despite being recognized for over 50 years, analysis of these phenomena remained largely speculative. Here, we explore polarization switching on the prototypical LiNbO3 surface using the combination of contact mode Kelvin probe force microscopy and chemical imaging by time-of-flight mass-spectrometry and demonstrate pronounced chemical differences between the domains. These studies provide a consistent explanation to the anomalous polarization and surface charge behavior observed in LiNbO3 and point to new opportunities in chemical control of polarization dynamics in thin films and crystals via control of surface chemistry, complementing traditional routes via bulk doping, and substrate-induced strain and tilt systems.
Collapse
Affiliation(s)
- Sabine M Neumayer
- School of Physics , University College Dublin , Dublin 4 , Ireland
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Anton V Ievlev
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Liam Collins
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Rama Vasudevan
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Mohammad A Baghban
- Department of Applied Physics , KTH Royal Institute of Technology , Stockholm 106 91 , Sweden
| | - Olga Ovchinnikova
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Stephen Jesse
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| | - Katia Gallo
- Department of Applied Physics , KTH Royal Institute of Technology , Stockholm 106 91 , Sweden
| | | | - Sergei V Kalinin
- Center for Nanophase Materials Science , Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States
| |
Collapse
|
23
|
Collins L, Kilpatrick JI, Kalinin SV, Rodriguez BJ. Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2018; 81:086101. [PMID: 29990308 DOI: 10.1088/1361-6633/aab560] [Citation(s) in RCA: 18] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid-liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels, etc and possess complex time and voltage dependent dynamics. This necessitates time-resolved and real-space probing of these phenomena. In this review, we discuss the applications of force-sensitive voltage modulated scanning probe microscopy (SPM) for probing electrical phenomena at solid-liquid interfaces. We first describe the working principles behind electrostatic and Kelvin probe force microscopies (EFM & KPFM) at the gas-solid interface, review the state of the art in advanced KPFM methods and developments to (i) overcome limitations of classical KPFM, (ii) expand the information accessible from KPFM, and (iii) extend KPFM operation to liquid environments. We briefly discuss the theoretical framework of electrical double layer (EDL) forces and dynamics, the implications and breakdown of classical EDL models for highly charged interfaces or under high ion concentrations, and describe recent modifications of the classical EDL theory relevant for understanding nanoscale electrical measurements at the solid-liquid interface. We further review the latest achievements in mapping surface charge, dielectric constants, and electrodynamic and electrochemical processes in liquids. Finally, we outline the key challenges and opportunities that exist in the field of nanoscale electrical measurements in liquid as well as providing a roadmap for the future development of liquid KPFM.
Collapse
Affiliation(s)
- Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States of America. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States of America
| | | | | | | |
Collapse
|
24
|
High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping. Nat Commun 2018; 9:2428. [PMID: 29930246 PMCID: PMC6013493 DOI: 10.1038/s41467-018-04887-1] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/06/2018] [Accepted: 05/31/2018] [Indexed: 02/01/2023] Open
Abstract
The key objective of scanning probe microscopy (SPM) techniques is the optimal representation of the nanoscale surface structure and functionality inferred from the dynamics of the cantilever. This is particularly pertinent today, as the SPM community has seen a rapidly growing trend towards simultaneous capture of multiple imaging channels and complex modes of operation involving high-dimensional information-rich datasets, bringing forward the challenges of visualization and analysis, particularly for cases where the underlying dynamic model is poorly understood. To meet this challenge, we present a data-driven approach, Graph-Bootstrapping, based on low-dimensional manifold learning of the full SPM spectra and demonstrate its successes for high-veracity mechanical mapping on a mixed polymer thin film and resolving irregular hydration structure of calcite at atomic resolution. Using the proposed methodology, we can efficiently reveal and hierarchically represent salient material features with rich local details, further enabling denoising, classification, and high-resolution functional imaging.
Collapse
|
25
|
López-Guerra EA, Banfi F, Solares SD, Ferrini G. Theory of Single-Impact Atomic Force Spectroscopy in liquids with material contrast. Sci Rep 2018; 8:7534. [PMID: 29760518 PMCID: PMC5951954 DOI: 10.1038/s41598-018-25828-4] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/20/2017] [Accepted: 04/25/2018] [Indexed: 11/09/2022] Open
Abstract
Scanning probe microscopy has enabled nanoscale mapping of mechanical properties in important technological materials, such as tissues, biomaterials, polymers, nanointerfaces of composite materials, to name only a few. To improve and widen the measurement of nanoscale mechanical properties, a number of methods have been proposed to overcome the widely used force-displacement mode, that is inherently slow and limited to a quasi-static regime, mainly using multiple sinusoidal excitations of the sample base or of the cantilever. Here, a different approach is put forward. It exploits the unique capabilities of the wavelet transform analysis to harness the information encoded in a short duration spectroscopy experiment. It is based on an impulsive excitation of the cantilever and a single impact of the tip with the sample. It performs well in highly damped environments, which are often seen as problematic in other standard dynamic methods. Our results are very promising in terms of viscoelastic property discrimination. Their potential is oriented (but not limited) to samples that demand imaging in liquid native environments and also to highly vulnerable samples whose compositional mapping cannot be obtained through standard tapping imaging techniques.
Collapse
Affiliation(s)
- Enrique A López-Guerra
- Department of Mechanical and Aerospace Engineering, The George Washington University, Washington, DC, 20052, USA
| | - Francesco Banfi
- Interdisciplinary Laboratories for Advanced Materials Physics, Università Cattolica del Sacro Cuore, I-25121, Brescia, Italy.,Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, I-25121, Brescia, Italy
| | - Santiago D Solares
- Department of Mechanical and Aerospace Engineering, The George Washington University, Washington, DC, 20052, USA
| | - Gabriele Ferrini
- Interdisciplinary Laboratories for Advanced Materials Physics, Università Cattolica del Sacro Cuore, I-25121, Brescia, Italy. .,Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, I-25121, Brescia, Italy.
| |
Collapse
|
26
|
Ahmadi M, Collins L, Puretzky A, Zhang J, Keum JK, Lu W, Ivanov I, Kalinin SV, Hu B. Exploring Anomalous Polarization Dynamics in Organometallic Halide Perovskites. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:1705298. [PMID: 29356145 DOI: 10.1002/adma.201705298] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/14/2017] [Revised: 11/20/2017] [Indexed: 06/07/2023]
Abstract
Organometallic halide perovskites (OMHPs) have attracted broad attention as prospective materials for optoelectronic applications. Among the many anomalous properties of these materials, of special interest are the ferroelectric properties including both classical and relaxor-like components, as a potential origin of slow dynamics, field enhancement, and anomalous mobilities. Here, ferroelectric properties of the three representative OMHPs are explored, including FAPbx Sn1-x I3 (x = 0, x = 0.85) and FA0.85 MA0.15 PbI3 using band excitation piezoresponse force microscopy and contact mode Kelvin probe force microscopy, providing insight into long- and short-range dipole and charge dynamics in these materials and probing ferroelectric density of states. Furthermore, second-harmonic generation in thin films of OMHPs is observed, providing a direct information on the noncentrosymmetric polarization in such materials. Overall, the data provide strong evidence for the presence of ferroelectric domains in these systems; however, the domain dynamics is suppressed by fast ion dynamics. These materials hence present the limit of ferroelectric materials with spontaneous polarization dynamically screened by ionic and electronic carriers.
Collapse
Affiliation(s)
- Mahshid Ahmadi
- Joint Institute for Advanced Materials, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA
| | - Liam Collins
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Alexander Puretzky
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Jia Zhang
- Joint Institute for Advanced Materials, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA
| | - Jong Kahk Keum
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Wei Lu
- Department of Chemistry, University of Tennessee, Knoxville, TN, 37996, USA
| | - Ilia Ivanov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Bin Hu
- Joint Institute for Advanced Materials, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA
| |
Collapse
|
27
|
Li L, Yang Y, Zhang D, Ye ZG, Jesse S, Kalinin SV, Vasudevan RK. Machine learning-enabled identification of material phase transitions based on experimental data: Exploring collective dynamics in ferroelectric relaxors. SCIENCE ADVANCES 2018; 4:eaap8672. [PMID: 29670940 PMCID: PMC5903900 DOI: 10.1126/sciadv.aap8672] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/04/2017] [Accepted: 02/12/2018] [Indexed: 05/14/2023]
Abstract
Exploration of phase transitions and construction of associated phase diagrams are of fundamental importance for condensed matter physics and materials science alike, and remain the focus of extensive research for both theoretical and experimental studies. For the latter, comprehensive studies involving scattering, thermodynamics, and modeling are typically required. We present a new approach to data mining multiple realizations of collective dynamics, measured through piezoelectric relaxation studies, to identify the onset of a structural phase transition in nanometer-scale volumes, that is, the probed volume of an atomic force microscope tip. Machine learning is used to analyze the multidimensional data sets describing relaxation to voltage and thermal stimuli, producing the temperature-bias phase diagram for a relaxor crystal without the need to measure (or know) the order parameter. The suitability of the approach to determine the phase diagram is shown with simulations based on a two-dimensional Ising model. These results indicate that machine learning approaches can be used to determine phase transitions in ferroelectrics, providing a general, statistically significant, and robust approach toward determining the presence of critical regimes and phase boundaries.
Collapse
Affiliation(s)
- Linglong Li
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Frontier Institute of Science and Technology, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China
| | - Yaodong Yang
- Frontier Institute of Science and Technology, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China
| | - Dawei Zhang
- School of Materials Science and Engineering, University of New South Wales, Sydney, New South Wales 2052, Australia
| | - Zuo-Guang Ye
- Department of Chemistry and 4D LABS, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia V5A 1S6, Canada
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Corresponding author. (S.V.K.); (R.K.V.)
| | - Rama K. Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Corresponding author. (S.V.K.); (R.K.V.)
| |
Collapse
|
28
|
Tripathi AM, Su WN, Hwang BJ. In situ analytical techniques for battery interface analysis. Chem Soc Rev 2018; 47:736-851. [DOI: 10.1039/c7cs00180k] [Citation(s) in RCA: 268] [Impact Index Per Article: 44.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
Abstract
Interface is a key to high performance and safe lithium-ion batteries or lithium batteries.
Collapse
Affiliation(s)
- Alok M. Tripathi
- Nano-electrochemistry Laboratory
- Department of Chemical Engineering
- National Taiwan University of Science and Technology
- Taipei
- Taiwan
| | - Wei-Nien Su
- Nano-electrochemistry Laboratory
- Department of Chemical Engineering
- National Taiwan University of Science and Technology
- Taipei
- Taiwan
| | - Bing Joe Hwang
- Nano-electrochemistry Laboratory
- Department of Chemical Engineering
- National Taiwan University of Science and Technology
- Taipei
- Taiwan
| |
Collapse
|
29
|
Strelcov E, Ahmadi M, Kalinin SV. Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes. KELVIN PROBE FORCE MICROSCOPY 2018. [DOI: 10.1007/978-3-319-75687-5_10] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/17/2023]
|
30
|
Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam. Sci Rep 2017; 7:16619. [PMID: 29192283 PMCID: PMC5709364 DOI: 10.1038/s41598-017-16949-3] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/27/2017] [Accepted: 11/20/2017] [Indexed: 11/11/2022] Open
Abstract
Multi-material systems interfaced with 2D materials, or entirely new 3D heterostructures can lead to the next generation multi-functional device architectures. Physical and chemical control at the nanoscale is also necessary tailor these materials as functional structures approach physical limit. 2D transition metal thiophosphates (TPS), with a general formulae Cu1−xIn1+x/3P2S6, have shown ferroelectric polarization behavior with a Tc above the room temperature, making them attractive candidates for designing both: chemical and physical properties. Our previous studies have demonstrated that ferroic order persists on the surface, and that spinoidal decomposition of ferroelectric and paraelectric phases occurs in non-stoichiometric Cu/In ratio formulations. Here, we discuss the chemical changes induced by helium ion irradiation. We explore the TPS compound library with varying Cu/In ratio, using Helium Ion Microscopy, Atomic Force Microscopy (AFM), and Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS). We correlate physical nano- and micro- structures to the helium ion dose, as well as chemical signatures of copper, oxygen and sulfur. Our ToF-SIMS results show that He ion irradiation leads to oxygen penetration into the irradiated areas, and diffuses along the Cu-rich domains to the extent of the stopping distance of the helium ions.
Collapse
|
31
|
Damodaran AR, Pandya S, Agar JC, Cao Y, Vasudevan RK, Xu R, Saremi S, Li Q, Kim J, McCarter MR, Dedon LR, Angsten T, Balke N, Jesse S, Asta M, Kalinin SV, Martin LW. Three-State Ferroelastic Switching and Large Electromechanical Responses in PbTiO 3 Thin Films. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2017; 29:1702069. [PMID: 28758269 DOI: 10.1002/adma.201702069] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/12/2017] [Revised: 06/04/2017] [Indexed: 06/07/2023]
Abstract
Leveraging competition between energetically degenerate states to achieve large field-driven responses is a hallmark of functional materials, but routes to such competition are limited. Here, a new route to such effects involving domain-structure competition is demonstrated, which arises from strain-induced spontaneous partitioning of PbTiO3 thin films into nearly energetically degenerate, hierarchical domain architectures of coexisting c/a and a1 /a2 domain structures. Using band-excitation piezoresponse force microscopy, this study manipulates and acoustically detects a facile interconversion of different ferroelastic variants via a two-step, three-state ferroelastic switching process (out-of-plane polarized c+ → in-plane polarized a → out-of-plane polarized c- state), which is concomitant with large nonvolatile electromechanical strains (≈1.25%) and tunability of the local piezoresponse and elastic modulus (>23%). It is further demonstrated that deterministic, nonvolatile writing/erasure of large-area patterns of this electromechanical response is possible, thus showing a new pathway to improved function and properties.
Collapse
Affiliation(s)
- Anoop R Damodaran
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Shishir Pandya
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Josh C Agar
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Ye Cao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Ruijuan Xu
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Sahar Saremi
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Qian Li
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Jieun Kim
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | | | - Liv R Dedon
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Tom Angsten
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Mark Asta
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Lane W Martin
- Department of Materials Science & Engineering, University of California, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| |
Collapse
|
32
|
Paine MRL, Kooijman PC, Fisher GL, Heeren RMA, Fernández FM, Ellis SR. Visualizing molecular distributions for biomaterials applications with mass spectrometry imaging: a review. J Mater Chem B 2017; 5:7444-7460. [PMID: 32264222 DOI: 10.1039/c7tb01100h] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
Abstract
Mass spectrometry imaging (MSI) is a rapidly emerging field that is continually finding applications in new and exciting areas. The ability of MSI to measure the spatial distribution of molecules at or near the surface of complex substrates makes it an ideal candidate for many applications, including those in the sphere of materials chemistry. Continual development and optimization of both ionization sources and analyzer technologies have resulted in a wide array of MSI tools available, both commercially available and custom-built, with each configuration possessing inherent strengths and limitations. Despite the unique potential of MSI over other chemical imaging methods, their potential and application to (bio)materials science remains in our view a largely underexplored avenue. This review will discuss these techniques enabling high parallel molecular detection, focusing on those with reported uses in (bio)materials chemistry applications and highlighted with select applications. Different technologies are presented in three main sections; secondary ion mass spectrometry (SIMS) imaging, matrix-assisted laser desorption ionization (MALDI) MSI, and emerging MSI technologies with potential for biomaterial analysis. The first two sections (SIMS and MALDI) discuss well-established methods that are continually evolving both in technological advancements and in experimental versatility. In the third section, relatively new and versatile technologies capable of performing measurements under ambient conditions will be introduced, with reported applications in materials chemistry or potential applications discussed. The aim of this review is to provide a concise resource for those interested in utilizing MSI for applications such as biomimetic materials, biological/synthetic material interfaces, polymer formulation and bulk property characterization, as well as the spatial and chemical distributions of nanoparticles, or any other molecular imaging application requiring broad chemical speciation.
Collapse
Affiliation(s)
- Martin R L Paine
- M4I, The Maastricht MultiModal Molecular Imaging Institute, Maastricht University, Maastricht 6229 ER, The Netherlands.
| | | | | | | | | | | |
Collapse
|
33
|
Kurnia F, Cheung J, Cheng X, Sullaphen J, Kalinin SV, Valanoor N, Vasudevan RK. Nanoscale Probing of Elastic-Electronic Response to Vacancy Motion in NiO Nanocrystals. ACS NANO 2017; 11:8387-8394. [PMID: 28742320 DOI: 10.1021/acsnano.7b03826] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Measuring the diffusion of ions and vacancies at nanometer length scales is crucial to understanding fundamental mechanisms driving technologies as diverse as batteries, fuel cells, and memristors; yet such measurements remain extremely challenging. Here, we employ a multimodal scanning probe microscopy (SPM) technique to explore the interplay between electronic, elastic, and ionic processes via first-order reversal curve I-V measurements in conjunction with electrochemical strain microscopy (ESM). The technique is employed to investigate the diffusion of oxygen vacancies in model epitaxial nickel oxide (NiO) nanocrystals with resistive switching characteristics. Results indicate that opening of the ESM hysteresis loop is strongly correlated with changes to the resonant frequency, hinting that elastic changes stem from the motion of oxygen (or cation) vacancies in the probed volume of the SPM tip. These changes are further correlated to the current measured on each nanostructure, which shows a hysteresis loop opening at larger (∼2.5 V) voltage windows, suggesting the threshold field for vacancy migration. This study highlights the utility of local multimodal SPM in determining functional and chemical changes in nanoscale volumes in nanostructured NiO, with potential use to explore a wide variety of materials including phase-change memories and memristive devices in combination with site-correlated chemical imaging tools.
Collapse
Affiliation(s)
- Fran Kurnia
- School of Materials Science and Engineering, University of New South Wales , Sydney 2052, Australia
| | - Jeffrey Cheung
- School of Materials Science and Engineering, University of New South Wales , Sydney 2052, Australia
| | - Xuan Cheng
- School of Materials Science and Engineering, University of New South Wales , Sydney 2052, Australia
| | - Jivika Sullaphen
- School of Materials Science and Engineering, University of New South Wales , Sydney 2052, Australia
| | - Sergei V Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
| | - Nagarajan Valanoor
- School of Materials Science and Engineering, University of New South Wales , Sydney 2052, Australia
| | - Rama K Vasudevan
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
| |
Collapse
|
34
|
Santos S, Lai CY, Olukan T, Chiesa M. Multifrequency AFM: from origins to convergence. NANOSCALE 2017; 9:5038-5043. [PMID: 28394393 DOI: 10.1039/c7nr00993c] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/14/2023]
Abstract
Since the inception of the atomic force microscope (AFM) in 1986, influential papers have been presented by the community and tremendous advances have been reported. Being able to routinely image conductive and non-conductive surfaces in air, liquid and vacuum environments with nanoscale, and sometimes atomic, resolution, the AFM has long been perceived by many as the instrument to unlock the nanoscale. From exploiting a basic form of Hooke's law to interpret AFM data to interpreting a seeming zoo of maps in the more advanced multifrequency methods however, an inflection point has been reached. Here, we discuss this evolution, from the fundamental dilemmas that arose in the beginning, to the exploitation of computer sciences, from machine learning to big data, hoping to guide the newcomer and inspire the experimenter.
Collapse
Affiliation(s)
- Sergio Santos
- Laboratory for Energy and NanoScience (LENS), Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates.
| | | | | | | |
Collapse
|
35
|
Kalinin SV, Strelcov E, Belianinov A, Somnath S, Vasudevan RK, Lingerfelt EJ, Archibald RK, Chen C, Proksch R, Laanait N, Jesse S. Big, Deep, and Smart Data in Scanning Probe Microscopy. ACS NANO 2016; 10:9068-9086. [PMID: 27676453 DOI: 10.1021/acsnano.6b04212] [Citation(s) in RCA: 56] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Abstract
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.
Collapse
Affiliation(s)
| | | | | | | | | | | | | | - Chaomei Chen
- College of Computing and Informatics, Drexel University , Philadelphia, Pennsylvania 19104, United States
| | - Roger Proksch
- Asylum Research, an Oxford Instruments Company , Santa Barbara, California 93117, United States
| | | | | |
Collapse
|
36
|
Somnath S, Collins L, Matheson MA, Sukumar SR, Kalinin SV, Jesse S. Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy. NANOTECHNOLOGY 2016; 27:414003. [PMID: 27607339 DOI: 10.1088/0957-4484/27/41/414003] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip-sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.
Collapse
Affiliation(s)
- Suhas Somnath
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | | | | | | | | | | |
Collapse
|
37
|
Iberi V, Liang L, Ievlev AV, Stanford MG, Lin MW, Li X, Mahjouri-Samani M, Jesse S, Sumpter BG, Kalinin SV, Joy DC, Xiao K, Belianinov A, Ovchinnikova OS. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams. Sci Rep 2016; 6:30481. [PMID: 27480346 PMCID: PMC4969618 DOI: 10.1038/srep30481] [Citation(s) in RCA: 31] [Impact Index Per Article: 3.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/19/2016] [Accepted: 07/04/2016] [Indexed: 11/09/2022] Open
Abstract
Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at the atomic level. We demonstrate He(+) beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young's modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.
Collapse
Affiliation(s)
- Vighter Iberi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
- The Procter and Gamble Company Winton Hill Business Center (WBHC), Cincinnati, OH 45224, USA
| | - Liangbo Liang
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Anton V. Ievlev
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37931, USA
| | - Michael G. Stanford
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
| | - Ming-Wei Lin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Xufan Li
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Masoud Mahjouri-Samani
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Stephen Jesse
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37931, USA
| | - Bobby G. Sumpter
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37931, USA
- Computer Science & Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Sergei V. Kalinin
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37931, USA
| | - David C. Joy
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
| | - Kai Xiao
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - Alex Belianinov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Procter and Gamble Company Winton Hill Business Center (WBHC), Cincinnati, OH 45224, USA
| | - Olga S. Ovchinnikova
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
- The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37931, USA
| |
Collapse
|
38
|
Cheng S, Bocharova V, Belianinov A, Xiong S, Kisliuk A, Somnath S, Holt AP, Ovchinnikova OS, Jesse S, Martin H, Etampawala T, Dadmun M, Sokolov AP. Unraveling the Mechanism of Nanoscale Mechanical Reinforcement in Glassy Polymer Nanocomposites. NANO LETTERS 2016; 16:3630-3637. [PMID: 27203453 DOI: 10.1021/acs.nanolett.6b00766] [Citation(s) in RCA: 85] [Impact Index Per Article: 10.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
The mechanical reinforcement of polymer nanocomposites (PNCs) above the glass transition temperature, Tg, has been extensively studied. However, not much is known about the origin of this effect below Tg. In this Letter, we unravel the mechanism of PNC reinforcement within the glassy state by directly probing nanoscale mechanical properties with atomic force microscopy and macroscopic properties with Brillouin light scattering. Our results unambiguously show that the "glassy" Young's modulus in the interfacial polymer layer of PNCs is two-times higher than in the bulk polymer, which results in significant reinforcement below Tg. We ascribe this phenomenon to a high stretching of the chains within the interfacial layer. Since the interfacial chain packing is essentially temperature independent, these findings provide a new insight into the mechanical reinforcement of PNCs also above Tg.
Collapse
Affiliation(s)
| | | | | | - Shaomin Xiong
- Department of Mechanical Engineering, University of California Berkeley , Berkeley, California 94720, United States
| | | | | | | | | | | | | | | | | | | |
Collapse
|
39
|
Iberi V, Ievlev AV, Vlassiouk I, Jesse S, Kalinin SV, Joy DC, Rondinone AJ, Belianinov A, Ovchinnikova OS. Graphene engineering by neon ion beams. NANOTECHNOLOGY 2016; 27:125302. [PMID: 26890062 DOI: 10.1088/0957-4484/27/12/125302] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He(+) and Ne(+) beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne(+) beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface.
Collapse
Affiliation(s)
- Vighter Iberi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. Department of Materials Science & Engineering, University of Tennessee Knoxville, TN 37996, USA
| | | | | | | | | | | | | | | | | |
Collapse
|
40
|
Belianinov A, Iberi V, Tselev A, Susner MA, McGuire MA, Joy D, Jesse S, Rondinone AJ, Kalinin SV, Ovchinnikova OS. Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors. ACS APPLIED MATERIALS & INTERFACES 2016; 8:7349-7355. [PMID: 26918591 DOI: 10.1021/acsami.5b12056] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Rapid advances in nanoscience rely on continuous improvements of material manipulation at near-atomic scales. Currently, the workhorse of nanofabrication is resist-based lithography and its various derivatives. However, the use of local electron, ion, and physical probe methods is expanding, driven largely by the need for fabrication without the multistep preparation processes that can result in contamination from resists and solvents. Furthermore, probe-based methods extend beyond nanofabrication to nanomanipulation and to imaging which are all vital for a rapid transition to the prototyping and testing of devices. In this work we study helium ion interactions with the surface of bulk copper indium thiophosphate CuM(III)P2X6 (M = Cr, In; X= S, Se), a novel layered 2D material, with a Helium Ion Microscope (HIM). Using this technique, we are able to control ferrielectric domains and grow conical nanostructures with enhanced conductivity whose material volumes scale with the beam dosage. Compared to the copper indium thiophosphate (CITP) from which they grow, the nanostructures are oxygen rich, sulfur poor, and with virtually unchanged copper concentration as confirmed by energy-dispersive X-ray spectroscopy (EDX). Scanning electron microscopy (SEM) imaging contrast as well as scanning microwave microscopy (SMM) measurements suggest enhanced conductivity in the formed particles, whereas atomic force microscopy (AFM) measurements indicate that the produced structures have lower dissipation and are softer as compared to the CITP.
Collapse
Affiliation(s)
- Alex Belianinov
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Vighter Iberi
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Alexander Tselev
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Michael A Susner
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Michael A McGuire
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - David Joy
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Stephen Jesse
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Adam J Rondinone
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Sergei V Kalinin
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Olga S Ovchinnikova
- The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
- Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States
| |
Collapse
|
41
|
Feng B, Sugiyama I, Hojo H, Ohta H, Shibata N, Ikuhara Y. Atomic structures and oxygen dynamics of CeO2 grain boundaries. Sci Rep 2016; 6:20288. [PMID: 26838958 PMCID: PMC4738319 DOI: 10.1038/srep20288] [Citation(s) in RCA: 50] [Impact Index Per Article: 6.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/11/2015] [Accepted: 12/30/2015] [Indexed: 11/09/2022] Open
Abstract
Material performance is significantly governed by grain boundaries (GBs), a typical crystal defects inside, which often exhibit unique properties due to the structural and chemical inhomogeneity. Here, it is reported direct atomic scale evidence that oxygen vacancies formed in the GBs can modify the local surface oxygen dynamics in CeO2, a key material for fuel cells. The atomic structures and oxygen vacancy concentrations in individual GBs are obtained by electron microscopy and theoretical calculations at atomic scale. Meanwhile, local GB oxygen reduction reactivity is measured by electrochemical strain microscopy. By combining these techniques, it is demonstrated that the GB electrochemical activities are affected by the oxygen vacancy concentrations, which is, on the other hand, determined by the local structural distortions at the GB core region. These results provide critical understanding of GB properties down to atomic scale, and new perspectives on the development strategies of high performance electrochemical devices for solid oxide fuel cells.
Collapse
Affiliation(s)
- Bin Feng
- Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
| | - Issei Sugiyama
- Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
| | - Hajime Hojo
- Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
| | - Hiromichi Ohta
- Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan
| | - Naoya Shibata
- Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
| | - Yuichi Ikuhara
- Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan.,Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan.,WPI advanced Institute for materials research, Tohoku University, Sendai 980-8577, Japan
| |
Collapse
|
42
|
BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments. ACTA ACUST UNITED AC 2016. [DOI: 10.1016/j.procs.2016.05.410] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
|
43
|
Belianinov A, He Q, Dziaugys A, Maksymovych P, Eliseev E, Borisevich A, Morozovska A, Banys J, Vysochanskii Y, Kalinin SV. CuInP₂S₆ Room Temperature Layered Ferroelectric. NANO LETTERS 2015; 15:3808-14. [PMID: 25932503 DOI: 10.1021/acs.nanolett.5b00491] [Citation(s) in RCA: 138] [Impact Index Per Article: 15.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
We explore ferroelectric properties of cleaved 2-D flakes of copper indium thiophosphate, CuInP2S6 (CITP), and probe size effects along with limits of ferroelectric phase stability, by ambient and ultra high vacuum scanning probe microscopy. CITP belongs to the only material family known to display ferroelectric polarization in a van der Waals, layered crystal at room temperature and above. Our measurements directly reveal stable, ferroelectric polarization as evidenced by domain structures, switchable polarization, and hysteresis loops. We found that at room temperature the domain structure of flakes thicker than 100 nm is similar to the cleaved bulk surfaces, whereas below 50 nm polarization disappears. We ascribe this behavior to a well-known instability of polarization due to depolarization field. Furthermore, polarization switching at high bias is also associated with ionic mobility, as evidenced both by macroscopic measurements and by formation of surface damage under the tip at a bias of 4 V-likely due to copper reduction. Mobile Cu ions may therefore also contribute to internal screening mechanisms. The existence of stable polarization in a van-der-Waals crystal naturally points toward new strategies for ultimate scaling of polar materials, quasi-2D, and single-layer materials with advanced and nonlinear dielectric properties that are presently not found in any members of the growing "graphene family".
Collapse
Affiliation(s)
- A Belianinov
- †The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Q He
- †The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - A Dziaugys
- ‡Faculty of Physics, Vilnius University, Vilnius, Lithuania LT-01513
| | - P Maksymovych
- †The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | | | - A Borisevich
- †The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | | | - J Banys
- ‡Faculty of Physics, Vilnius University, Vilnius, Lithuania LT-01513
| | - Y Vysochanskii
- ∥Institute of Solid State Physics and Chemistry, Uzhgorod University, Uzhgorod, Ukraine 88000
| | - S V Kalinin
- †The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| |
Collapse
|
44
|
Belianinov A, Vasudevan R, Strelcov E, Steed C, Yang SM, Tselev A, Jesse S, Biegalski M, Shipman G, Symons C, Borisevich A, Archibald R, Kalinin S. Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets. ADVANCED STRUCTURAL AND CHEMICAL IMAGING 2015; 1:6. [PMID: 27547705 PMCID: PMC4977326 DOI: 10.1186/s40679-015-0006-6] [Citation(s) in RCA: 67] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/27/2015] [Accepted: 04/21/2015] [Indexed: 11/10/2022]
Abstract
The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information.
Collapse
Affiliation(s)
- Alex Belianinov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rama Vasudevan
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Evgheni Strelcov
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Chad Steed
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sang Mo Yang
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 151-747 South Korea
- Department of Physics and Astronomy, Seoul National University, Seoul, 151-747 South Korea
| | - Alexander Tselev
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Stephen Jesse
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Michael Biegalski
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Galen Shipman
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer, Computational, and Statistical Sciences, Los Alamos National Laboratory, Los Alamos, NM 87545 USA
| | - Christopher Symons
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Albina Borisevich
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Rick Archibald
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| | - Sergei Kalinin
- Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
- The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA
| |
Collapse
|
45
|
Ovchinnikova OS, Tai T, Bocharova V, Okatan MB, Belianinov A, Kertesz V, Jesse S, Van Berkel GJ. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform. ACS NANO 2015; 9:4260-9. [PMID: 25783696 DOI: 10.1021/acsnano.5b00659] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/04/2023]
Abstract
The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating the co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas-phase species produced with subsequent mass analysis. The basic instrumental setup and operation are discussed, and the multimodal imaging capability and utility are demonstrated using a phase-separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showed that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm × 390 nm), band excitation (781 nm × 781 nm), and mass spectrometry (690 nm × 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 20 nm deep into the sample and the mass spectral image from 110 to 140 nm in depth. Because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the chemical image was estimated to be between 1.5 and 2.6 μm, based on the ability to distinguish surface features in that image that were also observed in the other images.
Collapse
Affiliation(s)
- Olga S Ovchinnikova
- †Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
| | - Tamin Tai
- †Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
| | - Vera Bocharova
- ‡Soft Materials Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131-6210 , United States
| | - Mahmut Baris Okatan
- ∥Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6487, United States
| | - Alex Belianinov
- ∥Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6487, United States
| | - Vilmos Kertesz
- †Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
| | - Stephen Jesse
- ∥Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6487, United States
| | - Gary J Van Berkel
- †Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
| |
Collapse
|
46
|
Li Q, Jesse S, Tselev A, Collins L, Yu P, Kravchenko I, Kalinin SV, Balke N. Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy. ACS NANO 2015; 9:1848-1857. [PMID: 25559112 DOI: 10.1021/nn506753u] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. With many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.
Collapse
Affiliation(s)
- Qian Li
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States
| | | | | | | | | | | | | | | |
Collapse
|
47
|
Damircheli M, Payam AF, Garcia R. Optimization of phase contrast in bimodal amplitude modulation AFM. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2015; 6:1072-81. [PMID: 26114079 PMCID: PMC4463493 DOI: 10.3762/bjnano.6.108] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/17/2014] [Accepted: 03/30/2015] [Indexed: 05/13/2023]
Abstract
Bimodal force microscopy has expanded the capabilities of atomic force microscopy (AFM) by providing high spatial resolution images, compositional contrast and quantitative mapping of material properties without compromising the data acquisition speed. In the first bimodal AFM configuration, an amplitude feedback loop keeps constant the amplitude of the first mode while the observables of the second mode have not feedback restrictions (bimodal AM). Here we study the conditions to enhance the compositional contrast in bimodal AM while imaging heterogeneous materials. The contrast has a maximum by decreasing the amplitude of the second mode. We demonstrate that the roles of the excited modes are asymmetric. The operational range of bimodal AM is maximized when the second mode is free to follow changes in the force. We also study the contrast in trimodal AFM by analyzing the kinetic energy ratios. The phase contrast improves by decreasing the energy of second mode relative to those of the first and third modes.
Collapse
Affiliation(s)
- Mehrnoosh Damircheli
- Instituto de Ciencia de Materiales de Madrid, CSIC, Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
- Permanent address: Department of Mechanical Engineering, Shahr-e-Qods Branch, Islamic Azad University, Tehran, Iran
| | - Amir F Payam
- Instituto de Ciencia de Materiales de Madrid, CSIC, Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
| | - Ricardo Garcia
- Instituto de Ciencia de Materiales de Madrid, CSIC, Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
| |
Collapse
|